KR20230140481A - 임프린트 장치, 임프린트 방법, 저장 매체, 및 물품 제조 방법 - Google Patents
임프린트 장치, 임프린트 방법, 저장 매체, 및 물품 제조 방법 Download PDFInfo
- Publication number
- KR20230140481A KR20230140481A KR1020230034515A KR20230034515A KR20230140481A KR 20230140481 A KR20230140481 A KR 20230140481A KR 1020230034515 A KR1020230034515 A KR 1020230034515A KR 20230034515 A KR20230034515 A KR 20230034515A KR 20230140481 A KR20230140481 A KR 20230140481A
- Authority
- KR
- South Korea
- Prior art keywords
- imprint
- gas supply
- substrate
- gas
- mold
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Classifications
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Shaping Of Tube Ends By Bending Or Straightening (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPJP-P-2022-047720 | 2022-03-24 | ||
| JP2022047720A JP2023141408A (ja) | 2022-03-24 | 2022-03-24 | インプリント装置、インプリント方法、コンピュータプログラム、及び、物品の製造方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20230140481A true KR20230140481A (ko) | 2023-10-06 |
Family
ID=88095667
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020230034515A Pending KR20230140481A (ko) | 2022-03-24 | 2023-03-16 | 임프린트 장치, 임프린트 방법, 저장 매체, 및 물품 제조 방법 |
Country Status (3)
| Country | Link |
|---|---|
| US (2) | US12504683B2 (https=) |
| JP (1) | JP2023141408A (https=) |
| KR (1) | KR20230140481A (https=) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7669199B2 (ja) * | 2021-06-07 | 2025-04-28 | キヤノン株式会社 | インプリント装置、インプリント方法、コンピュータプログラム、及び物品の製造方法 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7090716B2 (en) | 2003-10-02 | 2006-08-15 | Molecular Imprints, Inc. | Single phase fluid imprint lithography method |
| JP2011146447A (ja) * | 2010-01-12 | 2011-07-28 | Canon Inc | インプリント装置及び物品の製造方法 |
| JP6294679B2 (ja) * | 2014-01-21 | 2018-03-14 | キヤノン株式会社 | インプリント装置及び物品の製造方法 |
| JP6632270B2 (ja) * | 2014-09-08 | 2020-01-22 | キヤノン株式会社 | インプリント装置、インプリント方法および物品の製造方法 |
| JP6700777B2 (ja) * | 2015-12-24 | 2020-05-27 | キヤノン株式会社 | インプリント装置、情報処理装置および物品製造方法 |
| JP2019091741A (ja) | 2017-11-10 | 2019-06-13 | キヤノン株式会社 | インプリント装置、インプリント方法、および物品の製造方法 |
| JP6995593B2 (ja) * | 2017-12-06 | 2022-01-14 | キヤノン株式会社 | インプリント方法、インプリント装置及び物品の製造方法 |
| JP7262930B2 (ja) * | 2018-04-26 | 2023-04-24 | キヤノン株式会社 | 型を用いて基板上の組成物を成形する成形装置、成形方法、および物品の製造方法 |
| JP7204464B2 (ja) * | 2018-12-12 | 2023-01-16 | キヤノン株式会社 | インプリント方法、インプリント装置および物品製造方法 |
| JP7669199B2 (ja) * | 2021-06-07 | 2025-04-28 | キヤノン株式会社 | インプリント装置、インプリント方法、コンピュータプログラム、及び物品の製造方法 |
| JP7731831B2 (ja) * | 2022-03-11 | 2025-09-01 | キオクシア株式会社 | インプリント方法、半導体装置の製造方法、及びインプリント装置 |
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2022
- 2022-03-24 JP JP2022047720A patent/JP2023141408A/ja active Pending
-
2023
- 2023-03-02 US US18/177,400 patent/US12504683B2/en active Active
- 2023-03-16 KR KR1020230034515A patent/KR20230140481A/ko active Pending
-
2025
- 2025-11-07 US US19/382,372 patent/US20260063987A1/en active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| US20230305388A1 (en) | 2023-09-28 |
| US20260063987A1 (en) | 2026-03-05 |
| JP2023141408A (ja) | 2023-10-05 |
| US12504683B2 (en) | 2025-12-23 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| A201 | Request for examination | ||
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| D13-X000 | Search requested |
St.27 status event code: A-1-2-D10-D13-srh-X000 |
|
| D21 | Rejection of application intended |
Free format text: ST27 STATUS EVENT CODE: A-1-2-D10-D21-EXM-PE0902 (AS PROVIDED BY THE NATIONAL OFFICE) |
|
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
|
| P11 | Amendment of application requested |
Free format text: ST27 STATUS EVENT CODE: A-2-2-P10-P11-NAP-X000 (AS PROVIDED BY THE NATIONAL OFFICE) |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |