KR20220160579A - 반도체 장치 및 반도체 장치의 제작 방법 - Google Patents
반도체 장치 및 반도체 장치의 제작 방법 Download PDFInfo
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- KR20220160579A KR20220160579A KR1020227032987A KR20227032987A KR20220160579A KR 20220160579 A KR20220160579 A KR 20220160579A KR 1020227032987 A KR1020227032987 A KR 1020227032987A KR 20227032987 A KR20227032987 A KR 20227032987A KR 20220160579 A KR20220160579 A KR 20220160579A
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- insulator
- oxide
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- insulating film
- conductor
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- H10D30/67—Thin-film transistors [TFT]
- H10D30/674—Thin-film transistors [TFT] characterised by the active materials
- H10D30/6755—Oxide semiconductors, e.g. zinc oxide, copper aluminium oxide or cadmium stannate
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- H10D64/511—Gate electrodes for field-effect devices for FETs for IGFETs
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- Thin Film Transistor (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Semiconductor Memories (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPJP-P-2020-063049 | 2020-03-31 | ||
| JP2020063049 | 2020-03-31 | ||
| JPJP-P-2020-115292 | 2020-07-03 | ||
| JP2020115292 | 2020-07-03 | ||
| PCT/IB2021/052301 WO2021198836A1 (ja) | 2020-03-31 | 2021-03-19 | 半導体装置、および半導体装置の作製方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20220160579A true KR20220160579A (ko) | 2022-12-06 |
Family
ID=77928415
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020227032987A Pending KR20220160579A (ko) | 2020-03-31 | 2021-03-19 | 반도체 장치 및 반도체 장치의 제작 방법 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US12557366B2 (https=) |
| JP (2) | JP7629446B2 (https=) |
| KR (1) | KR20220160579A (https=) |
| CN (1) | CN115244713A (https=) |
| TW (1) | TWI907400B (https=) |
| WO (1) | WO2021198836A1 (https=) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW202329333A (zh) * | 2021-11-30 | 2023-07-16 | 日商半導體能源研究所股份有限公司 | 半導體裝置、半導體裝置的製造方法 |
| US11768237B2 (en) | 2022-05-10 | 2023-09-26 | Google Llc | Leakage screening based on use-case power prediction |
| WO2024165987A1 (en) * | 2023-02-09 | 2024-08-15 | Zinite Corporation | Passivation elements of a thin film transistor |
| CN117979690B (zh) * | 2023-12-22 | 2024-09-27 | 北京超弦存储器研究院 | 一种半导体器件及其制造方法、电子设备 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011151383A (ja) | 2009-12-25 | 2011-08-04 | Semiconductor Energy Lab Co Ltd | 半導体装置 |
| JP2012257187A (ja) | 2010-08-06 | 2012-12-27 | Semiconductor Energy Lab Co Ltd | 半導体集積回路 |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2011036981A1 (en) | 2009-09-24 | 2011-03-31 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| WO2011062057A1 (en) | 2009-11-20 | 2011-05-26 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| WO2012014786A1 (en) | 2010-07-30 | 2012-02-02 | Semiconductor Energy Laboratory Co., Ltd. | Semicondcutor device and manufacturing method thereof |
| US20130087784A1 (en) | 2011-10-05 | 2013-04-11 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
| WO2014013959A1 (en) * | 2012-07-20 | 2014-01-23 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing semiconductor device |
| KR102294507B1 (ko) * | 2013-09-06 | 2021-08-30 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
| KR20160102295A (ko) * | 2013-12-26 | 2016-08-29 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
| US9443876B2 (en) * | 2014-02-05 | 2016-09-13 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device, display device including the semiconductor device, display module including the display device, and electronic device including the semiconductor device, the display device, and the display module |
| KR102548001B1 (ko) | 2015-07-08 | 2023-06-28 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제작 방법 |
| JPWO2017144994A1 (ja) * | 2016-02-22 | 2019-02-14 | 株式会社半導体エネルギー研究所 | トランジスタおよびその作製方法、半導体ウエハならびに電子機器 |
| US10147681B2 (en) * | 2016-12-09 | 2018-12-04 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
| JP2019047101A (ja) * | 2017-09-05 | 2019-03-22 | 株式会社半導体エネルギー研究所 | 半導体装置、および半導体装置の作製方法 |
| WO2019053573A1 (ja) | 2017-09-15 | 2019-03-21 | 株式会社半導体エネルギー研究所 | 半導体装置、および半導体装置の作製方法 |
| JPWO2019171196A1 (ja) | 2018-03-07 | 2021-02-25 | 株式会社半導体エネルギー研究所 | 半導体装置、および半導体装置の作製方法 |
| WO2020049425A1 (ja) | 2018-09-05 | 2020-03-12 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
| US10978563B2 (en) | 2018-12-21 | 2021-04-13 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing semiconductor device |
| WO2021064503A1 (ja) | 2019-10-04 | 2021-04-08 | 株式会社半導体エネルギー研究所 | 半導体装置 |
| CN114616681A (zh) | 2019-11-01 | 2022-06-10 | 株式会社半导体能源研究所 | 半导体装置 |
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Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011151383A (ja) | 2009-12-25 | 2011-08-04 | Semiconductor Energy Lab Co Ltd | 半導体装置 |
| JP2012257187A (ja) | 2010-08-06 | 2012-12-27 | Semiconductor Energy Lab Co Ltd | 半導体集積回路 |
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| US20230113593A1 (en) | 2023-04-13 |
| JPWO2021198836A1 (https=) | 2021-10-07 |
| US12557366B2 (en) | 2026-02-17 |
| TW202213796A (zh) | 2022-04-01 |
| JP2025069295A (ja) | 2025-04-30 |
| WO2021198836A1 (ja) | 2021-10-07 |
| JP7629446B2 (ja) | 2025-02-13 |
| TWI907400B (zh) | 2025-12-11 |
| CN115244713A (zh) | 2022-10-25 |
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