KR20220042579A - Replaceable single type probe pin - Google Patents

Abstract

Disclosed is a replaceable probe pin. The replaceable probe pin comprises: a support unit; an upper plunger unit installed on an upper part of the support unit to be moveable up and down and having a plurality of upper plungers that independently move up and down; a lower plunger unit installed on a lower part of the support unit to be moveable up and down and having a plurality of lower plungers that independently move up and down; and a main elastic member installed on the support unit and elastically pressurizing the upper and lower plunger units in a direction growing apart from each other.

Description

REPLACEABLE SINGLE TYPE PROBE PIN

The present invention relates to a probe pin, and more particularly, to a replaceable probe pin capable of replacing a plunger in a detachable manner.

In general, in order to test the electrical characteristics of a semiconductor device, an electrical connection between the semiconductor device and a tester should be made smoothly.

In this way, the inspection device for connecting the semiconductor element and the tester is divided into a socket board, a probe card, and a connector. At this time, the socket board is used when the semiconductor element is in the form of a semiconductor package, the probe card is used when the semiconductor element is in the form of a semiconductor chip, and the connector is an inspection device that connects the semiconductor element and the tester in some discrete devices. is used as

The role of the inspection device such as the socket board, the probe card and the connector is to connect the terminals of the semiconductor device and the tester to each other so that electrical signals can be exchanged in both directions.

As a core component of such an inspection device, a contact means used inside the inspection device is a probe pin.

In general, the probe pin is divided into a double pin type in which both plungers slide and a single pin type in which only one plunger slides.

Among them, the double pin type includes a housing having a pipe shape, and a spring installed in the housing to provide an elastic force between the upper and lower plungers and the plungers on both sides of the housing. In the above configuration, the upper and lower plungers are relatively slid to approach and spaced apart, and the inspection operation is performed by exchanging electrical signals by contact when approaching.

However, in the case of a conventional probe pin, the end of the plunger wears out when used for a long time, causing electrical contact failure, and thus needs to be replaced. .

Therefore, there was a problem in that the replacement cost increases and the maintenance cost increases.

In addition, in the case of the conventional probe pin, each of the upper plunger and the lower plunger is provided in a single number, and when the inspection process is performed in a biased state, the position of the solder ball of the object to be inspected and the center of the probe pin do not coincide with each other. There is a problem that the reliability of the test is lowered because the state is unstable.

Republic of Korea Patent Publication No. 10-2016-0145807

The present invention has been devised in view of the above, and it is possible to partially exchange and use parts, and to provide a replaceable probe pin with an improved structure so that it can be inspected by stably contacting a solder ball that is biased. There is a purpose.

Replaceable probe pin of the present invention for achieving the above object, the support; an upper plunger unit movably installed on the upper portion of the support portion and having a plurality of upper plungers independently lifting and lowering; a lower plunger unit movably installed at a lower portion of the support and having a plurality of lower plungers independently elevating; and a main elastic member that is installed on the support and elastically presses each of the upper and lower plunge units in a direction away from each other.

Thereby, it is possible to partially replace the parts.

In addition, the upper plunger unit may include an upper movable member movably coupled to the support portion; a plurality of upper plungers coupled to the upper movable member to be reciprocally movable and symmetrically disposed about the support portion; and a first elastic member elastically supporting the upper plunger with respect to the upper movable member.

Accordingly, it is possible to perform the inspection by stably contacting the inspection object (solder ball) in the biased position.

In addition, the upper plunger, the plunger body; a guide coupling portion extending to have an outer diameter smaller than that of the plunger body and movably coupled to the upper movable member; And it is preferable to include a; and a locking protrusion that is extended and formed at the end of the guide coupling part.

In addition, a sliding hole that is slidably coupled to the support portion is formed in the center of the upper movable member,

It is preferable that the upper movable member has a plurality of plunger coupling portions formed to be radially symmetrical with respect to the sliding hole so that the upper plunger is coupled to be vertically and reciprocally movable.

Accordingly, the upper plunger can be installed to reciprocate stably up and down.

In addition, it is preferable that a slit for assembling is formed in the plunger coupling part so as to communicate with the plunger coupling hole from the outer edge.

Thereby, the upper plunger can be easily replaced and mounted independently.

In addition, the first elastic member may be coupled to the guide coupling portion so as to be positioned between the upper movable member and the plunger body of the upper plunger.

In addition, the first elastic member may include a spiral leaf spring.

Accordingly, the first elastic member can be easily assembled and separated from the upper plunger.

In addition, the plunger body, the body portion extending to a larger outer diameter than the guide coupling parent is formed in a cylindrical shape; and a plurality of contact tips formed to protrude symmetrically from the end of the body part radially with respect to the center.

Accordingly, by forming a plurality of contact tips on one plunger, it is possible to secure a plurality of contact points with the solder ball, thereby improving contact reliability.

In addition, the lower plunger unit may include a lower movable member movably coupled to the support portion; a plurality of upper plungers coupled to the lower movable member to be reciprocally movable and symmetrically disposed about the support portion; and a second elastic member elastically supporting the lower plunger with respect to the lower movable member.

Accordingly, by providing a plurality of lower plungers electrically connected to the tester side, it is possible to increase the electrical contact reliability regardless of a biased position.

In addition, the lower plunger, the plunger body; a guide coupling portion extending to have an outer diameter smaller than that of the plunger body and movably coupled to the lower movable member; And it is preferable to include a; and a locking protrusion that is extended and formed at the end of the guide coupling part.

In addition, a sliding hole slidably coupled to the support part is formed in the center of the lower movable member, and the lower movable member is formed radially symmetrically with respect to the sliding hole so that the lower plunger can move up and down reciprocally It is desirable to have a plurality of plunger engagement portions that engage.

Thereby, the lower plunger can be installed so as to reciprocate up and down a predetermined distance.

In addition, it is preferable that a slit for assembling is formed in the plunger coupling part so as to communicate with the plunger coupling hole from the outer edge.

In addition, the second elastic member may include a spiral leaf spring.

Thereby, the second elastic member can be easily replaced and mounted.

In addition, the support portion has a rod shape, the support bar having an extension rib formed to extend at one end; and a support ring coupled to the other end of the support bar, and the main elastic member is preferably installed by being inserted into the support bar.

As a result, the upper and lower plunger units can be easily assembled and detached from the support.

The replaceable probe pin of the present invention can be disassembled and installed for each part in a state in which each part is assembled and combined, if necessary.

Therefore, there is an advantage in that the maintenance cost can be reduced compared to the case where the entire product is exchanged and used in the prior art.

In addition, a plurality of the upper and lower plungers are installed so that each of the plungers can be operated independently, so that stable contact is possible with respect to the solder ball in a biased position. Therefore, the reliability of the inspection can be improved.

1 is a combined perspective view showing a replaceable probe pin according to an embodiment of the present invention.
FIG. 2 is an exploded perspective view of the replaceable probe pin of FIG. 1 ;
3 is a plan view of the replaceable probe pin shown in FIG. 1 ;
Fig. 4 is a front view of the replaceable probe pin shown in Fig. 1;
5 to 7 each is a schematic cross-sectional configuration view for explaining the operating state of the replaceable probe pin according to an embodiment of the present invention.
8 is a view for explaining an operation of inspecting a biased object to be inspected.

Hereinafter, a replaceable probe pin of the present invention will be described in detail with reference to the accompanying drawings.

1 to 8 , the replaceable probe pin according to an embodiment of the present invention includes a support part 100 , an upper plunger unit 200 , a lower plunger unit 300 , and a main elastic member 400 . do.

The support part 100 includes a support bar 110 having a predetermined length and a support ring 120 coupled to an end of the support bar 110 . The support bar 110 has a support bar body 111 having a rod shape of a predetermined length, and an extension rib 113 that is extended and formed at one end of the support bar body 111 . In addition, a ring coupling groove 115 to which the support ring 120 is press-fitted is formed in an annular shape at one end of the support bar 110 . The support ring 120 is fixed by being press-fitted to the ring coupling groove 115 in a so-called one-touch method.

The upper plunger unit 200 includes an upper movable member 210 movably coupled to the support bar 110 , a plurality of upper plungers 220 coupled to the upper movable member 210 , and the plurality of upper plungers. A plurality of first elastic members 230 for elastically supporting the 220 with respect to the upper movable member 210 are provided.

The upper movable member 210 has a plate structure, and a sliding hole 211 slidably coupled to the support bar 110 in the center, and a plurality of plungers radially symmetrically formed around the sliding hole 211 . It has a coupling portion (213). The sliding hole 211 is formed through the center of the upper movable member 210 . Plunger coupling portion 213 is formed to extend outwardly so that a plurality of the sliding hole 211 is symmetrically located as a center. A plunger coupling hole 213a to which the upper plunger 220 is coupled is formed in the plunger coupling part 213 . In addition, a slit 213b for assembling is formed in the plunger coupling part 213 to communicate with the plunger coupling hole 213a from the outer edge. And the assembling slit 213b is formed to gradually narrow from the outside to the inner circumferential surface of the plunger coupling hole 213a, and preferably, the slit surface S1 of the assembling slit 213b is inclined. Accordingly, the upper plunger 220 can be easily coupled to the plunger coupling hole 213a, and can be supported so as not to be easily detached from the coupled state.

The upper plunger 220 has a rod shape of a predetermined length up and down, and has a plunger body 221 , a guide coupling part 223 and a locking protrusion 225 from the top.

The plunger body 221 is a portion in which a portion of the semiconductor to be inspected is in electrical contact, and includes a body portion 221a formed in a cylindrical shape with a predetermined length up and down, and a plurality of protruding portions formed from an upper end of the body portion 221a. It has a contact tip (221b). The body part 221a has a cylindrical shape, and the guide coupling part 223 is connected to the lower part. The contact tips 221b are radially symmetrically formed with respect to the center C1 of the body portion 221a, and preferably four are symmetrically formed. The contact tip 221b preferably has a substantially triangular pyramid shape, and the outer surface s3 extending from the outer surface of the body portion 221a is formed to be round, and the inner surface s4 connected at the center C1 is A slanted flat surface is preferred. In this way, by forming a plurality of contact tips 221b symmetrically with respect to the center C1, stable contact is possible at a plurality of points with respect to the solder ball 20 of the inspection object 10, and the reliability of electrical contacts can increase

The guide coupling part 223 extends to a predetermined length below the plunger body 221 and has a cylindrical shape. The guide coupling part 223 has an outer diameter smaller than that of the plunger body 221 and the engaging protrusion 225 . The guide coupling part 223 is coupled to the coupling hole 213a of the plunger coupling part 213, and is capable of reciprocating up and down. When the guide coupling part 223 passes through the assembling slit 213b and is coupled, it can be assembled by being inserted into the coupling hole 213a in a so-called one-touch method. That is, when the guide coupling part 223 passes through the assembling slit 213b, the upper coupling part 213 is elastically deformed momentarily so that the guide coupling part 223 can be coupled in a one-touch coupling method, and the coupled In this state, it is possible to slide up and down by an external force.

The locking protrusion 225 is formed to have a larger outer diameter than the guide coupling part 223 at the lower end of the guide coupling part 223 . The moving distance in the upper direction of the guide coupling part 223 is limited by the locking protrusion 225 and does not fall out of the coupling hole 213a.

In addition, the first elastic member 230 is coupled to the guide coupling portion 223 . Specifically, the first elastic member 230 is installed by being inserted into the guide coupling part 223 to be positioned between the plunger coupling part 213 and the plunger body 221 of the upper plunger 220 . The first elastic member 230 may include a spiral plate spring or a coil spring. The first elastic member 230 elastically presses the upper plunger 220 to maintain a state in which the upper plunger 220 is maximally raised to the upper portion of the plunger coupling portion 213 .

In the upper plunger unit 200 having the above configuration, four upper plungers 220 are symmetrically arranged around the support bar 110 , and each of them can independently move up and down.

The lower plunger unit 300 is symmetrically disposed with the upper plunger unit 200 with the support 100 interposed therebetween, and has a configuration corresponding to the upper plunger unit 200 . That is, the lower plunger unit 300 includes a lower movable member 310 movably coupled to the support bar 110 , a plurality of lower plungers 320 coupled to the upper movable member 310 , and the plurality of lower portions. A plurality of second elastic members 330 for elastically supporting the plunger 220 with respect to the lower movable member 310 are provided.

Here, the lower movable member 310 is coupled to the support bar 111 so as to be symmetrical with the upper movable member 210 , and has the same shape as the movable member 210 . That is, the sliding hole 311 is formed in the center of the lower movable member 310 as well, and the plunger coupling part 313 is formed symmetrically radially around the sliding hole 311 . A plunger coupling hole 313a is formed in the plunger coupling part 313 . As a part of the plunger coupling hole 313a is exposed to the outside by the assembling slit 313b, the lower plunger 320 can be easily assembled and separated in a so-called one-touch method.

The lower plunger 320 is also provided in a number corresponding to the upper plunger 220 , and is vertically movably coupled to the plunger coupling part 313 . The lower plunger 320 also has the same configuration as the upper plunger 220 . That is, the lower plunger 320 has a rod shape of a predetermined length up and down, and has a plunger body 321 , a guide coupling part 323 , and a locking protrusion 325 from the bottom.

The plunger body 321 is a portion in contact with the electrical contact portion of the tester, and includes a body portion 321a formed in a cylindrical shape with a predetermined length up and down, and a plurality of contact tips protruding from the upper end of the body portion 321a. (321b). Since the plunger body 321 has the same configuration as the plunger body 221 of the upper plunger 220 described above, a detailed description thereof will be omitted.

In addition, since the configuration of the guide coupling part 323 and the locking protrusion 325 also corresponds to the configuration of the upper plunger 220, further detailed description will be omitted.

These lower plungers 320 are symmetrically disposed with respect to the center of the four support parts 100 , and each is elastically supported by the third elastic member 330 to be vertically and reciprocally movable. Each of these lower plungers 320 may be moved independently.

Here, the second elastic member 230 is coupled to the guide coupling portion 323 of the lower plunger 320 . Specifically, the second elastic member 230 is installed to be inserted into the guide coupling part 323 so as to be positioned between the plunger coupling part 313 and the plunger body 321 of the lower plunger 320 . The third elastic member 330 may include a spiral plate spring or a coil spring. The second elastic member 330 elastically presses the lower plunger 320 to maintain a state in which the lower plunger 320 is maximally raised to the lower portion of the plunger coupling portion 313 .

The main elastic member 400 is provided with a coil spring fitted to the support bar (110). The main elastic member 400 elastically supports each of the upper movable member 210 and the lower movable member 310 in a direction away from each other while being fitted to the support bar 110 . Therefore, when pressure is applied when the upper and lower plunger units 200 and 300 respectively are in contact with each other during the test operation, the upper and lower plunger units 200 and 300 are each 1 by the main elastic member 400 . Secondarily, it is possible to move up and down, and secondly, the upper and lower plungers 220 and 330 are independently movable up and down by the elastic force of each of the first and second elastic members 230 and 330 .

In the probe pin according to an embodiment of the present invention having the above configuration, in a state where the main elastic member 400 is positioned between the upper movable member 210 and the lower movable member 310, the support bar 110 is lower After coupling to pass through the movable member 310 and the upper movable member 210 , the support ring 120 is coupled to and fixed to the support bar 110 protruding upward of the upper movable member 210 . In this state, the first elastic member 230 is first assembled to each of the plurality of upper plungers 220 , and then the upper plunger 220 is assembled to the upper movable member 210 in a so-called one-touch method.

In addition, the lower plunger 320 in which the second elastic member 330 is first inverted is assembled to the lower movable member 310 in a one-touch manner in the same manner.

At this time, as described above, the guide coupling part 223 of the upper plunger 220 is coupled to the coupling hole 213a in a so-called one-touch method through the assembling slit 213b of the upper coupling part 213 .

As shown in FIG. 5 , the assembled probe pin is maintained in a state in which the upper plunger 220 is maximally raised upward by the first elastic member 230 , and the lower plunger 320 is the second elastic member 330 . maintained as low as possible by In addition, each of the first and second plunger units 200 and 300 maintain a state spaced apart from each other up and down by the main elastic member 400 .

When the inspection object 10 is tested in this state, as shown in FIGS. 6 and 7 , the upper plunger 220 is in contact with the solder ball 20 of the descending inspection object 10 and is in contact with it stably while descending. And, the lower plunger 330 may be in contact with the connection part 30 of the test part and rise while maintaining a stable contact state by the elastic force.

At this time, a plurality of upper plungers 220 are arranged, and each upper plunger 220 has a plurality of contact points, that is, a plurality of contact tips 221b, so that multiple contact with the solder ball 20 is possible. As such, multiple contacts are possible, and good conduction can be ensured, and even if wear and contamination occur, a plurality of upper plungers 220 and a plurality of contact tips 221 b are provided, thereby reducing the lifespan of the upper plunger 220. It can be extended and stable contact stability can be secured.

In addition, as shown in Fig. 8, when the position of the solder ball 20, which is the inspection object, is irregularly arranged, that is, even when the solder ball 20 is arranged with a bias in the center of the support bar 110, the upper plunger ( 220) is provided, and since each of the upper plungers 220 is provided with a plurality of contact tips 221b spaced apart from each other, contact with the object to be measured can be made normally. Accordingly, there is an advantage in that it is possible to inspect irregular objects to be measured. In particular, by having a configuration in which the plurality of upper plungers 220 can move up and down independently, it is possible to improve the reliability of the inspection of such irregular objects to be measured.

Meanwhile, in the probe pin according to the embodiment of the present invention having the above configuration, the upper plunger 220 is movably assembled to the upper movable member 210 , and the lower plunger 320 is movable to the lower movable member 310 . to be assembled

The probe pin 100 of this configuration is a configuration in which the upper and lower plungers 220 and 320 can move independently up and down by external force. And after separating from the lower movable members 210 and 310, it is possible to use it by assembling it as a new part.

For example, when the upper plunger 220 is to be replaced, the upper plunger 220 is forcibly taken out through the assembling slit 213b of the plunger coupling part 213 and separated. Then, in a state in which the first elastic member 230 is first assembled to the new upper plunger 220, the upper plunger 220 is inserted into the plunger coupling hole 213a in a so-called one-touch method through the assembling slit 213b. It can be easily combined and assembled. In the same way as in this method, the lower plunger 320 can also be easily exchanged. Of course, since the first and second elastic members 230 and 330 are helical leaf springs, they can be easily assembled and separated for replacement.

In the foregoing, specific embodiments of the present invention have been described and illustrated, but it is common knowledge in the art that the present invention is not limited to the described embodiments, and that various modifications and variations can be made without departing from the spirit and scope of the present invention. It is self-evident to those who have Therefore, such modifications or variations should not be individually understood from the technical spirit or point of view of the present invention, and modified embodiments should be said to belong to the claims of the present invention.

100.. Support 110. Support Bar
120..Support ring 200..Upper plunger unit
210..Upper movable member 220..Upper plunger
230.. First elastic member 300.. Lower plunger unit
310..Lower movable member 320..Lower plunger
330. Second elastic member 400. Main elastic member

Claims (15)

support;
an upper plunger unit movably installed on the upper portion of the support portion and having a plurality of upper plungers independently lifting and lowering;
a lower plunger unit movably installed in a lower portion of the support and having a plurality of lower plungers independently elevating; and
and a main elastic member that is installed on the support and elastically presses each of the upper and lower plunge units in a direction away from each other. According to claim 1, wherein the upper plunger unit,
an upper movable member movably coupled to the support part;
a plurality of upper plungers coupled to the upper movable member to be reciprocally movable and symmetrically disposed about the support portion; and
and a first elastic member elastically supporting the upper plunger with respect to the upper movable member. According to claim 2, wherein the upper plunger,
plunger body;
a guide coupling portion extending to have an outer diameter smaller than that of the plunger body and movably coupled to the upper movable member; and
A replaceable probe pin comprising a; a locking protrusion that is extended and formed at an end of the guide coupling part. 4. The method of claim 3,
A sliding hole that is slidably coupled with respect to the support is formed in the center of the upper movable member,
The upper movable member is formed radially symmetrically with respect to the sliding hole, and the upper plunger is a replaceable probe pin, characterized in that it has a plurality of plunger coupling portions to be coupled up and down reciprocally. 5. The method of claim 4,
A replaceable probe pin, characterized in that the plunger coupling portion is formed with a slit for assembling so as to communicate with the plunger coupling hole from the outer edge. 4. The method of claim 3,
The first elastic member is a replaceable probe pin, characterized in that coupled to the guide coupling portion so as to be positioned between the upper movable member and the plunger body of the upper plunger. 7. The method of claim 6,
The replaceable probe pin, characterized in that the first elastic member comprises a helical leaf spring. According to claim 3, wherein the plunger body,
a body portion extending to a larger outer diameter than the guide coupling parent and formed in a cylindrical shape; and
A replaceable probe pin comprising a; a plurality of contact tips formed to protrude radially symmetrically from the end of the body portion with respect to the center. According to claim 1, wherein the lower plunger unit,
a lower movable member movably coupled to the support part;
a plurality of upper plungers coupled to the lower movable member so as to be reciprocally moved and disposed symmetrically with respect to the support portion; and
and a second elastic member elastically supporting the lower plunger with respect to the lower movable member. 10. The method of claim 9, wherein the lower plunger,
plunger body;
a guide coupling portion extending to have an outer diameter smaller than that of the plunger body and movably coupled to the lower movable member; and
A replaceable probe pin comprising a; a locking protrusion that is extended and formed at an end of the guide coupling part. 11. The method of claim 10,
A sliding hole is formed in the center of the lower movable member to be slidably coupled with respect to the support portion,
The lower movable member is a replaceable probe pin, characterized in that it has a plurality of plunger coupling portion formed symmetrically radially with respect to the sliding hole to be coupled to the lower plunger up and down reciprocating movement. 12. The method of claim 11,
A replaceable probe pin, characterized in that the plunger coupling portion is formed with a slit for assembling so as to communicate with the plunger coupling hole from the outer edge. 10. The method of claim 9,
and the second elastic member includes a helical leaf spring. 11. The method of claim 10, wherein the plunger body,
a body portion extending to a larger outer diameter than the guide coupling parent and formed in a cylindrical shape; and
A replaceable probe pin comprising a; a plurality of contact tips formed to protrude radially symmetrically from the end of the body portion with respect to the center. According to any one of claims 1 to 1, wherein the support portion,
a support bar having a rod shape and having an extended rib that is extended and formed at one end; and
and a support ring coupled to the other end of the support bar.
The main elastic member is a replaceable probe pin, characterized in that installed by being fitted to the support bar.

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