KR20190025301A - Test tray for handler to support test of electronic devices - Google Patents

Abstract

The present invention relates to a test tray for a handler to support a test of electronic components. According to the present invention, the test tray for a handler to support a test of electronic components has a preventing means to prevent some pickers from interfering with an installation frame when some pickers perform operations of loading electronic components into the test tray or unloading electronic components from the test tray. According to the present invention, the replacement costs can be reduced, thereby improving an operating rate of the handler.

Description

[0001] TEST TRAY FOR HANDLER TO SUPPORT TEST OF ELECTRONIC DEVICES [0002]

The present invention relates to a test tray for a handler that supports testing of electronic components.

Electronic components, such as semiconductor devices, are produced through a number of standardized processes, as the case may be. However, even though each process is performed under standardized conditions, it is virtually impossible to produce only good electronic components because slight variations in the conditions affect the production of electronic components. Therefore, the produced electronic parts are tested by a tester and then divided into good and defective parts, and only good parts are shipped.

Testing of electronic components is only possible if the electronic components are electrically connected to the tester. In this case, a device that electrically connects the test socket of the tester to the electronic device is a handler (hereinafter, referred to as a "handler") that supports testing of the electronic device.

The types of electronic components vary, and the electrical connection structure of electronic components is also various. So there are various types of handlers.

Among the various types of handlers, there are those that electrically connect the electronic component and the tester while the electronic component is loaded in the test tray, and the present invention relates to this kind of things.

The test handler to which the test tray is applied loads the electronic parts to be tested into the test tray and presses the electronic parts loaded in the test tray with the pusher to electrically connect the electronic parts to the tester Japanese Patent Application Laid-Open No. 10-2014-0127389). And unloading the tested electronic components from the test tray.

The test tray includes inserts and frames as disclosed in Korean Patent Laid-Open No. 10-2008-0040251.

The insert has a seat for loading electronic components (referred to as a " storage compartment " in this publication) as shown in Korean Utility Model Publication No. 20-2009-0001188, and the loaded electronic component is stably (Called " holding device " in the corresponding publication). The open area of the top and bottom of the mounting groove is proportional to the size of the electronic component, and the size of the mounting groove is proportional to the size of the entire insert. Therefore, if the size of the electronic component to be tested is large, the insert size is large. If the size of the electronic component to be tested is small, the size of the insert is generally small.

The handler is also provided with a picking device for moving the electronic component to load or unload the electronic component into the test tray. In most cases, the picking device has a plurality of pickers arranged in a matrix form, and one picker is a part capable of gripping or releasing one electronic component.

The picking device mainly moves electronic components between the customer tray and the test tray. At this time, the interval between the electronic parts loaded in the customer tray differs from the interval between the electronic parts loaded in the test tray. Therefore, the picking apparatus is provided such that the spacing of the pickers can be adjusted in at least one of the X-axis direction and the Y-axis direction on the X-Y plane. In this connection, Korean Patent Laid-Open No. 10-2007-0077905 (hereinafter referred to as "Prior Art") can be referred to.

Prior art has a starter loading table and two picking devices to move electronic components from the customer tray to the test tray. As a result, the two picking devices are divided into one and the other, so that the processing speed is very fast, and the spacing of the pickers in each picking device can be adjusted only in either the X-axis direction or the Y-axis direction.

On the other hand, as mentioned above, as the size of the electronic component to be tested increases, the size of the insert increases, so that the interval of the inserts (the distance between the center and the center of the insert) If the size of the electronic component to be tested is small, it is desirable that the size of the insert be reduced in order to improve the processing capacity. In this case, the intervals of the inserts must be narrowed. On the other hand, if the old tester continues to be used, test trays and picking devices must be applied to the specifications of the tester used, despite advances in handler technology, such as improved precision and progressive development of mechanical structure.

Accordingly, when the size of the electronic component is changed or the tester is replaced with an increased number of times, the two picking devices, the starting type loading table, and the test tray must all be replaced. This increases the replacement cost, Resulting in a decline in utilization rate due to replacement time consumption. For example, the second picking apparatus of the prior art moves the electronic components from the starting type loading table to the test tray, and the gap between the pickers is adjusted only in the X-axis direction and fixed in the Y-axis direction . If the size of the electronic component to be tested is changed or the test tray is replaced by a tester which has been increased in the number of times of processing once, replacement with a picking device matching the gap in the Y axis direction between the inserts in the replaced test tray It is an essential task.

Of course, it is also possible to selectively remove only the pickers that do not perform the moving operation of the electronic components in the picking device, but it is also possible to remove several pickers selectively from among the closely packed pickers, It is a difficult task. In addition, work must be carried out to rearrange the pickers, because force is applied to neighboring pickers in the course of operation and movement due to various mechanical tolerances may occur. Thus, the time required for selective removal of pickers is inevitably excessive, and this may be a factor that greatly reduces the utilization rate.

Therefore, efforts are being made to minimize the number of parts to be replaced as much as possible, thereby minimizing the drop in the switching rate due to the increase of the replacement cost, the waste of resources, and the replacement time. The present invention relates to a handler to which a picking device (e.g., a second picking device in the prior art) is applied that is independent of the customer tray and associated with the test tray.

SUMMARY OF THE INVENTION It is an object of the present invention to provide a novel technique that can utilize a picking apparatus as it is even when the size of an electronic component to be tested is changed and a test tray is replaced.

A test tray for a handler supporting testing of an electronic component according to the present invention includes: inserts having a seating groove on which electronic components can be seated; And an installation frame in which the inserts are installed in a matrix fashion to be somewhat flowable; The insert comprising: a body having the seating groove; And a retainer for retaining the electronic component so that the electronic component seated in the seating groove is prevented from being released; (L (L)) among the N (N is a natural number greater than 1) pickers (the picker is a component for holding or releasing the electronic component) moving together while forming a picking device (M is a natural number smaller than N, that is, a natural number smaller than N) that can not perform an operation on the inserts when performing an operation of gripping an electronic part or releasing a grip on the inserts + M = N) number of pickers.

S denotes a distance between the inserts adjacent to each other in at least one direction of the X axis direction or the Y axis direction and S denotes aT, It is larger than 1 but smaller than N.

The prevention means is disposed between the inserts in at least one of the X-axis direction and the Y-axis direction, and is provided with at least one insert between the mutually adjacent inserts, and a smaller number than N inserts.

The prevention means is provided at least in the form of a hole or groove through which the grip portion of the picker can be inserted.

The preventive means is arranged in parallel with the inserts whose spacing of the pickers in the X-axis direction or the Y-axis direction is fixed.

The present invention has the following effects.

First, since the picking device can be utilized as it is despite the replacement of the test tray or the tester, the replacement cost and the waste of resources can be reduced, and the operation rate of the handler can be improved.

Second, it is possible to produce handlers with improved compatibility that can satisfy the consumer satisfaction of the products.

1 is a schematic plan view of a test tray for a handler according to an embodiment of the present invention.
Fig. 2 is a conceptual diagram of a picking apparatus that can mutually correspond to the test tray of Fig. 1;
3 is a reference diagram for explaining a problem of a conventional test tray.
FIG. 4 is a view for explaining the loading or unloading operation of the picking apparatus for the test tray of FIG. 1; FIG.
5 is a reference diagram for explaining a relationship between a test tray and a picking apparatus according to another example.

Preferred embodiments according to the present invention will be described with reference to the accompanying drawings, but for the sake of brevity of description, descriptions of redundant or substantially identical configurations are omitted or compressed as much as possible.

<Description of Test Tray>

1 is a plan view of a test tray 100 (hereinafter abbreviated as a test tray) for a handler according to an embodiment of the present invention.

The test tray 100 includes inserts 110 and a mounting frame 120.

The inserts 110 each have a seating groove IG on which electronic components can be seated, and include a body 111 and a retainer 112.

In the body 111, a seating groove IG is formed.

The retainer 112 holds the electronic component so as to prevent the escape of the electronic component seated in the seating groove IG.

In the installation frame 120, the inserts 110 are installed in a matrix fashion so as to be somewhat flowable. Prior to the detailed description of the installation frame 120, the picking apparatus 200 will be briefly described with reference to the conceptual diagram of FIG.

FIG. 2 conceptually illustrates a picking apparatus 200 for loading or unloading electronic components from the test tray 100 of FIG.

The picking apparatus 200 of FIG. 2 has a 2 × 8 matrix type of pickers 210 whose spacing can be adjusted in the X-axis direction but fixed in the Y-axis direction. The spacing between adjacent pickers 210 in the Y-axis direction is T. Of course, the 16 pickers 210 are coupled to each other to form a single picking apparatus 200 and move together. 1, the distance between adjacent inserts 110 in the Y-axis direction of the test tray 100 is S, not S, and S = 2T. That is, the distance between the inserts 110 adjacent to each other in the Y-axis is two times larger than the distance between the pickers 210 adjacent to each other in the Y-axis. 3, when the picking apparatus 200 is lowered for loading or unloading the electronic component ED, some of the pickers 210a and 210b, which do not correspond to the insert 110, The picking device 200 has to be replaced since the picking-up device 210b interferes with the installation frame 120. [

However, the test tray 100 according to FIG. 1 has a hole-shaped preventing means 121 formed in the mounting frame 120 so as to open upward and downward. As shown in FIG. 4, when the four pickers 210a perform the operation of gripping or releasing the electronic components with respect to the inserts 110, the inserts 110 are subjected to an operation The lower ends of the remaining four pickers 210b are prevented from interfering with the mounting frame 120 by being inserted into the hole-shaped preventing means 121. [ That is, according to the present invention, among the N pickers 210a having a number larger than 1, the L (L is a natural number smaller than N) number of the pickers 210a picks up or releases the electronic parts with respect to the inserts 110 The lower ends of the remaining M (M, M + N = N) number of pickers 210b, which can not perform operations on the inserts 110 when performing the operation, So that interference between the M pickers 210b and the mounting frame 120 is prevented. Here, since the number of the pickers 210 provided in the picking device 200 may vary depending on the specifications of the handler, the number of the pickers 210 is represented by symbols such as L, M,

5, it can be seen that the spacing S between the inserts 110 is 3T. In this case, two preventive means 121 are provided between the adjacent inserts 110, The remaining five pickers 210b in which the three pickers 210a perform work are inserted into the preventing means 121. [ As described above, according to the present embodiment, it can be understood that the present invention can be preferably applied when the interval S between the inserts 110 satisfies a condition that the interval between the pickers 210 is a times T. Where a must be a natural number greater than 1 but less than N. The prevention means 121 need to be arranged in parallel with the inserts 110 in the Y-axis direction (more specifically, the center of the preventive means is arranged in parallel with the center of the inserts in the Y-axis direction) The number of inserts 110 must be at least one and at least a number smaller than N.

In the above description, the preventing means 121 has the shape of a hole, but the shape of the recessed groove can be sufficiently taken into consideration so that the lower end of the picker 210 can be inserted.

In the above description, the prevention means 121 are arranged in the Y-axis direction in which the intervals of the pickers 210 are fixed. However, when the interval of the pickers 210 is fixed in the X-axis direction according to another embodiment, It is a matter of course that the grooves 121 may be arranged in the X-axis direction. In addition, it may be assumed that the interval between the pickers 210 of the picking apparatus 200 is fixed in both the X-axis direction and the Y-axis direction. In this case, Direction. Here, the prevention means 121 are arranged in the X-axis direction means that the prevention means 121 are arranged side by side with the inserts 110 in the X-axis direction, and the prevention means 121 are arranged in the Y-axis direction This means that the preventive means 121 are arranged side by side with the inserts 110 in the Y-axis direction.

<Examples of the Present Invention>

1. When the size of the electronic component to be tested is increased

The distance between the inserts 110 is a multiple of the distance between the pickers 210 of the picking apparatus 200 and the test tray 100 with the preventing means 121 is applied. In this case, the picking apparatus 200 can be utilized as it is. Of course, the symbol a is the same concept as a described above.

At this time, the control device of the handler needs to be implemented so that the new teaching point (the gripping point of the electronic component or the releasing point of the gripping part) can be adjusted based on the input information due to the increase in the size of the electronic component.

2. When manufacturing handler for tester of old specification

The spacing between the test sockets provided in the tester corresponds to the spacing S between the inserts 110 so that the picking apparatus 200 with pickers 210 at intervals of 1 / a times the spacing between the inserts 110 ) Can be applied to create a handler. Of course, the test tray 100 must be provided with the preventive means 121 between the inserts 110. In this case, even if the interval between the subsequent test sockets is replaced with a new specification tester equal to the interval between the applied pickers 210, replacement of the picking apparatus 200 is not necessary.

3. When creating a new handler

The picking apparatus 200 having the pickers 210 having the intervals corresponding to the electronic components of the smallest size that can be manufactured at present can be applied to the handler and the spacing between the inserts 110 required by the customer of the actual handler A test tray 100 is provided. Likewise, the test tray 100 is provided with the preventing means 121 corresponding to the picking apparatus 200. [

Taking the example of the above 1. former handler as a tester handler and 2. the new handler as an example, there is no need to adjust the teaching point separately, so the operating rate can be increased.

Although the present invention has been fully described by way of example only with reference to the accompanying drawings, it is to be understood that the present invention is not limited thereto. It is to be understood that the scope of the invention is to be construed as being limited only by the following claims and their equivalents.

100: Test trays for handlers to support testing of electronic components
110: insert
120: Installation frame
121: prevention means

Claims (5)

Inserts having a seating groove on which an electronic component can be seated; And
An installation frame in which the inserts are installed in a matrix fashion so as to be somewhat flowable; / RTI &gt;
The insert
A body having the seating groove; And
A retainer for retaining the electronic component so that the electronic component seated in the seating groove is prevented from being separated; / RTI &gt;
(L is a natural number smaller than N) among the N (N is a natural number larger than 1) pickers (the picker is a component for holding or releasing the electronic component) moving together while forming one picking device When the picker carries out the operation of gripping or releasing the electronic parts with respect to the inserts, the remaining M (M is a natural number smaller than N, L + M = N) With preventing means for preventing interference with
Test trays for handlers that support testing of electronic components. The method according to claim 1,
When the interval between the inserts adjacent to each other in at least one direction of the X axis direction or the Y axis direction is S and the interval between adjacent pickers in one direction is T,
S = aT, a is greater than 1 but less than N
Test trays for handlers that support testing of electronic components. The method according to claim 1,
The prevention means is disposed between the inserts in at least one of the X-axis direction and the Y-axis direction, and is provided with at least one or more than N inserts between mutually adjacent inserts
Test trays for handlers that support testing of electronic components. The method according to claim 1,
The prevention means is provided at least in the form of a hole or groove through which the grip portion of the picker can be inserted
Test trays for handlers that support testing of electronic components. The method according to claim 1,
The preventing means is arranged in parallel with the inserts whose spacing of the pickers in the X-axis direction or the Y-axis direction is fixed
Test trays for handlers that support testing of electronic components.

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