KR20180136397A - 자기 센서 회로 - Google Patents

자기 센서 회로 Download PDF

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Publication number
KR20180136397A
KR20180136397A KR1020180067674A KR20180067674A KR20180136397A KR 20180136397 A KR20180136397 A KR 20180136397A KR 1020180067674 A KR1020180067674 A KR 1020180067674A KR 20180067674 A KR20180067674 A KR 20180067674A KR 20180136397 A KR20180136397 A KR 20180136397A
Authority
KR
South Korea
Prior art keywords
magnetic field
switch
operational amplifier
resistor
field sensor
Prior art date
Application number
KR1020180067674A
Other languages
English (en)
Korean (ko)
Inventor
도모키 히키치
Original Assignee
에이블릭 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 에이블릭 가부시키가이샤 filed Critical 에이블릭 가부시키가이샤
Publication of KR20180136397A publication Critical patent/KR20180136397A/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0023—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/10—Plotting field distribution ; Measuring field distribution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
    • G01D5/14—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage
    • G01D5/142—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage using Hall-effect devices
    • G01D5/145—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage using Hall-effect devices influenced by the relative movement between the Hall device and magnetic fields
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
    • G01D5/244—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing characteristics of pulses or pulse trains; generating pulses or pulse trains
    • G01D5/245—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing characteristics of pulses or pulse trains; generating pulses or pulse trains using a variable number of pulses in a train
    • G01D5/2451—Incremental encoders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0005—Geometrical arrangement of magnetic sensor elements; Apparatus combining different magnetic sensor types
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0023—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration
    • G01R33/0029—Treating the measured signals, e.g. removing offset or noise
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0023—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration
    • G01R33/0041—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration using feed-back or modulation techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0088—Arrangements or instruments for measuring magnetic variables use of bistable or switching devices, e.g. Reed-switches
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • H03F3/45071—Differential amplifiers with semiconductor devices only
    • H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
    • H03F3/45475—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using IC blocks as the active amplifying circuit
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2200/00—Indexing scheme relating to amplifiers
    • H03F2200/129—Indexing scheme relating to amplifiers there being a feedback over the complete amplifier
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
    • H03F2203/45—Indexing scheme relating to differential amplifiers
    • H03F2203/45116—Feedback coupled to the input of the differential amplifier
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
    • H03F2203/45—Indexing scheme relating to differential amplifiers
    • H03F2203/45151—At least one resistor being added at the input of a dif amp
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
    • H03F2203/45—Indexing scheme relating to differential amplifiers
    • H03F2203/45528—Indexing scheme relating to differential amplifiers the FBC comprising one or more passive resistors and being coupled between the LC and the IC

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Measuring Magnetic Variables (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
KR1020180067674A 2017-06-14 2018-06-12 자기 센서 회로 KR20180136397A (ko)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JPJP-P-2017-116858 2017-06-14
JP2017116858 2017-06-14
JP2018091806A JP7109249B2 (ja) 2017-06-14 2018-05-11 磁気センサ回路
JPJP-P-2018-091806 2018-05-11

Publications (1)

Publication Number Publication Date
KR20180136397A true KR20180136397A (ko) 2018-12-24

Family

ID=65006953

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020180067674A KR20180136397A (ko) 2017-06-14 2018-06-12 자기 센서 회로

Country Status (4)

Country Link
JP (1) JP7109249B2 (ja)
KR (1) KR20180136397A (ja)
CN (1) CN109085516B (ja)
TW (1) TWI767006B (ja)

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS599510A (ja) * 1982-07-08 1984-01-18 Nippon Denso Co Ltd 方位検出装置
US5568047A (en) * 1994-08-10 1996-10-22 General Electric Company Current sensor and method using differentially generated feedback
CN1174549C (zh) * 1997-08-22 2004-11-03 迪特拉有限公司 具有电感回馈振荡电路的感应式邻近传感器
JP2003317201A (ja) * 2002-04-26 2003-11-07 Mitsubishi Electric Corp 半導体集積回路
DE102004017191B4 (de) 2004-04-07 2007-07-12 Infineon Technologies Ag Vorrichtung und Verfahren zur Ermittlung einer Richtung eines Objekts
US9116195B2 (en) * 2007-03-23 2015-08-25 Asahi Kasei Emd Corporation Magnetic sensor and sensitivity measuring method thereof
JP5245114B2 (ja) 2007-12-19 2013-07-24 旭化成エレクトロニクス株式会社 位置検出装置
US7990209B2 (en) * 2009-06-19 2011-08-02 Allegro Microsystems, Inc. Switched capacitor notch filter
US8896303B2 (en) * 2011-02-08 2014-11-25 Infineon Technologies Ag Low offset vertical Hall device and current spinning method
TWI481164B (zh) * 2012-08-13 2015-04-11 Leadtrend Tech Corp 應用於交流／直流轉換器的主動控制回授積體電路及其操作方法
JP2014163692A (ja) * 2013-02-21 2014-09-08 Seiko Instruments Inc 磁気センサ装置
JP6243741B2 (ja) * 2014-01-15 2017-12-06 旭化成エレクトロニクス株式会社 磁気センサ及び回転角センサ
DE102015102853A1 (de) * 2015-02-27 2016-09-01 Infineon Technologies Ag Magnetfeldsensor

Also Published As

Publication number Publication date
TW201905421A (zh) 2019-02-01
TWI767006B (zh) 2022-06-11
JP2019002911A (ja) 2019-01-10
CN109085516B (zh) 2022-02-18
CN109085516A (zh) 2018-12-25
JP7109249B2 (ja) 2022-07-29

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E701 Decision to grant or registration of patent right