KR20180059835A - 자기저항 요소 내의 혼합을 이용하는 자기장 센서들 및 방법들 - Google Patents

자기저항 요소 내의 혼합을 이용하는 자기장 센서들 및 방법들 Download PDF

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Publication number
KR20180059835A
KR20180059835A KR1020187010939A KR20187010939A KR20180059835A KR 20180059835 A KR20180059835 A KR 20180059835A KR 1020187010939 A KR1020187010939 A KR 1020187010939A KR 20187010939 A KR20187010939 A KR 20187010939A KR 20180059835 A KR20180059835 A KR 20180059835A
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South Korea
Prior art keywords
magnetic field
current
mixed
generating
magnitude
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KR1020187010939A
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Korean (ko)
Inventor
제랄도 에이. 몬레알
안드레아스 피. 프리드리히
클로드 페르몬
미리암 판네티에르-르쾨르
Original Assignee
알레그로 마이크로시스템스, 엘엘씨
꼼미사리아 아 레네르지 아또미끄 에 오 에네르지 알떼르나띠브스
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Application filed by 알레그로 마이크로시스템스, 엘엘씨, 꼼미사리아 아 레네르지 아또미끄 에 오 에네르지 알떼르나띠브스 filed Critical 알레그로 마이크로시스템스, 엘엘씨
Publication of KR20180059835A publication Critical patent/KR20180059835A/ko
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0023—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/09—Magnetoresistive devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/09—Magnetoresistive devices
    • G01R33/093—Magnetoresistive devices using multilayer structures, e.g. giant magnetoresistance sensors

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  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Magnetic Variables (AREA)
  • Hall/Mr Elements (AREA)
KR1020187010939A 2015-09-30 2016-09-21 자기저항 요소 내의 혼합을 이용하는 자기장 센서들 및 방법들 Ceased KR20180059835A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US14/870,834 US10078117B2 (en) 2015-09-30 2015-09-30 Magnetic field sensors and methods using mixing in a magnetoresistance element
US14/870,834 2015-09-30
PCT/US2016/052745 WO2017058586A1 (en) 2015-09-30 2016-09-21 Magnetic field sensors and methods using mixing in a magnetoresistance element

Publications (1)

Publication Number Publication Date
KR20180059835A true KR20180059835A (ko) 2018-06-05

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KR1020187010939A Ceased KR20180059835A (ko) 2015-09-30 2016-09-21 자기저항 요소 내의 혼합을 이용하는 자기장 센서들 및 방법들

Country Status (5)

Country Link
US (1) US10078117B2 (enExample)
EP (1) EP3347729B1 (enExample)
JP (1) JP6847933B2 (enExample)
KR (1) KR20180059835A (enExample)
WO (1) WO2017058586A1 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106597326B (zh) * 2015-10-16 2020-01-07 爱盛科技股份有限公司 磁场感测装置
US10591320B2 (en) * 2017-12-11 2020-03-17 Nxp B.V. Magnetoresistive sensor with stray field cancellation and systems incorporating same
US11630168B2 (en) 2021-02-03 2023-04-18 Allegro Microsystems, Llc Linear sensor with dual spin valve element having reference layers with magnetization directions different from an external magnetic field direction
US11609283B2 (en) * 2021-03-23 2023-03-21 Allegro Microsystems, Llc Electrical offset compensating in a magnetoresistance bridge
US11953565B2 (en) 2021-03-23 2024-04-09 Allegro Microsystems, Llc Electrical offset compensating in a bridge using more than four magnetoresistance elements

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1055998A (ja) * 1996-08-12 1998-02-24 Daido Hoxan Inc シリコンウェーハの加工方法
JP2000055998A (ja) 1998-08-05 2000-02-25 Tdk Corp 磁気センサ装置および電流センサ装置
EP1991862B1 (en) 2006-02-24 2013-07-10 Commissariat à l'Énergie Atomique et aux Énergies Alternatives Method and device for non destructive evaluation of defects in a metallic object
JP2008076286A (ja) * 2006-09-22 2008-04-03 Fujikura Ltd 磁気デバイス
JP4991322B2 (ja) * 2006-10-30 2012-08-01 日立オートモティブシステムズ株式会社 Ｇｍｒ素子を用いた変位センサ，ｇｍｒ素子を用いた角度検出センサ及びそれらに用いる半導体装置
JP2010266247A (ja) * 2009-05-12 2010-11-25 Nagoya Univ 磁気センサ及び磁界測定装置
JP5793682B2 (ja) * 2011-01-21 2015-10-14 パナソニックＩｐマネジメント株式会社 電力計測装置
US8922206B2 (en) * 2011-09-07 2014-12-30 Allegro Microsystems, Llc Magnetic field sensing element combining a circular vertical hall magnetic field sensing element with a planar hall element
CZ2013822A3 (cs) 2013-10-25 2015-02-04 České Vysoké Učení Technické V Praze Univerzitní Centrum Energeticky Efektivních Budov Bezkontaktní magnetický senzor polohy magnetických nebo elektricky vodivých objektů

Also Published As

Publication number Publication date
WO2017058586A1 (en) 2017-04-06
US10078117B2 (en) 2018-09-18
US20170089987A1 (en) 2017-03-30
EP3347729A1 (en) 2018-07-18
JP2018531383A (ja) 2018-10-25
JP6847933B2 (ja) 2021-03-24
EP3347729B1 (en) 2020-01-15

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