KR20170082357A - Jig apparatus using for LED chip test - Google Patents
Jig apparatus using for LED chip test Download PDFInfo
- Publication number
- KR20170082357A KR20170082357A KR1020160001652A KR20160001652A KR20170082357A KR 20170082357 A KR20170082357 A KR 20170082357A KR 1020160001652 A KR1020160001652 A KR 1020160001652A KR 20160001652 A KR20160001652 A KR 20160001652A KR 20170082357 A KR20170082357 A KR 20170082357A
- Authority
- KR
- South Korea
- Prior art keywords
- led chip
- groove
- holder
- guide groove
- seating portion
- Prior art date
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
- G01R1/06738—Geometry aspects related to tip portion
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2632—Circuits therefor for testing diodes
- G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2889—Interfaces, e.g. between probe and tester
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
Abstract
One embodiment of a jig device for inspecting an LED chip includes a seating part on which the LED chip is seated; A holder disposed in the guide groove formed in the seating portion, the holder being guided by the guide groove and movable on the seating portion; And a contact pin coupled to the holder and electrically connected to the LED chip.
Description
The embodiment relates to a jig device for inspecting an LED chip capable of performing a characteristic inspection of an LED chip having various shapes and sizes without changing the size or structure.
The contents described in this section merely provide background information on the embodiment and do not constitute the prior art.
LED (Light Emitting Diode) has various advantages such as making light with high brightness compared to power consumption, making various colors of light, and downsizing.
Due to these advantages of LEDs, LEDs are widely used in lighting, display and other various sales.
The LEDs may be fabricated from, for example, LED chips, and the LED chips may be electrically connected to each other to perform various functions.
The manufactured LED chip may include an LED and a terminal for electrical connection to an external power source. It is necessary to check the electrical characteristics, optical characteristics and other characteristics of the manufactured LED chip to determine whether or not the LED chip is defective.
The characteristic inspection of the LED chip may be performed in a jig device for conducting the inspection after the LED chip is operated by energizing the terminal and the external power source.
The size and shape of the LED chip may vary, and thus the position of the terminal formed on the LED chip may be varied. Therefore, in order to inspect LED chips having various shapes and sizes, it is necessary to individually manufacture and use jig devices corresponding to the shape and size of each LED chip in order to energize the terminals of LED chips disposed at various positions .
Therefore, the embodiment relates to a jig device for inspecting an LED chip capable of performing characteristic inspection of LED chips having various shapes and sizes without changing the size or structure.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory and are intended to provide further explanation of the invention as claimed.
One embodiment of a jig device for inspecting an LED chip includes a seating part on which the LED chip is seated; A holder disposed in the guide groove formed in the seating portion, the holder being guided by the guide groove and movable on the seating portion; And a contact pin coupled to the holder and electrically connected to the LED chip.
The seating portion may be formed in a plate shape, and a through-hole through which the LED chip is disposed may be formed at a central portion.
The guide grooves may be provided in pairs in positions symmetrical to each other with respect to the center of the through-hole, and the holder may be provided in each of the pair of guide grooves.
The seat portion may be provided with a connector for electrical connection with an external device on a side surface thereof.
The holder may be configured to be electrically connected to the connector and receive an electrical signal from an external device through the connector.
The holder may be provided to move up and down with respect to the seating part.
Wherein the guide groove includes a first groove provided in a slit shape in the x-axis direction that is away from or closer to the LED chip mounted on the seating portion; And a second groove communicating with the first groove and provided in a slit shape in a y-axis direction orthogonal to the x-axis.
The guide groove may be formed by combining the first groove and the second groove in a T-shape.
The contact pin may be formed by bending the end portion in the downward direction.
Another embodiment of a jig device for inspecting an LED chip includes a seating part on which the LED chip is seated; A first groove formed in a pair in the seating portion and provided in a slit shape in the x-axis direction to be distant from or close to the LED chip mounted on the seating portion; and a first groove communicating with the first groove, a guide groove including a second groove provided in a slit shape in the y-axis direction; A pair of holders disposed in the pair of guide grooves and guided by the guide grooves to be movable on the seating portion; And a pair of contact pins, which are respectively coupled to the pair of holders, and which are in electrical contact with the LED chip.
In the embodiment, since the guide groove is formed in the seating portion and the holder can move along the guide groove, even when the characteristics of the LED chips having various sizes and shapes are examined, individual jig devices It is possible to proceed with the characteristic inspection using one jig device.
Therefore, since the characteristic inspection of the LED chips having various sizes and shapes can be performed by using one jig device, the characteristic inspection process of the LED chips can be shortened and the cost can be reduced.
1 is a plan view showing a jig for testing an LED chip according to an embodiment.
2 is a side sectional view showing a jig for testing an LED chip according to an embodiment.
3 is an enlarged cross-sectional view showing part A of Fig.
4 is a view for explaining the operation of the LED chip inspection jig apparatus according to one embodiment.
5 is a side sectional view for explaining the operation of a jig for testing an LED chip according to an embodiment.
Hereinafter, embodiments will be described in detail with reference to the accompanying drawings. The embodiments are to be considered in all aspects as illustrative and not restrictive, and the invention is not limited thereto. It is to be understood, however, that the embodiments are not intended to be limited to the particular forms disclosed, but are to include all modifications, equivalents, and alternatives falling within the spirit and scope of the embodiments. The sizes and shapes of the components shown in the drawings may be exaggerated for clarity and convenience.
The terms "first "," second ", and the like can be used to describe various components, but the components should not be limited by the terms. The terms are used only for the purpose of distinguishing one component from another. In addition, terms specifically defined in consideration of the constitution and operation of the embodiment are only intended to illustrate the embodiments and do not limit the scope of the embodiments.
In the description of the embodiments, when it is described as being formed on the "upper" or "on or under" of each element, the upper or lower (on or under Quot; includes both that the two elements are in direct contact with each other or that one or more other elements are indirectly formed between the two elements. Also, when expressed as "on" or "on or under", it may include not only an upward direction but also a downward direction with respect to one element.
It is also to be understood that the terms "top / top / top" and "bottom / bottom / bottom", as used below, do not necessarily imply nor imply any physical or logical relationship or order between such entities or elements, But may be used only to distinguish one entity or element from another entity or element. Further, in the drawings, an orthogonal coordinate system (x, y, z) can be used.
1 is a plan view showing a jig device for inspecting an
The jig device of the embodiment can inspect the characteristics of the
In addition, the characteristics of the
The
The
The
The
At this time, the external device may be, for example, a power source. The
By applying a current to the
However, the present invention is not limited thereto, and the socket may be provided in various shapes and systems in consideration of the shape, size, and the like of the
The
The lower portion of the
The
The
In addition, the
As the
The
The
Of course, the
As shown in FIG. 2, the
Hereinafter, the structure of the
The
The width of the
Meanwhile, the
For example, a terminal connected to the lead wire in the
However, the present invention is not limited thereto, and the
As shown in FIGS. 1 and 2, the
As described above, since the
The
1 and 2, the
The determination of the width of the
As shown in FIG. 1, the
In another embodiment, the
1, the pair of
It goes without saying that the above-described embodiments can be combined with each other. According to various embodiments, the
4 is a view for explaining the operation of a jig device for inspecting an
4,
Therefore, when the
First, the
Next, each of the pair of
That is, the
Next, the
After the contact between the
On the other hand, the size of the
The x-axis, y-axis and z-axis movement of the
In another embodiment, the jig device includes a position sensor for sensing the position of the
In the case of a jig device in which the
As the LED chips have various sizes and shapes, it is impossible to test the characteristics of the LED chips by contacting the contact pins with all the chip terminals of the LED chips formed at various positions.
Accordingly, since the size and shape of the LED chips are different from each other in the jig device having such a structure, it is inevitable to individually test the characteristics of the LED chip by making individual jig devices. As a result, the time, cost, It can increase effort.
The
Therefore, since the characteristic inspection of the LED chips 10 having various sizes and shapes can be performed using one jig device, the process of inspecting the characteristics of the LED chips 10 can be shortened and the cost can be reduced.
While only a few have been described above with respect to the embodiments, various other forms of implementation are possible. The technical contents of the embodiments described above may be combined in various forms other than the mutually incompatible technologies, and may be implemented in a new embodiment through the same.
10: LED chip
11: chip terminal
20: Support
100:
110: guide groove
111: 1st home
112: 2nd home
120: Through hole
130: Connector
200: Holder
300: contact pin
310: end
Claims (10)
A holder disposed in the guide groove formed in the seating portion, the holder being guided by the guide groove and movable on the seating portion; And
A contact pin coupled to the holder and electrically connected to the LED chip,
And a jig device for inspecting the LED chip.
The seat (1)
And a through-hole through which the LED chip is disposed is formed at a central portion of the jig.
The guide groove
Wherein the pair of the through holes are symmetrical with respect to the center of the through hole,
And the holder is provided in each of the pair of guide grooves.
The seat (1)
And a connector for electrical connection to an external device is provided on a side surface of the jig.
Wherein the holder comprises:
And an electric signal is applied from an external device through the connector.
Wherein the holder comprises:
The jig for inspecting an LED chip is provided to move vertically with respect to the seating part.
The guide groove
A first groove provided in a slit shape in an x-axis direction that is distant or close to the LED chip mounted on the seating portion; And
A second groove communicating with the first groove and provided in a slit shape in a y-axis direction orthogonal to the x-
And a jig device for inspecting the LED chip.
The guide groove
Wherein the first groove and the second groove are combined to form a T-shape.
The contact pin
And the end portion is bent in the downward direction.
A first groove formed in a pair in the seating portion and provided in a slit shape in the x-axis direction to be distant from or close to the LED chip mounted on the seating portion; and a first groove communicating with the first groove, a guide groove including a second groove provided in a slit shape in the y-axis direction;
A pair of holders disposed in the pair of guide grooves and guided by the guide grooves to be movable on the seating portion; And
A pair of contact pins which are respectively coupled to the pair of holders and are brought into electrical contact with the LED chip,
And a jig device for inspecting the LED chip.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020160001652A KR20170082357A (en) | 2016-01-06 | 2016-01-06 | Jig apparatus using for LED chip test |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020160001652A KR20170082357A (en) | 2016-01-06 | 2016-01-06 | Jig apparatus using for LED chip test |
Publications (1)
Publication Number | Publication Date |
---|---|
KR20170082357A true KR20170082357A (en) | 2017-07-14 |
Family
ID=59358659
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020160001652A KR20170082357A (en) | 2016-01-06 | 2016-01-06 | Jig apparatus using for LED chip test |
Country Status (1)
Country | Link |
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KR (1) | KR20170082357A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108508341A (en) * | 2018-03-08 | 2018-09-07 | 佛山市顺德区蚬华多媒体制品有限公司 | LED ageing testers |
CN115993469A (en) * | 2023-03-22 | 2023-04-21 | 深圳市鲁光电子科技有限公司 | Diode device self-test device |
-
2016
- 2016-01-06 KR KR1020160001652A patent/KR20170082357A/en unknown
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108508341A (en) * | 2018-03-08 | 2018-09-07 | 佛山市顺德区蚬华多媒体制品有限公司 | LED ageing testers |
CN108508341B (en) * | 2018-03-08 | 2020-11-24 | 佛山市顺德区蚬华多媒体制品有限公司 | LED aging test device |
CN115993469A (en) * | 2023-03-22 | 2023-04-21 | 深圳市鲁光电子科技有限公司 | Diode device self-test device |
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