KR20170036510A - Interconnect structure and probe card having the same - Google Patents
Interconnect structure and probe card having the same Download PDFInfo
- Publication number
- KR20170036510A KR20170036510A KR1020150135776A KR20150135776A KR20170036510A KR 20170036510 A KR20170036510 A KR 20170036510A KR 1020150135776 A KR1020150135776 A KR 1020150135776A KR 20150135776 A KR20150135776 A KR 20150135776A KR 20170036510 A KR20170036510 A KR 20170036510A
- Authority
- KR
- South Korea
- Prior art keywords
- contact portion
- interconnect structure
- contactor
- contact
- sliding groove
- Prior art date
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
- G01R1/06738—Geometry aspects related to tip portion
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
Abstract
Description
The present invention relates to an interconnect structure and a probe card including the same.
In general, the semiconductor package is finally subjected to characteristic measurement or defect inspection through various electrical tests by an inspection apparatus. In this defect inspection, a probe card, a test socket, or the like is used to electrically connect the electronic device and the inspection apparatus, and the probe card and the test socket include an interconnect structure for driving between the electronic device and the inspection apparatus.
The conventional interconnect structure includes an upper probe pin, a lower probe pin spaced apart from the upper probe pin and disposed below the upper probe pin, an elastic member positioned between the upper probe pin and the lower probe pin, And a housing surrounding the pin and spring.
This interconnect structure is made along the point of contact between the upper probe pin, the spring, the housing and the lower probe pin, through which the electrical signal is transmitted through the tilting of the spring. Also, according to this, since the movement path of the electrical signal is formed sequentially or inversely along the upper probe pin, the spring, the housing, and the lower probe pin, the movement path of the electrical signal is complicated. In addition, there is a problem that the travel path of the electrical signal is complicated, the inspection time of the semiconductor package is long, and the impedance matching section is reduced.
In addition, in the conventional interconnect structure, a housing must be provided for the transmission of electrical signals. In order to transmit electrical signals, a tilting of the spring is required. In order to induce the tilting of the spring, the overall length of the interconnect structure is required to be more than a certain length, and a spring located between the upper probe pin and the lower probe pin And the overall length of the interconnect structure is increased due to the length. Such a requirement for length limits the scratch length of the interconnect structure. In addition, the increase in length required for the interconnect structure also caused a problem of increasing the travel time of the electrical signal.
Further, according to such an interconnect structure, an electrical signal is transmitted by point contact between the upper probe pin, the spring, the housing, and the lower profile pin, so that the occurrence rate of the noise during the transmission of the electrical signal is high and the transferability is low.
In order to solve the problems of the conventional interconnect structure, Korean Patent Laid-Open Publication No. 10-2015-0053480 (entitled "Inner Bridge Type Spring Probe Pin" with an enlarged tolerance) has a first connecting leg portion formed on at least one side thereof A first probe having a first external contact formed on the other side thereof; A second probe having a second connection leg formed at least on one side and a second external contact on the other side; And a coil spring elastically supporting the first and second probes in a state in which the first and second connection legs are inserted in an interpolating manner.
However, as the thickness of the first and second connecting legs located in the coil spring becomes thinner as the fine pitch is required, the rigidity of the first and second connecting legs is reduced, and the contact force is reduced The performance of the interconnect structure is reduced. In addition, such an interconnect structure has a problem in that first and second connection leg portions which are in contact with each other when the high current is applied are broken.
SUMMARY OF THE INVENTION It is an object of the present invention to provide an interconnect structure complementary to the physical and electrical characteristics of a probe card and a probe card including the same.
According to an aspect of the present invention, there is provided an interconnect structure comprising a lower tip portion and a first contact portion extending upward from the lower tip portion and having an upper opened sliding groove, A first contactor; A second contact portion into which a lower portion is inserted into the sliding groove, a step portion extending upward from the second contact portion, A second contactor including an upper tip extending upwardly from the stepped portion; And an elastic member which is inserted in the second contact portion and whose lower end is in contact with the upper surface of the first contact portion, wherein the outer side surface of the first contact portion and the inner side surface of the sliding groove are in surface contact.
According to the above-mentioned problem solving means of the present invention, since the entire space in the inner diameter of the elastic member can be used, the rigidity of the contact portion can be improved, and the effect of improving the physical and electrical characteristics of the interconnect structure have.
1 is a perspective view of an interconnect structure according to an embodiment of the present invention.
2 is a front view of an interconnect structure according to an embodiment of the invention.
3 is an exploded perspective view of an interconnect structure according to an embodiment of the present invention.
4 is a cross-sectional view taken along the line A-A 'in Fig.
5 is a perspective view of a probe card according to an embodiment of the present invention.
6 is a cross-sectional view of a probe card according to an embodiment of the present invention.
7 is a plan view of a laminate according to an embodiment of the present invention.
8 is a perspective view of a probe card according to another embodiment of the present invention.
9 is a plan view of a laminate according to another embodiment of the present invention.
10 is a view for explaining a method of manufacturing a connector according to an embodiment of the present invention.
11 is a view for explaining a method of manufacturing a laminate according to an embodiment of the present invention.
Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings so that those skilled in the art can easily carry out the present invention. It should be understood, however, that the present invention may be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. In the drawings, the same reference numbers are used throughout the specification to refer to the same or like parts.
Throughout this specification, when a part is referred to as being "connected" to another part, it is not limited to a case where it is "directly connected" but also includes the case where it is "electrically connected" do.
Throughout this specification, when a member is " on " another member, it includes not only when the member is in contact with the other member, but also when there is another member between the two members.
Throughout this specification, when an element is referred to as "including " an element, it is understood that the element may include other elements as well, without departing from the other elements unless specifically stated otherwise. The terms "about "," substantially ", etc. used to the extent that they are used throughout the specification are intended to be taken to mean the approximation of the manufacturing and material tolerances inherent in the stated sense, Accurate or absolute numbers are used to help prevent unauthorized exploitation by unauthorized intruders of the referenced disclosure. The word " step (or step) "or" step "used to the extent that it is used throughout the specification does not mean" step for.
For reference, the terms related to direction and position (upper, upper, lower, lower, etc.) in the description of the embodiments of the present application are set based on the arrangement state of each structure shown in the drawings. For example, referring to Fig. 1, the 12 o'clock direction as a whole may be the upper side, the end portion facing the 12 o'clock direction as a whole, the lower side as the 6 o'clock direction as a whole, have.
The present invention relates to an
1 is a perspective view of an interconnect structure according to an embodiment of the present invention, FIG. 2 is a front view of an interconnect structure according to an embodiment of the present invention, and FIG. 3 is a cross- FIG. 5 is a perspective view of a probe card according to an embodiment of the present invention, FIG. 6 is a perspective view of a probe card according to an embodiment of the present invention, FIG. 8 is a perspective view of a probe card according to another embodiment of the present invention, and FIG. 9 is a cross-sectional view of a laminated body according to another embodiment of the present invention, FIG. 7 is a plan view of a laminated body according to an embodiment of the present invention, FIG. 10 is a view for explaining a method of manufacturing a connector according to an embodiment of the present invention, and FIG. 11 is a view for explaining a method of manufacturing a laminated body according to an embodiment of the present invention.
First, an interconnection structure 100 (hereinafter referred to as 'the present interconnection structure 100') according to an embodiment of the present invention will be described.
The
1 to 3, the
The
The lower end of the
The
The
The
The above-mentioned widths may be the 4 o'clock and 10 o'clock directions of Fig. 1 or the 3 o'clock and 9 o'clock directions of Fig.
The
The
The longitudinal direction described above may be the 12 o'clock direction and the 6 o'clock direction in Fig.
The
The
The
2, the
Specifically, the
The length of the sliding
A: The length of the sliding
B: length of the most compressed
C: length of the
The outer surface of the
At this time, the upper end of the
The
Since the
The
As described above, the
The
Illustratively, the
4 (b), the
4 (c), the
The horizontal direction may be a direction perpendicular to the longitudinal direction of the
At this time, the
The first and
The above-described front surface can be the 8 o'clock direction of Fig. 1, and the rear surface can be the 2 o'clock direction of Fig.
The first and
Hereinafter, a
The
In addition, the
Illustratively, the
The
In other words, the
The first
The
When the
The third
The
In this case, when the
Hereinafter, a
The
Illustratively, as shown in FIG. 9, the first, second, and
Accordingly, the
Hereinafter, a method of manufacturing an interconnect structure according to an embodiment of the present invention will be described with reference to FIG.
The
The method of forming the
Referring to FIG. 10 (a), the step of forming the
10 (b), the step of forming the
As a result, a
For example, the
10C, the step of forming the
Exemplarily, an
10 (d), the step of forming the
10 (e), the step of forming the
The step of polishing the
The predetermined thickness of the
10 (f), the step of forming the
In the step of removing the
Hereinafter, with reference to FIG. 11, a method of manufacturing a laminate according to an embodiment of the present invention will be described.
The laminate manufacturing method may include a step of preparing the
11 (b), a plurality of holes of a shape corresponding to the plurality of
In addition, the laminate manufacturing method may include the step of forming the
Also, the laminate manufacturing method may include the step of forming the insulating
In the step of forming the insulating
It will be understood by those of ordinary skill in the art that the foregoing description of the embodiments is for illustrative purposes and that those skilled in the art can easily modify the invention without departing from the spirit or essential characteristics thereof. It is therefore to be understood that the above-described embodiments are illustrative in all aspects and not restrictive. For example, each component described as a single entity may be distributed and implemented, and components described as being distributed may also be implemented in a combined form.
The scope of the present invention is defined by the appended claims rather than the detailed description, and all changes or modifications derived from the meaning and scope of the claims and their equivalents should be construed as being included within the scope of the present invention.
10: Probe card
100: probe pin
110: first contactor 111: lower tip
112: first contact portion 113: sliding groove
114: First step
120: second contactor 121: second contact portion
1121:
122: step 123: upper tip
130: elastic member
200: Housing
210: first laminate 211: first hole
220: second laminate 221: second hole
230: third laminate 231: third hole
240: fourth laminate 241: fourth hole
Claims (10)
A first contactor having a lower tip portion and a first contact portion formed upwardly from the lower tip portion and having a sliding groove opened at an upper portion thereof;
A second contact portion into which a lower portion is inserted into the sliding groove, a step portion extending upward from the second contact portion, A second contactor including an upper tip extending upwardly from the stepped portion; And
And an elastic member inserted into the second contact portion, the lower end of the elastic member contacting the upper surface of the first contact portion,
Wherein an outer surface of the first contact portion and an inner surface of the sliding groove are in surface contact with each other.
Wherein an upper end of the first contact portion is in contact with a lower end of the elastic member and is formed to be inclined inward.
The second contact portion is formed in a trapezoidal shape in the horizontal direction,
And the sliding groove is formed in a shape corresponding to the second contact portion.
Wherein the second contact portion is inserted such that at least a part of the second contact portion protrudes out of the sliding groove,
Further comprising a step portion protruding outwardly from an edge portion protruding outward from the sliding groove of the second contact portion and contacting a side surface of the first contact portion.
Wherein the length of the sliding groove is greater than or equal to a value obtained by subtracting the length of the elastic member that is compressed at the maximum length from the length of the second contact portion.
Wherein the first contactor and the second contactor are formed in the shape of a plate and the planar axes are positioned coincident with each other.
A plurality of interconnect structures according to any one of claims 1 to 6; And
And a housing having a plurality of insertion holes into which the plurality of interconnecting structures are inserted.
The housing
A first laminate having a plurality of first holes into which a lower tip portion of the interconnect structure is inserted;
A second laminate having a plurality of second holes into which the first contacts of the interconnect structure are inserted;
A third laminate having a plurality of third holes into which the elastic members of the interconnect structure are inserted; And
And a fourth stack having a plurality of fourth holes into which an upper tip portion of the interconnect structure is inserted.
Wherein the first contactor and the second contactor of the interconnect structure are formed in a plate shape,
Wherein the first hole is formed in a rectangular shape corresponding to the lower tip portion,
The second hole is formed in a rectangular shape corresponding to the first contact portion,
The third hole is formed in a circular shape corresponding to the elastic member,
And the fourth hole is formed in a rectangular shape corresponding to the upper tip portion.
And the first, second, and fourth holes are formed to be inclined so as to have a predetermined angle about a center axis into which the interconnect structure is inserted.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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KR1020150135776A KR101785591B1 (en) | 2015-09-24 | 2015-09-24 | Interconnect structure and probe card having the same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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KR1020150135776A KR101785591B1 (en) | 2015-09-24 | 2015-09-24 | Interconnect structure and probe card having the same |
Publications (2)
Publication Number | Publication Date |
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KR20170036510A true KR20170036510A (en) | 2017-04-03 |
KR101785591B1 KR101785591B1 (en) | 2017-10-17 |
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102101318B1 (en) * | 2019-01-16 | 2020-04-16 | 한국기술교육대학교 산학협력단 | Non-circular Housing Device and Method of Manufacturing Housing Device using Hybrid Processing Technology |
KR102147699B1 (en) * | 2020-04-29 | 2020-08-26 | (주)피티앤케이 | Probe pin and manufacturing method thereof |
KR20220168462A (en) * | 2021-06-16 | 2022-12-23 | 주식회사 메가터치 | Probe pin and socket having the probe pin |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102013138B1 (en) * | 2018-02-14 | 2019-08-22 | 주식회사 오킨스전자 | Test socket pin having elastic piece between a pair of legs |
KR102003244B1 (en) * | 2018-02-14 | 2019-07-24 | 주식회사 오킨스전자 | Method of assembling semiconductor test socket pin using fractured protrusions for temporary fixing coil spring |
KR102013137B1 (en) * | 2018-02-14 | 2019-08-22 | 주식회사 오킨스전자 | Test socket pin having elastic piece improved contact characteristic |
KR102145398B1 (en) * | 2020-07-09 | 2020-08-19 | 피엠피(주) | Vertical probe pin and probe card with the same |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6396293B1 (en) * | 1999-02-18 | 2002-05-28 | Delaware Capital Formation, Inc. | Self-closing spring probe |
JP5449067B2 (en) | 2010-07-21 | 2014-03-19 | 株式会社日立ハイテクファインシステムズ | Spring probe apparatus and semiconductor test apparatus |
-
2015
- 2015-09-24 KR KR1020150135776A patent/KR101785591B1/en active IP Right Grant
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102101318B1 (en) * | 2019-01-16 | 2020-04-16 | 한국기술교육대학교 산학협력단 | Non-circular Housing Device and Method of Manufacturing Housing Device using Hybrid Processing Technology |
KR102147699B1 (en) * | 2020-04-29 | 2020-08-26 | (주)피티앤케이 | Probe pin and manufacturing method thereof |
KR20220168462A (en) * | 2021-06-16 | 2022-12-23 | 주식회사 메가터치 | Probe pin and socket having the probe pin |
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Publication number | Publication date |
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KR101785591B1 (en) | 2017-10-17 |
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