KR20160020480A - 델타―시그마 변환을 이용하는 용량형 근접 검출 - Google Patents
델타―시그마 변환을 이용하는 용량형 근접 검출 Download PDFInfo
- Publication number
- KR20160020480A KR20160020480A KR1020167000559A KR20167000559A KR20160020480A KR 20160020480 A KR20160020480 A KR 20160020480A KR 1020167000559 A KR1020167000559 A KR 1020167000559A KR 20167000559 A KR20167000559 A KR 20167000559A KR 20160020480 A KR20160020480 A KR 20160020480A
- Authority
- KR
- South Korea
- Prior art keywords
- voltage
- output
- capacitive sensor
- input
- coupled
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/0416—Control or interface arrangements specially adapted for digitisers
- G06F3/0418—Control or interface arrangements specially adapted for digitisers for error correction or compensation, e.g. based on parallax, calibration or alignment
- G06F3/04186—Touch location disambiguation
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/94—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated
- H03K17/945—Proximity switches
- H03K17/955—Proximity switches using a capacitive detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
- G01D5/14—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage
- G01D5/24—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying capacitance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
- G01D5/14—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage
- G01D5/24—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying capacitance
- G01D5/2405—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying capacitance by varying dielectric
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2605—Measuring capacitance
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M3/00—Conversion of analogue values to or from differential modulation
- H03M3/30—Delta-sigma modulation
- H03M3/39—Structural details of delta-sigma modulators, e.g. incremental delta-sigma modulators
- H03M3/436—Structural details of delta-sigma modulators, e.g. incremental delta-sigma modulators characterised by the order of the loop filter, e.g. error feedback type
- H03M3/456—Structural details of delta-sigma modulators, e.g. incremental delta-sigma modulators characterised by the order of the loop filter, e.g. error feedback type the modulator having a first order loop filter in the feedforward path
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M3/00—Conversion of analogue values to or from differential modulation
- H03M3/30—Delta-sigma modulation
- H03M3/458—Analogue/digital converters using delta-sigma modulation as an intermediate step
- H03M3/462—Details relating to the decimation process
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M3/00—Conversion of analogue values to or from differential modulation
- H03M3/30—Delta-sigma modulation
- H03M3/458—Analogue/digital converters using delta-sigma modulation as an intermediate step
- H03M3/494—Sampling or signal conditioning arrangements specially adapted for delta-sigma type analogue/digital conversion systems
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/30—Nc systems
- G05B2219/37—Measurements
- G05B2219/37284—Capacitive 3-D proximity sensor
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
- H03K2217/94—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00 characterised by the way in which the control signal is generated
- H03K2217/96—Touch switches
- H03K2217/9607—Capacitive touch switches
- H03K2217/96071—Capacitive touch switches characterised by the detection principle
- H03K2217/960725—Charge-transfer
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Human Computer Interaction (AREA)
- Electronic Switches (AREA)
- Analogue/Digital Conversion (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201361834236P | 2013-06-12 | 2013-06-12 | |
| US61/834,236 | 2013-06-12 | ||
| US14/301,462 | 2014-06-11 | ||
| US14/301,462 US9587964B2 (en) | 2013-06-12 | 2014-06-11 | Capacitive proximity detection using delta-sigma conversion |
| PCT/US2014/042036 WO2014201198A1 (en) | 2013-06-12 | 2014-06-12 | Capacitive proximity detection using delta-sigma conversion |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20160020480A true KR20160020480A (ko) | 2016-02-23 |
Family
ID=52018692
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020167000559A Withdrawn KR20160020480A (ko) | 2013-06-12 | 2014-06-12 | 델타―시그마 변환을 이용하는 용량형 근접 검출 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US9587964B2 (enExample) |
| EP (1) | EP3008824B1 (enExample) |
| JP (1) | JP6554637B2 (enExample) |
| KR (1) | KR20160020480A (enExample) |
| CN (1) | CN105379120B (enExample) |
| TW (1) | TWI651930B (enExample) |
| WO (1) | WO2014201198A1 (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20220163758A (ko) | 2021-06-03 | 2022-12-12 | 서울대학교산학협력단 | 용량성 센서를 위한 읽기 회로 |
| US12085595B2 (en) | 2020-04-24 | 2024-09-10 | Gwanak Analog CO., LTD | Read-out circuit for a capacitive sensor |
Families Citing this family (30)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2999833B1 (fr) * | 2012-12-19 | 2015-01-23 | Continental Automotive France | Dispositif de mesure d'une variation d'une capacite et procede de mesure associe |
| US10255422B1 (en) * | 2014-09-15 | 2019-04-09 | Apple Inc. | Identity proxy for access control systems |
| US10063214B2 (en) * | 2015-03-26 | 2018-08-28 | Pixart Imaging Inc. | Programmable band-pass filter circuit of analog front-end used for capacitance detection |
| US9639226B2 (en) * | 2015-08-31 | 2017-05-02 | Cypress Semiconductor Corporation | Differential sigma-delta capacitance sensing devices and methods |
| CN105242804B (zh) * | 2015-09-21 | 2017-11-24 | 京东方科技集团股份有限公司 | 触控补偿电路、其补偿方法、触摸屏及显示装置 |
| CN108352842B (zh) * | 2015-11-20 | 2022-03-04 | 株式会社村田制作所 | 传感器装置 |
| CN106775141B (zh) | 2015-12-30 | 2019-09-27 | 深圳市汇顶科技股份有限公司 | 电容感测电路及触控面板 |
| US10170905B2 (en) | 2016-04-08 | 2019-01-01 | Infineon Technologies Ag | Electronic switching and protection circuit with wakeup function |
| WO2017179508A1 (ja) * | 2016-04-15 | 2017-10-19 | 株式会社村田製作所 | A/d変換器およびそれを備えるセンサ装置 |
| TWI621984B (zh) * | 2016-12-02 | 2018-04-21 | 瑞鼎科技股份有限公司 | 電容値量測電路及電容値量測方法 |
| TWI615762B (zh) * | 2016-12-21 | 2018-02-21 | 十速興業科技(深圳)有限公司 | 電容偵測裝置及方法 |
| US10459856B2 (en) | 2016-12-30 | 2019-10-29 | Itron, Inc. | Variable acquisition buffer length |
| US9768792B1 (en) * | 2016-12-30 | 2017-09-19 | Itron, Inc. | Asynchronous sigma-delta analog-to-digital converter |
| US10378969B2 (en) * | 2017-05-10 | 2019-08-13 | Infineon Technologies Ag | Temperature sensor |
| CN110869709B (zh) * | 2017-05-12 | 2022-01-21 | 德州仪器公司 | 用以确定电机的可旋转轴的位置的方法及设备 |
| WO2018205260A1 (en) | 2017-05-12 | 2018-11-15 | Texas Instruments Incorporated | Capacitive-sensing rotary encoders and methods |
| US11531424B2 (en) * | 2017-09-07 | 2022-12-20 | Cypress Semiconductor Corporation | Nano-power capacitance-to-digital converter |
| EP3480606B1 (en) | 2017-09-11 | 2020-05-13 | Shenzhen Goodix Technology Co., Ltd. | Capacitance detection circuit, capacitance detection method, touch detection device and terminal device |
| GB2568543B (en) * | 2017-11-21 | 2020-12-09 | Johnson Electric Int Ag | Multi-stage capacitive sensor |
| US10236905B1 (en) * | 2018-02-21 | 2019-03-19 | Analog Devices Global Unlimited Company | Time interleaved filtering in analog-to-digital converters |
| JP7215124B2 (ja) * | 2018-12-10 | 2023-01-31 | 株式会社アイシン | 静電容量センサ |
| JP7215123B2 (ja) * | 2018-12-10 | 2023-01-31 | 株式会社アイシン | 静電容量センサ |
| WO2020122030A1 (ja) * | 2018-12-10 | 2020-06-18 | アイシン精機株式会社 | 静電容量センサ |
| DE102019133874A1 (de) * | 2018-12-12 | 2020-06-18 | Huf Hülsbeck & Fürst Gmbh & Co. Kg | Anordnung für ein Fahrzeug |
| CN113826061B (zh) * | 2019-05-10 | 2024-08-23 | 株式会社和冠 | 从传感器控制器向笔发送发送数据的方法及笔 |
| US11133811B2 (en) * | 2019-11-08 | 2021-09-28 | Sigmasense, Llc. | High resolution analog to digital converter (ADC) with improved bandwidth |
| CN113691251B (zh) * | 2020-05-19 | 2025-04-08 | 上海复旦微电子集团股份有限公司 | 电容式感测设备及感测电容的方法 |
| TWI726753B (zh) * | 2020-06-24 | 2021-05-01 | 茂達電子股份有限公司 | 快速預估感測數值電路及其方法 |
| CN112953581B (zh) * | 2021-02-23 | 2022-04-01 | 广州市慧芯电子科技有限公司 | 一种信号积分电路、信号处理方法及红外信号接收系统 |
| WO2024108015A1 (en) * | 2022-11-18 | 2024-05-23 | University Of Washington | Sub-femto farad capacitance measurement circuit |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| JP2661693B2 (ja) * | 1987-10-27 | 1997-10-08 | アイシン精機株式会社 | 人員検出装置 |
| US6774684B2 (en) * | 2001-01-17 | 2004-08-10 | Cirrus Logic, Inc. | Circuits and methods for controlling transients during audio device power-up and power-down, and systems using the same |
| JP4359843B2 (ja) * | 2004-10-14 | 2009-11-11 | 横河電機株式会社 | 出力回路 |
| WO2006132960A1 (en) | 2005-06-03 | 2006-12-14 | Synaptics Incorporated | Methods and systems for detecting a capacitance using sigma-delta measurement techniques |
| US8089289B1 (en) | 2007-07-03 | 2012-01-03 | Cypress Semiconductor Corporation | Capacitive field sensor with sigma-delta modulator |
| US8570053B1 (en) * | 2007-07-03 | 2013-10-29 | Cypress Semiconductor Corporation | Capacitive field sensor with sigma-delta modulator |
| US8766910B2 (en) | 2007-07-04 | 2014-07-01 | Cypress Semiconductor Corporation | Capacitive sensing control knob |
| US8531193B2 (en) * | 2007-07-11 | 2013-09-10 | Marimils Oy | Method and device for capacitive detection of objects |
| US8446158B1 (en) | 2007-11-09 | 2013-05-21 | Cypress Semiconductor Corporation | Compensation for parasitic capacitance of a capacitive sensor |
| CN101685364B (zh) * | 2008-09-27 | 2012-03-07 | 盛群半导体股份有限公司 | 触摸面板的传感装置及方法 |
| JP2010108501A (ja) * | 2008-10-30 | 2010-05-13 | Samsung Electronics Co Ltd | センシング感度を向上させたタッチスクリーンコントローラ、タッチスクリーンコントローラを備えるディスプレイ駆動回路、ディスプレイ装置及びシステム |
| JP2010152876A (ja) * | 2008-11-26 | 2010-07-08 | Seiko Instruments Inc | 静電検出装置、静電検出回路、静電検出方法及び初期化方法 |
| US20110068810A1 (en) | 2009-04-03 | 2011-03-24 | Tpo Displays Corp. | Sensing method and driving circuit of capacitive touch screen |
| CN101621291B (zh) * | 2009-08-05 | 2013-06-12 | 松翰科技股份有限公司 | 电容式触控感应电路 |
| TWI420826B (zh) * | 2010-04-09 | 2013-12-21 | Memsor Corp | 具有校正機制之電容式感測器及電容偵測方法 |
| EP2428774B1 (en) * | 2010-09-14 | 2013-05-29 | Stichting IMEC Nederland | Readout system for MEMs-based capacitive accelerometers and strain sensors, and method for reading |
| CN103299549B (zh) | 2010-12-03 | 2016-11-09 | 马维尔国际贸易有限公司 | 具有降噪反馈通路的模数转换器 |
| US9490804B2 (en) | 2011-09-28 | 2016-11-08 | Cypress Semiconductor Corporation | Capacitance sensing circuits, methods and systems having conductive touch surface |
| US9437093B2 (en) * | 2011-10-06 | 2016-09-06 | Microchip Technology Incorporated | Differential current measurements to determine ION current in the presence of leakage current |
-
2014
- 2014-06-11 US US14/301,462 patent/US9587964B2/en active Active
- 2014-06-12 CN CN201480040649.4A patent/CN105379120B/zh not_active Expired - Fee Related
- 2014-06-12 KR KR1020167000559A patent/KR20160020480A/ko not_active Withdrawn
- 2014-06-12 WO PCT/US2014/042036 patent/WO2014201198A1/en not_active Ceased
- 2014-06-12 TW TW103120370A patent/TWI651930B/zh not_active IP Right Cessation
- 2014-06-12 EP EP14736556.3A patent/EP3008824B1/en not_active Not-in-force
- 2014-06-12 JP JP2016519635A patent/JP6554637B2/ja not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US12085595B2 (en) | 2020-04-24 | 2024-09-10 | Gwanak Analog CO., LTD | Read-out circuit for a capacitive sensor |
| KR20220163758A (ko) | 2021-06-03 | 2022-12-12 | 서울대학교산학협력단 | 용량성 센서를 위한 읽기 회로 |
| US11892327B2 (en) | 2021-06-03 | 2024-02-06 | Seoul National University R&Db Foundation | Read-out circuit for a capacitive sensor |
Also Published As
| Publication number | Publication date |
|---|---|
| CN105379120A (zh) | 2016-03-02 |
| EP3008824B1 (en) | 2020-11-18 |
| JP6554637B2 (ja) | 2019-08-07 |
| CN105379120B (zh) | 2019-05-17 |
| JP2016525827A (ja) | 2016-08-25 |
| US20140368222A1 (en) | 2014-12-18 |
| TWI651930B (zh) | 2019-02-21 |
| WO2014201198A1 (en) | 2014-12-18 |
| TW201517514A (zh) | 2015-05-01 |
| EP3008824A1 (en) | 2016-04-20 |
| US9587964B2 (en) | 2017-03-07 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0105 | International application |
Patent event date: 20160108 Patent event code: PA01051R01D Comment text: International Patent Application |
|
| PG1501 | Laying open of application | ||
| PC1203 | Withdrawal of no request for examination | ||
| WITN | Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid |