JP2016525827A5 - - Google Patents

Download PDF

Info

Publication number
JP2016525827A5
JP2016525827A5 JP2016519635A JP2016519635A JP2016525827A5 JP 2016525827 A5 JP2016525827 A5 JP 2016525827A5 JP 2016519635 A JP2016519635 A JP 2016519635A JP 2016519635 A JP2016519635 A JP 2016519635A JP 2016525827 A5 JP2016525827 A5 JP 2016525827A5
Authority
JP
Japan
Prior art keywords
voltage
output
duty cycle
capacitive sensor
clock
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2016519635A
Other languages
English (en)
Japanese (ja)
Other versions
JP6554637B2 (ja
JP2016525827A (ja
Filing date
Publication date
Priority claimed from US14/301,462 external-priority patent/US9587964B2/en
Application filed filed Critical
Publication of JP2016525827A publication Critical patent/JP2016525827A/ja
Publication of JP2016525827A5 publication Critical patent/JP2016525827A5/ja
Application granted granted Critical
Publication of JP6554637B2 publication Critical patent/JP6554637B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2016519635A 2013-06-12 2014-06-12 デルタシグマ変換を使用した容量近接検出 Expired - Fee Related JP6554637B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201361834236P 2013-06-12 2013-06-12
US61/834,236 2013-06-12
US14/301,462 2014-06-11
US14/301,462 US9587964B2 (en) 2013-06-12 2014-06-11 Capacitive proximity detection using delta-sigma conversion
PCT/US2014/042036 WO2014201198A1 (en) 2013-06-12 2014-06-12 Capacitive proximity detection using delta-sigma conversion

Publications (3)

Publication Number Publication Date
JP2016525827A JP2016525827A (ja) 2016-08-25
JP2016525827A5 true JP2016525827A5 (enExample) 2017-07-20
JP6554637B2 JP6554637B2 (ja) 2019-08-07

Family

ID=52018692

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016519635A Expired - Fee Related JP6554637B2 (ja) 2013-06-12 2014-06-12 デルタシグマ変換を使用した容量近接検出

Country Status (7)

Country Link
US (1) US9587964B2 (enExample)
EP (1) EP3008824B1 (enExample)
JP (1) JP6554637B2 (enExample)
KR (1) KR20160020480A (enExample)
CN (1) CN105379120B (enExample)
TW (1) TWI651930B (enExample)
WO (1) WO2014201198A1 (enExample)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2999833B1 (fr) * 2012-12-19 2015-01-23 Continental Automotive France Dispositif de mesure d'une variation d'une capacite et procede de mesure associe
US10255422B1 (en) * 2014-09-15 2019-04-09 Apple Inc. Identity proxy for access control systems
US10063214B2 (en) * 2015-03-26 2018-08-28 Pixart Imaging Inc. Programmable band-pass filter circuit of analog front-end used for capacitance detection
US9639226B2 (en) * 2015-08-31 2017-05-02 Cypress Semiconductor Corporation Differential sigma-delta capacitance sensing devices and methods
CN105242804B (zh) * 2015-09-21 2017-11-24 京东方科技集团股份有限公司 触控补偿电路、其补偿方法、触摸屏及显示装置
CN108352842B (zh) * 2015-11-20 2022-03-04 株式会社村田制作所 传感器装置
CN106775141B (zh) 2015-12-30 2019-09-27 深圳市汇顶科技股份有限公司 电容感测电路及触控面板
US10170905B2 (en) 2016-04-08 2019-01-01 Infineon Technologies Ag Electronic switching and protection circuit with wakeup function
WO2017179508A1 (ja) * 2016-04-15 2017-10-19 株式会社村田製作所 A/d変換器およびそれを備えるセンサ装置
TWI621984B (zh) * 2016-12-02 2018-04-21 瑞鼎科技股份有限公司 電容値量測電路及電容値量測方法
TWI615762B (zh) * 2016-12-21 2018-02-21 十速興業科技(深圳)有限公司 電容偵測裝置及方法
US10459856B2 (en) 2016-12-30 2019-10-29 Itron, Inc. Variable acquisition buffer length
US9768792B1 (en) * 2016-12-30 2017-09-19 Itron, Inc. Asynchronous sigma-delta analog-to-digital converter
US10378969B2 (en) * 2017-05-10 2019-08-13 Infineon Technologies Ag Temperature sensor
CN110869709B (zh) * 2017-05-12 2022-01-21 德州仪器公司 用以确定电机的可旋转轴的位置的方法及设备
WO2018205260A1 (en) 2017-05-12 2018-11-15 Texas Instruments Incorporated Capacitive-sensing rotary encoders and methods
US11531424B2 (en) * 2017-09-07 2022-12-20 Cypress Semiconductor Corporation Nano-power capacitance-to-digital converter
EP3480606B1 (en) 2017-09-11 2020-05-13 Shenzhen Goodix Technology Co., Ltd. Capacitance detection circuit, capacitance detection method, touch detection device and terminal device
GB2568543B (en) * 2017-11-21 2020-12-09 Johnson Electric Int Ag Multi-stage capacitive sensor
US10236905B1 (en) * 2018-02-21 2019-03-19 Analog Devices Global Unlimited Company Time interleaved filtering in analog-to-digital converters
JP7215124B2 (ja) * 2018-12-10 2023-01-31 株式会社アイシン 静電容量センサ
JP7215123B2 (ja) * 2018-12-10 2023-01-31 株式会社アイシン 静電容量センサ
WO2020122030A1 (ja) * 2018-12-10 2020-06-18 アイシン精機株式会社 静電容量センサ
DE102019133874A1 (de) * 2018-12-12 2020-06-18 Huf Hülsbeck & Fürst Gmbh & Co. Kg Anordnung für ein Fahrzeug
CN113826061B (zh) * 2019-05-10 2024-08-23 株式会社和冠 从传感器控制器向笔发送发送数据的方法及笔
US11133811B2 (en) * 2019-11-08 2021-09-28 Sigmasense, Llc. High resolution analog to digital converter (ADC) with improved bandwidth
KR102375320B1 (ko) 2020-04-24 2022-03-16 관악아날로그 주식회사 용량성 센서를 위한 읽기 회로
CN113691251B (zh) * 2020-05-19 2025-04-08 上海复旦微电子集团股份有限公司 电容式感测设备及感测电容的方法
TWI726753B (zh) * 2020-06-24 2021-05-01 茂達電子股份有限公司 快速預估感測數值電路及其方法
CN112953581B (zh) * 2021-02-23 2022-04-01 广州市慧芯电子科技有限公司 一种信号积分电路、信号处理方法及红外信号接收系统
KR102691711B1 (ko) 2021-06-03 2024-08-02 서울대학교산학협력단 용량성 센서를 위한 읽기 회로
WO2024108015A1 (en) * 2022-11-18 2024-05-23 University Of Washington Sub-femto farad capacitance measurement circuit

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2661693B2 (ja) * 1987-10-27 1997-10-08 アイシン精機株式会社 人員検出装置
US6774684B2 (en) * 2001-01-17 2004-08-10 Cirrus Logic, Inc. Circuits and methods for controlling transients during audio device power-up and power-down, and systems using the same
JP4359843B2 (ja) * 2004-10-14 2009-11-11 横河電機株式会社 出力回路
WO2006132960A1 (en) 2005-06-03 2006-12-14 Synaptics Incorporated Methods and systems for detecting a capacitance using sigma-delta measurement techniques
US8089289B1 (en) 2007-07-03 2012-01-03 Cypress Semiconductor Corporation Capacitive field sensor with sigma-delta modulator
US8570053B1 (en) * 2007-07-03 2013-10-29 Cypress Semiconductor Corporation Capacitive field sensor with sigma-delta modulator
US8766910B2 (en) 2007-07-04 2014-07-01 Cypress Semiconductor Corporation Capacitive sensing control knob
US8531193B2 (en) * 2007-07-11 2013-09-10 Marimils Oy Method and device for capacitive detection of objects
US8446158B1 (en) 2007-11-09 2013-05-21 Cypress Semiconductor Corporation Compensation for parasitic capacitance of a capacitive sensor
CN101685364B (zh) * 2008-09-27 2012-03-07 盛群半导体股份有限公司 触摸面板的传感装置及方法
JP2010108501A (ja) * 2008-10-30 2010-05-13 Samsung Electronics Co Ltd センシング感度を向上させたタッチスクリーンコントローラ、タッチスクリーンコントローラを備えるディスプレイ駆動回路、ディスプレイ装置及びシステム
JP2010152876A (ja) * 2008-11-26 2010-07-08 Seiko Instruments Inc 静電検出装置、静電検出回路、静電検出方法及び初期化方法
US20110068810A1 (en) 2009-04-03 2011-03-24 Tpo Displays Corp. Sensing method and driving circuit of capacitive touch screen
CN101621291B (zh) * 2009-08-05 2013-06-12 松翰科技股份有限公司 电容式触控感应电路
TWI420826B (zh) * 2010-04-09 2013-12-21 Memsor Corp 具有校正機制之電容式感測器及電容偵測方法
EP2428774B1 (en) * 2010-09-14 2013-05-29 Stichting IMEC Nederland Readout system for MEMs-based capacitive accelerometers and strain sensors, and method for reading
CN103299549B (zh) 2010-12-03 2016-11-09 马维尔国际贸易有限公司 具有降噪反馈通路的模数转换器
US9490804B2 (en) 2011-09-28 2016-11-08 Cypress Semiconductor Corporation Capacitance sensing circuits, methods and systems having conductive touch surface
US9437093B2 (en) * 2011-10-06 2016-09-06 Microchip Technology Incorporated Differential current measurements to determine ION current in the presence of leakage current

Similar Documents

Publication Publication Date Title
JP2016525827A5 (enExample)
EP3008824B1 (en) Capacitive proximity detection using delta-sigma conversion
CN105556321B (zh) 电容感测电路和方法
TWI410853B (zh) 用於觸控裝置之電容量測量裝置
JP2008542760A5 (enExample)
JP2010015262A5 (enExample)
US8144047B2 (en) Current-mode dual-slope temperature-digital conversion device
CN105580279B (zh) 多通道电容分压器扫描方法及设备
CN101910849A (zh) 时间斜率电容测量电路和方法
FI3172581T3 (fi) Piiriarkkitehtuuri tilakytkintä varten
JP2013137237A5 (enExample)
US9374101B2 (en) Sensor device including high-resolution analog to digital converter
JP2015162840A (ja) 2重積分型a/d変換器
KR20140098571A (ko) 정전 용량 측정 방법 및 이를 이용한 정전 터치 스위치
KR20130028346A (ko) 가속도 측정장치 및 가속도 측정방법
RU2603937C1 (ru) Микроконтроллерный измерительный преобразователь для резистивных и емкостных датчиков с передачей результата преобразования по радиоканалу
WO2018036303A1 (zh) 控制电容模块的充放电的方法和装置、显示装置
JP5876703B2 (ja) 静電容量式センサ素子のキャパシタンスおよび/またはキャパシタンスの変化を決定するための方法および装置
TW201405439A (zh) 自學習校正觸摸按鍵電路
KR102028555B1 (ko) 고해상도 아날로그-디지털 변환기를 포함하는 센서 장치
JP6393669B2 (ja) センサ装置及びセンシング方法
CN111854806A (zh) 具有扩展的测量范围的电容数字转换器和相关联的方法
KR20140079095A (ko) 경사형 아날로그-디지털 변환기
JP2009193139A (ja) 近接検出装置及びその方法
JP2009192253A (ja) 近接検出装置及びその方法