KR20150027636A - 잔류 전하 제거 방법, 이 방법을 이용한 엑스선 영상 촬영 방법 및 장치 - Google Patents

잔류 전하 제거 방법, 이 방법을 이용한 엑스선 영상 촬영 방법 및 장치 Download PDF

Info

Publication number
KR20150027636A
KR20150027636A KR20130106307A KR20130106307A KR20150027636A KR 20150027636 A KR20150027636 A KR 20150027636A KR 20130106307 A KR20130106307 A KR 20130106307A KR 20130106307 A KR20130106307 A KR 20130106307A KR 20150027636 A KR20150027636 A KR 20150027636A
Authority
KR
South Korea
Prior art keywords
voltage
ray
photoconductive material
absolute value
detection unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
KR20130106307A
Other languages
English (en)
Korean (ko)
Inventor
김영
김선일
박재철
이강호
Original Assignee
삼성전자주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 삼성전자주식회사 filed Critical 삼성전자주식회사
Priority to KR20130106307A priority Critical patent/KR20150027636A/ko
Priority to EP14183420.0A priority patent/EP2846199A1/en
Priority to IN2527DE2014 priority patent/IN2014DE02527A/en
Priority to US14/476,069 priority patent/US9961754B2/en
Priority to CN201410448597.6A priority patent/CN104414667A/zh
Publication of KR20150027636A publication Critical patent/KR20150027636A/ko
Abandoned legal-status Critical Current

Links

Images

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • H05G1/30—Controlling
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
    • G03G15/00—Apparatus for electrographic processes using a charge pattern
    • G03G15/22—Apparatus for electrographic processes using a charge pattern involving the combination of more than one step according to groups G03G13/02 - G03G13/20
    • G03G15/221—Machines other than electrographic copiers, e.g. electrophotographic cameras, electrostatic typewriters
    • G03G15/222—Machines for handling xeroradiographic images, e.g. xeroradiographic processors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/191—Photoconductor image sensors
    • H10F39/195—X-ray, gamma-ray or corpuscular radiation imagers

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Toxicology (AREA)
  • Engineering & Computer Science (AREA)
  • Medical Informatics (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Optics & Photonics (AREA)
  • Radiology & Medical Imaging (AREA)
  • Biomedical Technology (AREA)
  • Biophysics (AREA)
  • Surgery (AREA)
  • Animal Behavior & Ethology (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Solid State Image Pick-Up Elements (AREA)
KR20130106307A 2013-09-04 2013-09-04 잔류 전하 제거 방법, 이 방법을 이용한 엑스선 영상 촬영 방법 및 장치 Abandoned KR20150027636A (ko)

Priority Applications (5)

Application Number Priority Date Filing Date Title
KR20130106307A KR20150027636A (ko) 2013-09-04 2013-09-04 잔류 전하 제거 방법, 이 방법을 이용한 엑스선 영상 촬영 방법 및 장치
EP14183420.0A EP2846199A1 (en) 2013-09-04 2014-09-03 Method of removing residual charge, x-ray imaging method and apparatus using the same
IN2527DE2014 IN2014DE02527A (enExample) 2013-09-04 2014-09-03
US14/476,069 US9961754B2 (en) 2013-09-04 2014-09-03 Method for removing of residual charge, X-ray imaging method and apparatus using the method
CN201410448597.6A CN104414667A (zh) 2013-09-04 2014-09-04 去除残余电荷的方法、使用其的x射线成像方法和装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR20130106307A KR20150027636A (ko) 2013-09-04 2013-09-04 잔류 전하 제거 방법, 이 방법을 이용한 엑스선 영상 촬영 방법 및 장치

Publications (1)

Publication Number Publication Date
KR20150027636A true KR20150027636A (ko) 2015-03-12

Family

ID=51535325

Family Applications (1)

Application Number Title Priority Date Filing Date
KR20130106307A Abandoned KR20150027636A (ko) 2013-09-04 2013-09-04 잔류 전하 제거 방법, 이 방법을 이용한 엑스선 영상 촬영 방법 및 장치

Country Status (5)

Country Link
US (1) US9961754B2 (enExample)
EP (1) EP2846199A1 (enExample)
KR (1) KR20150027636A (enExample)
CN (1) CN104414667A (enExample)
IN (1) IN2014DE02527A (enExample)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111107285A (zh) * 2018-10-29 2020-05-05 和鑫光电股份有限公司 X光探测器以及使用x光探测器拍摄影像的方法
KR20210137158A (ko) 2019-04-03 2021-11-17 가부시키가이샤 리코 액체 토출기 및 액체 토출 장치
KR20220037226A (ko) * 2020-09-17 2022-03-24 엘지디스플레이 주식회사 디지털 엑스레이 검출기 및 그의 구동 방법
CN114747202A (zh) * 2019-12-13 2022-07-12 瓦里安医疗系统国际股份公司 X射线检测器面板中的图像滞后的减少
WO2025080048A1 (ko) * 2023-10-13 2025-04-17 주식회사 레이언스 엑스선 디텍터

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102116321B1 (ko) * 2013-12-04 2020-05-28 주식회사 레이언스 엑스선 디텍터 및 이를 이용한 엑스선 영상장치와 이의 구동방법
KR20160047314A (ko) * 2014-10-22 2016-05-02 삼성전자주식회사 방사선 검출기 및 방사선 검출기 구동 방법
CN105655364B (zh) * 2015-12-28 2018-09-25 上海奕瑞光电子科技股份有限公司 一种基于行间重叠的电荷补偿方法

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2627922B1 (fr) * 1988-02-26 1990-06-22 Thomson Csf Matrice photosensible a deux diodes par point, sans conducteur specifique de remise a niveau
US5661309A (en) * 1992-12-23 1997-08-26 Sterling Diagnostic Imaging, Inc. Electronic cassette for recording X-ray images
US5510626A (en) * 1994-06-22 1996-04-23 Minnesota Mining And Manufacturing Company System and method for conditioning a radiation detector
US5563421A (en) * 1995-06-07 1996-10-08 Sterling Diagnostic Imaging, Inc. Apparatus and method for eliminating residual charges in an image capture panel
CA2184667C (en) * 1996-09-03 2000-06-20 Bradley Trent Polischuk Multilayer plate for x-ray imaging and method of producing same
CA2200532C (en) * 1997-03-20 2002-02-26 Benoit Adam X-ray image erasure method
US5969360A (en) * 1997-11-26 1999-10-19 Direct Radiography Corp. Readout sequence for residual image elimination in a radiation detection panel
JP3181874B2 (ja) 1998-02-02 2001-07-03 セイコーインスツルメンツ株式会社 イメージセンサー
KR100524081B1 (ko) 1999-03-25 2005-10-26 엘지.필립스 엘시디 주식회사 엑스레이 영상 감지소자
DE19934980B4 (de) 1999-07-26 2004-02-12 Siemens Ag Röntgendiagnostikeinrichtung mit einem flächenförmigen Röntgenbildwandler mit Rückseitenbeleuchtung
KR100361470B1 (ko) 1999-12-31 2002-11-21 엘지.필립스 엘시디 주식회사 엑스-선 이미지 촬영장치 및 그 구동방법
KR100394461B1 (ko) 2001-02-14 2003-08-09 주식회사 디알텍 디지털 ｘ선 촬영 패널
CA2363663C (en) * 2001-11-22 2004-10-19 Ftni Inc. Direct conversion flat panel x-ray detector with automatic cancellation of ghost images
JP2007129347A (ja) * 2005-11-01 2007-05-24 Fujifilm Corp 放射線固体検出器の残留電荷消去方法、および放射線画像記録読取装置
JP5405093B2 (ja) 2008-12-05 2014-02-05 富士フイルム株式会社 画像処理装置及び画像処理方法
KR20110019158A (ko) 2009-08-19 2011-02-25 (주)디알젬 엑스선 제너레이터 시스템
CN103119929B (zh) * 2010-09-13 2016-08-03 雷湾地区研究所 重置光导x射线成像检测器的系统和方法
US20150103975A1 (en) * 2013-10-11 2015-04-16 National Chiao Tung University X-ray image sensor and x-ray image sensor system using the same

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111107285A (zh) * 2018-10-29 2020-05-05 和鑫光电股份有限公司 X光探测器以及使用x光探测器拍摄影像的方法
KR20210137158A (ko) 2019-04-03 2021-11-17 가부시키가이샤 리코 액체 토출기 및 액체 토출 장치
CN114747202A (zh) * 2019-12-13 2022-07-12 瓦里安医疗系统国际股份公司 X射线检测器面板中的图像滞后的减少
KR20220037226A (ko) * 2020-09-17 2022-03-24 엘지디스플레이 주식회사 디지털 엑스레이 검출기 및 그의 구동 방법
WO2025080048A1 (ko) * 2023-10-13 2025-04-17 주식회사 레이언스 엑스선 디텍터

Also Published As

Publication number Publication date
IN2014DE02527A (enExample) 2015-06-26
CN104414667A (zh) 2015-03-18
US9961754B2 (en) 2018-05-01
EP2846199A1 (en) 2015-03-11
US20150063544A1 (en) 2015-03-05

Similar Documents

Publication Publication Date Title
KR20150027636A (ko) 잔류 전하 제거 방법, 이 방법을 이용한 엑스선 영상 촬영 방법 및 장치
JP4669653B2 (ja) 放射線撮像装置、放射線撮像システム及びコンピュータプログラム
EP3141186B1 (en) Fast dual energy for general radiography
EP3322177A1 (en) Radiation imaging apparatus, radiation imaging system, and radiation imaging method
JP5137770B2 (ja) 放射線画像撮影システム
JP6462262B2 (ja) Ｘ線コンピュータ断層撮影装置及びフォトンカウンティングｃｔ装置
EP2549297A2 (en) Radiographic detector including trap occupancy change monitor and feedback, imaging apparatus and methods using the same
US9538099B2 (en) X-ray imaging apparatus and control method thereof
CN104068882A (zh) 放射线图像检测设备及其操作方法、以及放射线成像系统
DE112010003540T5 (de) Bildgebungsvorrichtung, bildgebungssystem,verfahren zur steuerung der vorrightung und des systems, sowie programm
KR20160047314A (ko) 방사선 검출기 및 방사선 검출기 구동 방법
JP2004321310A (ja) 放射線撮像装置
JP6887812B2 (ja) 放射線撮像装置及び放射線撮像システム
CN108968992B (zh) 放射线摄像装置、放射线摄像方法及计算机可读存储介质
JP2008246022A (ja) 放射線撮影装置
JP2004154409A (ja) 乳房用画像撮像装置
KR101141378B1 (ko) 촬상장치
JP6431307B2 (ja) 放射線撮像装置および放射線撮像システム
JP4050117B2 (ja) 画像情報記録読取方法および装置
JP5152979B2 (ja) 放射線画像処理方法および装置
KR20150059450A (ko) 엑스선 영상 촬영 장치 및 방법
JP2018195949A (ja) 放射線撮像装置及び放射線撮像システム
JP2004020300A (ja) 放射線診断装置
JP2007267980A (ja) 回転機構のない連続処理型ｘ線ｃｔ装置
JP2010158392A (ja) 放射線発生装置および放射線画像撮影装置

Legal Events

Date Code Title Description
PA0109 Patent application

Patent event code: PA01091R01D

Comment text: Patent Application

Patent event date: 20130904

PG1501 Laying open of application
A201 Request for examination
PA0201 Request for examination

Patent event code: PA02012R01D

Patent event date: 20180823

Comment text: Request for Examination of Application

Patent event code: PA02011R01I

Patent event date: 20130904

Comment text: Patent Application

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

Comment text: Notification of reason for refusal

Patent event date: 20200110

Patent event code: PE09021S01D

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

Patent event code: PE07011S01D

Comment text: Decision to Grant Registration

Patent event date: 20200714

PC1904 Unpaid initial registration fee