KR20140078279A - Apparatus of inspecting electric condition and inspect method for the same - Google Patents

Apparatus of inspecting electric condition and inspect method for the same Download PDF

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Publication number
KR20140078279A
KR20140078279A KR1020120147476A KR20120147476A KR20140078279A KR 20140078279 A KR20140078279 A KR 20140078279A KR 1020120147476 A KR1020120147476 A KR 1020120147476A KR 20120147476 A KR20120147476 A KR 20120147476A KR 20140078279 A KR20140078279 A KR 20140078279A
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KR
South Korea
Prior art keywords
pattern
pcb
conductive plate
electrical inspection
electrical
Prior art date
Application number
KR1020120147476A
Other languages
Korean (ko)
Inventor
이상민
장용순
이상재
Original Assignee
삼성전기주식회사
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Application filed by 삼성전기주식회사 filed Critical 삼성전기주식회사
Priority to KR1020120147476A priority Critical patent/KR20140078279A/en
Publication of KR20140078279A publication Critical patent/KR20140078279A/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/16Inspection; Monitoring; Aligning
    • H05K2203/162Testing a finished product, e.g. heat cycle testing of solder joints

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

The present invention relates to an electrical inspection apparatus. According to the present invention, the electrical inspection apparatus comprises a top jig unit composed of a conductive plate and a joining member which are disposed on the top of a peripheral typed PCB pattern; an electrical signal applying unit for applying an electrical signal; and a control unit for performing electrical inspection.

Description

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an electric inspection apparatus,

BACKGROUND OF THE INVENTION 1. Field of the Invention [0001] The present invention relates to an apparatus and a method for inspecting an electrical inspection of a PCB, and more particularly, to an apparatus and a method for inspecting an electrical inspection of a PCB.

A circuit board such as a printed circuit board (PCB) supports electric elements such as active elements and passive elements, and provides a circuit pattern for driving the electric elements.

Usually, a printed circuit board is manufactured by forming a circuit pattern on each of the thin plates called a green sheet, and then laminating and firing the thin plates. In the process, a process of inspecting electrical defects such as open / short test of the thin plates or circuit boards made by stacking the thin plates is performed.

Generally, this inspection process is performed using a predetermined substrate inspection apparatus. The substrate inspecting apparatus includes an upper inspecting plate opposed to a front surface of a printed circuit board and a lower inspecting plate opposed to a back surface of the printed circuit board. Each of the upper and lower test boards has test pins connected to a circuit pattern formed on the printed circuit board. In the inspection of the substrate, the test pins are selectively connected to the external circuit patterns of the printed circuit board, and a current is supplied to the test pins to electrically connect the circuit patterns formed on the printed circuit board to the external Open, short test (OS test).

Since the conventional inspection apparatus is a one-to-one correspondence to the circuit pattern formed on the printed circuit board, when the OS pattern of the fine pattern circuit (pattern width is 20 μm or less) is smaller than the pattern of the printed circuit board, It may be thinner. Therefore, there has been a problem in that the conventional inspection apparatus causes an over-scan (when it is judged to be defective but not defective) in the OS test process.

Korean Patent Publication No. 2007-0045764 Korean Patent Publication No. 2009-0053051

Accordingly, the present invention was conceived to solve the above-described problems and disadvantages encountered in conventional electric testing apparatuses and methods, and is a top jig unit having a conductive plate, so that a prepreg type PCB pattern having a pattern length of 40 μm or less The present invention provides an electric inspection apparatus and method capable of confirming whether electrical opening or shorting of an electric wire is possible.

The above object of the present invention can be achieved by a semiconductor device comprising: a top jig part composed of a conductive plate and a joining member positioned on top of a prepreg type PCB; An electric signal applying unit for applying an electric signal; And a controller for performing electrical inspection; The present invention relates to an electric inspection apparatus.

At this time, the PCB of the prepreg type may have a pattern pitch of 40 탆 or less.

The joint member of the top jig may have a cylindrical shape and an end portion thereof may be coupled to the center of the conductive plate.

In addition, the conductive plate may be formed of any one of metal, carbon-loaded plastic, electrostatically dissipative (ESD) plastic, and porous sintered metal.

The lateral length of the conductive plate may be a length obtained by adding both pattern widths and pattern pitches so that at least two patterns can be simultaneously connected.

Further, if a part of the transmitted electrical signal is not detected, it can be regarded as electrically open and the PCB can be judged as defective.

It is still another object of the present invention to provide a method of inspecting an electrical inspection apparatus, comprising: disposing a top jig of the electrical inspection apparatus on a top of a prepreg type PCB; Contacting the top jig with an adjacent pattern of the prepreg type PCB; And a step of electrically inspecting an electrical signal by applying an electric signal to a solder located under the PCB of the prepreg type corresponding to the pattern.

As described above, the electric inspection apparatus and method according to the present invention are configured as a top jig including a conductive plate, thereby making it possible to perform electrical inspection of a prepreg type PCB pattern having a width smaller than an electrical inspection pin There are advantages.

Therefore, the electric inspection apparatus and method according to the present invention can distinguish whether a product is bombarded according to electrical inspection of a prepreg type PCB having a pattern length of 40 μm or less, so that defective products leaked to the next process are eliminated, It is possible to prevent loss of parts and deterioration of productivity.

1 is a sectional view of an embodiment of an electric inspection apparatus according to the present invention.
2 is a perspective view showing a top jig part of an electric inspection apparatus according to the present invention.
3 is a flow chart for performing an electrical inspection using the electrical inspection apparatus according to the present invention.
4 and 5 are a perspective view and a plan view for explaining an electric inspection method of a pre-type PCB according to a preferred embodiment of the present invention.

The electrical inspection apparatus and method according to the present invention will be apparent from the following detailed description of preferred embodiments of the present invention with reference to the accompanying drawings.

The terms used herein are intended to illustrate the embodiments and are not intended to limit the invention. In the present specification, the singular form includes plural forms unless otherwise specified in the specification. It is to be understood that the terms 'comprise', and / or 'comprising' as used herein may be used to refer to the presence or absence of one or more other components, steps, operations, and / Or additions.

FIG. 1 is a perspective view of an electric inspection apparatus according to an embodiment of the present invention, FIG. 2 is a flowchart for performing an electric inspection using the electric inspection apparatus according to the present invention, FIG. FIG. 4 is a plan view showing the inspection of a plurality of patterns in order. FIG.

1, the electrical inspection apparatus according to the present invention includes a top jig 110 disposed on a PCB 200 of a preprint type and an electrical signal application unit 120 for applying an electrical signal .

The top jig 110 may be composed of a conductive plate 112 forming a contact with the PCB pattern 210 and a joint member 113 transmitting an electrical signal, The PCB 210 can be vertically arranged toward the PCB 200 of the prepreg type.

The conductive plate 112 may be in contact with the plurality of patterns 210 at the bottom and may be formed of a conductive material since the electric signal applied from the electrical signal application unit 120 is transmitted.

At this time, since the electric testing apparatus is configured to detect whether the electric preference has been transmitted, the electric testing apparatus may be made of a material having a small electric resistance, so that the electric testing apparatus may be effective in detecting an electric signal transmitted from the electric signal applying unit 120.

The conductive plate 112 of the top jig 110 may be made of a material having good softness. The conductive plate 112 may contact the pattern 210 of the PCB during the PCB electrical inspection.

At this time, the top jig 110 can transmit the force of the external driving unit (not shown) directly to the conductive plate 112 through the coupling member 111 to apply pressure to the pattern 210, The shape of the lower surface pattern 210 is deformed, so that the conductive plate having good ductility can be selected.

The conductive plate 112 may be formed of any one of metal, carbon-loaded plastic, electrostatically dissipative (ESD) plastic, and porous sintered metal.

The joint member 111 of the top jig 110 has a cylindrical shape and an end portion thereof can be coupled to the center of the conductive plate 112.

Since the joint member 111 can be a route for transmitting an electric signal, a generally conductive material is sufficient, and an external driving unit required for upward, downward, leftward and rightward movement in the process of transferring the top jig 110 is combined It is not necessary to be concerned with the shape.

On the other hand, the transverse length 113 of the conductive plate 112 may be larger than the pattern pitch 221. The conductive plate 112 must simultaneously contact adjacent patterns having a pattern pitch 221 formed on the PCB 200 of the prepreg type so that the width 113 of the conductive plate 112 is at least Or more.

It is preferable that the positions where the conductive plate 112 is in contact with the two patterns 210 while they are descending are matched for each pattern. However, since there is a high incidence of process errors, which is a connection to the fine pattern, It may not be consistent.

The lateral length 113 of the conductive plate 112 is set to a value obtained by adding both the pattern width 220 and the pattern pitch 221 so that at least two patterns can be simultaneously connected Lt; / RTI > At this time, the transverse length 113 of the conductive plate 112 can be reduced in proportion to a decrease in the pattern pitch 221.

The conductive plate 112 may be formed in a straight shape corresponding to the entire pattern width 222 that can be connected to a plurality of patterns but there is no uniformity that the pattern 210 of the PCB and the conductive plate 112 are in contact with each other, It is necessary to construct a conductive plate 112 capable of connecting adjacent patterns at the same time, thereby improving the accuracy of electrical inspection.

The present invention is directed to the electrical inspection apparatus 100 for a product having a pattern pitch 221 of 40 탆 or less. However, if the pattern pitch 221 is limited to a smaller range, any one of a plurality of patterns connected to the conductors 112 It may be preferable that the pattern pitch 221 is set to 40 μm or less to 5 μm or more.

Further, a plurality of the top jig parts 110 may be connected in parallel (FIG. 5) within a range where mutual shot does not occur. Since the shapes and sizes of the patterns formed on the PCB 200 of the prepreg type to be subjected to the electrical inspection are various, it is possible to shorten the electrical inspection time by configuring the plurality of top jig parts 110 so as to flexibly correspond to each inspection target PCB .

The control unit 130 may further include a speaker unit or a display unit (not shown) that can confirm an electrical open or short with respect to the pattern 210 of the preprint type PCB 200.

Electrical inspection of the PCB is a simple task of checking whether each pattern is electrically open (Open) or short (OS). Therefore, it is necessary to provide a speaker unit It is possible to quickly carry out the electric inspection when the display part shown on the screen is provided.

When the pattern 210 and the conductive plate 112 are in contact with each other by driving the electrical signal applying unit 120, the controller 130 may perform an OS test by applying an electrical signal to the pattern 210 to be inspected have.

4 and 5 are plan views illustrating an electrical inspection method of a pre-type PCB according to a preferred embodiment of the present invention.

4 and 5, the top jig 110 of the electrical inspection apparatus is disposed on the top of the prepreg type PCB 200 and the top jig 110 is disposed on the pattern 210 of the prepreg type PCB 200, . Then, an electric signal is applied to the solder 212 under the PCB 200 of the prepreg type corresponding to the pattern 210 to perform electrical inspection.

When the preprint type PCB 200 is fixed to the stage unit 230, the test pin 121 connecting the electrical signal application unit 120 is brought into contact with the solder 212. In this case, the stage 230 may have a general shape such that a hole or an opening may be formed so that the test pin 121 connecting the electrical signal applying unit may contact the solder 212, The driving unit is operated to raise the top jig and the conductive plate 112 of the top jig 110 may be in contact with the pattern 210 formed on the PCB.

In addition, the controller 130 generates electrical signals corresponding to the patterns 210 in the electrical signal applying unit 120 and performs electrical inspection. At this time, it is possible to check whether the via 211 of the preprint type PCB 200 is connected to the pattern 210 to see whether there is an electrical opening or a short circuit.

The conductive plate 112 of the top jig 110 may perform an electrical inspection to perform electrical inspection by using two adjacent patterns of the prepreg type PCB 200 as one. When the electrical signal is applied to the solder 212 under the PCB 200 of the prepreg type corresponding to each pattern 210 in the electrical signal application unit 120, the controller 130 checks whether the electrical opening or short circuit is present, Electrical inspection of the pattern 210 is performed.

When the conductive plate 112 contacts the two patterns, the controller 130 sends electrical signals to the solder 212 under the PCB 200 of the corresponding type corresponding to each pattern in a predetermined order, Perform an inspection to record the electrical open or shorted results.

When the electrical inspection of the adjacent pattern is completed, the top jig 110 is moved to the next adjacent two pattern portions, and the conductive plate 112 is brought into contact with the upper portion of the pattern. Then, an electric signal is sent to the lower solder 212 of the PCB 200 of the prepreg type corresponding to each pattern, and it is possible to confirm whether the electric opening or the short circuit is performed.

The remaining patterns 210 can perform the electrical inspection by repeating the above-mentioned process. If a part of the transmitted electrical signal is not detected, it is regarded as electrically open, and information of a pattern in which no electrical signal is detected is stored, The PCB 200 is judged to be defective.

In addition, if electrical signals are detected in all the patterns, the PCB 200 of the pre-type can be regarded as a good product and the remaining PCB processing process can be performed.

 While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it is to be understood that the invention is not limited to the disclosed exemplary embodiments, and that various changes, substitutions and alterations can be made therein without departing from the spirit and scope of the invention. However, it should be understood that such substitutions, changes, and the like fall within the scope of the following claims.

100. Electrical inspection equipment
110. Top jig
111. Connecting member
112. Conductive plate
120. An electric signal application unit
121. Test pin
130. Control unit
200. Pre-type PCB
210. Pattern
211. Via
212. Solder
220. Pattern Width
221. Pattern pitch
230. Stage part

Claims (7)

A top jig comprising a conductive plate and a joining member positioned on top of a prepreg type PCB pattern;
An electric signal applying unit for applying an electric signal; And
A control unit for performing an electrical inspection;
And an electric power supply.
The method according to claim 1,
Wherein the prepreg-type PCB has a pattern pitch of 40 m or less.
The method according to claim 1,
Wherein the coupling member of the top jig has a cylindrical shape and an end portion thereof is coupled to the center of the conductive plate.
The method according to claim 1,
Wherein the conductive plate is made of any one of metal, carbon-loaded plastic, ESD (electrostatically dissipative) plastic or porous sintered metal.
The method according to claim 1,
Wherein the width of the conductive plate is a length obtained by adding both pattern widths and pattern pitches so that at least two patterns can be simultaneously connected.
The method according to claim 1,
And if the electric signal transmitted is not detected at all, it is regarded as electrically open, and the corresponding PCB is determined to be defective.
A method for electrical inspection of a prepreg type PCB,
Disposing a top jig portion of the electrical inspection apparatus on a top of a prepreg type PCB;
Contacting the top jig with an adjacent pattern of the prepreg type PCB; And
Applying an electric signal to the solder on the bottom of the PCB of the prepreg type corresponding to the pattern to conduct electrical inspection;
. ≪ / RTI >
KR1020120147476A 2012-12-17 2012-12-17 Apparatus of inspecting electric condition and inspect method for the same KR20140078279A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1020120147476A KR20140078279A (en) 2012-12-17 2012-12-17 Apparatus of inspecting electric condition and inspect method for the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020120147476A KR20140078279A (en) 2012-12-17 2012-12-17 Apparatus of inspecting electric condition and inspect method for the same

Publications (1)

Publication Number Publication Date
KR20140078279A true KR20140078279A (en) 2014-06-25

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Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020120147476A KR20140078279A (en) 2012-12-17 2012-12-17 Apparatus of inspecting electric condition and inspect method for the same

Country Status (1)

Country Link
KR (1) KR20140078279A (en)

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