KR20140078279A - Apparatus of inspecting electric condition and inspect method for the same - Google Patents
Apparatus of inspecting electric condition and inspect method for the same Download PDFInfo
- Publication number
- KR20140078279A KR20140078279A KR1020120147476A KR20120147476A KR20140078279A KR 20140078279 A KR20140078279 A KR 20140078279A KR 1020120147476 A KR1020120147476 A KR 1020120147476A KR 20120147476 A KR20120147476 A KR 20120147476A KR 20140078279 A KR20140078279 A KR 20140078279A
- Authority
- KR
- South Korea
- Prior art keywords
- pattern
- pcb
- conductive plate
- electrical inspection
- electrical
- Prior art date
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/16—Inspection; Monitoring; Aligning
- H05K2203/162—Testing a finished product, e.g. heat cycle testing of solder joints
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
Description
BACKGROUND OF THE INVENTION 1. Field of the Invention [0001] The present invention relates to an apparatus and a method for inspecting an electrical inspection of a PCB, and more particularly, to an apparatus and a method for inspecting an electrical inspection of a PCB.
A circuit board such as a printed circuit board (PCB) supports electric elements such as active elements and passive elements, and provides a circuit pattern for driving the electric elements.
Usually, a printed circuit board is manufactured by forming a circuit pattern on each of the thin plates called a green sheet, and then laminating and firing the thin plates. In the process, a process of inspecting electrical defects such as open / short test of the thin plates or circuit boards made by stacking the thin plates is performed.
Generally, this inspection process is performed using a predetermined substrate inspection apparatus. The substrate inspecting apparatus includes an upper inspecting plate opposed to a front surface of a printed circuit board and a lower inspecting plate opposed to a back surface of the printed circuit board. Each of the upper and lower test boards has test pins connected to a circuit pattern formed on the printed circuit board. In the inspection of the substrate, the test pins are selectively connected to the external circuit patterns of the printed circuit board, and a current is supplied to the test pins to electrically connect the circuit patterns formed on the printed circuit board to the external Open, short test (OS test).
Since the conventional inspection apparatus is a one-to-one correspondence to the circuit pattern formed on the printed circuit board, when the OS pattern of the fine pattern circuit (pattern width is 20 μm or less) is smaller than the pattern of the printed circuit board, It may be thinner. Therefore, there has been a problem in that the conventional inspection apparatus causes an over-scan (when it is judged to be defective but not defective) in the OS test process.
Accordingly, the present invention was conceived to solve the above-described problems and disadvantages encountered in conventional electric testing apparatuses and methods, and is a top jig unit having a conductive plate, so that a prepreg type PCB pattern having a pattern length of 40 μm or less The present invention provides an electric inspection apparatus and method capable of confirming whether electrical opening or shorting of an electric wire is possible.
The above object of the present invention can be achieved by a semiconductor device comprising: a top jig part composed of a conductive plate and a joining member positioned on top of a prepreg type PCB; An electric signal applying unit for applying an electric signal; And a controller for performing electrical inspection; The present invention relates to an electric inspection apparatus.
At this time, the PCB of the prepreg type may have a pattern pitch of 40 탆 or less.
The joint member of the top jig may have a cylindrical shape and an end portion thereof may be coupled to the center of the conductive plate.
In addition, the conductive plate may be formed of any one of metal, carbon-loaded plastic, electrostatically dissipative (ESD) plastic, and porous sintered metal.
The lateral length of the conductive plate may be a length obtained by adding both pattern widths and pattern pitches so that at least two patterns can be simultaneously connected.
Further, if a part of the transmitted electrical signal is not detected, it can be regarded as electrically open and the PCB can be judged as defective.
It is still another object of the present invention to provide a method of inspecting an electrical inspection apparatus, comprising: disposing a top jig of the electrical inspection apparatus on a top of a prepreg type PCB; Contacting the top jig with an adjacent pattern of the prepreg type PCB; And a step of electrically inspecting an electrical signal by applying an electric signal to a solder located under the PCB of the prepreg type corresponding to the pattern.
As described above, the electric inspection apparatus and method according to the present invention are configured as a top jig including a conductive plate, thereby making it possible to perform electrical inspection of a prepreg type PCB pattern having a width smaller than an electrical inspection pin There are advantages.
Therefore, the electric inspection apparatus and method according to the present invention can distinguish whether a product is bombarded according to electrical inspection of a prepreg type PCB having a pattern length of 40 μm or less, so that defective products leaked to the next process are eliminated, It is possible to prevent loss of parts and deterioration of productivity.
1 is a sectional view of an embodiment of an electric inspection apparatus according to the present invention.
2 is a perspective view showing a top jig part of an electric inspection apparatus according to the present invention.
3 is a flow chart for performing an electrical inspection using the electrical inspection apparatus according to the present invention.
4 and 5 are a perspective view and a plan view for explaining an electric inspection method of a pre-type PCB according to a preferred embodiment of the present invention.
The electrical inspection apparatus and method according to the present invention will be apparent from the following detailed description of preferred embodiments of the present invention with reference to the accompanying drawings.
The terms used herein are intended to illustrate the embodiments and are not intended to limit the invention. In the present specification, the singular form includes plural forms unless otherwise specified in the specification. It is to be understood that the terms 'comprise', and / or 'comprising' as used herein may be used to refer to the presence or absence of one or more other components, steps, operations, and / Or additions.
FIG. 1 is a perspective view of an electric inspection apparatus according to an embodiment of the present invention, FIG. 2 is a flowchart for performing an electric inspection using the electric inspection apparatus according to the present invention, FIG. FIG. 4 is a plan view showing the inspection of a plurality of patterns in order. FIG.
1, the electrical inspection apparatus according to the present invention includes a
The
The conductive plate 112 may be in contact with the plurality of
At this time, since the electric testing apparatus is configured to detect whether the electric preference has been transmitted, the electric testing apparatus may be made of a material having a small electric resistance, so that the electric testing apparatus may be effective in detecting an electric signal transmitted from the electric
The conductive plate 112 of the
At this time, the
The conductive plate 112 may be formed of any one of metal, carbon-loaded plastic, electrostatically dissipative (ESD) plastic, and porous sintered metal.
The
Since the
On the other hand, the
It is preferable that the positions where the conductive plate 112 is in contact with the two
The
The conductive plate 112 may be formed in a straight shape corresponding to the
The present invention is directed to the
Further, a plurality of the
The
Electrical inspection of the PCB is a simple task of checking whether each pattern is electrically open (Open) or short (OS). Therefore, it is necessary to provide a speaker unit It is possible to quickly carry out the electric inspection when the display part shown on the screen is provided.
When the
4 and 5 are plan views illustrating an electrical inspection method of a pre-type PCB according to a preferred embodiment of the present invention.
4 and 5, the
When the preprint type PCB 200 is fixed to the
In addition, the
The conductive plate 112 of the
When the conductive plate 112 contacts the two patterns, the
When the electrical inspection of the adjacent pattern is completed, the
The remaining
In addition, if electrical signals are detected in all the patterns, the
While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it is to be understood that the invention is not limited to the disclosed exemplary embodiments, and that various changes, substitutions and alterations can be made therein without departing from the spirit and scope of the invention. However, it should be understood that such substitutions, changes, and the like fall within the scope of the following claims.
100. Electrical inspection equipment
110. Top jig
111. Connecting member
112. Conductive plate
120. An electric signal application unit
121. Test pin
130. Control unit
200. Pre-type PCB
210. Pattern
211. Via
212. Solder
220. Pattern Width
221. Pattern pitch
230. Stage part
Claims (7)
An electric signal applying unit for applying an electric signal; And
A control unit for performing an electrical inspection;
And an electric power supply.
Wherein the prepreg-type PCB has a pattern pitch of 40 m or less.
Wherein the coupling member of the top jig has a cylindrical shape and an end portion thereof is coupled to the center of the conductive plate.
Wherein the conductive plate is made of any one of metal, carbon-loaded plastic, ESD (electrostatically dissipative) plastic or porous sintered metal.
Wherein the width of the conductive plate is a length obtained by adding both pattern widths and pattern pitches so that at least two patterns can be simultaneously connected.
And if the electric signal transmitted is not detected at all, it is regarded as electrically open, and the corresponding PCB is determined to be defective.
Disposing a top jig portion of the electrical inspection apparatus on a top of a prepreg type PCB;
Contacting the top jig with an adjacent pattern of the prepreg type PCB; And
Applying an electric signal to the solder on the bottom of the PCB of the prepreg type corresponding to the pattern to conduct electrical inspection;
. ≪ / RTI >
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020120147476A KR20140078279A (en) | 2012-12-17 | 2012-12-17 | Apparatus of inspecting electric condition and inspect method for the same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020120147476A KR20140078279A (en) | 2012-12-17 | 2012-12-17 | Apparatus of inspecting electric condition and inspect method for the same |
Publications (1)
Publication Number | Publication Date |
---|---|
KR20140078279A true KR20140078279A (en) | 2014-06-25 |
Family
ID=51129928
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020120147476A KR20140078279A (en) | 2012-12-17 | 2012-12-17 | Apparatus of inspecting electric condition and inspect method for the same |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR20140078279A (en) |
-
2012
- 2012-12-17 KR KR1020120147476A patent/KR20140078279A/en not_active Application Discontinuation
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