JP3719137B2 - Printed wiring board inspection equipment - Google Patents

Printed wiring board inspection equipment Download PDF

Info

Publication number
JP3719137B2
JP3719137B2 JP2000384853A JP2000384853A JP3719137B2 JP 3719137 B2 JP3719137 B2 JP 3719137B2 JP 2000384853 A JP2000384853 A JP 2000384853A JP 2000384853 A JP2000384853 A JP 2000384853A JP 3719137 B2 JP3719137 B2 JP 3719137B2
Authority
JP
Japan
Prior art keywords
inspection
printed wiring
wiring board
inspected
contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2000384853A
Other languages
Japanese (ja)
Other versions
JP2002181874A (en
Inventor
武夫 船岡
昭夫 越智
新二 西浦
裕祥 皆藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Corp
Panasonic Holdings Corp
Original Assignee
Panasonic Corp
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Panasonic Corp, Matsushita Electric Industrial Co Ltd filed Critical Panasonic Corp
Priority to JP2000384853A priority Critical patent/JP3719137B2/en
Publication of JP2002181874A publication Critical patent/JP2002181874A/en
Application granted granted Critical
Publication of JP3719137B2 publication Critical patent/JP3719137B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)

Description

【0001】
【発明の属する技術分野】
本発明はプリント配線板の検査装置に関するものである。
【0002】
【従来の技術】
従来におけるこの種の検査装置について図面を用いて説明する。図7は従来のプリント配線板の検査装置の要部構成図であり、12は絶縁体よりなる上下移動自在なホルダーである。9は金属材よりなり、ホルダー12に装着された複数の伸縮自在なスプリングプローブである。
【0003】
スプリングプローブ9の下端は、被検査プリント配線板2の電極3に当接すべく円錐状であり、上端には配線材8aの一端が接続され、その他端は検査部18に接続されている。
【0004】
被検査プリント配線板2はフェノール樹脂、エポキシ樹脂、ポリイミド樹脂などの絶縁基材5の片面に、導体材の銅箔などでなる配線パターンや複数の電極3などを設けた構成となっている。
【0005】
検査時は、被検査プリント配線板2の検査すべきポイントである電極3の位置に、ホルダー12を下降させてスプリングプローブ9の下端を弾性をもって当接させ、配線材8aを介して接続された検査部18により比較演算や判定を行って、被検査プリント配線板2の所定箇所における電気的接続状態を測定検査するようになっていた。
【0006】
【発明が解決しようとする課題】
しかしながら、前記従来の構成では、電極3の密度が高い場合には、細くしたスプリングプローブ9を密集して装着する必要があるが、細いスプリングプローブ9は損傷しやすく、また複数のスプリングプローブ9を高精度で確実に弾性をもって電極3に当接することは容易ではなく、結論として高密度電極のプリント配線板の測定検査が困難であるという課題を有していた。
【0007】
本発明は、前記従来の課題を解決しようとするものであり、高密度電極のプリント配線板の測定検査を確実に行える検査装置を提供することを目的とするものである。
【0008】
【課題を解決するための手段】
前記課題を解決するために本発明のプリント配線板の検査装置は、被検査プリント配線板に形成した複数の電極と対向した位置に配設した接点部、およびこの接点部に配線部を介して接続した配線端子を設けた検査用基板と、前記配線端子と圧接して電気的接続する接続部と、前記検査用基板と被検査プリント配線板との相対的位置関係を認識するカメラと、前記検査用基板と被検査プリント配線板を相対的に移動させるアライメント機構と、前記接点部を電極に接続すべく押圧する押圧部と、前記接続部に接続されて被検査プリント配線板の電気的接続状態を測定し検査する検査部からなり、検査用基板には、被検査プリント配線板に設けた基準マークを透視する孔を設け、押圧部には孔を介して基準マークを検出するカメラを設置してなる構成としたものであり、検査装置における検査用基板と被検査プリント配線板が容易かつ確実に接続され、電気的接続状態を測定検査することが可能となる。
【0009】
【発明の実施の形態】
本発明の請求項1に記載の発明は、被検査プリント配線板に形成した複数の電極と対向した位置に配設された接点部、およびこの接点部に配線部を介して接続した配線端子を設けた検査用基板と、前記配線端子と圧接して電気的接続する接続部と、前記検査用基板と被検査プリント配線板との相対的位置関係を認識するカメラと、前記検査用基板と被検査プリント配線板を相対的に移動させるアライメント機構と、前記接点部を電極に接続すべく押圧する押圧部と、前記接続部に接続されて被検査プリント配線板の電気的接続状態を測定し検査する検査部とからなり、検査用基板には、被検査プリント配線板に設けた基準マークを透視する孔を設け、押圧部には孔を介して基準マークを検出するカメラを設置してなるプリント配線板の検査装置であり、使用材質に限定されることなく、検査用基板と被検査プリント配線板を容易かつ高精度に位置合せでき、測定検査が容易かつ確実にできるという作用を有する。
【0014】
以下、本発明の実施の形態について図面を用いて説明する。なお、従来の技術で説明したものと同じ機構部材には、同一の番号を付与し詳細な説明は簡略する。
【0015】
図1,図2において、3は電極、5は絶縁基材、2は被検査プリント配線板である。1は検査用基板であり、片面に銅箔などの導体材で配線パターン7を形成し、内部に銅、銀、ニッケルや充填材などからなる導電性物質6を充填したスルーホールを設けた絶縁基材5aを必要な枚数積層し電気的に接続して形成している。
【0016】
導電性物質6と配線パターン7で多層状の配線部21を構成しており、1bは積層した絶縁基材5aの最下層であり、下面にスルーホールの導電性物質6と接続し、電極3と対向し相似した形状の複数の接点4を設け、接点部14としている。
【0017】
また、1cは積層した絶縁基材5aの最上層であり、スルーホールの導電性物質6と接続した複数の配線端子8を上面に設けている。なお、配線端子8は検査用基板1の最下層1bの下面または外周の端面1dに形成することも可能である。
【0018】
接点部14である複数の接点4および配線パターン7は銅箔のフォトエッチング加工やメッキなどにより形成する。また、絶縁基材5aはフェノール、ポリイミド、エポキシ、ポリエステルなどの絶縁樹脂、あるいはその絶縁樹脂に紙、ガラス繊維、アラミド繊維などの補強材を添加した材料を使用している。
【0019】
11は上下移動自在な絶縁材よりなる検査用プレートであり、検査用基板1に設けた配線端子8に下端が当接する伸縮自在なスプリングプローブ9を装着している。またスプリングプローブ9の上端はフレキシブルな配線材8aにより検査部18に接続されており、この部分で接続部19を構成している。
【0020】
10はバネ、ゴム、樹脂などの弾性体でなる押圧部材であり、検査用プレート11と検査用基板1との間に配設あるいは装着されて押圧部20を構成している。
【0021】
なお、配線端子8は被検査プリント配線板2よりも大きな検査用基板1の上面上に配置されており、押圧部材10の下動により接点部14が対応する電極3の全てに押圧できるような構成となっている。
【0022】
また、接続部19には各種の被検査プリント配線板2の検査に対応できるように、スプリングプローブ9を使用し、検査用基板1を取替え可能としているが、スプリングプローブ9に代えてコネクターなど固定接続体を使用してもよく、さらに、被検査プリント配線板2を1品種に限定する場合には、柔軟性あるいは伸縮自在すなわちフレキシブルな配線材で配線端子8と固着してもよい。
【0023】
押圧部20が当接する検査用基板1の上面には図2に示すように、検査用基板1の配線部21aが設けられている。したがって押圧部20の押圧力が配線部21aによる段差で接点部14全体に均一に伝達されず、例えば接点4dが電極3fに当接しない状態が発生する場合がある。
【0024】
そこでそれを防止するため、配線部21aと同一厚みの金属箔や絶縁膜などでなる平面保持体21bを、配線部21aに隣接して設け、接点部14を設けた面とは反対の上面を均一な平面とし、接点部14に均一の押圧力を印加させるようにし、これにより図2の検査用基板1の右側を若干下降させて、接点4dと電極3fを当接させるようにしている。
【0025】
検査時には被検査プリント配線板2を測定検査ステージ(図示せず)に載置し接点した後、検査用プレート11を下降させてスプリングプローブ9の下端を配線端子8の表面と弾性をもって当接させ、続いて検査用プレート11および検査用基板1を同時に一体として下降させる。すると接点部14が被検査プリント配線板2のそれぞれ対応する電極3に当接、接続され、検査部18により被検査プリント配線板2の所定の電気的接続状態を測定検査、判定する。
【0026】
図3は検査用基板1と被検査プリント配線板2のアライメントおよびその確認を行うアライメント機構と認識機構の要部構成図であり、図3に示すように、認識機構を構成する1台あるいは複数台の水平および垂直移動自在な認識用のカメラ32と、検査用基板1と被検査プリント配線板2を相対的に移動させるために、X軸、Y軸およびθ軸方向にそれらを駆動するアライメント機構33を押圧部20の一部に結合して設けた構成としたものである。
【0027】
測定検査のために検査用基板1と被検査プリント配線板2を位置決めし当接させる際には、検査用基板1と被検査プリント配線板2の間に、対応する上面と下面の両面を認識するカメラ32を配設し、電極3と接点部14における接点4の位置を認識してアライメント機構33により検査用基板1をX軸方向、Y軸方向およびθ軸方向に位置補正を行って位置決めし、測定し検査する際には認識用のカメラ32を矢印F,G方向にそれぞれ待避させた後、検査用基板1と被検査プリント配線板2を当接し接続させるようになっており、高精度に位置合せすることができ、測定検査が容易かつ確実にできる。
【0028】
なお、電極3と接点4はいずれもプリント配線板に形成されたパターンの一部であるため、特別な認識用のマークを付加する必要がなく、また、あらゆる形状の電極3および接点4に対して対応することができる。
【0029】
図4は基準マークと位置合せ孔を有する検査用基板とその認識用のカメラを配設した押圧部の構成要部断面図であり、図4に示すように、電極3が形成された面に1個あるいは複数の基準マーク3dを設けた被検査プリント配線板2を設ける。また基準マーク3dと同一の位置関係に配設した基準マーク4kの中央部を挿通して位置合せ孔15を有する検査用基板1を設ける。そして検査用基板1の接点4で形成された接点部14を設けた面とは反対側で、かつ位置合せ孔15を見通して基準マーク3dの検出が可能な位置に、検査用基板1と被検査プリント配線板2の相対的な位置関係を認識するカメラ16を1台あるいは複数台する押圧部20を設けたものである。
【0030】
前記構成によれば、カメラ16で認識した位置関係を基にして検査用基板1と被検査用プリント配線板2を高精度に位置合せすることが可能となる。また、検査用基板1と被検査プリント配線板2は相対的な位置関係を合致させるのであり、カメラ16の取付け位置精度が前記の位置合せにあまり影響しないことも有利なことである。
【0031】
なお、基準マーク3dは接点部14となる接点4の形成と同じく、導体材である銅箔をフォトエッチング加工やレーザ切削加工などにより形成すれば、接点部4と同時に加工することができ、かつ接点部14との位置関係が高精度になる。
【0032】
図5はアライメント機構及び押圧力の制御自在なプレス駆動部を付設した検査装置の要部構成図であり、図5に示すように、前記で説明した検査部18、配線材8a、押圧部20、検査用基板1そして被検査プリント配線板2でなる基本検査装置の検査用基板1の外周に動作体38を配置した。動作体38はアライメント機構33で動作する。また押圧部20への押圧力を任意に設定制御するための制御部39を設け、プレス駆動部37を介して押圧部20を動作させるものである。
【0033】
なお、アライメント機構33に駆動力が伝達しない位置に分離してプレス駆動部37は配設されており、検査用基板1と被検査プリント配線板2を高精度に位置合せすることができ、かつ当接のための押圧が確実で高精度に設定することができる。
【0034】
また、接点部14の劣化や被検査プリント配線板2の構成材質の変更などにともない、押圧部20への押圧力を制御部39によって変更し、最適に設定して制御することにより、被検査プリント配線板2に損傷を与えず、接点部14の寿命を延ばすことができる。
【0035】
図6は痕跡付加体を結合したアライメント確認機構を付設した検査装置の要部構成図である。この図6に示すように、検査部18、配線材8a、押圧部20、検査用基板1そして被検査プリント配線板2でなる基本の検査装置に、検査用基板1と被検査プリント配線板2とのアライメント、すなわち接点部14と電極3が当接し、接続された状態を確認するために、前記当接、接続した場合に基準用の痕跡42を付加する。具体的には、ダミーピン、導通ピンあるいはレーザ照射体などの痕跡付加体41を1個あるいは複数個を設け、アライメント確認機構40により検査用基板1に設けた位置合せ孔15を挿通して駆動させることで、痕跡42を形成する。
【0036】
この部分の説明をさらに行うと、接点部14の周辺近傍でかつ対角線上に設けたアライメント確認機構40と結合した痕跡付加体41を、被検査プリント配線板2の電気的接続状態を測定し検査を行うと同時に駆動し、被検査プリント配線板2のダミー電極やレジストなどに痕跡42を付加する。そして、前記測定検査を行った後、その痕跡42を認識カメラなどで検出することにより、アライメントすなわち接点部14と電極3が当接し接続した状態を確認するものであり、検査用基板1と被検査プリント配線板2の高精度な位置合せや、当接し接続したか否かの状態を容易かつ確実に確認することができるのである。
【0037】
なお、接点部14の表面の一部にインクや塗料などを塗布し、それを電極3に当接した際に転写する方法とすることも可能である。
【0038】
以上、被検査プリント配線板2の片面に複数の電極3を有する場合を説明したが、両面に複数の電極3を設けた被検査プリント配線板2の場合には、前記と同じ付設機構を含めて検査用基板1を2枚以上として、被検査プリント配線板2を挟持するように配設し、2枚以上の検査用基板1を一体化して移動動作させて測定検査するように構成すればよい。
【0039】
【発明の効果】
以上のように本発明によれば、高密度電極のプリント配線板の測定検査を容易に、かつ確実に行うことができる。
【図面の簡単な説明】
【図1】本発明の一実施の形態におけるプリント配線板の検査装置の要部断面図
【図2】同押圧部、検査用基板および被検査プリント配線板の要部断面図
【図3】同アライメント機構と認識機構の要部構成図
【図4】同基準マークと位置合せ孔を有する検査用基板と認識用のカメラを配設した押圧部の要部構成図
【図5】同アライメント機構とプレス駆動部を付設した検査装置の要部構成図
【図6】同痕跡付加体を結合したアライメント確認機構を付設した検査装置の要部構成図
【図7】従来のプリント配線板の検査装置の要部構成図
【符号の説明】
1 検査用基板
1b 最下層
1c 最上層
1d 端面
2 被検査プリント配線板
3,3f 電極
3d,4k 基準マーク
4,4d 接点
5,5a 絶縁基材
6 導電性物質
7 配線パターン
8 配線端子
8a 配線材
9 スプリングプローブ
10 押圧部材
11 検査用プレート
12 ホルダー
14 接点部
15 位置合せ孔
16,32 カメラ
18 検査部
19 接続部
20 押圧部
21,21a 配線部
21b 平面保持体
33 アライメント機構
37 プレス駆動部
38 動作体
39 制御部
40 アライメント確認機構
41 痕跡付加体
42 痕跡
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a printed wiring board inspection apparatus.
[0002]
[Prior art]
A conventional inspection apparatus of this type will be described with reference to the drawings. FIG. 7 is a block diagram of a main part of a conventional printed wiring board inspection apparatus. Reference numeral 12 denotes a holder made of an insulator that can move up and down. Reference numeral 9 denotes a plurality of elastic spring probes made of a metal material and attached to the holder 12.
[0003]
The lower end of the spring probe 9 has a conical shape so as to come into contact with the electrode 3 of the printed wiring board 2 to be inspected, one end of the wiring member 8 a is connected to the upper end, and the other end is connected to the inspection unit 18.
[0004]
The printed wiring board 2 to be inspected has a configuration in which a wiring pattern made of a copper foil of a conductor material, a plurality of electrodes 3 and the like are provided on one surface of an insulating base material 5 such as phenol resin, epoxy resin, or polyimide resin.
[0005]
At the time of inspection, the holder 12 is lowered at the position of the electrode 3 which is a point to be inspected on the printed wiring board 2 to be inspected, and the lower end of the spring probe 9 is elastically contacted to be connected via the wiring member 8a. The inspection unit 18 performs comparison calculation and determination to measure and inspect the electrical connection state at a predetermined location of the printed wiring board 2 to be inspected.
[0006]
[Problems to be solved by the invention]
However, in the conventional configuration, when the density of the electrodes 3 is high, it is necessary to mount the thin spring probes 9 densely. However, the thin spring probes 9 are easily damaged, and a plurality of spring probes 9 are attached. It is not easy to make contact with the electrode 3 with high accuracy and sure elasticity, and as a result, there is a problem that it is difficult to measure and inspect the printed wiring board of the high-density electrode.
[0007]
The present invention is intended to solve the above-described conventional problems, and an object of the present invention is to provide an inspection apparatus capable of reliably performing a measurement inspection of a printed wiring board having a high-density electrode.
[0008]
[Means for Solving the Problems]
In order to solve the above problems, a printed wiring board inspection apparatus according to the present invention includes a contact portion disposed at a position facing a plurality of electrodes formed on a printed wiring board to be inspected, and a wiring portion connected to the contact portion. An inspection board provided with a connected wiring terminal; a connection part that is in electrical contact with the wiring terminal; a camera that recognizes a relative positional relationship between the inspection board and the printed wiring board to be inspected; An alignment mechanism for relatively moving the inspection substrate and the printed wiring board to be inspected, a pressing portion for pressing the contact portion to connect to the electrode, and an electrical connection between the connecting portion and the printed wiring board to be inspected It consists of an inspection unit that measures and inspects the state . The inspection board is provided with a hole to see through the reference mark provided on the printed wiring board to be inspected, and a camera that detects the reference mark through the hole is installed in the pressing part. Do it Is obtained by the structure, is connected inspection board and the objective printed circuit board easily and reliably in the inspection apparatus, it is possible the electrical connection state measurement and inspection.
[0009]
DETAILED DESCRIPTION OF THE INVENTION
According to the first aspect of the present invention, there is provided a contact portion disposed at a position facing a plurality of electrodes formed on a printed wiring board to be inspected, and a wiring terminal connected to the contact portion via the wiring portion. An inspection board provided; a connection portion that is electrically connected to the wiring terminal by pressure contact; a camera that recognizes a relative positional relationship between the inspection board and the printed wiring board to be inspected; An alignment mechanism that relatively moves the inspection printed wiring board, a pressing portion that presses the contact portion to connect to the electrode, and an electrical connection state of the printed wiring board that is connected to the connection portion is measured and inspected. Ri Do and a checking unit which, on the testing board, provided with a hole for the perspective a reference mark provided on the objective printed circuit board, formed by installing a camera for detecting reference mark through the hole in the pressing portion Inspection equipment for printed wiring boards , And the is not limited to the materials used, the inspection substrate and the objective printed circuit board can be aligned easily and accurately, it has the effect of measurement and inspection can be easily and reliably.
[0014]
Hereinafter, embodiments of the present invention will be described with reference to the drawings. In addition, the same number is given to the same mechanism member as what was demonstrated by the prior art, and detailed description is simplified.
[0015]
1 and 2, 3 is an electrode, 5 is an insulating substrate, and 2 is a printed wiring board to be inspected. Reference numeral 1 denotes an inspection substrate, in which a wiring pattern 7 is formed on one surface with a conductor material such as copper foil, and an insulating material is provided with a through hole filled with a conductive material 6 made of copper, silver, nickel, filler, or the like. A necessary number of base materials 5a are stacked and electrically connected.
[0016]
The conductive material 6 and the wiring pattern 7 constitute a multilayer wiring portion 21, 1 b is the lowermost layer of the laminated insulating base material 5 a, and the lower surface is connected to the conductive material 6 of the through hole, and the electrode 3 A plurality of contact points 4 having a shape similar to that of the contact point 14 are provided as contact points 14.
[0017]
Moreover, 1c is the uppermost layer of the laminated | stacked insulating base material 5a, and has provided the several wiring terminal 8 connected with the electroconductive substance 6 of a through hole on the upper surface. The wiring terminal 8 can also be formed on the lower surface or the outer peripheral end surface 1d of the lowermost layer 1b of the inspection substrate 1.
[0018]
The plurality of contacts 4 and the wiring pattern 7 that are the contact portions 14 are formed by photo-etching or plating of copper foil. The insulating substrate 5a is made of an insulating resin such as phenol, polyimide, epoxy, or polyester, or a material obtained by adding a reinforcing material such as paper, glass fiber, or aramid fiber to the insulating resin.
[0019]
Reference numeral 11 denotes an inspection plate made of an insulating material that can move up and down, and is provided with a stretchable spring probe 9 whose lower end abuts against a wiring terminal 8 provided on the inspection substrate 1. Further, the upper end of the spring probe 9 is connected to the inspection unit 18 by a flexible wiring member 8a, and this portion constitutes the connection unit 19.
[0020]
Reference numeral 10 denotes a pressing member made of an elastic body such as a spring, rubber, or resin. The pressing member 20 is disposed or mounted between the inspection plate 11 and the inspection substrate 1 to constitute the pressing portion 20.
[0021]
The wiring terminal 8 is disposed on the upper surface of the inspection substrate 1 larger than the printed wiring board 2 to be inspected, and the contact portion 14 can press all the corresponding electrodes 3 by the downward movement of the pressing member 10. It has a configuration.
[0022]
In addition, a spring probe 9 is used for the connection portion 19 so that it can cope with various inspections of the printed wiring board 2 to be inspected, and the inspection substrate 1 can be replaced. A connection body may be used, and when the printed wiring board 2 to be inspected is limited to one type, it may be fixed to the wiring terminal 8 with a flexible or stretchable or flexible wiring material.
[0023]
As shown in FIG. 2, a wiring portion 21 a of the inspection substrate 1 is provided on the upper surface of the inspection substrate 1 with which the pressing portion 20 abuts. Therefore, the pressing force of the pressing portion 20 is not uniformly transmitted to the entire contact portion 14 due to a step due to the wiring portion 21a, and for example, a state in which the contact 4d does not contact the electrode 3f may occur.
[0024]
Therefore, in order to prevent this, a plane holding body 21b made of a metal foil or an insulating film having the same thickness as the wiring portion 21a is provided adjacent to the wiring portion 21a, and an upper surface opposite to the surface on which the contact portion 14 is provided. A uniform pressing force is applied to the contact portion 14 so that the right side of the inspection substrate 1 shown in FIG. 2 is slightly lowered to bring the contact 4d and the electrode 3f into contact with each other.
[0025]
At the time of inspection, the printed wiring board 2 to be inspected is placed on and contacted with a measurement inspection stage (not shown), and then the inspection plate 11 is lowered to bring the lower end of the spring probe 9 into elastic contact with the surface of the wiring terminal 8. Subsequently, the inspection plate 11 and the inspection substrate 1 are simultaneously lowered together. Then, the contact portions 14 are brought into contact with and connected to the corresponding electrodes 3 of the printed wiring board 2 to be inspected, and a predetermined electrical connection state of the printed wiring board 2 to be inspected is measured, inspected, and determined by the inspection portion 18.
[0026]
FIG. 3 is a configuration diagram of the main parts of the alignment mechanism and the recognition mechanism for alignment and confirmation of the inspection substrate 1 and the printed wiring board 2 to be inspected. As shown in FIG. Alignment that drives them in the X-axis, Y-axis, and θ-axis directions to relatively move the inspection camera 1 and the inspection substrate 1 and the printed wiring board 2 to be inspected, which can be moved horizontally and vertically. The mechanism 33 is configured to be coupled to a part of the pressing portion 20.
[0027]
When the inspection substrate 1 and the printed wiring board 2 to be inspected are positioned and brought into contact with each other for measurement and inspection, the corresponding upper and lower surfaces are recognized between the inspection substrate 1 and the printed wiring board 2 to be inspected. The camera 32 is disposed, the position of the contact 4 on the electrode 3 and the contact portion 14 is recognized, and the position of the inspection substrate 1 is corrected by the alignment mechanism 33 in the X axis direction, the Y axis direction, and the θ axis direction. When measuring and inspecting, the recognition camera 32 is retracted in the directions of arrows F and G, respectively, and then the inspection substrate 1 and the printed wiring board 2 to be inspected are brought into contact with each other and connected. It can be aligned with accuracy, and measurement inspection can be performed easily and reliably.
[0028]
Since both the electrode 3 and the contact 4 are part of the pattern formed on the printed wiring board, it is not necessary to add a special recognition mark, and for the electrode 3 and the contact 4 of any shape. Can respond.
[0029]
FIG. 4 is a cross-sectional view of the main part of the pressing portion provided with the inspection substrate having the reference mark and the alignment hole and the camera for recognition thereof. As shown in FIG. 4, the surface on which the electrode 3 is formed is shown. An inspected printed wiring board 2 provided with one or a plurality of reference marks 3d is provided. Further, the inspection substrate 1 having the alignment hole 15 is provided through the central portion of the reference mark 4k disposed in the same positional relationship as the reference mark 3d. The inspection substrate 1 and the substrate to be inspected are positioned on the side opposite to the surface provided with the contact portion 14 formed by the contact 4 of the inspection substrate 1 and at the position where the reference mark 3d can be detected by looking through the alignment hole 15. it is provided with a test printed circuit board pressing portions 20 of the second relative positional relationship recognizing camera 16 to one or chromatic plurality.
[0030]
According to the above configuration, the inspection substrate 1 and the inspected printed wiring board 2 can be aligned with high accuracy based on the positional relationship recognized by the camera 16. Further, since the inspection substrate 1 and the printed wiring board 2 to be inspected are matched in relative positional relationship, it is advantageous that the mounting position accuracy of the camera 16 does not significantly affect the alignment.
[0031]
The reference mark 3d can be processed at the same time as the contact portion 4 if the copper foil, which is a conductor material, is formed by photo-etching or laser cutting as in the case of forming the contact 4 that becomes the contact portion 14. The positional relationship with the contact portion 14 becomes high accuracy.
[0032]
FIG. 5 is a configuration diagram of the main part of an inspection apparatus provided with an alignment mechanism and a press drive unit capable of controlling the pressing force. As shown in FIG. 5, the inspection unit 18, wiring member 8a, and pressing unit 20 described above are shown. The operating body 38 is arranged on the outer periphery of the inspection substrate 1 of the basic inspection apparatus including the inspection substrate 1 and the printed wiring board 2 to be inspected. The operating body 38 operates with the alignment mechanism 33. In addition, a control unit 39 for arbitrarily setting and controlling the pressing force to the pressing unit 20 is provided, and the pressing unit 20 is operated via the press driving unit 37.
[0033]
The press drive unit 37 is disposed separately from the position where the driving force is not transmitted to the alignment mechanism 33, and the inspection substrate 1 and the printed wiring board 2 to be inspected can be aligned with high accuracy, and The pressing for contact is reliable and can be set with high accuracy.
[0034]
In addition, as the contact portion 14 deteriorates or the constituent material of the printed wiring board 2 to be inspected changes, the pressing force applied to the pressing portion 20 is changed by the control portion 39 and optimally set and controlled. The life of the contact portion 14 can be extended without damaging the printed wiring board 2.
[0035]
FIG. 6 is a configuration diagram of a main part of an inspection apparatus provided with an alignment confirmation mechanism combined with a trace addition body. As shown in FIG. 6, an inspection substrate 1 and an inspected printed wiring board 2 are added to a basic inspection apparatus including an inspection portion 18, a wiring member 8a, a pressing portion 20, an inspection substrate 1 and an inspected printed wiring board 2. In other words, in order to confirm that the contact portion 14 and the electrode 3 are in contact with each other and connected, a reference trace 42 is added when the contact and connection are made. Specifically, one or a plurality of trace addition bodies 41 such as dummy pins, conduction pins, or laser irradiation bodies are provided, and the alignment confirmation mechanism 40 is inserted and driven through the alignment holes 15 provided in the inspection substrate 1. Thus, the trace 42 is formed.
[0036]
If this part is further explained, the trace addition body 41 combined with the alignment confirmation mechanism 40 provided in the vicinity of the contact portion 14 and on the diagonal line is measured by inspecting the electrical connection state of the printed wiring board 2 to be inspected. At the same time, it is driven to add a trace 42 to the dummy electrode or resist of the printed wiring board 2 to be inspected. Then, after performing the measurement inspection, the trace 42 is detected by a recognition camera or the like, thereby confirming the alignment, that is, the state in which the contact portion 14 and the electrode 3 are in contact with and connected to each other. It is possible to easily and reliably confirm the alignment of the inspection printed wiring board 2 and the state of contact or contact.
[0037]
It is also possible to apply a method of applying ink, paint, or the like to a part of the surface of the contact portion 14 and transferring it when contacting the electrode 3.
[0038]
The case where a plurality of electrodes 3 are provided on one side of the printed wiring board 2 to be inspected has been described above. However, the printed wiring board 2 to be inspected having a plurality of electrodes 3 on both sides includes the same attachment mechanism as described above. If two or more inspection substrates 1 are provided and are arranged so as to sandwich the printed wiring board 2 to be inspected, and two or more inspection substrates 1 are integrated and moved to perform measurement and inspection. Good.
[0039]
【The invention's effect】
As described above, according to the present invention, measurement and inspection of a printed wiring board having a high-density electrode can be easily and reliably performed.
[Brief description of the drawings]
FIG. 1 is a cross-sectional view of a principal part of a printed wiring board inspection apparatus according to an embodiment of the present invention. FIG. 2 is a cross-sectional view of a principal part of the pressing part, an inspection substrate and a printed wiring board to be inspected. FIG. 4 is a configuration diagram of the main part of the alignment mechanism and the recognition mechanism. FIG. 4 is a configuration diagram of the main part of the pressing unit provided with the inspection substrate having the reference mark and the alignment hole and the recognition camera. Fig. 6 is a block diagram of the main part of an inspection apparatus provided with a press drive unit. Fig. 6 is a block diagram of the main part of an inspection apparatus provided with an alignment confirmation mechanism combined with the trace addition body. Main part configuration diagram [Explanation of symbols]
DESCRIPTION OF SYMBOLS 1 Inspection board | substrate 1b Lowermost layer 1c Uppermost layer 1d End surface 2 Inspected printed wiring board 3, 3f Electrode 3d, 4k Reference mark 4, 4d Contact 5, 5a Insulating base material 6 Conductive substance 7 Wiring pattern 8 Wiring terminal 8a Wiring material DESCRIPTION OF SYMBOLS 9 Spring probe 10 Press member 11 Inspection plate 12 Holder 14 Contact part 15 Positioning hole 16, 32 Camera 18 Inspection part 19 Connection part 20 Press part 21,21a Wiring part 21b Planar holding body 33 Alignment mechanism 37 Press drive part 38 Operation Body 39 Control unit 40 Alignment confirmation mechanism 41 Trace added body 42 Trace

Claims (1)

被検査プリント配線板に形成した複数の電極と対向した位置に配設された接点部、およびこの接点部に配線部を介して接続した配線端子を設けた検査用基板と、前記配線端子と圧接して電気的接続する接続部と、前記検査用基板と被検査プリント配線板との相対的位置関係を認識するカメラと、前記検査用基板と被検査プリント配線板を相対的に移動させるアライメント機構と、前記接点部を電極に接続すべく押圧する押圧部と、前記接続部に接続されて被検査プリント配線板の電気的接続状態を測定し検査する検査部とからなり、検査用基板には、被検査プリント配線板に設けた基準マークを透視する孔を設け、押圧部には孔を介して基準マークを検出するカメラを設置してなるプリント配線板の検査装置。An inspection board provided with a contact portion disposed at a position facing a plurality of electrodes formed on the printed wiring board to be inspected, and a wiring terminal connected to the contact portion via the wiring portion, and a pressure contact with the wiring terminal A connection part that is electrically connected, a camera that recognizes a relative positional relationship between the inspection substrate and the printed wiring board to be inspected, and an alignment mechanism that relatively moves the inspection substrate and the printed wiring board to be inspected. When a pressing portion for pressing to connect the contact portions to the electrodes, the Ri Do after being connected to the connecting portion and the inspection section for inspecting and measuring an electrical connection state of the objective printed circuit board, a substrate for inspection Is a printed wiring board inspection apparatus in which a hole for seeing through the reference mark provided on the printed wiring board to be inspected is provided, and a camera for detecting the reference mark is installed in the pressing portion through the hole .
JP2000384853A 2000-12-19 2000-12-19 Printed wiring board inspection equipment Expired - Fee Related JP3719137B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000384853A JP3719137B2 (en) 2000-12-19 2000-12-19 Printed wiring board inspection equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000384853A JP3719137B2 (en) 2000-12-19 2000-12-19 Printed wiring board inspection equipment

Publications (2)

Publication Number Publication Date
JP2002181874A JP2002181874A (en) 2002-06-26
JP3719137B2 true JP3719137B2 (en) 2005-11-24

Family

ID=18852224

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000384853A Expired - Fee Related JP3719137B2 (en) 2000-12-19 2000-12-19 Printed wiring board inspection equipment

Country Status (1)

Country Link
JP (1) JP3719137B2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4336170B2 (en) * 2003-09-10 2009-09-30 日本電産リード株式会社 Substrate inspection apparatus and laser beam irradiation position correction method
CN101930045A (en) * 2010-08-19 2010-12-29 黄道铭 Special on-off detection device of automobile window control switch connection terminal board
WO2014009542A2 (en) * 2012-07-12 2014-01-16 Konrad Gmbh Device for producing and/or processing a workpiece

Also Published As

Publication number Publication date
JP2002181874A (en) 2002-06-26

Similar Documents

Publication Publication Date Title
JP3976276B2 (en) Inspection device
JPWO2007000799A1 (en) Contactor, contact structure including the contactor, probe card, and test apparatus
CN1111357A (en) Printed circuit board test fixture and method
KR20050115297A (en) Connector for measurement of electric resistance, connector device for measurement of electric resistance and production process thereof, and measuring apparatus and measuring method of electric resistance for circuit board
WO2007007869A1 (en) Connector for measuring electrical resistance, and apparatus and method for measuring electrical resistance of circuit board
US20130206460A1 (en) Circuit board for semiconductor device inspection apparatus and manufacturing method thereof
JP3719137B2 (en) Printed wiring board inspection equipment
JP4725318B2 (en) COMPOSITE CONDUCTIVE SHEET AND METHOD FOR MANUFACTURING THE SAME, ANISOTROPIC CONDUCTIVE CONNECTOR, ADAPTER DEVICE, AND ELECTRIC INSPECTION DEVICE FOR CIRCUIT DEVICE
KR20180092027A (en) Probe card assembly
TWM469489U (en) Testing assembly and electrical testing device
US20080017508A1 (en) Non-contact type single side probe structure
JPS63243768A (en) Electrical connection apparatus to conductive pattern
JP2002005980A (en) Printed wiring board inspection jig, inspection device, and positioning method between printed wiring board and upper/lower inspection jig
JPH10253688A (en) Apparatus and method for continuity inspection of flexible circuit board
JPH0915289A (en) Inspection device for multilayer printed circuit board
JP2002181876A (en) Inspection device for printed circuit board
JP4264310B2 (en) Board inspection equipment
KR100947916B1 (en) Printed circuit board for probe card
JP3269492B2 (en) Inspection apparatus and inspection method for printed wiring board
JP2002181871A (en) Inspection device for printed circuit board
JP3230857B2 (en) Inspection method of printed wiring circuit
WO2021149668A1 (en) Probe, measuring device, and measuring method
JPH052867Y2 (en)
JP2007265705A (en) Anisotropic conductive connector and its application
JP2001099882A (en) Inspection equipment for printed wiring board

Legal Events

Date Code Title Description
A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20050221

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20050301

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20050428

RD01 Notification of change of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7421

Effective date: 20050630

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20050816

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20050829

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20080916

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20090916

Year of fee payment: 4

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20090916

Year of fee payment: 4

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20100916

Year of fee payment: 5

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110916

Year of fee payment: 6

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120916

Year of fee payment: 7

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130916

Year of fee payment: 8

LAPS Cancellation because of no payment of annual fees