KR20130107287A - 개선된 초음파 세정 방법 및 장치 - Google Patents
개선된 초음파 세정 방법 및 장치 Download PDFInfo
- Publication number
- KR20130107287A KR20130107287A KR1020137007408A KR20137007408A KR20130107287A KR 20130107287 A KR20130107287 A KR 20130107287A KR 1020137007408 A KR1020137007408 A KR 1020137007408A KR 20137007408 A KR20137007408 A KR 20137007408A KR 20130107287 A KR20130107287 A KR 20130107287A
- Authority
- KR
- South Korea
- Prior art keywords
- article
- ultrasonic
- megasonic energy
- processing
- resonator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/04—Cleaning involving contact with liquid
- B08B3/10—Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration
- B08B3/12—Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration by sonic or ultrasonic vibrations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P70/00—Cleaning of wafers, substrates or parts of devices
- H10P70/10—Cleaning before device manufacture, i.e. Begin-Of-Line process
- H10P70/15—Cleaning before device manufacture, i.e. Begin-Of-Line process by wet cleaning only
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0402—Apparatus for fluid treatment
- H10P72/0406—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H10P72/0411—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H10P72/0416—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing with the semiconductor substrates being dipped in baths or vessels
Landscapes
- Cleaning Or Drying Semiconductors (AREA)
- Cleaning By Liquid Or Steam (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/889,975 | 2010-09-24 | ||
| US12/889,975 US9662686B2 (en) | 2010-09-24 | 2010-09-24 | Ultrasonic cleaning method and apparatus |
| PCT/IB2011/054195 WO2012038933A2 (en) | 2010-09-24 | 2011-09-23 | Improved ultrasonic cleaning method and apparatus |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20130107287A true KR20130107287A (ko) | 2013-10-01 |
Family
ID=45869372
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020137007408A Ceased KR20130107287A (ko) | 2010-09-24 | 2011-09-23 | 개선된 초음파 세정 방법 및 장치 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US9662686B2 (https=) |
| JP (1) | JP5974009B2 (https=) |
| KR (1) | KR20130107287A (https=) |
| CN (1) | CN103118810B (https=) |
| SG (1) | SG188535A1 (https=) |
| TW (1) | TWI473668B (https=) |
| WO (1) | WO2012038933A2 (https=) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10391526B2 (en) | 2013-12-12 | 2019-08-27 | Lam Research Corporation | Electrostatic chuck cleaning fixture |
| TWI698291B (zh) * | 2016-11-02 | 2020-07-11 | 大陸商盛美半導體設備(上海)股份有限公司 | 襯底清洗方法及清洗裝置 |
| JP6554128B2 (ja) | 2017-02-28 | 2019-07-31 | 株式会社Subaru | 繊維強化複合材料の製造方法 |
| US10995422B2 (en) * | 2017-05-26 | 2021-05-04 | Sumitomo Electric Industries, Ltd. | GaAs substrate and method for manufacturing the same |
| CN107570482A (zh) * | 2017-07-06 | 2018-01-12 | 天津大学 | 界面的非特异性吸附物的去除装置及方法 |
| JP6715226B2 (ja) | 2017-10-25 | 2020-07-01 | 株式会社Subaru | 複合材成形治具及び複合材成形方法 |
| CN110560425B (zh) * | 2019-09-20 | 2021-01-29 | 深圳先进技术研究院 | 超声清洗装置、清洗方法及其应用 |
| US12269070B2 (en) * | 2020-12-16 | 2025-04-08 | The Boeing Company | Flexible cavitation apparatus |
| CN116581067B (zh) * | 2023-07-12 | 2023-09-22 | 北京东方金荣超声电器有限公司 | 基于器件湿法处理的兆声波系统的控制方法 |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5625249A (en) | 1994-07-20 | 1997-04-29 | Submicron Systems, Inc. | Megasonic cleaning system |
| JP3511441B2 (ja) | 1996-11-29 | 2004-03-29 | 忠弘 大見 | 洗浄やエッチング、現像、剥離等を含むウエット処理に用いる省液型の液体供給ノズル、ウエット処理装置及びウエット処理方法 |
| US6290778B1 (en) | 1998-08-12 | 2001-09-18 | Hudson Technologies, Inc. | Method and apparatus for sonic cleaning of heat exchangers |
| JP4608748B2 (ja) * | 1999-08-05 | 2011-01-12 | 東京エレクトロン株式会社 | 洗浄装置、洗浄システム及び洗浄方法 |
| US6729339B1 (en) * | 2002-06-28 | 2004-05-04 | Lam Research Corporation | Method and apparatus for cooling a resonator of a megasonic transducer |
| US7240679B2 (en) | 2002-09-30 | 2007-07-10 | Lam Research Corporation | System for substrate processing with meniscus, vacuum, IPA vapor, drying manifold |
| WO2004112093A2 (en) | 2003-06-06 | 2004-12-23 | P.C.T. Systems, Inc. | Method and apparatus to process substrates with megasonic energy |
| CN1822905A (zh) | 2003-06-06 | 2006-08-23 | P.C.T.系统公司 | 用兆频声波能量处理基片的方法和设备 |
| CN1976765B (zh) | 2004-06-29 | 2011-11-09 | 株式会社鹿儿岛超音波综合研究所 | 超声波清洗的方法与装置 |
| US7392814B2 (en) | 2004-12-24 | 2008-07-01 | Dainippon Screen Mfg. Co., Ltd. | Substrate processing apparatus and method |
| TWI259110B (en) | 2005-09-22 | 2006-08-01 | Delta Electronics Inc | Ultrasonic cleaning system and method |
| JP4652959B2 (ja) * | 2005-11-30 | 2011-03-16 | 芝浦メカトロニクス株式会社 | 基板の処理装置 |
| KR100710803B1 (ko) * | 2006-01-23 | 2007-04-23 | 삼성전자주식회사 | 기판 세정 장치 |
| JP2008021672A (ja) * | 2006-07-10 | 2008-01-31 | Sony Corp | ガス過飽和溶液を用いた超音波洗浄方法及び洗浄装置 |
| WO2008008921A2 (en) * | 2006-07-12 | 2008-01-17 | Akrion Technologies, Inc. | Tranducer assembly incorporating a transmitter having through holes, and method of cleaning |
| KR100931856B1 (ko) * | 2007-08-24 | 2009-12-15 | 세메스 주식회사 | 기판 세정 장치 및 기판 세정 방법 |
| JP2009178440A (ja) | 2008-01-31 | 2009-08-13 | Sammy Corp | 演出表示装置及び遊技機 |
-
2010
- 2010-09-24 US US12/889,975 patent/US9662686B2/en active Active
-
2011
- 2011-09-22 TW TW100134216A patent/TWI473668B/zh active
- 2011-09-23 SG SG2013018825A patent/SG188535A1/en unknown
- 2011-09-23 KR KR1020137007408A patent/KR20130107287A/ko not_active Ceased
- 2011-09-23 CN CN201180045874.3A patent/CN103118810B/zh active Active
- 2011-09-23 JP JP2013529756A patent/JP5974009B2/ja active Active
- 2011-09-23 WO PCT/IB2011/054195 patent/WO2012038933A2/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| TW201223652A (en) | 2012-06-16 |
| SG188535A1 (en) | 2013-05-31 |
| CN103118810A (zh) | 2013-05-22 |
| TWI473668B (zh) | 2015-02-21 |
| US20120073596A1 (en) | 2012-03-29 |
| CN103118810B (zh) | 2015-07-01 |
| WO2012038933A3 (en) | 2012-07-12 |
| JP5974009B2 (ja) | 2016-08-23 |
| JP2013543653A (ja) | 2013-12-05 |
| US9662686B2 (en) | 2017-05-30 |
| WO2012038933A2 (en) | 2012-03-29 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0105 | International application |
Patent event date: 20130322 Patent event code: PA01051R01D Comment text: International Patent Application |
|
| PG1501 | Laying open of application | ||
| A201 | Request for examination | ||
| PA0201 | Request for examination |
Patent event code: PA02012R01D Patent event date: 20160922 Comment text: Request for Examination of Application |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 20171019 Patent event code: PE09021S01D |
|
| E601 | Decision to refuse application | ||
| PE0601 | Decision on rejection of patent |
Patent event date: 20180425 Comment text: Decision to Refuse Application Patent event code: PE06012S01D Patent event date: 20171019 Comment text: Notification of reason for refusal Patent event code: PE06011S01I |