KR20130023072A - Clssification apparatus and operation method - Google Patents

Abstract

PURPOSE: A classifying apparatus and an operation method thereof are provided to repetitively perform inspection by circulating and returning a standard article consecutively. CONSTITUTION: A part supplier(1) supplies a LED chip(L) in an arrangement. A returning unit receives the LED chip from the part supplier, absorbs and supports the LED chip, passes through a test portion(31) in a supply position(30), and returns the LED chip to a discharge position(32). A test unit(2) is installed along the returning route of a returning unit and inspects the electrical and optical features of the LED chip in the test position. A distribution unit(4) is arranged in the lower side of the discharge position and classifies the discharged LED chip according to electrical and optical features. A classifying unit(5) is arranged in the lower side and includes multiple classifying tanks(50) storing LED chips returned through a tube(10).

Description

[0001] CLASSIFICATION APPARATUS AND OPERATION METHOD [0002]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an article sorting apparatus and an operation method thereof, and more particularly to an article sorting apparatus and method for sorting electronic parts such as LED elements.

BACKGROUND ART Conventionally, an electronic component sorting device as disclosed in Patent Document 1 is known. In the electronic component sorting apparatus disclosed in Patent Document 1, the electronic component W sucked by the suction nozzle 8 of the index table 2 and transported to the discharge position is blown by the nozzle 11, The charged electronic component W is supplied to the charging box 15 of the apparatus 4 through the distribution port 14A of the distribution member 14 required by rotation of the rotary pipe 13 .

Such a sorting apparatus for electronic parts has the following problems. That is, in discharging the electronic component W adsorbed by the suction nozzle 8 from the discharge position, the nozzle 11 blows the electronic component W in the horizontal direction with respect to the electronic component W, There is a risk that the electronic component W made of a soft material such as ceramics is broken. Further, since it is necessary to turn on / off the solenoid valve in order to blow from the nozzle 11, the discharge time becomes longer by the operation delay (time lag) of the solenoid valve.

Therefore, if the electronic part W is naturally dropped and put into a linear input tube that extends vertically, it is possible not only to reduce the possibility of such scratches of the work, but also to shorten the discharge time. As a sorting device of a natural drop type through such a discharge hole, a sorting device for an electronic part disclosed in Patent Document 2 is known.

In such a sorting apparatus for electronic components, the optical characteristics and electrical characteristics of the electronic components are inspected by the inspection apparatus, and the classification is performed based on the inspection. Therefore, when starting the operation of the sorting device of the electronic component, or when the lot or varieties of the electronic component to be inspected are changed, it is necessary to perform the test operation because of the adjustment of the inspection device.

In this test operation, the reference chip for calibration of the inspection apparatus previously inspected for the characteristics of the electronic component was repeatedly inspected, and the inspection apparatus was adjusted based on the inspection result. This test operation is usually performed several times a day.

However, in the sorting device for an electronic part shown in Document 2, since there is a discharge hole, continuous circulating transportation can not be performed for the test operation. In this case, the operator repeatedly supplies the reference chip, which is once passed through the inspection apparatus and is classified as the specified classification vessel, to the apparatus every few times during the test operation every day, and the work for the test operation becomes troublesome .

In the test operation for adjusting the inspection apparatus in the sorting apparatus for electronic components shown in Patent Document 1, the nozzle 11 is not blown while the suction of the suction nozzle 8 is maintained at the discharge position, (W) is continuously circulated on the index table 2 to be conveyed, thereby repeatedly passing the inspection apparatus. However, even in this case, there was a risk that the reference chip for calibration of the inspection apparatus would be broken at the time of discharging after the end of the test operation.

Here, the code used in the background art is a code used in Patent Document 1.

Japanese Patent No. 4474612 Patent Publication Japanese Patent No. 2814525 Patent Publication

SUMMARY OF THE INVENTION The present invention has been made to solve the above problems and has an object to provide a method and apparatus for automatically dropping a reference article at the time of ending a classification operation or a test operation at a sorting operation, Which is capable of repeatedly circulating and transporting a reference article during a test operation and is capable of repeatedly inspecting the same reference article by an inspection apparatus, And a method of operating the same.

In order to solve the above problems, the first invention employs the following means in the article sorting apparatus.

First, there are provided a rotating body including a rotating body having a plurality of receiving portions for respectively receiving articles on the outer periphery thereof, and a fixing body supporting the articles received in the receiving portions of the rotating body from below, An inspection unit provided along a conveying path of the conveying unit and inspecting the characteristics of the article; a plurality of sorting containers provided below the discharging unit; And a distributing means for sorting the discharged and installed articles into necessary classified containers based on the characteristics of the articles.

Secondly, a discharge unit closing means is provided for discharging the article when it is opened and blocking the falling of the article when the article is closed.

Thirdly, in the sorting operation of sorting the articles conveyed by the conveying means into necessary classified containers, the discharge unit closing means is opened to drop the articles.

Fourth, in the test operation in which the article is circulated and conveyed by the conveying means, the discharge unit closing means is closed to prevent the article from falling, thereby continuing the conveyance of the article by the conveying means.

The second invention is an article sorting apparatus to which the following means are added to the first invention

First, there is one supply path for supplying the article to the conveying means.

Secondly, in the sorting operation, an article is automatically supplied from the supply path.

Thirdly, in the test operation, the automatic supply of the article from the supply path is stopped and the reference article is manually supplied.

The third invention is an article sorting apparatus having the following means added to the first invention

First, there are two supply paths for supplying the article to the conveying means.

Secondly, in the sorting operation, the article is automatically supplied from the first supply path and the second supply path is closed.

Thirdly, in the test operation, the reference product is automatically supplied from the second supply path and the first supply path is closed.

The fourth invention adopts the following means for the operation method of the article sorting apparatus.

First, there are provided a rotating body including a rotating body having a plurality of receiving portions for respectively receiving articles on the outer periphery thereof, and a fixing body supporting the articles received in the receiving portions of the rotating body from below, An inspection unit provided along a conveying path of the conveying unit and inspecting the characteristics of the article; a plurality of sorting containers provided below the discharging unit; And a distributing means for sorting the discharged and installed articles into necessary classified containers based on the characteristics of the articles.

Secondly, a discharge unit closing means is provided for discharging the article when it is opened and blocking the falling of the article when the article is closed.

Thirdly, in the sorting operation of sorting the articles conveyed by the conveying means into necessary classified containers, the discharge unit closing means is opened to drop the articles.

Fourth, in the test operation in which the article is circulated and conveyed by the conveying means, the discharge unit closing means is closed to prevent the article from falling, thereby continuing the conveyance of the article by the conveying means.

The fifth invention is a method for operating an article sorting apparatus having the following means added to the fourth invention.

First, there is one supply path for supplying the article to the conveying means.

Secondly, in the sorting operation, an article is automatically supplied from the supply path.

Thirdly, in the test operation, the automatic supply of the article from the supply path is stopped and the reference article is manually supplied.

The sixth invention is a method for operating an article sorting apparatus, with the following means added to the fourth invention.

First, there are two supply paths for supplying the article to the conveying means.

Secondly, in the sorting operation, the article is automatically supplied from the first supply path and the second supply path is closed.

Thirdly, in the test operation, the reference product is automatically supplied from the second supply path and the first supply path is closed.

The first invention and the fourth invention are an article sorting apparatus and an operation method thereof which can facilitate the switching between the sorting operation and the test operation by a simple method of selecting whether to open or close the discharge unit closing means.

On the other hand, in the sorting operation, the article sorting apparatus and the operation method thereof can reduce the damage to the work-in-place article by simply opening the discharge section closing means and dropping the article by its own weight.

Further, in the test operation, the discharging portion closing means is closed to stop the falling of the article (since it is the test operation, therefore, the reference article), so that the conveyance of the reference article can be continuously continued and the same reference article can be repeatedly inspected by the inspection apparatus And has become an article sorting apparatus and a driving method thereof that can facilitate test operation.

In the second and fifth inventions, in the test operation in which the articles are automatically supplied in the sorting operation for sorting a plurality of articles by one supply path, and the same reference articles are circulated and transported, It is possible to eliminate the necessity of cumbersome work for removing the articles remaining in the supply path due to the test operation by manually stopping the reference article.

According to the third and sixth aspects of the present invention, two supply paths are provided, the supply paths are different in the sorting operation and the test operation, and in the sorting operation, the articles are automatically supplied from the first supply path, In the test operation, the reference product is automatically supplied from the second supply path, and the first supply path is closed. Thus, it is possible to eliminate the need for troublesome operation of removing the articles remaining in the supply path for each operation change there was.

1 is an outline explanatory diagram of an electronic part sorting apparatus showing one embodiment of the present invention;
2 is a plan view of the conveying means,
3 is a side explanatory view of the conveying means showing the supply position and the inspection position,
4 is a sectional explanatory view of the discharge position,
5 is an explanatory diagram showing a feeding method at a feeding position,
Fig. 6 is an explanatory diagram showing the positional relationship between the probe and the LED chip at the inspection position, in which (A) shows the state before and after the inspection, and Fig. 6 (B) shows the inspection.

Hereinafter, embodiments of the present invention will be described with reference to the embodiments shown in the drawings. 1 is an outline explanatory diagram of an electronic part sorting apparatus showing one embodiment of the present invention. In the embodiment, the work-in-parts are LED chips (L), and are devices for classifying the LED chips (L) by their electrical characteristics and optical characteristics.

The electronic part sorting apparatus includes a component feeder 1 for aligning and supplying the LED chip L and a component feeder 1 for picking up and holding the LED chip L from the component feeder 1, And an electrical characteristic and an optical characteristic of the LED chip L provided along the conveying path of the conveying means 3 are inspected at the inspection position 31, And a distributing device for sorting the LED chips (L) disposed on the lower side of the discharge position (specifically below the discharge part (61)) and based on electrical characteristics and optical characteristics (5) composed of a plurality of divided containers (50) for storing the LED chip (L), which is disposed below the LED chip (4) and is divided from the distribution device (4) Respectively.

The component feeder 1 is constituted by a feeder ball 11 and a rail 12 in which a plurality of LED chips L are arbitrarily accommodated as shown in Fig. 1, and the LED chip L is mounted on the feeder ball 11 as a means for feeding the LED chips L from the rails 12 to the conveying means 3 by arranging them in a line in the longitudinal direction from the rail 12 to the rail 12 as supply paths in the present invention. This supply path is one in the embodiment, but in the present invention, it is also possible to provide two supply paths, that is, a first supply path used in the sorting operation and a second supply path used in the test operation.

The conveying means 3 is constituted by a disk-shaped index table 7 which rotates intermittently as shown in Fig. 3, and a fixed table 6 which is arranged below the index table 7. As shown in Fig. The index table 7 becomes the rotating body of the present invention, and the fixed table 6 becomes the fixed body in the present invention.

A plurality of grooves are formed at a predetermined interval on the outer periphery 70 of the index table 7 and the grooves constitute pocket-like receiving portions 71 for accommodating the LED chips L. In the embodiment, the accommodating portions 71 are provided at equal intervals. On the back surface of the index table 7, a plurality of radial grooves 72 communicating with the respective receiving portions 71 are formed.

The fixing table 6 is provided with a support portion for supporting the LED chips L accommodated in the accommodating portions 71 from below and an LED chip L to fall down naturally to the distributing apparatus 4 disposed below the conveying means 3 is formed. The position where the discharge portion 61 is formed becomes the discharge position 32. [ The upper surface of the stationary table 6 excluding the discharge portion 61 in the discharge position 32 is a supporting portion.

The discharge portion 61 is provided with a shutter 8 serving as a discharge portion closing means in the present invention. The shutter 8 naturally drops the LED chip L at the time of opening and stops the dropping of the LED chip L at the time of closing the shutter so that the shutter 8 does not fall over the discharging portion 61. 2 and 4, the shutter 8 is formed in a disc shape having a discharge hole 80 through which the LED chip L can pass. The shutter 8 is rotatable with the shaft 83 as a fulcrum . Although the rotary shutter 8 as described above is used in the embodiment, it may be a forward-moving shutter or a removal shutter.

An auxiliary nozzle 81 is provided above the discharge portion 61. The auxiliary nozzle 81 is provided at a pressure such that the LED chip L is not broken to ensure discharge of the LED chip L. [ Air is blown downward from the upper side of the discharge hole 80 located above the discharge portion 61. A connection tube 82 is connected to the lower part of the discharge part 61 and a lower end of the connection tube 82 is connected to the distribution device 4.

The fixing table 6 is provided with a supply position 30 and an inspection position 31 in addition to the discharge position 32. The conveying means 3 sucks and supports the LED chip L in the receiving portion 71 of the fixing table 6 and the index table 7 to support the inspection position 31 in the feeding position 30 shown in Fig. And transports the LED chip L to the discharging position 32. [0050]

Therefore, it is necessary to cause the accommodating portion 71 to generate a negative pressure for adsorbing the LED chip L. Therefore, in the area where only the LED chip L is transported in the area other than the supply position 30, the inspection position 31 and the discharge position 32 on the upper surface of the fixed table 6, Grooves 62 communicating with the radial grooves 72 formed in the grooves 62 are engraved. The grooves 62 are connected to a vacuum source (not shown).

The concentric grooves 62 of the fixed table 6 and the radial grooves 72 of the index table 7 communicate with each other so that the LED chip L, And is sucked and supported by the accommodating portion 71. A separate groove is formed in each of the supply position 30 and the inspection position 31 of the fixed table 6 so as to supply a negative pressure to the accommodating portion 71 at each position.

The transport of the LED chip L from the supply position 30 to the accommodating portion 71 is carried out as follows. The LED chip L is inserted into the accommodating portion 71 of the index table 7 which is intermittently moved from the front end of the rail 12 of the component feeder 1 to the feed position 30 One at a time. More specifically, as shown in Fig. 5, the suction 2 of the LED chip L1 at the front end of the rail 12 is turned OFF, and the suction 1 is turned ON so that the LED chip L1 And transport it. That is, the LED chip L1 moves to the dotted line position in FIG.

At this time, a cover (33) which can be opened and opened is located above the accommodating portion (71) of the supply position (30). The cover 33 covers the upper portion of the accommodating portion 71 and the LED chip L can move smoothly into the accommodating portion 71. [

Even if the LED chip L1 is supplied to the accommodating portion 71, the suction 3 remains ON. In other words, the LED chip L2 is stopped at its original position. Next, the suction 2 is turned ON, and the suction 3 is turned OFF to move the LED chip L2, which is the next head, to the front end of the rail 12.

Whether or not the LED chip L1 is supplied to the accommodating portion 71 is detected by the acceptance detecting sensor 34. [ It is possible to detect whether or not the attitude of the supplied LED chip L is defective by observing the cover 33. [ The cover 33, which is pushed up by the defective LED chip L, is detected by the photo-micro sensor to detect that there is a storage error or the supply is not completed.

A side guide 9 (a side guide 90 having a special shape in the discharge position 32) is provided on the side of the index table 7 to prevent the LED chip L from jumping out. In the inspection position 31, a side and a top guide 91 for guiding the side and the upper side of the LED chip L4 existing in the inspection position 31 are provided.

The inspection apparatus 2 comprises a probe 20 provided so as to be able to move up and down below the inspection position 31 and an integrating sphere 21 provided above the inspection position 31. 6A to 6B, the probe 20 is raised so as to come into contact with the electrode of the LED chip L4 so that current is supplied to the LED chip L4 And the emitted light is received by the integrating sphere 21 to examine the electrical characteristics of the LED chip L4 together with the optical characteristics thereof.

The electronic part sorting apparatus includes a sorting operation for dropping the LED chip L loaded on the conveying means 3 to the discharge section 61 by opening the shutter 8 and sorting it into a required sorting container 50, It is necessary to perform the test operation for adjusting the inspection apparatus 2 by continuing the cyclic conveyance of the LED chip L while preventing the LED chip L from falling to the discharge section 61 by closing it. Hereinafter, the method of the classification operation and the test operation will be described.

The sorting operation is performed as follows. The LED chip L is automatically fed one by one from the leading end of the rail 12 of the component feeder 1 serving as the supply path to the accommodating portion 71 of the index table 7 . It is detected by the accommodation detection sensor 34 whether or not the LED chip L1 is supplied to the accommodation portion 71. [

When supply to the accommodating portion 71 is confirmed, the index table 7 rotates and the LED chip L4 reaches the inspection position 31 by intermittent conveyance. The probe 20 raised to the LED chip L4 thus reached is brought into contact with the light to cause the light to emit light, and the optical property and the electrical property are inspected by the integrator 21 provided above.

Since the discharge hole 80 of the shutter 8 is located in the discharge portion 61 when the LED chip L reaches above the discharge portion 61 of the discharge position 32 after the inspection, The falling of the chip L from the discharge portion 61 is not blocked by the shutter 8 but is discharged from the discharge portion 61. [

The LED chip L discharged from the discharge portion 61 through the discharge hole 80 drops naturally within the connection tube 82 as shown in Fig. 4, and the distribution device 4 And is classified into the required sorting containers 50 which are the sorting part 5 through the tube 10 according to the characteristics of the articles.

Next, the test operation is performed as follows. First, the discharge portion 61 is closed by the shutter 8, that is, the discharge hole 80 of the shutter 8 is rotated 90 degrees above the discharge portion 61, The LED chip L1 at the head of the rail 12 of the component feeder 1 is sucked and fixed and the automatic supply from the supply path is stopped. The suction 2 in Fig. 5 is turned ON.

Thereafter, the cover 33 of the supply position 30 is opened, and an operator holds an arbitrary number of reference chips of about 3 to 10 in the accommodating portion 71 of the index table 7. That is, the reference chip is manually supplied. For test operation, open the cover (33) and manually load the reference chip with tweezers.

The LED chip L that has passed through the inspection position 31 is discharged by the shutter 8 because the discharge portion 61 is closed by the shutter 8 when the cover 33 is then closed and the index table 7 is rotated, Passes through the shutter (8) which is closed even when passing through the portion (61), and is continuously circulated and conveyed so as to pass again through the inspection position (31).

After the end of the test operation, the shutter 8 is opened, that is, the discharge hole 80 of the shutter 8 is aligned on the discharge portion 61. The reference chip falls naturally at the discharge portion 61 which is opened at the time of passing, and is discharged to the required sorting container 50 to be completed. Here, the reference chip is used repeatedly.

Since the discharge unit 61 is closed by the shutter 8 in this manner, the reference chip can be circulated and transported, thereby facilitating the test operation. Further, in the test operation, the cover 33 is opened to supply the reference chip from the human hand. Therefore, for example, when returning from the emergency stop, a large number of LED chips L remain in the component feeder 1 The reference chip can be supplied and the test operation can be performed.

Further, since the reference chip is few in number even if the parts feeder 1 is empty, the supply of the reference chip by the hand of a person is simpler than the supply of the reference chip to the parts feeder 1 to supply the reference chip automatically. In the embodiment, the position for supplying the reference chip by the human hand at the time of the test operation is the supply position 30. However, the position for the manual supply is not limited, and the position may be other positions. Further, the cover may be provided at a desired position, and the cover may be opened only when supplied.

In the above embodiment, there is only one supply path (component feeder 1) for supplying the LED chip L or the reference chip to the transporting means 3, And the reference chip may be automatically supplied to the second supply path.

In this case, in the sorting operation, the LED chip L is automatically supplied from the first supply path and the second supply path is closed. In the test operation, the reference chip is automatically supplied from the second supply path, 1 Close the supply path and operate.

1 · · · · · · · · Parts feeder
2 · · · · Inspection device
3:
4 ······ Distribution device
5:
6 ......... fixed table
7 ... Index table
8 ······ Shutter
9 ···· Side guide
10 ... tube
11 · · · · Feeder Ball
12 ···· Rail
20 ······· Probe
21 · · · · · · · · · · · · · · ·
30 ····· Supply location
31 ····· Inspection position
32 ······ Discharge position
33 ····· Cover
· · · · · · · · · · · · · · · ·
50 Category
61:
62 · · · · · · · · · · · · · · · · · · ·
70 · · · · Outsourcing
71?
72 ... radial groove
80 ····· Outlet hole
81 ······ Auxiliary nozzle
82 ......... Connecting tube
83 ······ Axis
90 ····· Side guide
91 ····· Side and top guide
L1, L2, L3, L4 ......... LED chips

Claims (6)

A rotatable body having a plurality of accommodating portions accommodating articles in an outer periphery thereof and a fixed body supporting the articles accommodated in the accommodating portions of the rotatable body from below, (Conveying means) having a discharge position for discharging the article by dropping the article from a discharge section (discharge section) provided in the fixture,
Inspection means (inspection means) provided along the conveying path of the conveying means for inspecting the characteristics of the article,
A plurality of sorting containers (sorting containers) provided below the discharge portion,
And a distributing means (distributing means) provided below the discharging portion for sorting the discharged article into necessary classified containers based on the characteristics of the article
In the article sorting apparatus (article sorting apparatus)
And a discharge unit closing means (discharge unit closing means) provided in the discharge unit of the fixed body for dropping the article when it is opened and blocking the falling of the article when the article is closed,
In the sorting operation for sorting the articles conveyed by the conveying means into the required sorting containers, the discharge section closing means is opened to drop the articles,
Wherein in the test operation in which the article is circulated and conveyed by the conveying means, the discharge section closing means is closed to prevent the article from falling, thereby continuing the conveyance of the article by the conveying means.
The method according to claim 1,
Wherein in the sorting operation, the automatic supply of the article from the supply path is automatically stopped, and in the test operation, the automatic supply of the article from the supply path is stopped, And the article is manually fed.
The method according to claim 1,
Wherein in the sorting operation, the article is automatically supplied from the first supply path and the second supply path is closed, and in the test operation, the reference from the second supply path And automatically closes the first supply path while supplying the product automatically.
A rotatable body having a plurality of accommodating portions for respectively accommodating the articles on the outer periphery thereof and a fixture for supporting the articles accommodated in the accommodating portions of the rotatable body from below, A conveying means having a discharging position for discharging,
Inspection means provided along the conveyance path of the conveyance means for inspecting the characteristics of the article;
A plurality of sorting containers provided below the discharge portion,
And a distributing means provided below the discharging portion for sorting the discharged articles into necessary classified containers based on the characteristics of the articles
A method for operating an article sorting apparatus comprising:
A discharge unit closing means provided in the discharge portion of the fixed body for dropping the article when opened and blocking the falling of the article when closed and allowing the article to pass through the discharge portion,
In the sorting operation for sorting the articles conveyed by the conveying means into the required sorting containers, the discharge section closing means is opened to drop the articles,
In the test operation in which the article is circulated and conveyed by the conveying means, the discharge section closing means is closed to prevent the article from falling, thereby continuing the conveyance of the article by the conveying means
Wherein the method comprises:
5. The method of claim 4,
Wherein in the sorting operation, the automatic supply of the article from the supply path is automatically stopped, and in the test operation, the automatic supply of the article from the supply path is stopped, And the supply of the product is manually performed.
5. The method of claim 4,
Wherein in the sorting operation, the article is automatically supplied from the first supply path and the second supply path is closed, and in the test operation, the reference from the second supply path And automatically closes the first supply path when the supply of the product is stopped.

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