TWI559989B - Article classifying device and operating method thereof - Google Patents

Article classifying device and operating method thereof

Info

Publication number
TWI559989B
TWI559989B TW101130281A TW101130281A TWI559989B TW I559989 B TWI559989 B TW I559989B TW 101130281 A TW101130281 A TW 101130281A TW 101130281 A TW101130281 A TW 101130281A TW I559989 B TWI559989 B TW I559989B
Authority
TW
Taiwan
Prior art keywords
operating method
classifying device
article classifying
article
operating
Prior art date
Application number
TW101130281A
Other languages
Chinese (zh)
Other versions
TW201309397A (en
Inventor
Shunichi Hori
Original Assignee
Shibuya Kogyo Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shibuya Kogyo Co Ltd filed Critical Shibuya Kogyo Co Ltd
Publication of TW201309397A publication Critical patent/TW201309397A/en
Application granted granted Critical
Publication of TWI559989B publication Critical patent/TWI559989B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers

Landscapes

  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Sorting Of Articles (AREA)
TW101130281A 2011-08-22 2012-08-21 Article classifying device and operating method thereof TWI559989B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011180429A JP5866726B2 (en) 2011-08-22 2011-08-22 Article classification apparatus and operation method thereof

Publications (2)

Publication Number Publication Date
TW201309397A TW201309397A (en) 2013-03-01
TWI559989B true TWI559989B (en) 2016-12-01

Family

ID=47759838

Family Applications (1)

Application Number Title Priority Date Filing Date
TW101130281A TWI559989B (en) 2011-08-22 2012-08-21 Article classifying device and operating method thereof

Country Status (4)

Country Link
JP (1) JP5866726B2 (en)
KR (1) KR101960662B1 (en)
CN (1) CN102950117B (en)
TW (1) TWI559989B (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106269562A (en) * 2016-08-15 2017-01-04 太仓高创电气技术有限公司 A kind of for producing the test of flat bridge, Jiang Liao mechanism and method of work thereof
JP6838534B2 (en) * 2017-09-21 2021-03-03 日亜化学工業株式会社 Transport method of light emitting device and transport device of light emitting device
CN112345905A (en) * 2018-12-29 2021-02-09 温州易正科技有限公司 Positioning guide rail of diode performance detection equipment
CN112756275B (en) * 2020-12-30 2023-04-11 运易通科技有限公司 Air logistics transportation ground service classifier and using method
CN113231328A (en) * 2021-04-26 2021-08-10 东莞市科蓬达电子科技有限公司 Chip testing machine and testing method thereof
CN114505245A (en) * 2022-02-11 2022-05-17 深圳格芯集成电路装备有限公司 Collecting device, sorting equipment and sorting method

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05302948A (en) * 1992-04-27 1993-11-16 Anritsu Corp Setting device of component for calibration use
JP2814525B2 (en) * 1989-03-10 1998-10-22 松下電器産業株式会社 Electronic component classification device

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05293447A (en) * 1992-04-15 1993-11-09 Anritsu Corp Electronic part sorting apparatus
JP2929935B2 (en) * 1994-03-24 1999-08-03 日本電気株式会社 Classification equipment for semiconductor devices
JP4030031B2 (en) * 1998-05-13 2008-01-09 日本インター株式会社 Inspection method for electronic components
JP2001264385A (en) * 2000-03-23 2001-09-26 Mitsubishi Electric Corp Automatic ic transport device and automatic ic inspection method
JP4474612B2 (en) 2004-09-09 2010-06-09 澁谷工業株式会社 Electronic component classification device
JP4760188B2 (en) * 2005-07-28 2011-08-31 パナソニック株式会社 Cylindrical article inspection method and inspection apparatus therefor
KR100713799B1 (en) * 2006-04-07 2007-05-04 (주)알티에스 Apparatus for dual electronic part inspection
JP2008014909A (en) * 2006-07-10 2008-01-24 Fujifilm Corp Adjustment method for light source in image sensor elements inspection system, and device thereof
US7973259B2 (en) * 2007-05-25 2011-07-05 Asm Assembly Automation Ltd System for testing and sorting electronic components
JP5309631B2 (en) * 2008-03-14 2013-10-09 澁谷工業株式会社 Classification device
JP5453011B2 (en) * 2009-08-07 2014-03-26 株式会社ヒューモラボラトリー Electronic component characteristic inspection and classification device
JP5510916B2 (en) * 2009-09-11 2014-06-04 上野精機株式会社 Semiconductor manufacturing equipment

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2814525B2 (en) * 1989-03-10 1998-10-22 松下電器産業株式会社 Electronic component classification device
JPH05302948A (en) * 1992-04-27 1993-11-16 Anritsu Corp Setting device of component for calibration use

Also Published As

Publication number Publication date
JP2013044549A (en) 2013-03-04
CN102950117A (en) 2013-03-06
JP5866726B2 (en) 2016-02-17
KR101960662B1 (en) 2019-03-21
TW201309397A (en) 2013-03-01
CN102950117B (en) 2016-06-08
KR20130023072A (en) 2013-03-07

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