KR20120013322A - 전도성 라인, 나노입자, 잉크 및 패터닝 - Google Patents

전도성 라인, 나노입자, 잉크 및 패터닝 Download PDF

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Publication number
KR20120013322A
KR20120013322A KR1020117024088A KR20117024088A KR20120013322A KR 20120013322 A KR20120013322 A KR 20120013322A KR 1020117024088 A KR1020117024088 A KR 1020117024088A KR 20117024088 A KR20117024088 A KR 20117024088A KR 20120013322 A KR20120013322 A KR 20120013322A
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KR
South Korea
Prior art keywords
tip
ink
substrate
line
stamp
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
KR1020117024088A
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English (en)
Korean (ko)
Inventor
셍-춘 헝
옴카르 나프데이
제이슨 알. 하헤임
Original Assignee
나노잉크, 인크.
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Filing date
Publication date
Application filed by 나노잉크, 인크. filed Critical 나노잉크, 인크.
Publication of KR20120013322A publication Critical patent/KR20120013322A/ko
Withdrawn legal-status Critical Current

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    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0002Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y40/00Manufacture or treatment of nanostructures
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/10Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
    • H05K3/12Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using thick film techniques, e.g. printing techniques to apply the conductive material or similar techniques for applying conductive paste or ink patterns
    • H05K3/1241Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using thick film techniques, e.g. printing techniques to apply the conductive material or similar techniques for applying conductive paste or ink patterns by ink-jet printing or drawing by dispensing
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/09Use of materials for the conductive, e.g. metallic pattern
    • H05K1/092Dispersed materials, e.g. conductive pastes or inks
    • H05K1/097Inks comprising nanoparticles and specially adapted for being sintered at low temperature
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/01Tools for processing; Objects used during processing
    • H05K2203/0195Tool for a process not provided for in H05K3/00, e.g. tool for handling objects using suction, for deforming objects, for applying local pressure
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/24Structurally defined web or sheet [e.g., overall dimension, etc.]
    • Y10T428/24802Discontinuous or differential coating, impregnation or bond [e.g., artwork, printing, retouched photograph, etc.]

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Nanotechnology (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Manufacturing & Machinery (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Inks, Pencil-Leads, Or Crayons (AREA)
  • Manufacturing Of Printed Wiring (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
KR1020117024088A 2009-04-14 2010-04-13 전도성 라인, 나노입자, 잉크 및 패터닝 Withdrawn KR20120013322A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US16925409P 2009-04-14 2009-04-14
US61/169,254 2009-04-14
PCT/US2010/030928 WO2010120809A1 (en) 2009-04-14 2010-04-13 Conducting lines, nanoparticles, inks, and patterning

Publications (1)

Publication Number Publication Date
KR20120013322A true KR20120013322A (ko) 2012-02-14

Family

ID=42289105

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020117024088A Withdrawn KR20120013322A (ko) 2009-04-14 2010-04-13 전도성 라인, 나노입자, 잉크 및 패터닝

Country Status (7)

Country Link
US (1) US20100288543A1 (https=)
EP (1) EP2419793A1 (https=)
JP (1) JP2012524411A (https=)
KR (1) KR20120013322A (https=)
AU (1) AU2010236563A1 (https=)
CA (1) CA2754701A1 (https=)
WO (1) WO2010120809A1 (https=)

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KR20250091048A (ko) * 2023-12-13 2025-06-20 국립금오공과대학교 산학협력단 전극 패턴의 형성방법 및 이를 포함하는 전극
KR20250097660A (ko) * 2023-12-20 2025-06-30 주식회사 에이아이시티 전도성 소재를 활용한 결함부위 감지 및 모니터링 시스템

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Cited By (2)

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Publication number Priority date Publication date Assignee Title
KR20250091048A (ko) * 2023-12-13 2025-06-20 국립금오공과대학교 산학협력단 전극 패턴의 형성방법 및 이를 포함하는 전극
KR20250097660A (ko) * 2023-12-20 2025-06-30 주식회사 에이아이시티 전도성 소재를 활용한 결함부위 감지 및 모니터링 시스템

Also Published As

Publication number Publication date
EP2419793A1 (en) 2012-02-22
WO2010120809A1 (en) 2010-10-21
US20100288543A1 (en) 2010-11-18
CA2754701A1 (en) 2010-10-21
JP2012524411A (ja) 2012-10-11
AU2010236563A1 (en) 2011-09-22

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PA0105 International application

Patent event date: 20111013

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application
PC1203 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid