KR20110033786A - 무연마제 화학 기계 연마 조성물 - Google Patents
무연마제 화학 기계 연마 조성물 Download PDFInfo
- Publication number
- KR20110033786A KR20110033786A KR1020100090903A KR20100090903A KR20110033786A KR 20110033786 A KR20110033786 A KR 20110033786A KR 1020100090903 A KR1020100090903 A KR 1020100090903A KR 20100090903 A KR20100090903 A KR 20100090903A KR 20110033786 A KR20110033786 A KR 20110033786A
- Authority
- KR
- South Korea
- Prior art keywords
- acid
- methacrylic acid
- weight
- composition
- copolymer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/04—Aqueous dispersions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
- H10P52/40—Chemomechanical polishing [CMP]
- H10P52/403—Chemomechanical polishing [CMP] of conductive or resistive materials
Landscapes
- Chemical & Material Sciences (AREA)
- Dispersion Chemistry (AREA)
- Organic Chemistry (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/586,642 US20110073800A1 (en) | 2009-09-25 | 2009-09-25 | Abrasive-free chemical mechanical polishing compositions |
| US12/586,642 | 2009-09-25 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20110033786A true KR20110033786A (ko) | 2011-03-31 |
Family
ID=43779265
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020100090903A Withdrawn KR20110033786A (ko) | 2009-09-25 | 2010-09-16 | 무연마제 화학 기계 연마 조성물 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20110073800A1 (https=) |
| JP (1) | JP2011082512A (https=) |
| KR (1) | KR20110033786A (https=) |
| CN (1) | CN102031065B (https=) |
| TW (1) | TW201127924A (https=) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20140129175A (ko) * | 2012-03-16 | 2014-11-06 | 가부시키가이샤 후지미인코퍼레이티드 | 연마용 조성물 |
| CN113969173A (zh) * | 2021-09-23 | 2022-01-25 | 易安爱富(武汉)科技有限公司 | 一种ITO/Ag/ITO复合金属层薄膜的蚀刻液 |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2014034425A1 (ja) * | 2012-08-31 | 2014-03-06 | 株式会社 フジミインコーポレーテッド | 研磨用組成物及び基板の製造方法 |
| US20140308814A1 (en) * | 2013-04-15 | 2014-10-16 | Applied Materials, Inc | Chemical mechanical polishing methods and systems including pre-treatment phase and pre-treatment compositions |
| CN104002252B (zh) * | 2014-05-21 | 2016-06-01 | 华侨大学 | 超细磨料生物高分子柔性抛光膜及其制备方法 |
| US10181408B2 (en) * | 2017-01-31 | 2019-01-15 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing method for tungsten using polyglycols and polyglycol derivatives |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4270480B2 (ja) * | 1999-04-30 | 2009-06-03 | 綜研化学株式会社 | アクリル系重合体の製造法 |
| JP2001300285A (ja) * | 2000-04-18 | 2001-10-30 | Sanyo Chem Ind Ltd | 研磨用砥粒分散剤及び研磨用スラリー |
| JP2004517980A (ja) * | 2000-09-21 | 2004-06-17 | ローム アンド ハース カンパニー | 極性モノマーと多価カチオンとに関わる方法および組成物 |
| US6433061B1 (en) * | 2000-10-24 | 2002-08-13 | Noveon Ip Holdings Corp. | Rheology modifying copolymer composition |
| US7288616B2 (en) * | 2002-01-18 | 2007-10-30 | Lubrizol Advanced Materials, Inc. | Multi-purpose polymers, methods and compositions |
| US7435356B2 (en) * | 2004-11-24 | 2008-10-14 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Abrasive-free chemical mechanical polishing compositions and methods relating thereto |
-
2009
- 2009-09-25 US US12/586,642 patent/US20110073800A1/en not_active Abandoned
-
2010
- 2010-09-16 KR KR1020100090903A patent/KR20110033786A/ko not_active Withdrawn
- 2010-09-21 TW TW099131937A patent/TW201127924A/zh unknown
- 2010-09-21 CN CN2010102981564A patent/CN102031065B/zh not_active Expired - Fee Related
- 2010-09-24 JP JP2010213450A patent/JP2011082512A/ja active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20140129175A (ko) * | 2012-03-16 | 2014-11-06 | 가부시키가이샤 후지미인코퍼레이티드 | 연마용 조성물 |
| CN113969173A (zh) * | 2021-09-23 | 2022-01-25 | 易安爱富(武汉)科技有限公司 | 一种ITO/Ag/ITO复合金属层薄膜的蚀刻液 |
| CN113969173B (zh) * | 2021-09-23 | 2022-05-13 | 易安爱富(武汉)科技有限公司 | 一种ITO/Ag/ITO复合金属层薄膜的蚀刻液 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN102031065A (zh) | 2011-04-27 |
| TW201127924A (en) | 2011-08-16 |
| CN102031065B (zh) | 2013-09-11 |
| US20110073800A1 (en) | 2011-03-31 |
| JP2011082512A (ja) | 2011-04-21 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| PC1203 | Withdrawal of no request for examination |
St.27 status event code: N-1-6-B10-B12-nap-PC1203 |
|
| WITN | Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid | ||
| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |