KR20110033786A - 무연마제 화학 기계 연마 조성물 - Google Patents
무연마제 화학 기계 연마 조성물 Download PDFInfo
- Publication number
- KR20110033786A KR20110033786A KR1020100090903A KR20100090903A KR20110033786A KR 20110033786 A KR20110033786 A KR 20110033786A KR 1020100090903 A KR1020100090903 A KR 1020100090903A KR 20100090903 A KR20100090903 A KR 20100090903A KR 20110033786 A KR20110033786 A KR 20110033786A
- Authority
- KR
- South Korea
- Prior art keywords
- acid
- methacrylic acid
- weight
- composition
- copolymer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/04—Aqueous dispersions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
- H10P52/40—Chemomechanical polishing [CMP]
- H10P52/403—Chemomechanical polishing [CMP] of conductive or resistive materials
Landscapes
- Chemical & Material Sciences (AREA)
- Dispersion Chemistry (AREA)
- Organic Chemistry (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/586,642 | 2009-09-25 | ||
| US12/586,642 US20110073800A1 (en) | 2009-09-25 | 2009-09-25 | Abrasive-free chemical mechanical polishing compositions |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20110033786A true KR20110033786A (ko) | 2011-03-31 |
Family
ID=43779265
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020100090903A Withdrawn KR20110033786A (ko) | 2009-09-25 | 2010-09-16 | 무연마제 화학 기계 연마 조성물 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20110073800A1 (https=) |
| JP (1) | JP2011082512A (https=) |
| KR (1) | KR20110033786A (https=) |
| CN (1) | CN102031065B (https=) |
| TW (1) | TW201127924A (https=) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20140129175A (ko) * | 2012-03-16 | 2014-11-06 | 가부시키가이샤 후지미인코퍼레이티드 | 연마용 조성물 |
| CN113969173A (zh) * | 2021-09-23 | 2022-01-25 | 易安爱富(武汉)科技有限公司 | 一种ITO/Ag/ITO复合金属层薄膜的蚀刻液 |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102155205B1 (ko) * | 2012-08-31 | 2020-09-11 | 가부시키가이샤 후지미인코퍼레이티드 | 연마용 조성물 및 기판의 제조 방법 |
| US20140308814A1 (en) * | 2013-04-15 | 2014-10-16 | Applied Materials, Inc | Chemical mechanical polishing methods and systems including pre-treatment phase and pre-treatment compositions |
| CN104002252B (zh) * | 2014-05-21 | 2016-06-01 | 华侨大学 | 超细磨料生物高分子柔性抛光膜及其制备方法 |
| US10181408B2 (en) * | 2017-01-31 | 2019-01-15 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing method for tungsten using polyglycols and polyglycol derivatives |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4270480B2 (ja) * | 1999-04-30 | 2009-06-03 | 綜研化学株式会社 | アクリル系重合体の製造法 |
| JP2001300285A (ja) * | 2000-04-18 | 2001-10-30 | Sanyo Chem Ind Ltd | 研磨用砥粒分散剤及び研磨用スラリー |
| BR0113999A (pt) * | 2000-09-21 | 2003-08-12 | Rohm & Haas | Processo para preparar uma dispersão polimérica aquosa nanocompósita de argila, dispersão nanocompósita aquosa, espessador, dispersante, aglutinante, composição de tinta flexográfica, verniz de sobre impressão, modificador de pó de cimento seco, semente polimérica nanocompósita de argila, composição polimérica nanocompósita de argila, e, método para preparar uma pluralidade de partìculas poliméricas nanocompósitas de argila ocas |
| US6433061B1 (en) * | 2000-10-24 | 2002-08-13 | Noveon Ip Holdings Corp. | Rheology modifying copolymer composition |
| US7288616B2 (en) * | 2002-01-18 | 2007-10-30 | Lubrizol Advanced Materials, Inc. | Multi-purpose polymers, methods and compositions |
| US7435356B2 (en) * | 2004-11-24 | 2008-10-14 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Abrasive-free chemical mechanical polishing compositions and methods relating thereto |
-
2009
- 2009-09-25 US US12/586,642 patent/US20110073800A1/en not_active Abandoned
-
2010
- 2010-09-16 KR KR1020100090903A patent/KR20110033786A/ko not_active Withdrawn
- 2010-09-21 CN CN2010102981564A patent/CN102031065B/zh not_active Expired - Fee Related
- 2010-09-21 TW TW099131937A patent/TW201127924A/zh unknown
- 2010-09-24 JP JP2010213450A patent/JP2011082512A/ja active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20140129175A (ko) * | 2012-03-16 | 2014-11-06 | 가부시키가이샤 후지미인코퍼레이티드 | 연마용 조성물 |
| CN113969173A (zh) * | 2021-09-23 | 2022-01-25 | 易安爱富(武汉)科技有限公司 | 一种ITO/Ag/ITO复合金属层薄膜的蚀刻液 |
| CN113969173B (zh) * | 2021-09-23 | 2022-05-13 | 易安爱富(武汉)科技有限公司 | 一种ITO/Ag/ITO复合金属层薄膜的蚀刻液 |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201127924A (en) | 2011-08-16 |
| CN102031065B (zh) | 2013-09-11 |
| CN102031065A (zh) | 2011-04-27 |
| US20110073800A1 (en) | 2011-03-31 |
| JP2011082512A (ja) | 2011-04-21 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| PC1203 | Withdrawal of no request for examination |
St.27 status event code: N-1-6-B10-B12-nap-PC1203 |
|
| WITN | Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid | ||
| PN2301 | Change of applicant |
St.27 status event code: A-3-3-R10-R13-asn-PN2301 St.27 status event code: A-3-3-R10-R11-asn-PN2301 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |