KR20100094224A - 태양전지 및 이의 제조방법 - Google Patents
태양전지 및 이의 제조방법 Download PDFInfo
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- KR20100094224A KR20100094224A KR1020090013547A KR20090013547A KR20100094224A KR 20100094224 A KR20100094224 A KR 20100094224A KR 1020090013547 A KR1020090013547 A KR 1020090013547A KR 20090013547 A KR20090013547 A KR 20090013547A KR 20100094224 A KR20100094224 A KR 20100094224A
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- electrode
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- 238000000034 method Methods 0.000 title claims abstract description 48
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 24
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 70
- 229910052751 metal Inorganic materials 0.000 claims abstract description 68
- 239000002184 metal Substances 0.000 claims abstract description 68
- 239000010703 silicon Substances 0.000 claims abstract description 65
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims abstract description 64
- 239000000758 substrate Substances 0.000 claims abstract description 60
- 229910021332 silicide Inorganic materials 0.000 claims abstract description 34
- FVBUAEGBCNSCDD-UHFFFAOYSA-N silicide(4-) Chemical compound [Si-4] FVBUAEGBCNSCDD-UHFFFAOYSA-N 0.000 claims abstract description 33
- 238000002161 passivation Methods 0.000 claims abstract description 19
- 238000009413 insulation Methods 0.000 claims abstract description 6
- 238000010438 heat treatment Methods 0.000 claims description 17
- 229910052721 tungsten Inorganic materials 0.000 claims description 15
- 229910052804 chromium Inorganic materials 0.000 claims description 8
- 229910052802 copper Inorganic materials 0.000 claims description 8
- 229910052750 molybdenum Inorganic materials 0.000 claims description 8
- 150000004767 nitrides Chemical class 0.000 claims description 8
- 229910052697 platinum Inorganic materials 0.000 claims description 8
- 229910052692 Dysprosium Inorganic materials 0.000 claims description 7
- 229910052691 Erbium Inorganic materials 0.000 claims description 7
- 229910052693 Europium Inorganic materials 0.000 claims description 7
- 229910052688 Gadolinium Inorganic materials 0.000 claims description 7
- 229910052689 Holmium Inorganic materials 0.000 claims description 7
- 229910052779 Neodymium Inorganic materials 0.000 claims description 7
- 229910052777 Praseodymium Inorganic materials 0.000 claims description 7
- 229910052772 Samarium Inorganic materials 0.000 claims description 7
- 229910052771 Terbium Inorganic materials 0.000 claims description 7
- 229910052775 Thulium Inorganic materials 0.000 claims description 7
- 229910052769 Ytterbium Inorganic materials 0.000 claims description 7
- 229910052737 gold Inorganic materials 0.000 claims description 7
- 229910052735 hafnium Inorganic materials 0.000 claims description 7
- 229910052741 iridium Inorganic materials 0.000 claims description 7
- 229910052700 potassium Inorganic materials 0.000 claims description 7
- 229910052709 silver Inorganic materials 0.000 claims description 7
- 229910052715 tantalum Inorganic materials 0.000 claims description 7
- 229910052719 titanium Inorganic materials 0.000 claims description 7
- 229910052725 zinc Inorganic materials 0.000 claims description 7
- 229910052733 gallium Inorganic materials 0.000 claims description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 4
- QPLDLSVMHZLSFG-UHFFFAOYSA-N Copper oxide Chemical compound [Cu]=O QPLDLSVMHZLSFG-UHFFFAOYSA-N 0.000 claims description 4
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 claims description 4
- 229910021417 amorphous silicon Inorganic materials 0.000 claims description 3
- 239000012298 atmosphere Substances 0.000 claims description 3
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 2
- 229910052684 Cerium Inorganic materials 0.000 claims description 2
- 229910006404 SnO 2 Inorganic materials 0.000 claims description 2
- 229910045601 alloy Inorganic materials 0.000 claims description 2
- 239000000956 alloy Substances 0.000 claims description 2
- 229910001873 dinitrogen Inorganic materials 0.000 claims description 2
- 229910021389 graphene Inorganic materials 0.000 claims description 2
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 claims description 2
- 229910021421 monocrystalline silicon Inorganic materials 0.000 claims description 2
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims 1
- 229910052738 indium Inorganic materials 0.000 claims 1
- 229910052814 silicon oxide Inorganic materials 0.000 claims 1
- 239000010408 film Substances 0.000 description 41
- 239000010410 layer Substances 0.000 description 22
- 230000008569 process Effects 0.000 description 19
- 239000000463 material Substances 0.000 description 10
- 238000005229 chemical vapour deposition Methods 0.000 description 8
- 230000005684 electric field Effects 0.000 description 7
- 239000007772 electrode material Substances 0.000 description 6
- 238000005240 physical vapour deposition Methods 0.000 description 5
- 238000000231 atomic layer deposition Methods 0.000 description 4
- 230000004888 barrier function Effects 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 4
- 238000009792 diffusion process Methods 0.000 description 4
- 238000004544 sputter deposition Methods 0.000 description 4
- 239000010409 thin film Substances 0.000 description 4
- 235000012431 wafers Nutrition 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000000313 electron-beam-induced deposition Methods 0.000 description 3
- 238000005530 etching Methods 0.000 description 3
- 238000001451 molecular beam epitaxy Methods 0.000 description 3
- 229920002120 photoresistant polymer Polymers 0.000 description 3
- 230000006798 recombination Effects 0.000 description 3
- 238000005215 recombination Methods 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- VLJQDHDVZJXNQL-UHFFFAOYSA-N 4-methyl-n-(oxomethylidene)benzenesulfonamide Chemical compound CC1=CC=C(S(=O)(=O)N=C=O)C=C1 VLJQDHDVZJXNQL-UHFFFAOYSA-N 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 229910021340 platinum monosilicide Inorganic materials 0.000 description 2
- 238000004151 rapid thermal annealing Methods 0.000 description 2
- 239000002994 raw material Substances 0.000 description 2
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 238000000137 annealing Methods 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 239000000969 carrier Substances 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 239000000356 contaminant Substances 0.000 description 1
- 229910021419 crystalline silicon Inorganic materials 0.000 description 1
- 238000005137 deposition process Methods 0.000 description 1
- 238000007598 dipping method Methods 0.000 description 1
- 230000005264 electron capture Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000005224 laser annealing Methods 0.000 description 1
- 238000001465 metallisation Methods 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 239000012299 nitrogen atmosphere Substances 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 238000006748 scratching Methods 0.000 description 1
- 230000002393 scratching effect Effects 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0216—Coatings
- H01L31/02161—Coatings for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/02167—Coatings for devices characterised by at least one potential jump barrier or surface barrier for solar cells
- H01L31/02168—Coatings for devices characterised by at least one potential jump barrier or surface barrier for solar cells the coatings being antireflective or having enhancing optical properties for the solar cells
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0236—Special surface textures
- H01L31/02366—Special surface textures of the substrate or of a layer on the substrate, e.g. textured ITO/glass substrate or superstrate, textured polymer layer on glass substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/06—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier
- H01L31/07—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier the potential barriers being only of the Schottky type
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Abstract
Description
Claims (13)
- 텍스처링된 실리콘 기판;상기 텍스처링된 기판 전면에 걸쳐 형성된 패시배이션막;상기 패시배이션막 전면에 걸쳐 형성된 반사방지막;상기 기판의 하부에 패터닝된 전극; 및상기 전극 사이의 절연을 위해 형성된 절연막을 구비한 후면 전극형 태양전지에 있어서,상기 전극은 금속 실리사이드를 포함하는 것인 후면 전극형 태양전지.
- 실리콘 기판;상기 기판의 상부에 형성된 전면 투명 전극;상기 기판의 하부에 패터닝된 전극; 및상기 전극 사이의 절연을 위해 형성된 절연막을 구비한 후면 전극형 태양전지에 있어서,상기 전극은 금속 실리사이드를 포함하는 것인 후면 전극형 태양전지.
- 제1항 또는 제2항에 있어서,상기 금속 실리사이드는 Ce, Pr, Nd, Pm, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu, Ni, Ti, Co, Cu, Pt, W, Cr, Mo, W, Au, Ag, Zn, Ir, Ta, Hf, K, Li, Cs Co, Cu, Pt, W, Cr, Mo 및 이들의 합금으로 이루어진 군에서 선택된 1종의 금속을 포함하는 실리사이드인 것인 후면 전극형 태양전지.
- 제1항 또는 제2항에 있어서,상기 실리콘 기판은 단결정 실리콘, 다결정 실리콘, 도핑된 실리콘, 비정질 실리콘, SixGe1-X(X는 0<X<1의 수), SixN1-x(X는 0<X<1의 수), 및 SiC으로 이루어진 군에서 선택된 1종을 포함하는 박형 기판인 것인 후면 전극형 태양전지.
- 제1항에 있어서,상기 패시배이션막은 실리콘 산화막인 것인 후면 전극형 태양전지.
- 제1항 또는 제2항에 있어서,상기 절연막은 Si, Ga, Ge, Ce, Pr, Nd, Pm, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu, Ni, Ti, Co, Cu, Pt, W, Cr, Mo, W, Au, Ag, Zn, Ir, Ta, Hf, K, Li, Cs 및 이들의 조합으로 이루어진 군에서 선택된 1종의 금속을 포함하는 산화물인 것인 후면 전극형 태양전지.
- 제1항에 있어서,상기 전극은 정공 포집용 전극 및 전자 포집용 전극인 것인 후면 전극형 태 양전지.
- 제1항에 있어서,상기 반사방지막은 Si, Ga, Ge, Ce, Pr, Nd, Pm, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu, Ni, Ti, Co, Cu, Pt, W, Cr, Mo, W, Au, Ag, Zn, Ir, Ta, Hf, K, Li, Cs 및 이들의 조합으로 이루어진 군에서 선택된 1종의 금속을 포함하는 산화물, 질화물 또는 이들의 조합인 것인 후면 전극형 태양전지.
- 제2항에 있어서,상기 전극은 정공 포집용 전극 또는 전자 포집용 전극인 것인 후면 전극형 태양전지.
- 제2항에 있어서,상기 전면 투명 전극은 In2O3, SnO2, CuO, 그라핀(Graphene), ZnO, 산화인듐주석(Indium Tin Oxide(ITO)) 및 이들의 조합으로 이루어진 군에서 선택된 1종을 포함하는 것인 후면 전극형 태양전지.
- 실리콘 기판을 텍스처링하는 단계;상기 텍스처링된 기판의 상부에 패시배이션막을 형성하는 단계;상기 패시배이션막 전면에 걸쳐 반사방지막을 형성하는 단계;상기 기판의 하부에 패터닝된 절연막을 형성하는 단계;상기 절연막 패턴 사이에 전극용 금속층을 형성하는 단계; 및열처리를 수행하여 상기 금속층을 금속 실리사이드를 포함하는 전극으로 형성하는 단계를 포함하는 제1항의 후면 전극형 태양전지의 제조방법.
- 실리콘 기판을 제공하는 단계;상기 기판의 상부에 전면 투명 전극을 형성하는 단계;상기 기판의 하부에 패터닝된 절연막을 형성하는 단계;상기 절연막 패턴 사이에 전극용 금속층을 형성하는 단계; 및열처리를 수행하여 상기 전극용 금속층을 금속 실리사이드 전극으로 형성하는 단계를 포함하는 제2항의 후면 전극형 태양전지의 제조방법.
- 제11항 또는 제12항에 있어서,상기 열처리는 질소가스(N2) 분위기 하에서 100℃∼1000℃에서 10초 내지 1시간 동안 수행하는 것인 후면 전극형 태양전지의 제조방법.
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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WO2013009056A2 (ko) * | 2011-07-11 | 2013-01-17 | 주식회사 두산 | 그라핀과 ito를 함유하는 투명전극 |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
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KR101830782B1 (ko) | 2011-09-22 | 2018-04-05 | 삼성전자주식회사 | 그래핀을 포함하는 전극 구조체 및 전계효과 트랜지스터 |
KR101264368B1 (ko) | 2011-12-07 | 2013-05-14 | 한국기계연구원 | 다층 구조의 쇼트키 접합층을 갖는 태양 전지 |
KR101920724B1 (ko) | 2012-12-11 | 2018-11-21 | 삼성전자주식회사 | 그래핀을 포함하는 전자 소자 |
KR101951019B1 (ko) | 2018-03-23 | 2019-02-21 | 영남대학교 산학협력단 | Cigs 박막 태양전지 및 이의 제조방법 |
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WO2013009056A2 (ko) * | 2011-07-11 | 2013-01-17 | 주식회사 두산 | 그라핀과 ito를 함유하는 투명전극 |
WO2013009056A3 (ko) * | 2011-07-11 | 2013-03-07 | 주식회사 두산 | 그라핀과 ito를 함유하는 투명전극 |
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