KR20100065321A - 가스의 화학적 조성을 확인하는 방법 및 장치 - Google Patents

가스의 화학적 조성을 확인하는 방법 및 장치 Download PDF

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Publication number
KR20100065321A
KR20100065321A KR1020107005150A KR20107005150A KR20100065321A KR 20100065321 A KR20100065321 A KR 20100065321A KR 1020107005150 A KR1020107005150 A KR 1020107005150A KR 20107005150 A KR20107005150 A KR 20107005150A KR 20100065321 A KR20100065321 A KR 20100065321A
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South Korea
Prior art keywords
plasma
gas
power
chamber
atoms
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English (en)
Korean (ko)
Inventor
조셉 알. 몬코우스키
바르톤 레인
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피포탈 시스템즈 코포레이션
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Publication of KR20100065321A publication Critical patent/KR20100065321A/ko
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N7/00—Analysing materials by measuring the pressure or volume of a gas or vapour
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/68—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using high frequency electric fields

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  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Drying Of Semiconductors (AREA)
  • Plasma Technology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
KR1020107005150A 2007-08-07 2008-08-01 가스의 화학적 조성을 확인하는 방법 및 장치 Ceased KR20100065321A (ko)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US96397407P 2007-08-07 2007-08-07
US60/963,974 2007-08-07
US2045708P 2008-01-11 2008-01-11
US61/020,457 2008-01-11

Publications (1)

Publication Number Publication Date
KR20100065321A true KR20100065321A (ko) 2010-06-16

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Family Applications (1)

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KR1020107005150A Ceased KR20100065321A (ko) 2007-08-07 2008-08-01 가스의 화학적 조성을 확인하는 방법 및 장치

Country Status (7)

Country Link
US (2) US7940395B2 (OSRAM)
EP (1) EP2185909A4 (OSRAM)
JP (1) JP2010539443A (OSRAM)
KR (1) KR20100065321A (OSRAM)
CN (1) CN101784878B (OSRAM)
TW (1) TWI396224B (OSRAM)
WO (1) WO2009020881A1 (OSRAM)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20140051211A (ko) * 2011-06-06 2014-04-30 램 리써치 코포레이션 에칭 동안 가스 스위칭과 rf 스위칭을 동기화시키기 위한 스펙트럼의 사용

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US8716655B2 (en) * 2009-07-02 2014-05-06 Tricorntech Corporation Integrated ion separation spectrometer
US20120129318A1 (en) * 2010-11-24 2012-05-24 Semiconductor Energy Laboratory Co., Ltd. Atmospheric pressure plasma etching apparatus and method for manufacturing soi substrate
US8609548B2 (en) 2011-06-06 2013-12-17 Lam Research Corporation Method for providing high etch rate
JP6095901B2 (ja) * 2012-05-24 2017-03-15 株式会社Ihi 物質特定装置および物質特定方法
KR101791870B1 (ko) * 2013-02-19 2017-11-02 세메스 주식회사 검사 방법, 이를 포함하는 기판 처리 방법 및 기판 처리 장치
US9454158B2 (en) 2013-03-15 2016-09-27 Bhushan Somani Real time diagnostics for flow controller systems and methods
EP3204741A4 (en) * 2014-10-10 2018-06-06 Orthobond, Inc. Method for detecting and analyzing surface films
CN108028214B (zh) * 2015-12-30 2022-04-08 玛特森技术公司 用于毫秒退火系统的气体流动控制
US10504720B2 (en) * 2016-11-29 2019-12-10 Taiwan Semiconductor Manufacturing Company, Ltd. Etching using chamber with top plate formed of non-oxygen containing material
US10983537B2 (en) 2017-02-27 2021-04-20 Flow Devices And Systems Inc. Systems and methods for flow sensor back pressure adjustment for mass flow controller
US10685819B2 (en) * 2017-05-25 2020-06-16 Applied Materials, Inc. Measuring concentrations of radicals in semiconductor processing
JP2020136473A (ja) * 2019-02-19 2020-08-31 株式会社東芝 半導体装置の製造方法
TWI897405B (zh) * 2019-03-25 2025-09-11 日商亞多納富有限公司 半導體製造系統、其控制方法及控制該系統的電腦程式
US20220093428A1 (en) * 2020-09-21 2022-03-24 Applied Materials, Inc. Atomic oxygen detection in semiconductor processing chambers

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JPH0722151B2 (ja) * 1984-05-23 1995-03-08 株式会社日立製作所 エツチングモニタ−方法
US5405488A (en) * 1993-09-13 1995-04-11 Vlsi Technology, Inc. System and method for plasma etching endpoint detection
JP3333657B2 (ja) * 1995-02-10 2002-10-15 サイエンステクノロジー株式会社 気相エッチング装置及び気相エッチング方法
US5711843A (en) * 1995-02-21 1998-01-27 Orincon Technologies, Inc. System for indirectly monitoring and controlling a process with particular application to plasma processes
JPH11102895A (ja) * 1997-09-29 1999-04-13 Fujitsu Ltd 半導体装置の製造方法
US5986747A (en) * 1998-09-24 1999-11-16 Applied Materials, Inc. Apparatus and method for endpoint detection in non-ionizing gaseous reactor environments
DE60036801T2 (de) * 1999-07-23 2008-07-24 Efthimion Emerging Industries, Llc Vorrichtung zur kontinuierlichen überwachung von emissionen verschiedener metalle in rauhen umgebungen
JP3565774B2 (ja) * 2000-09-12 2004-09-15 株式会社日立製作所 プラズマ処理装置及び処理方法
JP2002270574A (ja) * 2001-03-07 2002-09-20 Hitachi Kokusai Electric Inc プラズマエッチング装置
US7052943B2 (en) * 2001-03-16 2006-05-30 Semiconductor Energy Laboratory Co., Ltd. Method of manufacturing a semiconductor device
CN1153056C (zh) * 2001-04-10 2004-06-09 华邦电子股份有限公司 以光学方法测量温度并监控蚀刻率的方法
KR100426988B1 (ko) * 2001-11-08 2004-04-14 삼성전자주식회사 반도체 제조장비의 식각 종말점 검출장치 및 그에 따른검출방법
US20030129117A1 (en) * 2002-01-02 2003-07-10 Mills Randell L. Synthesis and characterization of a highly stable amorphous silicon hydride as the product of a catalytic hydrogen plasma reaction
US8580076B2 (en) * 2003-05-22 2013-11-12 Lam Research Corporation Plasma apparatus, gas distribution assembly for a plasma apparatus and processes therewith
US20040235299A1 (en) * 2003-05-22 2004-11-25 Axcelis Technologies, Inc. Plasma ashing apparatus and endpoint detection process
US7072028B2 (en) * 2003-07-25 2006-07-04 Lightwind Corporation Method and apparatus for chemical monitoring
US7053994B2 (en) * 2003-10-28 2006-05-30 Lam Research Corporation Method and apparatus for etch endpoint detection
JP4849875B2 (ja) * 2005-11-17 2012-01-11 東京エレクトロン株式会社 プラズマエッチング方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20140051211A (ko) * 2011-06-06 2014-04-30 램 리써치 코포레이션 에칭 동안 가스 스위칭과 rf 스위칭을 동기화시키기 위한 스펙트럼의 사용

Also Published As

Publication number Publication date
US8237928B2 (en) 2012-08-07
US20110177625A1 (en) 2011-07-21
TW200917330A (en) 2009-04-16
TWI396224B (zh) 2013-05-11
EP2185909A1 (en) 2010-05-19
US7940395B2 (en) 2011-05-10
JP2010539443A (ja) 2010-12-16
CN101784878B (zh) 2012-08-08
EP2185909A4 (en) 2015-08-05
WO2009020881A1 (en) 2009-02-12
US20090180113A1 (en) 2009-07-16
CN101784878A (zh) 2010-07-21

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