KR20070109357A - Liquid crystal display panel testing device and testing method thereof - Google Patents

Abstract

An apparatus and a method for inspecting a liquid crystal panel are provided to supply a test power signal driving the liquid crystal panel in an anti static-electricity circuit of the liquid crystal panel to prevent a defective inspection due to a defective contact between a liquid crystal panel and an inspection probe. At least one probe(100) includes a plurality of connection pins respectively connected to a gate line, a data line, and a storage voltage supply line connected to an anti static-electricity circuit of a liquid crystal panel. A tape carrier package generates and supplies a test driving signal to the probe. A printed circuit board includes a power unit and a timing controller supplying a power signal and a control signal to the tape carrier package. The power unit supplies a test power signal to the storage voltage supply line.

Description

Liquid crystal panel inspection apparatus and method {LIQUID CRYSTAL DISPLAY PANEL TESTING DEVICE AND TESTING METHOD THEREOF}

1 is a perspective view illustrating a liquid crystal panel inspection device according to a first embodiment of the present invention.

FIG. 2 is a view illustrating the inside of the bracket illustrated in FIG. 1 in detail.

FIG. 3 is a plan view illustrating the liquid crystal panel illustrated in FIG. 1 in detail.

4 is a flowchart sequentially illustrating a liquid crystal panel inspection method using a liquid crystal panel inspection apparatus according to an exemplary embodiment of the present invention.

<Brief Description of Main Drawing Numbers>

10: liquid crystal panel 11: color filter substrate

12: thin film transistor substrate 21: data metal pad

25: gate metal pad 27: storage voltage supply line

28: storage metal pad 30: antistatic circuit

100: probe 110, 120: connection pin

130: driver IC 140: TCP

150: printed circuit board 160: power circuit

170: timing controller 180: power supply

300: stage 500: bracket

The present invention relates to a liquid crystal panel inspection apparatus, and more particularly, to a liquid crystal panel inspection apparatus and a method for preventing a liquid crystal panel inspection error due to a poor contact between the liquid crystal panel and the inspection probe.

In general, a liquid crystal display device displays an image by adjusting the light transmittance using an electric field. The liquid crystal display includes a liquid crystal panel, a panel driver for supplying a driving signal to the liquid crystal panel, and a backlight unit for supplying light to the liquid crystal panel.

Such a liquid crystal display device inspects the liquid crystal panel before attaching a tape carrier package (hereinafter referred to as 'TCP') in which a driving circuit is mounted on the liquid crystal panel.

In general, a method of inspecting a liquid crystal panel connects a connection pin of a probe to each of a gate line and a data line of a liquid crystal panel to supply a driving signal to discriminate between good and bad products through a displayed image.

Specifically, defects of the signal lines of the liquid crystal panel are provided by connecting the metal pads connected to the gate lines and the data lines formed on the thin film transistor substrate of the liquid crystal panel and the connection pins of the probe for inspection and supplying a test drive signal to the probe. Alternatively, a gross test for testing a defective pixel is performed. Next, a test image signal is supplied to the liquid crystal panel determined to be good after the gross test, and an image driving test is performed to transfer the TCP including the drive circuit to the liquid crystal panel finally determined to be good.

Here, when the connection pin of the probe is connected to the metal pad of the liquid crystal panel during the high resolution liquid crystal panel inspection, the metal pad and the connection pin of the probe are formed at a fine pitch to be connected at very close intervals. At this time, since the connecting pins of the connected probes are very thin for fine pitch, they are bent or broken when connecting to the metal pads, resulting in poor connection between the connecting pins and the metal pads.

For example, if a connection line of an arbitrary data line and probe occurs and a connection error occurs, the pixel area connected to the data line cannot be driven, and thus color cannot be displayed even if it is connected to a normally formed data line. . In this case, since the inspector determines that the defect is a problem, there is a problem that can not use the normal liquid crystal panel.

The technical problem to be achieved by the present invention is to supply a test power signal for driving the liquid crystal panel to the antistatic circuit of the liquid crystal panel, the liquid crystal panel inspection to prevent the inspection error due to the poor contact between the liquid crystal panel and the inspection probe during the liquid crystal panel inspection To provide an apparatus and method.

In order to solve the above technical problem, the present invention, at least one probe with a plurality of connecting pins connected to each of the storage line supply line connected to the gate line and data line of the liquid crystal panel and the antistatic circuit, and the test on the probe A tape carrier package generating and supplying a driving signal, a printed circuit board mounted with a power supply unit and a timing controller for supplying a power signal and a control signal to the tape carrier package, and supplying a test power signal to the storage voltage supply line. Provided is a liquid crystal panel inspection device having a power supply unit.

The probe further includes a gate probe connected to a gate metal pad connected to a gate line of the liquid crystal panel.

The probe further includes a data probe connected to a data metal pad connected to a data line of the liquid crystal panel.

At least one of the plurality of connection pins formed in the data probe is connected to the storage voltage supply line.

The tape carrier package may include a driving integrated circuit configured to generate a driving signal for driving each of the gate line and the data line.

The test power signal supplied from the power supply unit is supplied to the storage line via the printed circuit board, the tape carrier package and the probe, and the test power signal supplied to the storage line is prevented from being connected to the storage line. And is supplied to the data line via a circuit.

The printed circuit board further includes a power supply circuit and a timing controller for supplying a power signal, a control signal, and an image signal to each of the gate line and the data line.

The liquid crystal panel is further provided with a stage having a light source for mounting the light to the liquid crystal panel.

In order to solve the above technical problem, the present invention provides a method of connecting a probe having a plurality of connection pins to a gate line and a data line of a liquid crystal panel and a storage line connected to an antistatic circuit, and connected to the storage line. And a gross test by supplying a test power signal to a connection pin and an image driving test by supplying a driving signal to the gate line and the data line.

In the step of connecting the probe having a plurality of connection pins to each of the gate line and data line of the liquid crystal panel and the storage voltage supply line connected to the antistatic circuit, a separate probe for supplying a test power signal independently to the storage voltage supply line Connecting to the storage voltage supply line.

In a step of supplying a test power signal to a connection pin connected to the storage voltage supply line, the test power signal is further generated by a power supply and supplied via a printed circuit board, a tape carrier package and a probe.

Other technical problems and features of the present invention in addition to the above technical problem will become apparent through the description of the embodiments with reference to the accompanying drawings.

Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to FIGS. 1 to 4.

1 is a perspective view illustrating a liquid crystal panel inspecting apparatus according to an exemplary embodiment of the present invention, FIG. 2 is a view illustrating the inside of the bracket of the liquid crystal panel inspecting apparatus illustrated in FIG. 1 in detail, and FIG. A plan view of the illustrated liquid crystal panel is illustrated in detail.

1 and 2, the liquid crystal panel inspection apparatus according to the present invention includes a storage voltage supply line 27 connected to a gate line GL, a data line DL, and an antistatic circuit 30 of the liquid crystal panel 10. And at least one probe 100 having a plurality of connection pins 110 and 120 connected to each of the storage lines STL connected to the storage voltage supply line 27 and a test driving signal to the probe 100. Printed circuit board 150 and storage voltage supply line 27 mounted with a power supply unit 180 and a timing controller 170 for supplying a power supply signal and a control signal to the TCP 140 and the TCP 140. And a power supply unit 180 for supplying a test power signal.

Specifically, the liquid crystal panel 10 injects a liquid crystal between the thin film transistor substrate 12 having the thin film transistor TFT and the color filter substrate 11 having the color filter and bonds the two substrates together.

In the color filter substrate 11, pixels for displaying an image are formed. Therefore, the light transmitted through the liquid crystal is expressed in a predetermined color through the pixel to implement the image.

The thin film transistor substrate 12 illustrated in FIG. 3 has a gate line GL in each of the pixel regions defined by crossing the gate line GL and the data line DL, and the gate line GL and the data line DL. And a thin film transistor TFT connected to the data line DL, and a pixel electrode connected to each thin film transistor TFT formed in the pixel region. In addition, a storage voltage supply line 27 connected to the storage line STL and the storage line STL parallel to the gate line GL and supplied with a storage voltage is further formed. Here, an antistatic circuit 30 is further formed between any one storage line STL and each data line DL. One end of the antistatic circuit 30 is connected to the storage line STL and the other end thereof is connected to the data line DL. The antistatic circuit 30 bypasses static electricity induced in the data line DL and the pixel region to the outside through the storage voltage supply line 27 connected to the storage line STL and the storage line STL, and stores the storage voltage. In order to prevent static electricity induced in the supply line 27 from being induced into the pixel region or the data line DL, at least two diodes connected in the reverse direction are connected in parallel.

The gate line GL extends to the outside of the thin film transistor substrate 12 and is electrically connected to the gate metal pad 25 connected to the gate driving IC. The data line DL extends to the outside of the thin film transistor substrate 12 and is electrically connected to the data metal pad 21 connected to the data driver IC. In this case, the gate and data metal pads 21 and 25 are formed at narrow intervals for connection with the TCP 140 in which the driving ICs are mounted. Gate and data metal pads 21 and 25 formed at narrow intervals are connected to each of the connection pins 120 of the probe 100. The storage voltage supply line 27 extends to the outside of the thin film transistor substrate 12 to be electrically connected to the storage metal pad 28.

The panel inspection apparatus for inspecting the liquid crystal panel 10 includes a probe 100, a TCP 140 connected to each of the connection pins 110 formed on the other side of the connection pin 120 of the probe 100, and a TCP ( 140 is connected to the printed circuit board 150 on which the power supply circuit 160 and the timing controller 170 are mounted, and the power supply unit 180 connected to any one of the probe 100 or the printed circuit board 150. It includes a bracket 500 including.

The bracket 500 is formed in a box shape so that the TCP 140, the printed circuit board 150, and the power supply unit 180 are built-in, and one side of the bracket 500 is formed with a plurality of through holes to protrude outward. .

The probe 100 includes a plurality of connection pins 120 electrically connected to gates GL and / or data metal pads 25 and 21 connected to the gate line GL or the data line DL of the liquid crystal panel 10, respectively. do. In addition, a plurality of connection pins 110 connected to the TCP 140 are provided on opposite sides of the metal pads 21 and 25. Here, the plurality of connection pins 110 and 120 are electrically connected to each other. The connection pins 110 and 120 correspond to the metal pads 110 and 120 in a one-to-one correspondence to supply test image signals. The plurality of connection pins 110 and 120 may be formed to have the same pitch as that of the gate and data metal pads 21 and 25. In other words, the number of gate lines GL and data lines DL is determined according to the resolution of the liquid crystal panel 10, and the pitch is determined according to the resolution and the size of the liquid crystal panel 10. The pitch between the connection pins 110 and 120 is also determined according to the resolution and size of the liquid crystal panel 10. The probe 100 includes a gate probe transmitting a test signal to the gate metal pad 25 connected to the gate line GL, and a data probe transmitting a test signal to the data metal pad 21 connected to the data line, respectively. A separate power supply probe for supplying a power signal to the storage voltage supply line 27 may be further provided.

Here, instead of the power supply probe 100 connected to the storage voltage supply line 27, a separate connection pin 127 connected to the storage voltage supply line 27 may be formed on one side of the gate probe or the data probe. . In this case, the connection pin 127 connecting to the storage metal pad 28 connected to the storage voltage supply line 27 may be formed at the outermost side of the probe 100.

The probe 100 has a plurality. That is, the liquid crystal panel 10 is tested by supplying a test image signal by providing as many probes 100 as the number of TCPs 140. In addition, when a plurality of data lines DL or a plurality of gate lines GL are formed in one block, for example, as many as the number of connection pins 120 formed in the probe 100, a test may be performed for each single block. have.

In the TCP 140, the driving IC 130 is mounted on the film on which the signal line is formed. The TCP 140 mounts a driving IC 130 suitable for the characteristics of the liquid crystal panel 10 to be inspected and supplies a driving signal. That is, it is preferable to use the same drive IC as the drive IC 130 used in the liquid crystal display device to be commercialized. Here, in the TCP 140, the gate driving IC is mounted when connected to the gate probe, and the data driving IC 130 is mounted when connected to the data probe 100. Through this, the gate driving signal and the data driving signal may be supplied through the respective TCPs 140 during the inspection.

The printed circuit board 150 supplies a power signal, a control signal, and image signals of R (red), G (green), and B (blue) to the TCP 140. That is, the printed circuit board 150 is mounted with a power supply circuit 160 for generating a power signal for driving the drive IC 130 included in the TCP 140, and controls the timing of the gate drive signal and the data drive signal. A timing controller 170 for generating a control signal is mounted, and an image signal supply unit for supplying R, G, B image signals is mounted. The image signal supply unit stores a predetermined pattern or a moving image for the image test of the liquid crystal panel 10.

The power supply unit 180 generates and supplies a test driving voltage of 8V to 10V to the storage voltage supply line 27 of the liquid crystal panel 10. The test power signal supplied from the power supply unit 180 is supplied to the antistatic circuit 30 along the storage voltage supply line 27 via the printed circuit board 150, the TCP 140, and the probe 100 in order. The test power signal supplied to the antistatic circuit 30 is supplied to each data line DL connected to one side of the antistatic circuit 30 and drives the data line DL to supply a voltage to the pixel, thereby providing a liquid crystal panel. Supplied to (10). When the test power signal is supplied to the liquid crystal panel 10, the entire pixel area of the liquid crystal panel 10 is simultaneously driven to detect a defect. In other words, the test power signal supplied from the power supply unit 180 through the antistatic circuit 30 connected to any one storage line STL between each data line DL and the storage voltage supply line 27. Is applied to drive the entire liquid crystal panel 10 simultaneously. As a result, when the plurality of connection pins 120 formed on the data probe 100 are connected to the respective data lines DL, a phenomenon in which the pixel region cannot be driven even when a connection defect occurs is prevented, thereby preventing the phenomenon of good quality liquid crystal panel ( 10) can be prevented from being classified as defective.

Here, the liquid crystal panel 10 judged as good quality carries out the test which supplies a test image pattern, and drives an actual image. The test image signal is applied to the probe 100 connected to each of the data lines DL for inspection. The test image signal transmits a still pattern or supplies a moving image to the liquid crystal panel 10 through the probe 100.

The liquid crystal panel inspection apparatus further includes a stage 300 on which the liquid crystal panel 10 is seated.

The stage 300 further includes a light source for supplying light to the liquid crystal panel 10 on a seating surface on which the liquid crystal panel 10 is mounted, and supplies light when the liquid crystal panel 10 is tested.

4 is a flowchart sequentially illustrating a method for inspecting a liquid crystal panel according to an exemplary embodiment of the present invention.

Referring to FIG. 4, the method for inspecting a liquid crystal panel according to the present invention includes connecting a probe to a metal pad and a storage line connected to a gate line and a data line of the liquid crystal panel (S10), and supplying a test power signal through a power supply unit. And a step of performing a gross test (S20), and a step of performing an image test by removing a power signal and applying an image test signal through a probe.

Specifically, the connection pin 120 of the probe 100 is connected to the gate and data metal pads 21 and 25 connected to the gate line GL and the data line DL of the liquid crystal panel 10, respectively. At this time, the gate probe connected to the gate metal pad 25 connected to the gate line GL and the data probe connected to the data metal pad 21 connected to the data line DL are transferred to each metal pad 21. 25). In this case, when the gate driving circuit is integrated in the liquid crystal panel 10 or mounted on the liquid crystal panel 10, the gate probe is unnecessary, so that some connection pins of the data probe are supplied to the gate driving circuit on the liquid crystal panel 10. Connect to the line. In addition, the connection pin 127 of the probe 100 is connected to the storage voltage supply line 27. The connection pin 127 connected to the storage voltage supply line 27 is formed in the gate probe or the data probe, or is formed in a separate probe.

Next, the connection pin 127 connected to the storage voltage supply line 27 receives the test drive signal supplied from the power supply unit 180 and supplies the test driving signal to the storage voltage supply line 27, and an antistatic circuit connected to the storage line. It is supplied to each data line via 30. The liquid crystal panel 10 is driven through the supplied test power signal to perform a glow test. In this case, since the test power signal is supplied to the same liquid crystal panel 10 as a whole, the liquid crystal panel 10 in which a defect in a signal line or a defect in a pixel is detected is transferred to another process in order to rework or discard (S40). Include. And the good liquid crystal panel performs an image test.

Next, the supply of the test power signal supplied to the storage line is stopped, and the image driving test is performed through the gate probe and the data probe. The gate probe and the data probe are supplied with a moving picture test signal or a still picture signal. Through this, the image test of the liquid crystal panel is performed. The liquid crystal panel judged as good quality is transferred to the next step (S50)), for example, the TCP attachment process, and the liquid crystal panel determined as defective is transferred to the rework or discarded process.

This prevents defective product judgment due to poor connection between the liquid crystal panel gate line or the connection pin of the probe connected to the metal pad connected to the gate line. Since the gross test and the image driving test are performed for the same time in the same process, the inspection time can be shortened.

As described above, the liquid crystal panel inspection apparatus according to the present invention can prevent the good liquid crystal panel from being incorrectly detected as a defective liquid crystal panel due to a poor connection between the connection pin of the probe and the signal line of the liquid crystal panel during the image test.

Further, the inspection time can be shortened by simultaneously performing the gross test for detecting the connection state of the signal line of the panel and the defect of the pixel and the driving test of the image.

The present invention described above will be capable of various substitutions, modifications and changes by those skilled in the art to which the present invention pertains. Therefore, the present invention should not be limited to the above-described embodiments and the accompanying drawings, and the rights thereof should be determined by the claims.

Claims (11)

At least one probe having a plurality of connection pins connected to the gate line and the data line of the liquid crystal panel and the storage voltage supply line connected to the antistatic circuit; A tape carrier package generating and supplying a test drive signal to the probe; A printed circuit board mounted with a power supply unit and a timing controller for supplying a power signal and a control signal to the tape carrier package; And a power supply unit supplying a test power signal to the storage voltage supply line. The method of claim 1, The probe further comprises a gate probe connected to the gate metal pad connected to the gate line of the liquid crystal panel. The method of claim 1, And the probe further comprises a data probe connected to a data metal pad connected to a data line of the liquid crystal panel. The method of claim 3, wherein And at least one of the plurality of connection pins formed in the data probe is connected to the storage voltage supply line. The method of claim 1, The tape carrier package is a liquid crystal panel inspection apparatus, characterized in that a driving integrated circuit for generating a driving signal for driving each of the gate line and the data line. The method of claim 1, The test power signal supplied from the power supply unit is supplied to the storage line via the printed circuit board, the tape carrier package and the probe, and the test power signal supplied to the storage line is prevented from being connected to the storage line. The liquid crystal panel inspection device, characterized in that supplied to the data line via a circuit. The method of claim 1, The printed circuit board further comprises a power supply circuit and a timing controller for supplying a power signal, a control signal and an image signal to each of the gate line and the data line. The method of claim 1, And a stage having a light source for seating the liquid crystal panel and supplying light to the liquid crystal panel. Connecting a probe having a plurality of connection pins to each of a gate line and a data line of the liquid crystal panel and a storage line connected to an antistatic circuit; Supplying a test power signal to a connection pin connected to the storage line to perform a gross test; And supplying a driving signal to the gate line and the data line to perform an image driving test. The method of claim 9, In the step of connecting a probe having a plurality of connection pins to each of the gate line and data line of the liquid crystal panel and the storage voltage supply line connected to the antistatic circuit, And connecting a separate probe to the storage voltage supply line to independently supply a test power signal to the storage voltage supply line. The method of claim 9, In the step of supplying a test power signal to the connection pin connected to the storage voltage supply line, And the test power signal is generated by a power supply unit and supplied through a printed circuit board, a tape carrier package, and a probe.

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