KR20060100233A - 테스트 시스템과 접속 박스 - Google Patents

테스트 시스템과 접속 박스 Download PDF

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Publication number
KR20060100233A
KR20060100233A KR1020060023643A KR20060023643A KR20060100233A KR 20060100233 A KR20060100233 A KR 20060100233A KR 1020060023643 A KR1020060023643 A KR 1020060023643A KR 20060023643 A KR20060023643 A KR 20060023643A KR 20060100233 A KR20060100233 A KR 20060100233A
Authority
KR
South Korea
Prior art keywords
power supply
ground
tester
prober
connection box
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
KR1020060023643A
Other languages
English (en)
Korean (ko)
Inventor
아키토 기시다
Original Assignee
애질런트 테크놀로지스, 인크.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 애질런트 테크놀로지스, 인크. filed Critical 애질런트 테크놀로지스, 인크.
Publication of KR20060100233A publication Critical patent/KR20060100233A/ko
Withdrawn legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01H—MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
    • G01H11/00—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by detecting changes in electric or magnetic properties
    • G01H11/02—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by detecting changes in electric or magnetic properties by magnetic means, e.g. reluctance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2889—Interfaces, e.g. between probe and tester
    • G—PHYSICS
    • G08—SIGNALLING
    • G08B—SIGNALLING OR CALLING SYSTEMS; ORDER TELEGRAPHS; ALARM SYSTEMS
    • G08B13/00—Burglar, theft or intruder alarms
    • G08B13/22—Electrical actuation
    • G08B13/24—Electrical actuation by interference with electromagnetic field distribution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/18—Screening arrangements against electric or magnetic fields, e.g. against earth's field

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Electromagnetism (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Connection Or Junction Boxes (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
KR1020060023643A 2005-03-15 2006-03-14 테스트 시스템과 접속 박스 Withdrawn KR20060100233A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2005073601A JP2006258490A (ja) 2005-03-15 2005-03-15 テストシステム及びその接続箱
JPJP-P-2005-00073601 2005-03-15

Publications (1)

Publication Number Publication Date
KR20060100233A true KR20060100233A (ko) 2006-09-20

Family

ID=37002489

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020060023643A Withdrawn KR20060100233A (ko) 2005-03-15 2006-03-14 테스트 시스템과 접속 박스

Country Status (5)

Country Link
US (1) US20060208747A1 (enExample)
JP (1) JP2006258490A (enExample)
KR (1) KR20060100233A (enExample)
CN (1) CN1834664A (enExample)
TW (1) TW200636254A (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7724004B2 (en) 2005-12-21 2010-05-25 Formfactor, Inc. Probing apparatus with guarded signal traces
TWI354793B (en) * 2008-01-18 2011-12-21 King Yuan Electronics Co Ltd Ic testing environment investigating device and me
JP2009229083A (ja) * 2008-03-19 2009-10-08 Yokogawa Electric Corp 半導体試験装置
JP5478426B2 (ja) * 2010-08-30 2014-04-23 株式会社日立ハイテクノロジーズ 計測または検査装置およびそれを用いた計測または検査方法
KR101248144B1 (ko) 2011-10-28 2013-03-27 한국전력공사 가스절연송전선로 시험 장치
KR102085731B1 (ko) 2014-03-31 2020-03-09 엘에스산전 주식회사 배전반 결선 시험 장치
CN110146769B (zh) * 2019-05-10 2024-07-05 深圳微步信息股份有限公司 一种接地线监测装置、eos监测系统及其方法
CN110196347B (zh) * 2019-05-27 2022-09-23 国家电网有限公司 一种电能计量联合接线端子排
US11346883B2 (en) * 2019-11-05 2022-05-31 Formfactor, Inc. Probe systems and methods for testing a device under test
CN117321346A (zh) * 2022-04-27 2023-12-29 日立江森自控空调有限公司 空调机

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5266889A (en) * 1992-05-29 1993-11-30 Cascade Microtech, Inc. Wafer probe station with integrated environment control enclosure
JP3178652B2 (ja) * 1996-06-11 2001-06-25 株式会社戸上電機製作所 配線路識別装置
JP4022297B2 (ja) * 1997-12-02 2007-12-12 アジレント・テクノロジーズ・インク 判定基準の動的変更可能な半導体測定装置
JP2000105269A (ja) * 1998-09-30 2000-04-11 Advantest Corp 半導体試験装置
JP3949406B2 (ja) * 2001-08-07 2007-07-25 矢崎総業株式会社 車両用電気接続装置

Also Published As

Publication number Publication date
JP2006258490A (ja) 2006-09-28
CN1834664A (zh) 2006-09-20
TW200636254A (en) 2006-10-16
US20060208747A1 (en) 2006-09-21

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Legal Events

Date Code Title Description
PA0109 Patent application

Patent event code: PA01091R01D

Comment text: Patent Application

Patent event date: 20060314

PG1501 Laying open of application
PC1203 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid