KR20060066802A - 분해능을 향상시킨 파면왜곡 측정 방법 - Google Patents
분해능을 향상시킨 파면왜곡 측정 방법 Download PDFInfo
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- KR20060066802A KR20060066802A KR1020040105272A KR20040105272A KR20060066802A KR 20060066802 A KR20060066802 A KR 20060066802A KR 1020040105272 A KR1020040105272 A KR 1020040105272A KR 20040105272 A KR20040105272 A KR 20040105272A KR 20060066802 A KR20060066802 A KR 20060066802A
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- 238000000691 measurement method Methods 0.000 title claims 3
- 238000000034 method Methods 0.000 claims abstract description 27
- 230000005484 gravity Effects 0.000 claims abstract description 9
- 230000000694 effects Effects 0.000 claims description 5
- 230000003287 optical effect Effects 0.000 claims description 5
- 230000004075 alteration Effects 0.000 claims description 3
- 238000005259 measurement Methods 0.000 abstract description 16
- 238000000605 extraction Methods 0.000 abstract description 9
- 230000003247 decreasing effect Effects 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 3
- 230000003044 adaptive effect Effects 0.000 description 2
- 238000004364 calculation method Methods 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 230000004807 localization Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J9/04—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by beating two waves of a same source but of different frequency and measuring the phase shift of the lower frequency obtained
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
- G01M11/025—Testing optical properties by measuring geometrical properties or aberrations by determining the shape of the object to be tested
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
- G01J2001/4446—Type of detector
- G01J2001/448—Array [CCD]
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J2009/002—Wavefront phase distribution
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- Spectroscopy & Molecular Physics (AREA)
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- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
Claims (4)
- 레이저빔의 파면왜곡이나 광학계의 수차 등을 측정하기 위한 하트만 방식의 측정장치에 있어서,레이저빔(11)을 입사받아 적절한 크기로 확대/축소 시키는 양측단에 설치된 각각의 렌즈(2, 3)로 구성된 빔 확대기(12)와;이 빔확대기를 거친 레이저빔을 작은 여러 개의 구경으로 나누고 각각의 구경에 해당하는 빔은 초점면에 점영상이 맺히도록 하는 배열렌즈(4)와;초점면에 맺힌 점영상을 중계렌즈까지는 반사하는 2개의 거울(5, 6)과;거울로 부터 반사된 점영상을 중계하는 중계 렌즈(7)와;중계렌즈에 의해 센서 면에 영상이 맺히는 CCD 카메라(14)와;이 CCD 카메라(14)에 맺히는 영상을 조절하도록 설치된 선형 이송기(13)로 구성된 것을 특징으로 하는 분해능을 향상시킨 파면왜곡 측정 장치.
- 레이저빔의 파면왜곡이나 광학계의 수차 등을 측정하기 위한 하트만 방식의 측정방법에 있어서,측정 대상이 되는 빛이 빔 확대기를 통해 측정기기에 적절한 크기로 입사시킨 후 배열렌즈에 의해 빛이 여러 개의 작은 구경으로 나뉘어 각각의 구경에 대한 초점을 맺도록 하는 단계와;각각의 초점 영상은 렌즈를 통하여 카메라 등의 영상획득 장치로 입사되어 영상을 획득하는 단계와;획득된 영상에 있는 점 영상의 중심점들의 중심 위치를 정확히 판단하기 위하여 각 점영상의 세기에 가중치를 주어 가중치를 준 중심을 구함으로써 점 영상의 주변 노이즈를 제거한 위치를 구하는 단계와;이렇게 구한 중심점의 위치를 기준이 되는 중심점의 위치와 비교함으로써 그 이동량으로부터 파면왜곡 정도를 측정하는 단계로 이루어진 것을 특징으로 하는 분해능을 향상시킨 파면왜곡 측정 방법.
- 제 2항에 있어서,획득된 점영상의 중심점을 추출할 때 각영상의 세기의 제곱 또는 세제곱이 되는 양의 무게 중심을 구함으로써 큰 세기 값의 효과를 더욱 크게 하여 분해능을 향상시키는 단계로 구성되는 것을 특징으로 하는 분해능을 향상시킨 파면왜곡 측정 방법.
- 제 2항에 있어서,획득된 점영상의 중심점을 무게중심법으로 추출할 때 일차적으로 구한 중심점에 가까운 위치에 있는 세기값은 2 또는 3의 가중치를 주어서 더 큰 효과를 내도 록 함으로써 파면측정 장치의 분해능을 높이는 단계로 구성되는 것을 특징으로 하는 분해능을 향상시킨 파면왜곡 측정 방법.
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KR1020040105272A KR100620807B1 (ko) | 2004-12-14 | 2004-12-14 | 분해능을 향상시킨 파면왜곡 측정 방법 |
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KR1020040105272A KR100620807B1 (ko) | 2004-12-14 | 2004-12-14 | 분해능을 향상시킨 파면왜곡 측정 방법 |
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KR20060066802A true KR20060066802A (ko) | 2006-06-19 |
KR100620807B1 KR100620807B1 (ko) | 2006-09-12 |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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KR101404690B1 (ko) * | 2014-04-30 | 2014-06-09 | 국방과학연구소 | 레이저 파면센서의 기준파면 점영상 위치 측정 방법 |
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Publication number | Priority date | Publication date | Assignee | Title |
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JPH07332952A (ja) * | 1994-06-03 | 1995-12-22 | Fuji Photo Optical Co Ltd | 干渉計による球面測定解析方法 |
JP2000097609A (ja) | 1998-09-21 | 2000-04-07 | Nikon Corp | 波面干渉計 |
JP4007473B2 (ja) | 1999-03-24 | 2007-11-14 | フジノン株式会社 | 波面形状測定方法 |
CA2376756A1 (en) | 2000-04-19 | 2001-10-25 | Alcon Universal Ltd. | Wavefront sensor for objective measurement of an optical system and associated methods |
KR100419192B1 (ko) * | 2002-04-10 | 2004-02-21 | 한국수력원자력 주식회사 | 다중 입사광의 파면왜곡 정밀측정 장치 및 그 방법 |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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KR101404690B1 (ko) * | 2014-04-30 | 2014-06-09 | 국방과학연구소 | 레이저 파면센서의 기준파면 점영상 위치 측정 방법 |
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