KR20050088991A - 레이저에 의해 여기된 액체의 광학 방사 분광 방법 및 장치 - Google Patents
레이저에 의해 여기된 액체의 광학 방사 분광 방법 및 장치 Download PDFInfo
- Publication number
- KR20050088991A KR20050088991A KR1020057005013A KR20057005013A KR20050088991A KR 20050088991 A KR20050088991 A KR 20050088991A KR 1020057005013 A KR1020057005013 A KR 1020057005013A KR 20057005013 A KR20057005013 A KR 20057005013A KR 20050088991 A KR20050088991 A KR 20050088991A
- Authority
- KR
- South Korea
- Prior art keywords
- liquid
- analyzed
- gas
- laser
- laser beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
- 239000007788 liquid Substances 0.000 title claims abstract description 127
- 238000000034 method Methods 0.000 title claims abstract description 25
- 230000003287 optical effect Effects 0.000 title description 8
- 238000004611 spectroscopical analysis Methods 0.000 title description 4
- 238000004458 analytical method Methods 0.000 claims abstract description 54
- 238000001636 atomic emission spectroscopy Methods 0.000 claims abstract description 11
- 239000007789 gas Substances 0.000 claims description 54
- 230000005855 radiation Effects 0.000 claims description 19
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims description 12
- 230000005284 excitation Effects 0.000 claims description 11
- 230000003993 interaction Effects 0.000 claims description 8
- 239000007921 spray Substances 0.000 claims description 8
- 239000013307 optical fiber Substances 0.000 claims description 7
- 229910052786 argon Inorganic materials 0.000 claims description 6
- 230000000694 effects Effects 0.000 claims description 6
- 239000001307 helium Substances 0.000 claims description 5
- 229910052734 helium Inorganic materials 0.000 claims description 5
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 claims description 5
- 238000005259 measurement Methods 0.000 claims description 5
- 230000001427 coherent effect Effects 0.000 claims description 2
- 230000002452 interceptive effect Effects 0.000 claims 1
- 210000002381 plasma Anatomy 0.000 description 22
- 150000001875 compounds Chemical class 0.000 description 9
- 239000000243 solution Substances 0.000 description 8
- 210000004027 cell Anatomy 0.000 description 7
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 6
- 231100001261 hazardous Toxicity 0.000 description 6
- 230000006872 improvement Effects 0.000 description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 5
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 4
- 238000002347 injection Methods 0.000 description 3
- 239000007924 injection Substances 0.000 description 3
- 229910052757 nitrogen Inorganic materials 0.000 description 3
- 239000010453 quartz Substances 0.000 description 3
- 230000002285 radioactive effect Effects 0.000 description 3
- 230000035939 shock Effects 0.000 description 3
- 230000003595 spectral effect Effects 0.000 description 3
- 238000001228 spectrum Methods 0.000 description 3
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 238000002679 ablation Methods 0.000 description 2
- 230000009471 action Effects 0.000 description 2
- 238000003556 assay Methods 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 230000002860 competitive effect Effects 0.000 description 2
- 125000004122 cyclic group Chemical group 0.000 description 2
- 238000002536 laser-induced breakdown spectroscopy Methods 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 230000000704 physical effect Effects 0.000 description 2
- 230000032258 transport Effects 0.000 description 2
- 0 CCC=C*(CC=C)C1CC=*CC1 Chemical compound CCC=C*(CC=C)C1CC=*CC1 0.000 description 1
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 1
- ZLMJMSJWJFRBEC-UHFFFAOYSA-N Potassium Chemical compound [K] ZLMJMSJWJFRBEC-UHFFFAOYSA-N 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 239000003570 air Substances 0.000 description 1
- 238000000559 atomic spectroscopy Methods 0.000 description 1
- 230000002238 attenuated effect Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 229910052729 chemical element Inorganic materials 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000000295 emission spectrum Methods 0.000 description 1
- 238000010336 energy treatment Methods 0.000 description 1
- 210000003743 erythrocyte Anatomy 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000013056 hazardous product Substances 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910052700 potassium Inorganic materials 0.000 description 1
- 239000011591 potassium Substances 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000000306 recurrent effect Effects 0.000 description 1
- 238000004064 recycling Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000003252 repetitive effect Effects 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 229910052708 sodium Inorganic materials 0.000 description 1
- 239000011734 sodium Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000010183 spectrum analysis Methods 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
- 238000010408 sweeping Methods 0.000 description 1
- 231100000331 toxic Toxicity 0.000 description 1
- 230000002588 toxic effect Effects 0.000 description 1
- 238000009834 vaporization Methods 0.000 description 1
- 230000008016 vaporization Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
- G01N21/718—Laser microanalysis, i.e. with formation of sample plasma
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/15—Preventing contamination of the components of the optical system or obstruction of the light path
- G01N2021/151—Gas blown
Landscapes
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Optics & Photonics (AREA)
- Plasma & Fusion (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Abstract
Description
Claims (12)
- 액체의 표면에 포커싱된(focused) 펄스 레이저에 의해 여기된 액체의 광학 방사 분광 방법에 있어서,분석 구역(analysis zone)은, 후속의 펄스 레이저가 발생하기 전에, 제1 펄스 레이저로부터 생기는, 가스에 부유하는 플라스마의 잔류물을 제거하기에 충분한 속도 및 단면적을 가지는 층류 가스 흐름(laminar gas flow)에 의해 스위프(sweep)되는방법.
- 제1항에 있어서,상기 층류 가스 흐름은 상기 액체의 자유표면 상에 경합 효과(contention effect)를 일으키는방법.
- 제1항 또는 제2항에 있어서,상기 가스의 속도는 분석되는 상기 액체의 다음의 특성 즉, 온도, 점성, 유속, 그 흐름의 난류(turbulent) 또는 층류(laminar)성 중 적어도 하나에 따라 결정되는방법.
- 제1항 내지 제3항 중 어느 한 항에 있어서,상기 층류 가스 흐름에 의해 스위프되는 상기 단면적은 다음의 특성 즉, 상기 플라스마의 팽창 속도, 상기 레이저 펄스의 반복 속도, 측정의 정확성 중 적어도 하나에 따라 결정되는방법.
- 제1항 내지 제4항 중 어느 한 항에 있어서,상기 액체는 상기 분석 구역 내에서 흐르는방법.
- 제1항 내지 제5항 중 어느 한 항에 있어서,상기 가스는 분석되는 상기 액체의 덕트(duct)를 포위하는 덕트를 통해서 상기 분석 구역으로 운반되는방법.
- 제1항 내지 제6항 중 어느 한 항에 있어서,상기 레이저 빔은 상기 액체의 표면에 의해 형성된 평면을 기준으로 90도 이외의 각도로 기울어지는방법.
- 제7항에 있어서,상기 레이저 빔은 상기 액체의 표면에 의해 형성된 평면을 기준으로 60도보다 큰 각도로 기울어지는방법.
- 제1항 내지 제8항 중 어느 한 항에 있어서,상기 레이저 빔에 의한 여기(excitation) 후에 상기 액체에 의해 방사되는 빔은 상기 레이저 빔과 공선적으로(colinearly) 수집되는방법.
- 제1항 내지 제9항 중 어느 한 항에 있어서,상기 가스는 아르곤 또는 헬륨인방법.
- 액체의 표면에 포커싱된 펄스 레이저에 의해 여기된 액체의 광학 방사 분광 장치에 있어서,적어도 1Gw/cm2 의 파워 밀도를 갖는 간섭성 광 펄스를 발생하기 위한 레이저;적어도 1cm의 길이로, 분석될 액체의 층류 분사물(laminar jet)을 발생하기 위한 수단;분석될 상기 액체의 상기 표면에 평행인 층류 가스 분사물을 발생시켜, 이와 연결되어, 제1 펄스 레이저로부터 생기는, 상기 가스에 부유하는 플라스마의 잔류물을 제거하기 위한 수단;상기 분석 구역 내의 상기 레이저 빔을 분석되는 상기 액체 분사물의 표면에 포커싱하기 위한 수단;분석되는 상기 액체 분사물과 상기 레이저의 광 펄스의 상호작용으로부터 생기는 광을 수집하기 위한 수단;분석되는 상기 액체의 방사선이 발견되는 주파수 범위내에서 동작하고, 광섬유 빔에 의해 수집된 상기 상호작용 광을 받아들이도록 갖추고 있는 분광기;분석되는 상기 액체를 분사 형태로 유포하기 위한 수단; 및분석되는 상기 액체에 대해 접선방향으로 흐르기 전에 상기 가스를 분사 형태로 유포하기 위한 수단을 포함하는 장치.
- 제11항에 있어서,분석될 상기 액체의 방사광을 수집하기 위한 수단은, 이 광이 여기 레이저 빔과 공선적으로 수집되는 것이고,상기 장치는 분석될 상기 액체가 발견되는 밀폐된 인클로저(air-tight enclosure)와 상기 층류 가스 분사물을 발생하기 위한 수단을 갖고,상기 여기 레이저 빔과 상기 수집된 광의 방향의 공선성은 상기 레이저 빔과 상기 수집된 광을 위해 단지 하나의 인클로저 포트의 사용을 허용하는장치.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0211766A FR2844878B1 (fr) | 2002-09-24 | 2002-09-24 | Procede et dispositif de spectroscopie d'emission optique d'un liquide excite par laser |
FR02/11766 | 2002-09-24 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR20050088991A true KR20050088991A (ko) | 2005-09-07 |
Family
ID=31970918
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020057005013A Ceased KR20050088991A (ko) | 2002-09-24 | 2003-08-20 | 레이저에 의해 여기된 액체의 광학 방사 분광 방법 및 장치 |
Country Status (10)
Country | Link |
---|---|
US (1) | US7218396B2 (ko) |
EP (1) | EP1549933B1 (ko) |
JP (1) | JP4677554B2 (ko) |
KR (1) | KR20050088991A (ko) |
CN (1) | CN100514041C (ko) |
AU (1) | AU2003282205A1 (ko) |
ES (1) | ES2619175T3 (ko) |
FR (1) | FR2844878B1 (ko) |
RU (1) | RU2331868C2 (ko) |
WO (1) | WO2004029598A1 (ko) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7528607B2 (en) * | 2005-02-15 | 2009-05-05 | Southwest Research Institute | Measurement of CN emissions from engine spark igniter for characterization of spark igniter energy |
CN100510714C (zh) * | 2006-12-05 | 2009-07-08 | 中国科学院安徽光学精密机械研究所 | 水体金属污染物激光击穿光谱探测方法与系统 |
FR3020462B1 (fr) * | 2014-04-25 | 2016-05-06 | Ifp Energies Now | Systeme de mesure de la composition d'un liquide par spectroscopie sur plasma induit par laser |
CN105223170B (zh) * | 2014-05-30 | 2017-12-12 | 中国科学院空间科学与应用研究中心 | 一种模拟微小空间碎片撞击诱发放电的装置及方法 |
EP4273523B1 (en) * | 2015-03-06 | 2024-09-11 | Mécanique Analytique Inc. | Detection of impurities in a gas based on plasma-based optical emission |
US20170023484A1 (en) * | 2015-07-20 | 2017-01-26 | Thermo Scientific Portable Analytical Instruments Inc. | Portable laser induced breakdown spectroscopy systems |
JP6127280B1 (ja) * | 2016-03-29 | 2017-05-17 | パナソニックIpマネジメント株式会社 | 粒子検出センサ |
CN112945936B (zh) * | 2021-01-28 | 2023-02-03 | 西安电子科技大学 | 基于激光等离子体自约束的液体样品光谱测量方法与装置 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4925307A (en) * | 1984-05-01 | 1990-05-15 | The United States Of America As Represented By The United States Department Of Energy | Apparatus and method for the spectrochemical analysis of liquids using the laser spark |
RU2007703C1 (ru) * | 1991-06-14 | 1994-02-15 | Институт общей физики РАН | Способ спектрального анализа элементного состава вещества и устройство для его осуществления |
JPH073389B2 (ja) * | 1992-08-28 | 1995-01-18 | 東北電力株式会社 | 水質検査方法及びその装置 |
FR2712697B1 (fr) * | 1993-11-19 | 1995-12-15 | Commissariat Energie Atomique | Procédé d'analyse élémentaire par spectrométrie d'émission optique sur plasma produit par laser en présence d'argon. |
JP2000310596A (ja) * | 1999-04-27 | 2000-11-07 | Toshiba Corp | 元素分析装置 |
US6741345B2 (en) * | 2001-02-08 | 2004-05-25 | National Research Council Of Canada | Method and apparatus for in-process liquid analysis by laser induced plasma spectroscopy |
-
2002
- 2002-09-24 FR FR0211766A patent/FR2844878B1/fr not_active Expired - Lifetime
-
2003
- 2003-08-20 ES ES03773825.9T patent/ES2619175T3/es not_active Expired - Lifetime
- 2003-08-20 AU AU2003282205A patent/AU2003282205A1/en not_active Abandoned
- 2003-08-20 CN CNB038226502A patent/CN100514041C/zh not_active Expired - Lifetime
- 2003-08-20 KR KR1020057005013A patent/KR20050088991A/ko not_active Ceased
- 2003-08-20 RU RU2005108572/28A patent/RU2331868C2/ru active
- 2003-08-20 WO PCT/FR2003/050033 patent/WO2004029598A1/fr active Application Filing
- 2003-08-20 EP EP03773825.9A patent/EP1549933B1/fr not_active Expired - Lifetime
- 2003-08-20 US US10/529,127 patent/US7218396B2/en not_active Expired - Lifetime
- 2003-08-20 JP JP2004539154A patent/JP4677554B2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JP4677554B2 (ja) | 2011-04-27 |
CN1685218A (zh) | 2005-10-19 |
EP1549933A1 (fr) | 2005-07-06 |
AU2003282205A1 (en) | 2004-04-19 |
RU2005108572A (ru) | 2006-01-20 |
US20060119846A1 (en) | 2006-06-08 |
FR2844878B1 (fr) | 2005-08-05 |
EP1549933B1 (fr) | 2016-12-14 |
WO2004029598A1 (fr) | 2004-04-08 |
JP2006500576A (ja) | 2006-01-05 |
RU2331868C2 (ru) | 2008-08-20 |
FR2844878A1 (fr) | 2004-03-26 |
CN100514041C (zh) | 2009-07-15 |
AU2003282205A8 (en) | 2004-04-19 |
ES2619175T3 (es) | 2017-06-23 |
US7218396B2 (en) | 2007-05-15 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US6700660B2 (en) | Method and apparatus for in-process liquid analysis by laser induced plasma spectroscopy | |
KR101009845B1 (ko) | 용융 재료 분석용 레이저 유도 분석 분광법 | |
KR960012784B1 (ko) | 용융 금속의 중간 생성물 분석을 위한 순간 분광법 및 장치 | |
US5583634A (en) | Process for elementary analysis by optical emission spectrometry on plasma produced by a laser in the presence of argon | |
JP3559635B2 (ja) | エアロゾル分析装置 | |
EP1223423A2 (en) | Method and apparatus for enhanced laser-induced plasma spectroscopy using mixed-wavelength laser pulses | |
KR20080031787A (ko) | 용융물 및 액체 분석용 침지 랜스 | |
JP4734273B2 (ja) | レーザ誘起蛍光分析装置 | |
JP2009288068A (ja) | 分析方法およびその装置 | |
US6429935B1 (en) | Microwave plasma monitoring system for real-time elemental analysis | |
KR20050088991A (ko) | 레이저에 의해 여기된 액체의 광학 방사 분광 방법 및 장치 | |
US9625391B2 (en) | LIBS measurement tube | |
JPS6146773B2 (ko) | ||
Giannakaris et al. | Surface cleaning with atmospheric pressure plasma jet investigated by in-situ optical emission spectroscopy and laser-induced breakdown spectroscopy | |
JP2010038557A (ja) | 元素分析装置および元素分析方法 | |
Konidala et al. | Laser induced breakdown spectroscopy | |
JP3618198B2 (ja) | 元素分析方法 | |
JP2010019626A (ja) | 元素分析装置および元素分析方法 | |
JPH04274743A (ja) | レーザー発光分析方法 | |
Sabsabi et al. | On-line analysis of liquid samples by laser induced plasma spectroscopy (LIPS) | |
JPH0211097B2 (ko) | ||
JPH07190933A (ja) | レーザ発光分光分析用浸漬ランス | |
WO2001065244A1 (en) | Microwave plasma monitoring system for real-time elemental analysis | |
JPH0211098B2 (ko) |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PA0105 | International application |
Patent event date: 20050323 Patent event code: PA01051R01D Comment text: International Patent Application |
|
PG1501 | Laying open of application | ||
A201 | Request for examination | ||
PA0201 | Request for examination |
Patent event code: PA02012R01D Patent event date: 20080805 Comment text: Request for Examination of Application |
|
E902 | Notification of reason for refusal | ||
PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 20100531 Patent event code: PE09021S01D |
|
E90F | Notification of reason for final refusal | ||
PE0902 | Notice of grounds for rejection |
Comment text: Final Notice of Reason for Refusal Patent event date: 20101120 Patent event code: PE09021S02D |
|
E601 | Decision to refuse application | ||
PE0601 | Decision on rejection of patent |
Patent event date: 20110329 Comment text: Decision to Refuse Application Patent event code: PE06012S01D Patent event date: 20101120 Comment text: Final Notice of Reason for Refusal Patent event code: PE06011S02I Patent event date: 20100531 Comment text: Notification of reason for refusal Patent event code: PE06011S01I |