KR20040084202A - 집적화된 실리콘 콘택터의 제조방법 - Google Patents
집적화된 실리콘 콘택터의 제조방법 Download PDFInfo
- Publication number
- KR20040084202A KR20040084202A KR1020030019098A KR20030019098A KR20040084202A KR 20040084202 A KR20040084202 A KR 20040084202A KR 1020030019098 A KR1020030019098 A KR 1020030019098A KR 20030019098 A KR20030019098 A KR 20030019098A KR 20040084202 A KR20040084202 A KR 20040084202A
- Authority
- KR
- South Korea
- Prior art keywords
- silicon
- conductive
- contactor
- manufacturing
- magnets
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 30
- 229920001296 polysiloxane Polymers 0.000 title 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims abstract description 90
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 88
- 239000010703 silicon Substances 0.000 claims abstract description 88
- 239000002184 metal Substances 0.000 claims abstract description 17
- 229910052751 metal Inorganic materials 0.000 claims abstract description 17
- 239000000843 powder Substances 0.000 claims abstract description 17
- 239000004065 semiconductor Substances 0.000 claims abstract description 11
- 238000000034 method Methods 0.000 claims abstract description 10
- 239000007788 liquid Substances 0.000 claims abstract description 8
- 239000000463 material Substances 0.000 claims abstract description 6
- 239000004020 conductor Substances 0.000 claims description 15
- 238000010586 diagram Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- 238000007747 plating Methods 0.000 description 2
- 230000002730 additional effect Effects 0.000 description 1
- 239000010419 fine particle Substances 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06755—Material aspects
- G01R1/06761—Material aspects related to layers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
Description
Claims (3)
- 반도체소자의 리드단자가 접촉되는 영역에 형성된 도전성 실리콘부와, 상기 도전성 실리콘부를 지지할 수 있도록 반도체소자의 리드단자가 접촉되지 않는 영역에 형성되어 절연층 역할을 하는 절연 실리콘부로 구성되는 집적화된 실리콘 콘택터의 제조방법으로서,서로 다른 극성을 갖는 자석(12, 12')이 캐비티(14)를 사이에 두고 상하로 배치되는 단계;상기 두 자석(12, 12') 사이에 자력이 인가된 상태에서, 캐비티(14)에 액체 실리콘과 도전성 금속 파우더(15)가 혼합된 혼합 실리콘(16)을 주입하는 단계;상기 혼합 실리콘의 도전성 금속 파우더(15)가 상하 자석(12, 12')의 자력선 방향으로 모여들어 상하로 연결되어, 도전성 패드(18)가 형성되는 단계;상기 도전성 패드(18)가 형성된 후 계속 자력을 인가하는 상태에서 재료를 경화시킨 후 상하에 위치한 자석(12, 12')을 제거하는 단계로 구성되는, 집적화된 실리콘 콘택터의 제조방법.
- 청구항 1에 있어서, 상기 실리콘 콘택터에 있어서,상기 상하 자석(12, 12')의 자력선 방향으로 연결되어 형성된 도전성 패드(18) 이외의 액체 실리콘층이 경화된 부분은 절연 실리콘부(17)인 것을 특징으로 하는, 집적화된 실리콘 콘택터의 제조방법.
- 청구항 1에 있어서,상기 실리콘 콘택터의 상부 또는 하부에 도전체(35)가 실장가능한 것을 특징으로 하는, 집적화된 실리콘 콘택터의 제조방법.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020030019098A KR20040084202A (ko) | 2003-03-27 | 2003-03-27 | 집적화된 실리콘 콘택터의 제조방법 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020030019098A KR20040084202A (ko) | 2003-03-27 | 2003-03-27 | 집적화된 실리콘 콘택터의 제조방법 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR20040084202A true KR20040084202A (ko) | 2004-10-06 |
Family
ID=37367806
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020030019098A KR20040084202A (ko) | 2003-03-27 | 2003-03-27 | 집적화된 실리콘 콘택터의 제조방법 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR20040084202A (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2015156653A1 (ko) * | 2014-04-11 | 2015-10-15 | 주식회사 아이에스시 | 검사용 시트의 제조방법 및 검사용 시트 |
-
2003
- 2003-03-27 KR KR1020030019098A patent/KR20040084202A/ko not_active Application Discontinuation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2015156653A1 (ko) * | 2014-04-11 | 2015-10-15 | 주식회사 아이에스시 | 검사용 시트의 제조방법 및 검사용 시트 |
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