KR20040011862A - 화학증착 시스템에서 분산판과 회전체를 갖는 샤워 헤드 구조 - Google Patents
화학증착 시스템에서 분산판과 회전체를 갖는 샤워 헤드 구조 Download PDFInfo
- Publication number
- KR20040011862A KR20040011862A KR1020020045125A KR20020045125A KR20040011862A KR 20040011862 A KR20040011862 A KR 20040011862A KR 1020020045125 A KR1020020045125 A KR 1020020045125A KR 20020045125 A KR20020045125 A KR 20020045125A KR 20040011862 A KR20040011862 A KR 20040011862A
- Authority
- KR
- South Korea
- Prior art keywords
- gas
- shower head
- vapor deposition
- dispersion
- chemical vapor
- Prior art date
Links
- 238000005229 chemical vapour deposition Methods 0.000 title claims abstract description 11
- 238000009826 distribution Methods 0.000 title claims description 5
- 239000006185 dispersion Substances 0.000 claims abstract description 27
- 238000002347 injection Methods 0.000 claims abstract description 5
- 239000007924 injection Substances 0.000 claims abstract description 5
- 238000003756 stirring Methods 0.000 claims description 3
- 230000001133 acceleration Effects 0.000 claims 1
- 238000013019 agitation Methods 0.000 claims 1
- 239000007789 gas Substances 0.000 abstract description 40
- 238000010926 purge Methods 0.000 abstract description 7
- 239000000758 substrate Substances 0.000 abstract description 6
- 239000010409 thin film Substances 0.000 abstract description 6
- 238000004519 manufacturing process Methods 0.000 abstract description 5
- 239000012495 reaction gas Substances 0.000 abstract description 5
- 238000000034 method Methods 0.000 abstract description 4
- 238000004904 shortening Methods 0.000 abstract description 2
- 239000000356 contaminant Substances 0.000 abstract 1
- 238000005389 semiconductor device fabrication Methods 0.000 abstract 1
- 239000002356 single layer Substances 0.000 abstract 1
- 239000002826 coolant Substances 0.000 description 3
- 239000010408 film Substances 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 238000010574 gas phase reaction Methods 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 238000000277 atomic layer chemical vapour deposition Methods 0.000 description 1
- 238000000231 atomic layer deposition Methods 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 239000000498 cooling water Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000003344 environmental pollutant Substances 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 231100000719 pollutant Toxicity 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 239000000376 reactant Substances 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000000427 thin-film deposition Methods 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45565—Shower nozzles
Landscapes
- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
Description
Claims (3)
- 대표도와 같이 가스 분사가 원활하도록 샤워 헤드 내부에 다중의 분산판 설치 구조와 가스 흐름에 도움을 줄 수 있는 강제 회전체를 설치한 구조.
- 도 3와 같이 가스의 균일한 분산과 가스흐름의 가속을 위하여 샤워 헤드 내부에 임펠러 기능의 회전날개를 설치하여 강제 교반을 실시하는 구조.
- 화학증착 진공시스템 내부에 가스 교반의 목적으로 회전구동력을 전달하는 경우 도3과 같이 진공내부에 회전축이 설치되고 대기압 상태인 외부에 구동축이 설치되어 회전하는 축과 직접적인 접촉이 없이 자기력으로 구동력을 전달하여 고속회전 시에도 진공 유지에 제약이 없는 구조.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020020045125A KR20040011862A (ko) | 2002-07-31 | 2002-07-31 | 화학증착 시스템에서 분산판과 회전체를 갖는 샤워 헤드 구조 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020020045125A KR20040011862A (ko) | 2002-07-31 | 2002-07-31 | 화학증착 시스템에서 분산판과 회전체를 갖는 샤워 헤드 구조 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR20040011862A true KR20040011862A (ko) | 2004-02-11 |
Family
ID=37319900
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020020045125A KR20040011862A (ko) | 2002-07-31 | 2002-07-31 | 화학증착 시스템에서 분산판과 회전체를 갖는 샤워 헤드 구조 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR20040011862A (ko) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102817012A (zh) * | 2011-06-08 | 2012-12-12 | 先进科技新加坡有限公司 | 一种薄膜沉积装置 |
KR101298343B1 (ko) * | 2010-05-04 | 2013-08-20 | 주식회사 엘지화학 | 올레핀의 하이드로포밀화 반응장치 및 이를 이용하는 하이드로포밀화 방법 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0456124A (ja) * | 1990-06-22 | 1992-02-24 | Kawasaki Steel Corp | 常圧cvd装置 |
JPH0936046A (ja) * | 1995-07-19 | 1997-02-07 | Fujitsu Ltd | 気相化学処理装置及び方法 |
KR19990034510U (ko) * | 1998-01-24 | 1999-08-25 | 구본준 | 반도체 화학기상증착장비의 가스 균일분사장치 |
KR20000019254A (ko) * | 1998-09-08 | 2000-04-06 | 석창길 | 화학 기상 증착 장치의 박막 두께 균일도 개선을 위한 장치 |
-
2002
- 2002-07-31 KR KR1020020045125A patent/KR20040011862A/ko not_active Application Discontinuation
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0456124A (ja) * | 1990-06-22 | 1992-02-24 | Kawasaki Steel Corp | 常圧cvd装置 |
JPH0936046A (ja) * | 1995-07-19 | 1997-02-07 | Fujitsu Ltd | 気相化学処理装置及び方法 |
KR19990034510U (ko) * | 1998-01-24 | 1999-08-25 | 구본준 | 반도체 화학기상증착장비의 가스 균일분사장치 |
KR20000019254A (ko) * | 1998-09-08 | 2000-04-06 | 석창길 | 화학 기상 증착 장치의 박막 두께 균일도 개선을 위한 장치 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101298343B1 (ko) * | 2010-05-04 | 2013-08-20 | 주식회사 엘지화학 | 올레핀의 하이드로포밀화 반응장치 및 이를 이용하는 하이드로포밀화 방법 |
CN102817012A (zh) * | 2011-06-08 | 2012-12-12 | 先进科技新加坡有限公司 | 一种薄膜沉积装置 |
KR101479480B1 (ko) * | 2011-06-08 | 2015-01-06 | 에이에스엠 테크놀러지 싱가포르 피티이 엘티디 | 박막 증착을 위한 장치 |
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