KR20020081721A - Pin-probe assembly for testing LCD - Google Patents

Pin-probe assembly for testing LCD Download PDF

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Publication number
KR20020081721A
KR20020081721A KR1020010021047A KR20010021047A KR20020081721A KR 20020081721 A KR20020081721 A KR 20020081721A KR 1020010021047 A KR1020010021047 A KR 1020010021047A KR 20010021047 A KR20010021047 A KR 20010021047A KR 20020081721 A KR20020081721 A KR 20020081721A
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KR
South Korea
Prior art keywords
pin
pin probe
block
probe assembly
probes
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KR1020010021047A
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Korean (ko)
Inventor
박찬중
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비엔엘솔루컴 (주)
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Priority to KR1020010021047A priority Critical patent/KR20020081721A/en
Publication of KR20020081721A publication Critical patent/KR20020081721A/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06705—Apparatus for holding or moving single probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
  • Liquid Crystal (AREA)

Abstract

PURPOSE: A pin probe assembly for testing a liquid crystal display(LCD) is provided, which can be used for a long time by replacing a defective pin probe embedded in a block. CONSTITUTION: A top of a block(10) is opened and a number of fixing bar(12) are installed on a side wall of the block. A number of pin probes(14) comprise accommodation part(14a) where the fixing bars are inserted, and a needle line part are projected from both ends of the pin probes. The first insulator panel(16) comprises a slot groove where a top of each pin probe is inserted along a width direction of a bottom plane. The fixing bar of the block penetrates the pin probe, and the second insulator panel comprises a slot groove where a bottom of the pin probe is inserted.

Description

액정표시장치 검사용 핀프루브조립체 { Pin-probe assembly for testing LCD }Pin Probe Assembly for LCD Display {Pin-probe assembly for testing LCD}

본 발명은 액정표시장치 검사용 핀프루브조립체에 관한 것으로, 특히 모듈상태에서 전극패턴의 불량유무를 검사하는 액정표시장치 검사용 핀프루브조립체에 관한 것이다.The present invention relates to a pin probe assembly for inspecting a liquid crystal display device, and more particularly, to a pin probe assembly for inspecting a defective electrode pattern in a module state.

일반적으로, 액정표시장치(LCD : Liquid Crystal display)는 음극선과 더불어 가장 널리 사용되는 디스플레이 장치로서, 전압인가에 따라 배열방향을 달리하는 액정분자의 고유특성을 이용함으로써 박형화, 소형화할 수 있다. 이러한 액정표시장치는 모듈상태에서 화질이나 전극패턴의 불량유무를 검사하기 위하여 다수의 핀프루브가 조립된 핀프루브조립체를 사용하는데, 핀프루브의 한쪽선단에 신호발생기를 접촉하고 다른쪽 선단이 전극에 접촉되게 하여 검사한다.In general, a liquid crystal display (LCD) is a display device which is most widely used together with a cathode ray, and can be thinned and miniaturized by utilizing inherent characteristics of liquid crystal molecules that vary in the arrangement direction depending on voltage application. The liquid crystal display uses a pin probe assembly in which a plurality of pin probes are assembled in order to inspect image quality or an electrode pattern in a module state. The signal generator contacts one end of the pin probe and the other end contacts the electrode. Inspect for contact.

그런데, 기존의 핀프루브조립체는 블록에 내장되는 다수의 핀프루브가 엑폭싱처리되어 몇개의 핀프루브가 마모되거나 굽어질 경우, 불량의 핀프루브를 분해하고 새핀프루브로 교체하는 작업이 거의 불가능하였다. 이에 따라 고가인 핀프루브조립체는 몇개의 핀프루브가 불량이 생기게 될 때 블록전체를 교체해야 하므로 비생산적이고 비경제적인 문제점이 있었다.However, in the existing pin probe assembly, when a plurality of pin probes embedded in a block are amplified and some pin probes are worn or bent, it is almost impossible to disassemble a defective pin probe and replace it with a new pin probe. Accordingly, the expensive pin probe assembly has to replace the entire block when a few pin probes are defective, resulting in unproductive and uneconomical problems.

한편, 브루브조립체는 액정표시장치의 해상도가 점차적으로 높아질수록 블록에 장착되는 핀프루브의 갯수가 증가하게 되고 핀프루브의 불량률이 높아 질 수밖에 없다.On the other hand, as the resolution of the liquid crystal display device increases, the number of pin probes mounted on the block increases and the defective rate of the pin probes increases.

이에 본 발명은 상술한 바와 같은 문제점을 해소하기 위해 안출된 것으로, 블록에 내장된 낱개의 핀프루브에 불량이 생기더라도 손쉽게 교환하여 오랫동안 사용할 수 있는 액정표시장치 검사용 핀프루브조립체를 제공하는데 그 목적이 있다.Accordingly, the present invention has been made to solve the above-described problems, and to provide a pin probe assembly for inspecting a liquid crystal display device that can be easily used for a long time even if a defect occurs in the individual pin probes embedded in the block. There is this.

상기한 목적을 달성하기 위하여 본 발명은, 상부가 개방되고 측벽에 다수의 고정바가 장착된 블록과, 상기 블록의 고정바에 끼워지는 수용부가 구비되고 양선단에 서로 반대방향으로 침선부가 각각 돌출형성된 다수의 핀프루브 및, 바닥면 폭방향을 따라 각각의 상기 핀프루브의 상부선단이 끼워지는 슬로트홈이 구비된 제2절연패널을 포함한다.In order to achieve the above object, the present invention provides a block having an upper portion and a plurality of fixing bars mounted on sidewalls, a receiving portion fitted to the fixing bars of the block, and a plurality of needles protruding from opposite ends at opposite ends, respectively. And a second insulating panel provided with a pin probe and a slot groove into which an upper end of each of the pin probes is fitted along the bottom surface width direction.

상기 핀프루브에 상기 블록의 고정바가 관통되고 상기 핀프루브의 하부선단이 각각 끼워지는 슬로트홈이 구비된 제2절연패널을 더 포함한다.The pin probe further includes a second insulating panel having a slot groove through which the fixing bar of the block penetrates and the lower end of the pin probe is fitted.

상기 고정바는 적어도 3개 이상의 접촉표면이 형성되는 한편, 상기 핀프루브의 수용부에는 상기 접촉표면과 대응하게 결합면이 형성되어 있다.The fixing bar has at least three contact surfaces formed thereon, while the receiving portion of the pin probe has a mating surface corresponding to the contact surface.

상기 제1,2절연패널은 세라믹재질로 제작되는 것이 바람직하다.The first and second insulating panels are preferably made of a ceramic material.

이와 같이 본 발명에 따른 액정표시장치 검사용 핀프루브조립체에 의하면, 핀프루브의 선단부가 절연패널의 슬로트홈에 각각 끼워져 고정지지되어 핀프루브가 불량이 생기면 분해하여 불량난 핀루브를 새 것으로 교환할 수 있으므로 유지 및 보수작업이 편리하게 된다.As described above, according to the liquid crystal display inspection pin probe assembly according to the present invention, the tip ends of the pin probes are inserted into the slot grooves of the insulating panel to be fixed to each other. Maintenance and repair work is convenient.

도 1은 본 발명의 제1실시예에 따른 핀프루브조립체를 도시한 사시도,1 is a perspective view showing a pin probe assembly according to a first embodiment of the present invention,

도 2는 도 1의 A-A선을 절단하여 도시한 단면도,2 is a cross-sectional view taken along the line A-A of FIG.

도 3은 본 발명의 제1실시예에 따른 핀프루브조립체의 구성도,3 is a block diagram of a pin probe assembly according to a first embodiment of the present invention,

도 4a와 도 4b는 고정바와 핀프루브의 결합도,4a and 4b is a coupling of the fixed bar and the pin probe,

도 5는 본 발명의 제2실시예에 따른 핀프루브조립체를 도시한 분해사시도,5 is an exploded perspective view showing a pin probe assembly according to a second embodiment of the present invention;

도 6은 본 발명의 제2실시예에 따른 핀프루브조립체의 결합단면도이다.6 is a cross-sectional view of the coupling of the pin probe assembly according to a second embodiment of the present invention.

* 도면의 주요 부분에 대한 부호의 설명 *Explanation of symbols on the main parts of the drawings

10 : 블록 12,13 : 고정바10: block 12,13: fixed bar

14 : 핀프루브 16 : 제1절연패널14: pin probe 16: first insulating panel

18 : 제2절연패널18: second insulation panel

이하, 본 발명의 바람직한 실시예를 첨부한 예시도면에 따라 상세하게 설명한다.Hereinafter, with reference to the accompanying drawings, preferred embodiments of the present invention will be described in detail.

도 1은 본 발명의 제1실시예에 따른 핀프루브조립체를 도시한 사시도이고, 도 2는 도 1의 A-A선을 절단하여 도시한 단면도이고, 도 3은 본 발명의 제1실시예에 따른 핀프루브조립체의 구성도이다.1 is a perspective view showing a pin probe assembly according to a first embodiment of the present invention, Figure 2 is a cross-sectional view taken along the line AA of Figure 1, Figure 3 is a pin according to a first embodiment of the present invention It is a block diagram of a probe assembly.

본 발명의 제1실시예에 따른 핀프루브조립체는 도 1 내지 도 3에 도시된 바와 같이, 상부가 개방되고 측벽에 다수의 고정바(12,13)가 장착된 블록(10)과, 상기 블록(10)의 고정바(12,13)에 끼워지는 수용부(14a,14b)가 구비되고 양선단에 서로 반대방향으로 침선부(14c)가 돌출형성된 다수의 핀프루브(14) 및, 바닥면 폭방향을 따라 각각의 상기 핀프루브(14)의 상부선단이 끼워지는 슬로트홈(16a)이 구비된 절연패널(16)을 포함한다.As shown in FIGS. 1 to 3, the pin probe assembly according to the first embodiment of the present invention includes a block 10 having an open top and a plurality of fixing bars 12 and 13 mounted on sidewalls, and the block 10. A plurality of pin probes 14 having a receiving portion 14a, 14b fitted to the fixing bars 12 and 13 of the 10 and having needle tips 14c protruding in opposite directions at both ends thereof, and a bottom surface thereof. And an insulating panel 16 provided with a slot groove 16a into which an upper end of each of the pin probes 14 is fitted along the width direction.

상기 블록(10)은 상부가 개방되어 고정바(12)를 매개로 상기 핀프루브(14)를 장착하도록 되어 있다. 여기서, 블록(10)은 무게가 가볍고 비전도성의 금속재로 제작되는 것이 바람직하다. 상기 고정바(12,13)는 블록(10)의 양측벽에 고정된 상태로 상기 핀프루브(14)를 부분적으로 관통하도록 되어 있다. 여기서, 고정바(12,13)는 핀프루브(14)의 선단부를 지지하여 핀에 탄성을 주는 역할을 한다.The block 10 is open at the top to mount the pin probe 14 through the fixing bar 12. Here, the block 10 is preferably made of a light weight and non-conductive metal material. The fixing bars 12 and 13 may partially penetrate the pin probe 14 in a state of being fixed to both side walls of the block 10. Here, the fixing bars 12 and 13 support the tip of the pin probe 14 to give elasticity to the pin.

상기 핀프루브(14)는 도 4a에 도시된 바와 같이, 원주형의 고정바(12)가 통과하는 부분에 구형의 수용부(14a)가 형성되어 있다. 한편, 도 4b에 도시된 바와 같이, 핀프루브(14)는 각형의 고정바(13)가 통과하는 부분에 사각형의 수용부(14b)가 형성되어 있다. 여기서, 핀프루브(14)의 결합면은 고정바(12,13)의 표면형상에 따라 달라질 수 있다. 즉, 고정바의 표면형상이 3각, 4각,5각,6각,8각 등으로 바뀌게 될 경우 핀프루브(14)의 결합면도 그에 맞게 바뀌게 될 것이다. 핀프루브(14)는 적어도 3개 이상의 접촉표면을 갖는 고정바에 의해서 지지되는 것이 바람직하다. 한편, 핀프루브(14)는 양선단이 서로 반대방향으로 침선부(14c)가 각각 돌출형성되어 있다.As shown in FIG. 4A, the pin probe 14 has a spherical receiving portion 14a formed at a portion through which the cylindrical fixing bar 12 passes. On the other hand, as shown in Figure 4b, the pin probe 14 has a rectangular receiving portion (14b) is formed in the portion passing through the rectangular fixing bar (13). Here, the engagement surface of the pin probe 14 may vary depending on the surface shape of the fixing bars 12 and 13. That is, when the surface shape of the fixing bar is changed to 3, 4, 5, 6, 8, etc., the coupling surface of the pin probe 14 will be changed accordingly. The pin probe 14 is preferably supported by a fixing bar having at least three contact surfaces. On the other hand, the pin probe 14 has needle tips 14c protruding from each other in opposite directions.

상기 제1절연패널(16)은 일측면에 핀프루브(14)의 상부선단이 끼워지는 다수의 슬로트홈(16a)이 소정간격을 두고 형성되어 있다. 여기서, 제1절연패널(16)은 세라믹재질로 제작되는 것이 바람직하다.In the first insulating panel 16, a plurality of slot grooves 16a into which the upper end of the pin probe 14 is fitted are formed at predetermined intervals on one side thereof. Here, the first insulating panel 16 is preferably made of a ceramic material.

도 5는 본 발명의 제2실시예에 따른 핀프루브조립체를 도시한 분해사시도이고, 도 6은 본 발명의 제2실시예에 따른 핀프루브조립체의 결합단면도이다.Figure 5 is an exploded perspective view showing a pin probe assembly according to a second embodiment of the present invention, Figure 6 is a cross-sectional view of the coupling of the pin probe assembly according to a second embodiment of the present invention.

본 발명의 제2실시예에 따른 핀프루브조립체는 도 5 및 도 6에 도시된 바와 같이, 상부가 개방되고 측벽에 다수의 고정바(13)가 장착된 블록(10)과, 상기 블록(10)의 고정바(13)에 관통되는 수용부(14d)가 구비되고 양선단에 서로 반대방향으로 침선부(14c)가 돌출형성된 다수의 핀프루브(14)와, 상기 핀프루브(14)의 상부선단이 각각 끼워지는 슬로트홈(16a)이 구비된 제1절연패널(16) 및, 상기 핀프루브(14)의 하부선단이 각각 끼워지는 슬로트홈(18a)이 구비된 제2절연패널(18)을 포함한다.As shown in FIGS. 5 and 6, the pin probe assembly according to the second embodiment of the present invention includes a block 10 having an upper portion and a plurality of fixing bars 13 mounted on a side wall thereof, and the block 10. And a plurality of pin probes 14 having a receiving portion 14d penetrating through the fixing bar 13 and having needle tips 14c protruding in opposite directions at both ends thereof, and an upper portion of the pin probes 14. A first insulating panel 16 having a slot groove 16a into which a tip is inserted, and a second insulating panel 18 having a slot groove 18a into which a lower end of the pin probe 14 is fitted. It includes.

본 발명의 제2실시예는 고정바(13)가 핀프루브(14)의 표면을 관통하고, 핀프루브(14)의 하부선단을 덮는 제2절연패널(18)이 더 구비된 것이 제1실시예와 차이점이 있다. 상기 제2절연패널(18)은 블록(10)의 내면에 일체로 부착되어 슬로트홈(18a)에 핀프루브(14)의 하부선단이 끼워지도록 되어 있다. 제2절연패널(18)은 제1절연패널(16)과 마찬가지로 세라믹재질로 제작되는 것이 바람직하다.In the second embodiment of the present invention, the fixing bar 13 penetrates the surface of the pin probe 14 and further includes a second insulating panel 18 covering the lower end of the pin probe 14. There is a difference from the example. The second insulating panel 18 is integrally attached to the inner surface of the block 10 so that the lower end of the pin probe 14 is fitted into the slot groove 18a. Like the first insulating panel 16, the second insulating panel 18 may be made of a ceramic material.

본 발명의 실시예 구성에 의하면, 핀프루브(14)가 고정바(12,13)에 의해서 1차적으로 고정지지되고 제1절연패널(16)과 제2절연패널(18)에 소정간격을 두고 절연지지됨으로써 낱개의 핀프루브가 불량이 생기면 손쉽게 교환하여 사용할 수 있게 된다.According to the exemplary embodiment of the present invention, the pin probe 14 is primarily supported by the fixing bars 12 and 13 and spaced apart from the first insulating panel 16 and the second insulating panel 18 at predetermined intervals. Insulation support makes it easy to replace and use individual pin probes if they fail.

이상에서 설명한 바와 같은 본 발명에 따른 액정표시장치 검사용 핀프루브조립체에 의하면, 기존과 달리 몇개의 핀프루브가 불량이 생길 때 블록전체를 교환하지 않고 불량난 핀브루브만을 교체하여 고가인 핀프루브조립체를 반영구적으로 사용할 수 있으며, 액정표시장치의 생산비용을 절감할 수 있게 된다.According to the liquid crystal display inspection pin probe assembly according to the present invention as described above, when several pin probes are defective, expensive pin probes are replaced by replacing only the defective pin grooves without replacing the entire block. The assembly can be used semi-permanently, it is possible to reduce the production cost of the liquid crystal display device.

Claims (4)

상부가 개방되고 측벽에 다수의 고정바(12,13)가 장착된 블록(10);A block 10 having an upper portion and having a plurality of fixing bars 12 and 13 mounted on sidewalls thereof; 상기 블록(10)의 고정바(12,13)에 끼워지는 수용부(14a,14b)가 구비되고 양선단에 서로 반대방향으로 침선부(14c)가 각각 돌출형성된 다수의 핀프루브(14); 및A plurality of pin probes 14 having accommodation portions 14a and 14b fitted to the fixing bars 12 and 13 of the block 10 and protruding needle tips 14c in opposite directions at both ends thereof, respectively; And 바닥면 폭방향을 따라 각각의 상기 핀프루브(14)의 상부선단이 끼워지는 슬로트홈(16a)이 구비된 제1절연패널(16); 을 포함하는 액정표시장치 검사용 핀프루브조립체.A first insulating panel (16) having a slot groove (16a) into which an upper end of each of said pin probes (14) is fitted along a bottom width direction; Liquid crystal display inspection pin probe assembly comprising a. 제 1 항에 있어서,The method of claim 1, 상기 핀프루브(14)에 상기 블록(10)의 고정바(13)가 관통되고, 상기 핀프루브(14)의 하부선단이 각각 끼워지는 슬로트홈(18a)이 구비된 제2절연패널(18)을 더 포함하는 것을 특징으로 하는 액정표시장치 검사용 핀프루브조립체.The second insulating panel 18 having a slot groove 18a through which the fixing bar 13 of the block 10 penetrates the pin probe 14 and the lower end of the pin probe 14 is fitted. Liquid crystal display device inspection pin probe assembly further comprising a. 제 1 항 또는 제 2 항에 있어서,The method according to claim 1 or 2, 상기 고정바(12,13)는 적어도 3개 이상의 접촉표면이 형성되는 한편, 상기 핀프루브(14)의 수용부(14a,14b)에는 상기 접촉표면과 대응하게 결합면이 형성된 것을 특징으로 하는 액정표시장치 검사용 핀프루브조립체.The fixing bars 12 and 13 are formed with at least three contact surfaces, and the receiving portions 14a and 14b of the pin probe 14 have a mating surface corresponding to the contact surface. Pin probe assembly for display device inspection. 제 1 항 또는 제 2 항에 있어서,The method according to claim 1 or 2, 상기 제1,2절연패널(16,18)은 세라믹재질로 된 것을 특징으로 하는 액정표시장치 검사용 핀프루브조립체.The first and second insulating panels (16, 18) is a pin probe assembly for the liquid crystal display device characterized in that the ceramic material.
KR1020010021047A 2001-04-19 2001-04-19 Pin-probe assembly for testing LCD KR20020081721A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101071141B (en) * 2006-05-09 2010-05-26 飞而康公司 Detecting unit and detecting device with same

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101071141B (en) * 2006-05-09 2010-05-26 飞而康公司 Detecting unit and detecting device with same

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