KR20020021295A - 유리 검사장치 및 제어방법 - Google Patents
유리 검사장치 및 제어방법 Download PDFInfo
- Publication number
- KR20020021295A KR20020021295A KR1020000054076A KR20000054076A KR20020021295A KR 20020021295 A KR20020021295 A KR 20020021295A KR 1020000054076 A KR1020000054076 A KR 1020000054076A KR 20000054076 A KR20000054076 A KR 20000054076A KR 20020021295 A KR20020021295 A KR 20020021295A
- Authority
- KR
- South Korea
- Prior art keywords
- glass
- light
- inspection
- error
- unit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
- G01N2021/8893—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques providing a video image and a processed signal for helping visual decision
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
Claims (2)
- 일정한 파장을 가지고 있는 직진성이 강한 광을 발생시키는 광조사수단과, 상기 광 조사수단에서 제공되는 광을 피검사체인 유리의 표면이 아닌 두께면에 한정하여 집중적으로 조사시킴으로써 굴절율의 차이에 따라 유리 내부의 이물질로부터 에러 포인트가 발생되도록 하는 광학지그수단과, 상기 광학 지그부상의 피사체에서 반사되는 광량을 카메라를 통하여 감지하여 이미지 처리한 뒤에 에러 포인트를 출력하는 제1 검사수단과, 상기 제1 검사수단으로부터 받은 에러 포인트를 이용하여 정확한 에러의 종류를 판단한 뒤에 검사된 결과를 출력하는 제2 검사수단을 포함하여 이루어지는 것을 특징으로 하는 유리 검사 장치.
- 전원이 공급되면 동작이 시작되어 모든 변수 및 설정을 초기화시키는 단계와, 피검사체인 유리를 로딩하는 단계와, 피검사체인 유리의 공급이 완료된 후 유리의 표면이 아닌 내부에 집중하여 빛을 주사하는 단계와, 굴절율의 차이에 의하여 반사된 빛이 유리의 내부로부터 유리의 외부로 진행되는 경우에 카메라를 이용하여 일차적으로 이미지를 체킹하는 단계와, 피검사체의 표면에 형성되는 발광부의 유,무를 검사함으로써 에러 포인트가 존재하는지를 판단하는 단계와, 이차적으로 이미지를 체킹하여 발광부에 대한 정밀검사를 실시하여 에러내용을 판단하는 단계와, 검사결과에 따른 에러내용을 화면상에 디스플레이하는 단계와, 피검사체를 언로딩하고 광조사부의 동작을 오프시키므로써 종료를 하는 단계를 포함하여 이루어지는것을 특징으로 하는 유리 검사 장치의 제어방법.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2000-0054076A KR100381134B1 (ko) | 2000-09-14 | 2000-09-14 | 유리 검사장치 및 제어방법 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2000-0054076A KR100381134B1 (ko) | 2000-09-14 | 2000-09-14 | 유리 검사장치 및 제어방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20020021295A true KR20020021295A (ko) | 2002-03-20 |
KR100381134B1 KR100381134B1 (ko) | 2003-04-23 |
Family
ID=19688676
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR10-2000-0054076A Expired - Fee Related KR100381134B1 (ko) | 2000-09-14 | 2000-09-14 | 유리 검사장치 및 제어방법 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR100381134B1 (ko) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100769691B1 (ko) * | 2006-02-16 | 2007-10-24 | (주)코미 | 탭 검사장치 및 이를 이용한 탭 검사방법 |
CN117607160A (zh) * | 2024-01-23 | 2024-02-27 | 南京旗云中天科技有限公司 | 一种光伏组件表面积灰检测方法、积灰传感器及监测系统 |
CN117740816A (zh) * | 2023-11-10 | 2024-03-22 | 南京旗云中天科技有限公司 | 提高光伏组件积灰污染比检测精度的方法、传感器、系统 |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100596048B1 (ko) * | 2002-07-08 | 2006-07-03 | 삼성코닝정밀유리 주식회사 | 유리기판의 에지 검사시스템 |
KR101828536B1 (ko) | 2013-04-11 | 2018-02-12 | 한화테크윈 주식회사 | 패널 검사 방법 및 장치 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06138045A (ja) * | 1992-10-28 | 1994-05-20 | Masayoshi Tsuchiya | ガラス基板用欠陥検査装置 |
JPH1062354A (ja) * | 1996-08-20 | 1998-03-06 | Nachi Fujikoshi Corp | 透明板の欠陥検査装置及び欠陥検査方法 |
JPH11201895A (ja) * | 1998-01-16 | 1999-07-30 | Nikon Corp | 光学部材の内部不均質の検査方法および工具ガラス |
-
2000
- 2000-09-14 KR KR10-2000-0054076A patent/KR100381134B1/ko not_active Expired - Fee Related
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100769691B1 (ko) * | 2006-02-16 | 2007-10-24 | (주)코미 | 탭 검사장치 및 이를 이용한 탭 검사방법 |
CN117740816A (zh) * | 2023-11-10 | 2024-03-22 | 南京旗云中天科技有限公司 | 提高光伏组件积灰污染比检测精度的方法、传感器、系统 |
CN117607160A (zh) * | 2024-01-23 | 2024-02-27 | 南京旗云中天科技有限公司 | 一种光伏组件表面积灰检测方法、积灰传感器及监测系统 |
CN117607160B (zh) * | 2024-01-23 | 2024-03-29 | 南京旗云中天科技有限公司 | 一种光伏组件表面积灰检测方法、积灰传感器及监测系统 |
Also Published As
Publication number | Publication date |
---|---|
KR100381134B1 (ko) | 2003-04-23 |
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