KR20020018606A - 테이퍼된 랜딩을 갖는 구조 및 그 제조 방법 - Google Patents
테이퍼된 랜딩을 갖는 구조 및 그 제조 방법 Download PDFInfo
- Publication number
- KR20020018606A KR20020018606A KR1020010053303A KR20010053303A KR20020018606A KR 20020018606 A KR20020018606 A KR 20020018606A KR 1020010053303 A KR1020010053303 A KR 1020010053303A KR 20010053303 A KR20010053303 A KR 20010053303A KR 20020018606 A KR20020018606 A KR 20020018606A
- Authority
- KR
- South Korea
- Prior art keywords
- layer
- region
- conductive
- thick portion
- landing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D1/00—Resistors, capacitors or inductors
- H10D1/60—Capacitors
- H10D1/68—Capacitors having no potential barriers
- H10D1/692—Electrodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/40—Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes
- H10W20/495—Capacitive arrangements or effects of, or between wiring layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/40—Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes
- H10W20/495—Capacitive arrangements or effects of, or between wiring layers
- H10W20/496—Capacitor integral with wiring layers
Landscapes
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US65349200A | 2000-08-31 | 2000-08-31 | |
| US09/653492 | 2000-08-31 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20020018606A true KR20020018606A (ko) | 2002-03-08 |
Family
ID=24621097
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020010053303A Withdrawn KR20020018606A (ko) | 2000-08-31 | 2001-08-31 | 테이퍼된 랜딩을 갖는 구조 및 그 제조 방법 |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP2002124576A (https=) |
| KR (1) | KR20020018606A (https=) |
| GB (1) | GB2371408B (https=) |
| TW (1) | TW582090B (https=) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4949656B2 (ja) * | 2005-08-12 | 2012-06-13 | ルネサスエレクトロニクス株式会社 | 半導体装置およびその製造方法 |
| US11869725B2 (en) | 2021-11-30 | 2024-01-09 | Texas Instruments Incorporated | Multi-stacked capacitor |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5838605A (en) * | 1996-03-20 | 1998-11-17 | Ramtron International Corporation | Iridium oxide local interconnect |
| US6114766A (en) * | 1997-12-18 | 2000-09-05 | Advanced Micro Devices, Inc. | Integrated circuit with metal features presenting a larger landing area for vias |
-
2001
- 2001-08-30 TW TW090121454A patent/TW582090B/zh not_active IP Right Cessation
- 2001-08-31 JP JP2001262668A patent/JP2002124576A/ja not_active Abandoned
- 2001-08-31 GB GB0121205A patent/GB2371408B/en not_active Expired - Fee Related
- 2001-08-31 KR KR1020010053303A patent/KR20020018606A/ko not_active Withdrawn
Also Published As
| Publication number | Publication date |
|---|---|
| GB2371408A (en) | 2002-07-24 |
| GB2371408B (en) | 2004-12-22 |
| JP2002124576A (ja) | 2002-04-26 |
| TW582090B (en) | 2004-04-01 |
| GB0121205D0 (en) | 2001-10-24 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US6027980A (en) | Method of forming a decoupling capacitor | |
| US6680542B1 (en) | Damascene structure having a metal-oxide-metal capacitor associated therewith | |
| US7534692B2 (en) | Process for producing an integrated circuit comprising a capacitor | |
| US20030025143A1 (en) | Metal-insulator-metal capacitor and method of manufacture | |
| US6284619B1 (en) | Integration scheme for multilevel metallization structures | |
| US6893935B2 (en) | Semiconductor component and fabrication method | |
| US6894364B2 (en) | Capacitor in an interconnect system and method of manufacturing thereof | |
| KR100865944B1 (ko) | Mim 구조의 커패시터 제조방법 | |
| US6794702B2 (en) | Semiconductor device and fabrication method thereof | |
| JPS62188229A (ja) | 集積回路の製法 | |
| US20030006480A1 (en) | MIMCap with high dielectric constant insulator | |
| KR20030047876A (ko) | 금속-유전체-금속 커패시터 및 그 제조 방법 | |
| US7109090B1 (en) | Pyramid-shaped capacitor structure | |
| EP1378935A2 (en) | A method to form both high and low-K materials in one plane on a substrate, and their application in mixed mode circuits | |
| US12021115B2 (en) | Metal-insulator-metal (MIM) capacitor module with dielectric sidewall spacer | |
| KR20020018606A (ko) | 테이퍼된 랜딩을 갖는 구조 및 그 제조 방법 | |
| KR100607660B1 (ko) | Mim 구조의 커패시터 제조방법 | |
| US6503823B1 (en) | Method for manufacturing capacitor elements on a semiconductor substrate | |
| US6762087B1 (en) | Process for manufacturing an integrated circuit including a dual-damascene structure and a capacitor | |
| US12615786B2 (en) | Metal-insulator-metal (MIM) capacitor module | |
| US20070145599A1 (en) | Metal-insulator-metal (MIM) capacitor and methods of manufacturing the same | |
| US20230395649A1 (en) | Metal-insulator-metal (mim) capacitor module | |
| KR100450244B1 (ko) | 반도체 소자 및 그 제조 방법 | |
| KR100480890B1 (ko) | 반도체 장치의 커패시터의 제조방법 | |
| KR19990061344A (ko) | 메탈-절연막-메탈 커페시터의 제조방법 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
Patent event code: PA01091R01D Comment text: Patent Application Patent event date: 20010831 |
|
| PG1501 | Laying open of application | ||
| PC1203 | Withdrawal of no request for examination | ||
| WITN | Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid |