KR20010013719A - 저비용으로 용이하게 사용할 수 있는 자동 테스트 시스템소프트웨어 - Google Patents

저비용으로 용이하게 사용할 수 있는 자동 테스트 시스템소프트웨어 Download PDF

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Publication number
KR20010013719A
KR20010013719A KR1019997011734A KR19997011734A KR20010013719A KR 20010013719 A KR20010013719 A KR 20010013719A KR 1019997011734 A KR1019997011734 A KR 1019997011734A KR 19997011734 A KR19997011734 A KR 19997011734A KR 20010013719 A KR20010013719 A KR 20010013719A
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KR
South Korea
Prior art keywords
test
data
spreadsheet
program
software
Prior art date
Application number
KR1019997011734A
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English (en)
Korean (ko)
Inventor
프로스카우어다니엘씨.
데시판데프라딥비.
Original Assignee
레카 도날드 지.
테라다인 인코퍼레이티드
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 레카 도날드 지., 테라다인 인코퍼레이티드 filed Critical 레카 도날드 지.
Publication of KR20010013719A publication Critical patent/KR20010013719A/ko

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31912—Tester/user interface
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Human Computer Interaction (AREA)
  • Tests Of Electronic Circuits (AREA)
KR1019997011734A 1997-06-13 1998-06-04 저비용으로 용이하게 사용할 수 있는 자동 테스트 시스템소프트웨어 KR20010013719A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/874,615 1997-06-13
US08/874,615 US5910895A (en) 1997-06-13 1997-06-13 Low cost, easy to use automatic test system software

Publications (1)

Publication Number Publication Date
KR20010013719A true KR20010013719A (ko) 2001-02-26

Family

ID=25364174

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019997011734A KR20010013719A (ko) 1997-06-13 1998-06-04 저비용으로 용이하게 사용할 수 있는 자동 테스트 시스템소프트웨어

Country Status (6)

Country Link
US (1) US5910895A (de)
EP (1) EP0988558B1 (de)
JP (1) JP4972244B2 (de)
KR (1) KR20010013719A (de)
DE (1) DE69826659T2 (de)
WO (1) WO1998057187A1 (de)

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US7050937B2 (en) 2003-07-18 2006-05-23 Samsung Electronics Co., Ltd. Performance measurement system
KR20150104814A (ko) * 2014-03-06 2015-09-16 삼성전자주식회사 스프레드 시트를 이용한 rtl 자동 합성 시스템, 방법 및 기록매체

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Also Published As

Publication number Publication date
EP0988558A1 (de) 2000-03-29
DE69826659D1 (de) 2004-11-04
JP2002505000A (ja) 2002-02-12
EP0988558B1 (de) 2004-09-29
JP4972244B2 (ja) 2012-07-11
WO1998057187A1 (en) 1998-12-17
DE69826659T2 (de) 2005-10-06
US5910895A (en) 1999-06-08

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