KR19990031195U - 푸셔 및 캐리어의 방열구조 - Google Patents
푸셔 및 캐리어의 방열구조 Download PDFInfo
- Publication number
- KR19990031195U KR19990031195U KR2019970043904U KR19970043904U KR19990031195U KR 19990031195 U KR19990031195 U KR 19990031195U KR 2019970043904 U KR2019970043904 U KR 2019970043904U KR 19970043904 U KR19970043904 U KR 19970043904U KR 19990031195 U KR19990031195 U KR 19990031195U
- Authority
- KR
- South Korea
- Prior art keywords
- head
- carrier
- pusher
- memory device
- pole
- Prior art date
Links
- 230000017525 heat dissipation Effects 0.000 title claims abstract description 23
- 230000005855 radiation Effects 0.000 abstract description 3
- 230000001939 inductive effect Effects 0.000 abstract description 2
- 239000012050 conventional carrier Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
- G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature
Landscapes
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
Description
Claims (3)
- 몸체의 하단부분에 연결축으로 연결되는 헤드를 갖는 푸셔와. 상기 헤드의 저면에 고정되어 메모리장치가 고정되는 메모리 테스트장치에 있어서,상기 헤드의 외측으로 일정 간격으로 돌출되어 헤드에서 발생된 열을 방출하는 방열부재와;상기 헤드의 저면부분에 원형축으로 돌출된 폴대와;상기 폴대에 끼워지는 폴대끼움공이 형성되고, 상부면에 헤드 저면 사이의 공간부분으로 흐르는 공기를 유도하는 방열판을 형성하며, 메모리장치를 고정시키는 캐리어로 구성된 것을 특징으로 하는 푸셔 및 캐리어의 방열구조.
- 제 1 항에 있어서, 상기 방열부재는 원형 단면의 봉상으로 돌출되는 것을 특징으로 하는 푸셔 및 캐리어의 방열구조.
- 제 1 항에 있어서, 상기 방열판은 캐리어의 상부면으로 타원형상으로 다단계로 형성되는 것을 특징으로 하는 푸셔 및 캐리어의 방열구조.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019970043904U KR200248168Y1 (ko) | 1997-12-30 | 1997-12-30 | 푸셔 및 캐리어의 방열구조 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019970043904U KR200248168Y1 (ko) | 1997-12-30 | 1997-12-30 | 푸셔 및 캐리어의 방열구조 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR19990031195U true KR19990031195U (ko) | 1999-07-26 |
KR200248168Y1 KR200248168Y1 (ko) | 2001-11-22 |
Family
ID=53897873
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR2019970043904U KR200248168Y1 (ko) | 1997-12-30 | 1997-12-30 | 푸셔 및 캐리어의 방열구조 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR200248168Y1 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20040026902A (ko) * | 2002-09-26 | 2004-04-01 | 대우전자주식회사 | 반도체 방열부재의 성능 시험 장치 |
-
1997
- 1997-12-30 KR KR2019970043904U patent/KR200248168Y1/ko not_active IP Right Cessation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20040026902A (ko) * | 2002-09-26 | 2004-04-01 | 대우전자주식회사 | 반도체 방열부재의 성능 시험 장치 |
Also Published As
Publication number | Publication date |
---|---|
KR200248168Y1 (ko) | 2001-11-22 |
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