KR19990009765A - Dual scan drive type substrate for liquid crystal display - Google Patents

Abstract

The present invention relates to a repair line structure and a repair method of a substrate which can be applied to a liquid crystal display substrate using a dual scan driving method, and a plurality of gate lines are formed in the horizontal direction of the substrate, and are perpendicular to the gate lines. A first data line group including a plurality of data lines formed on the upper half of the substrate in a vertical direction intersecting the second data line, and a second data line group including a plurality of data lines formed on the lower half of the substrate on the same line as the data lines, respectively. In the dual scan drive type liquid crystal display substrate in which the two data line groups are separated from each other at the center of the substrate, a repair is repeatedly formed in parallel with the data lines of each data line group and adjacent to each predetermined number of data lines. Lines formed on the upper and lower ends of the substrate in parallel with the lines and the gate lines, respectively. Two data control ring and a line separated from each other and surrounding the central group on a substrate comprising a common gate line that is formed into a shape.

Description

Dual scan drive type substrate for liquid crystal display

The present invention relates to a substrate for a liquid crystal display device, and more particularly, to a repair line structure and a repair method applicable to a substrate for a liquid crystal display device using a dual scan driving method.

As the pattern refinement of the liquid crystal display panel is required, defects in signal lines such as gate lines or data lines are becoming a serious problem. Moreover, as the panel becomes higher resolution (SXGA or higher), it is becoming more difficult to repair a faulty line due to an increase in load due to parasitic capacitance existing between the data line and the repair line for repairing it. .

Therefore, a dual scan driving scheme is used as a method for reducing such a load by half. In this manner, as shown in Fig. 1, the data lines d1 to dn extending from the upper end to the lower end of the substrate are separated at the center of the substrate. The data of one frame is divided in half and stored in two memories, and the data stored in each memory is supplied from the top of the substrate to the center of the substrate and from the bottom of the substrate to the center of the substrate. Because the (m / 2 + 1) th gate lines are scanned simultaneously or with a slight time difference (where m is the total number of gate lines), as described above, the load on the data lines can be reduced to 1/2 as well as the scanning An advantage is that the signal can be applied to the gate line for a sufficient time.

However, in the panel driven by the dual scan method, since half a frame of data is supplied above and below the substrate, the repair ring as used in the conventional single scan drive panel is used. Or there is a structural problem that can not be applied to repair by the PCB repair ring.

Accordingly, an object of the present invention is to provide a signal line repair method that can be applied to a liquid crystal display panel having a dual scan driving method by a simple method.

1 is a view illustrating a signal line structure of a substrate for a liquid crystal display of a general dual scan driving method;

2 is a view showing a repair line structure of a substrate for a liquid crystal display device of a dual scan driving method according to the present invention;

3 is a view showing a repair method of a data line disconnected from the substrate shown in FIG.

4 is a view showing a wiring structure when the independent wiring method is applied to the substrate shown in FIG.

FIG. 5 is a diagram illustrating a wiring structure when the shear gate method is applied to the substrate illustrated in FIG. 2.

Explanation of symbols on the main parts of the drawings

5: repair ring 6: repair line

11, 12: data driver 20: gate driver

30: redundant gate line

This invention for achieving said subject,

A plurality of gate lines are formed in the horizontal direction of the substrate, respectively, and include a first data line group including a plurality of data lines formed in the upper half of the substrate in a vertical direction perpendicular to the gate lines, and in parallel with each other. In the second data line group including a plurality of data lines formed in the lower half of the substrate, the two data line group is a substrate for a liquid crystal display device of the dual scan driving method is separated from each other in the center of the substrate,

In each data line group, a plurality of repair lines are repeatedly formed in parallel with the data lines and adjacent to a certain number of data lines, and repair rings are formed at the upper and lower ends of the substrate in parallel with the gate lines, respectively. . In addition, two data line groups in which the common gate lines are separated from each other are formed in the center of the substrate.

DETAILED DESCRIPTION Hereinafter, exemplary embodiments of the present invention will be described with reference to the accompanying drawings so that those skilled in the art can easily implement the present invention.

2 is a view showing a repair line structure of a substrate for a liquid crystal display device of a dual scan driving method according to the present invention.

As illustrated in FIG. 2, a plurality of gate lines g1 to gm are formed in the horizontal direction of the substrate in the dual scan driving substrate for the liquid crystal display, and are perpendicular to the gate lines g1 to gm. A plurality of data lines d1 to dn extending from the top of the substrate to the center in the longitudinal direction of the substrate are formed so as to intersect. A plurality of data lines d1 'to dn' extending from the lower end to the center of the substrate are formed on the same line as the data lines d1 to dn, respectively, and these two groups of data lines are separated from each other at the center of the substrate. .

In each data line group, a repair line 6 is repeatedly formed adjacent to each data line in parallel with the data line, and a repair ring 5 is formed in each of the upper and lower ends of the substrate in parallel with the gate line. A double gate line 30 having a ladder structure surrounds two data line groups separated from each other at the center of the substrate.

At this time, the repair ring 5 formed at the upper end of the substrate intersects all the data lines d1 to dn of the upper half of the substrate and the repair line 6 adjacent thereto, and the repair ring 5 formed at the lower end of the substrate The data lines d1 'to dn' intersect with the repair line 6 adjacent thereto. The double gate line 30 having a ladder structure formed at the center of the substrate also intersects all the data lines d1 to dn and d1 'to dn' and the repair line 6 adjacent thereto.

FIG. 4 is a diagram illustrating a wiring structure when the independent wiring method is applied to the substrate illustrated in FIG. 2, and FIG. 5 is a diagram illustrating a wiring structure when the shear gate method is applied to the substrate illustrated in FIG. 2.

In the substrate to which the independent wiring method shown in FIG. 4 is applied, a storage capacitor is formed between the double gate line 30 having a ladder structure and the pixel electrode, that is, the ITO film 40, which are repeatedly formed for each gate line. The double gate line 30 having a ladder structure formed at the center is formed to surround the separated data line group.

In the substrate to which the front gate method shown in FIG. 5 is applied, a double gate line 30 having a ladder structure is formed as a gate line for scanning each line of the panel, and is held between the gate line 30 and the ITO film 40. The capacitance is formed, and the double gate line 30 having a ladder structure formed in the center of the substrate is formed in a structure surrounding the separated data line groups as in the substrate to which the independent wiring method is applied.

Such a wiring structure in a substrate using the independent wiring method or the front gate method not only reduces the load of the data line by 1/2, but also the driving margin of the panel, that is, the scanning signal is applied to the gate line. There is an advantage that it is possible to secure a sufficient time to be applied. However, it should be taken into consideration that the aperture ratio may be reduced to some extent in the pixel layout in the panel in which the front gate method is applied.

FIG. 3 is a view illustrating a repair method of a data line disconnected from the substrate shown in FIG. 2.

As shown in FIG. 3, assuming that a specific data line di of the upper half of the substrate is disconnected, the data line di and the repair line 6 adjacent thereto are first repaired to repair the disconnected data line di. Points a and b that intersect the repair ring 5 formed at the upper end of the substrate and the data line di and the repair line 6 adjacent thereto intersect the double gate line 30 of the ladder structure formed at the center of the substrate. Shorting (▲) points c and d with a laser respectively.

Next, both the points a 'and b' outside the section formed by the laser shorted points a and b in the repair ring 5 formed at the upper end of the substrate are cut (□) and similarly formed at the center of the substrate. The two points c 'and d' outside the section formed by the laser shorted points c and d in the double gate line 30 are cut (□). If one data line is broken in this way, the repair is completed by shorting the four points and cutting the four points.

At the end of this repair process, the image signal is transmitted through the path of P1 to the disconnected point f along the data line di, at which point the repair ring 5 to the repair line 6 and the center of the substrate. The image signal is transmitted through the path of P2 leading to the double gate line 30 of.

Therefore, the double gate line 30 of the ladder structure formed in the center of the substrate is used not only to form the storage capacitance but also to perform the dual function of performing a repair function. In addition, because of the double structure of the ladder shape, not only the data line but also the disconnected gate line can be repaired.

An effect of the liquid crystal display substrate according to the present invention having the above structure is that a signal line in which a defect occurs in a liquid crystal display panel driven by a dual scan method can be repaired by a simple method.

Claims (9)

A plurality of gate lines are formed in the horizontal direction of the substrate, respectively, and include a first data line group including a plurality of data lines formed in the upper half of the substrate in a vertical direction perpendicular to the gate lines, and in parallel with each other. In the second data line group including a plurality of data lines formed in the lower half of the substrate, the two data line group is a substrate for a liquid crystal display device of the dual scan driving method is separated from each other in the center of the substrate, A repair line which is repeatedly formed in parallel with the data lines of each data line group and adjacent to each predetermined number of data lines, A repair ring formed at an upper end and a lower end of the substrate in parallel with the gate line, and A liquid crystal display substrate comprising a common gate line formed to surround two groups of data lines separated from each other at a center of the substrate. In claim 1, The repair ring formed at an upper end portion of the substrate crosses all data lines of the first data line group and the repair line adjacent thereto. In claim 2, The repair ring formed at the lower end of the substrate crosses all data lines of the second data line group and the repair line adjacent thereto. In claim 3, And a common gate line formed at the center of the substrate intersects all data lines of the upper and lower half of the substrate and a repair line adjacent thereto. In claim 4, The common gate line is a double gate line of a ladder structure substrate for a liquid crystal display device. In claim 5, The double gate line is a substrate for a liquid crystal display device that is responsible for data line repair and gate line repair at the same time. In claim 6, And the double gate line forms a storage capacitor for holding an image signal together with a pixel electrode. In claim 1, The repair line is a substrate for a liquid crystal display device is formed repeatedly repeatedly adjacent to each data line. The repair line is repeatedly formed adjacent to each of a predetermined number of data lines in parallel with each data line formed in the upper half and the lower half of the substrate, and the repair ring is formed at the upper end and the lower end of the substrate in parallel with the gate line. In the substrate for a dual scan drive type liquid crystal display device which is formed in a form surrounding the data line formed separately from each other in the upper half and the lower half of the substrate in the center of the substrate, Shorting a point at which the disconnected data line and a repair line adjacent thereto intersect the repair ring formed at the upper end of the substrate and a point at which the disconnected data line and the repair line adjacent thereto intersect the common gate line formed at the center of the substrate, Cutting both two points outside the section formed by the two laser shorted points in the repair ring formed at the upper end of the substrate, and cutting both two points outside the section formed by the two laser shorted points at the common gate line formed at the center of the substrate. Repair method of the board | substrate for liquid crystal display devices containing.