KR102882669B1 - 소전류 증폭용 증폭 장치 - Google Patents

소전류 증폭용 증폭 장치

Info

Publication number
KR102882669B1
KR102882669B1 KR1020217030597A KR20217030597A KR102882669B1 KR 102882669 B1 KR102882669 B1 KR 102882669B1 KR 1020217030597 A KR1020217030597 A KR 1020217030597A KR 20217030597 A KR20217030597 A KR 20217030597A KR 102882669 B1 KR102882669 B1 KR 102882669B1
Authority
KR
South Korea
Prior art keywords
amplifier
current
input
path
paragraph
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
KR1020217030597A
Other languages
English (en)
Korean (ko)
Other versions
KR20210145745A (ko
Inventor
노르베르트 롤프
Original Assignee
인피콘 게엠베하
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 인피콘 게엠베하 filed Critical 인피콘 게엠베하
Publication of KR20210145745A publication Critical patent/KR20210145745A/ko
Application granted granted Critical
Publication of KR102882669B1 publication Critical patent/KR102882669B1/ko
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/08Circuits for altering the measuring range
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/36Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03FAMPLIFIERS
    • H03F3/00Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45Differential amplifiers
    • H03F3/45071Differential amplifiers with semiconductor devices only
    • H03F3/45076Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
    • H03F3/45475Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using IC blocks as the active amplifying circuit
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03FAMPLIFIERS
    • H03F3/00Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/72Gated amplifiers, i.e. amplifiers which are rendered operative or inoperative by means of a control signal
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0004Gaseous mixtures, e.g. polluted air
    • G01N33/0009General constructional details of gas analysers, e.g. portable test equipment
    • G01N33/0027General constructional details of gas analysers, e.g. portable test equipment concerning the detector
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/36Overload-protection arrangements or circuits for electric measuring instruments
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0046Arrangements for measuring currents or voltages or for indicating presence or sign thereof characterised by a specific application or detail not covered by any other subgroup of G01R19/00
    • G01R19/0061Measuring currents of particle-beams, currents from electron multipliers, photocurrents, ion currents; Measuring in plasmas
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03FAMPLIFIERS
    • H03F2200/00Indexing scheme relating to amplifiers
    • H03F2200/261Amplifier which being suitable for instrumentation applications
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03FAMPLIFIERS
    • H03F2200/00Indexing scheme relating to amplifiers
    • H03F2200/426Indexing scheme relating to amplifiers the amplifier comprising circuitry for protection against overload
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03FAMPLIFIERS
    • H03F2200/00Indexing scheme relating to amplifiers
    • H03F2200/444Diode used as protection means in an amplifier, e.g. as a limiter or as a switch
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03FAMPLIFIERS
    • H03F2200/00Indexing scheme relating to amplifiers
    • H03F2200/462Indexing scheme relating to amplifiers the current being sensed
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03FAMPLIFIERS
    • H03F2203/00Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
    • H03F2203/45Indexing scheme relating to differential amplifiers
    • H03F2203/45138Two or more differential amplifiers in IC-block form are combined, e.g. measuring amplifiers
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03FAMPLIFIERS
    • H03F2203/00Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
    • H03F2203/45Indexing scheme relating to differential amplifiers
    • H03F2203/45518Indexing scheme relating to differential amplifiers the FBC comprising one or more diodes and being coupled between the LC and the IC
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03FAMPLIFIERS
    • H03F2203/00Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
    • H03F2203/72Indexing scheme relating to gated amplifiers, i.e. amplifiers which are rendered operative or inoperative by means of a control signal
    • H03F2203/7227Indexing scheme relating to gated amplifiers, i.e. amplifiers which are rendered operative or inoperative by means of a control signal the gated amplifier being switched on or off by a switch in the supply circuit of the amplifier

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Amplifiers (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Combustion & Propulsion (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
KR1020217030597A 2019-03-29 2020-03-06 소전류 증폭용 증폭 장치 Active KR102882669B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102019108192.0A DE102019108192A1 (de) 2019-03-29 2019-03-29 Verstärkervorrichtung zur Verstärkung kleiner Ströme
DE102019108192.0 2019-03-29
PCT/EP2020/056031 WO2020200644A1 (de) 2019-03-29 2020-03-06 Verstärkervorrichtung zur verstärkung kleiner ströme

Publications (2)

Publication Number Publication Date
KR20210145745A KR20210145745A (ko) 2021-12-02
KR102882669B1 true KR102882669B1 (ko) 2025-11-07

Family

ID=69810812

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020217030597A Active KR102882669B1 (ko) 2019-03-29 2020-03-06 소전류 증폭용 증폭 장치

Country Status (8)

Country Link
US (1) US12603623B2 (https=)
EP (1) EP3948306B1 (https=)
JP (1) JP7627662B2 (https=)
KR (1) KR102882669B1 (https=)
CN (1) CN113614548B (https=)
DE (1) DE102019108192A1 (https=)
TW (1) TWI848089B (https=)
WO (1) WO2020200644A1 (https=)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI3719993T3 (fi) * 2019-04-02 2023-03-20 QuantalRF AG Radiotaajuustehovahvistinjärjestelmä ja menetelmä sen lähtösignaalin linearisoimiseksi
WO2022173862A1 (en) 2021-02-09 2022-08-18 QuantalRF AG System and method for adjusting amplifier bias current based on input signal envelope tracking
US11973478B2 (en) * 2021-09-02 2024-04-30 Globalfoundries U.S. Inc. Single-to-differential converter
KR102735229B1 (ko) * 2022-07-14 2024-11-28 (주)시스코어 저잡음 완전 차동 전하 증폭기
US12519456B2 (en) 2022-08-31 2026-01-06 QuantalRF AG Integrated coupled resonator filtering
KR102888013B1 (ko) * 2023-12-07 2025-11-24 주식회사 인스파워 광대역 피드-포워드 증폭기 및 이를 제어하는 제어 장치

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017198661A (ja) * 2016-04-26 2017-11-02 パナソニックIpマネジメント株式会社 気体検出装置及び気体検出方法

Family Cites Families (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2723609A1 (de) 1977-05-25 1978-11-30 Leybold Heraeus Gmbh & Co Kg Eingangsschaltung fuer einen messverstaerker
US4259643A (en) 1979-01-25 1981-03-31 National Semiconductor Corporation Current gain amplifier cell
DE3144003C2 (de) 1981-11-04 1984-11-08 Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V., 3400 Göttingen Meßanordnung für extrem kleine Ströme
JPS63190974A (ja) 1987-01-29 1988-08-08 Horikawa Jiro 加硫ゴムパツキン
JPH0645909Y2 (ja) * 1987-05-29 1994-11-24 株式会社アドバンテスト Ic試験装置
DE4140112A1 (de) * 1991-12-05 1993-06-09 Leybold Ag, 6450 Hanau, De Verfahren und schaltung zur messung von teilchenstroemen
JP3181954B2 (ja) * 1991-10-30 2001-07-03 アジレント・テクノロジー株式会社 電流/電圧変換回路およびこの回路を用いた電流/電圧変換方法
US6583421B2 (en) 2001-10-11 2003-06-24 Diamond Semiconductor Group, Llc Charge measuring device with wide dynamic range
US6897665B2 (en) 2003-09-06 2005-05-24 Taiwan Semiconductor Manufacturing Co., Ltd In-situ electron beam induced current detection
US7230431B2 (en) * 2004-01-27 2007-06-12 Aadu Mirme Integrating electrometer amplifying circuit
US20090000236A1 (en) 2006-01-18 2009-01-01 David Schlumpf Keeper device for perpendicularly positioning a tie rod relative to a panel form wall
DE102007030172A1 (de) * 2007-06-27 2009-01-15 Forschungszentrum Jülich GmbH Strommessgerät mit hoher Dynamik und kleiner Zeitkonstante
US9086400B2 (en) 2007-11-29 2015-07-21 Cornell Research Foundation, Inc. Amplifier and array for measuring small current
CN101236404B (zh) * 2008-02-29 2010-06-02 钱生宏 一种延时切换控制器
CN101556169A (zh) * 2008-04-07 2009-10-14 中国科学院空间科学与应用研究中心 一种微电流放大器
JP4800371B2 (ja) * 2008-07-30 2011-10-26 富士男 小澤 レンジ切り替え回路
CN102472097B (zh) 2009-07-09 2015-03-04 斯克皮尔塔公司 用于高度耐磨应用的耐磨附件
US8278909B2 (en) * 2009-07-16 2012-10-02 Mks Instruments, Inc. Wide-dynamic range electrometer with a fast response
CN102545793A (zh) 2010-12-17 2012-07-04 南京航空航天大学 一种pA-μA量程的微弱电流放大器
WO2013179058A2 (en) 2012-06-01 2013-12-05 Smiths Detection-Watford Limited Capacitive transimpedance amplifier with offset
US9274145B2 (en) * 2012-10-22 2016-03-01 Tektronix, Inc. Active shunt ammeter apparatus and method
KR101582994B1 (ko) * 2013-11-12 2016-01-06 가락전자 주식회사 Dsp 내장형 오디오 증폭기의 출력 제어방법
CN103558445B (zh) * 2013-11-13 2019-05-21 福禄克精密测量有限公司 电流检测电路以及测量装置
CN103592498B (zh) * 2013-11-13 2019-05-03 福禄克精密测量有限公司 电流检测电路
CN203708590U (zh) * 2014-01-26 2014-07-09 深圳市梓晶微科技有限公司 一种具有高功率因数高效率的led线性恒流控制电路
CN203759112U (zh) * 2014-03-31 2014-08-06 深圳市嘉力电气技术有限公司 一种高频电流检测电路
US9671270B2 (en) 2015-07-30 2017-06-06 Daniel Measurement And Control, Inc. Flow meter having electronic mount bracket assembly
CN105372525A (zh) * 2015-11-09 2016-03-02 上海芯哲微电子科技有限公司 运算放大器的测试电路
CN106936423B (zh) * 2015-12-29 2024-10-01 柳州桂通科技股份有限公司 运算放大器、驱动接口、测控设备、驱动电路和驱动器
CN107171650B (zh) * 2016-03-08 2020-04-17 晶豪科技股份有限公司 可变增益放大电路
JP6594810B2 (ja) * 2016-03-23 2019-10-23 ルネサスエレクトロニクス株式会社 電流検出回路及びそれを備えたdcdcコンバータ
US9806685B1 (en) 2016-05-13 2017-10-31 Mks Instruments, Inc. Trans-impedance amplifier with increased dynamic range
US10338224B2 (en) * 2017-03-27 2019-07-02 Analog Devices Global Unlimited Company High dynamic range analog front-end receiver for long range LIDAR
EP4042566A1 (de) * 2019-10-09 2022-08-17 Gottfried Wilhelm Leibniz Universität Hannover Elektrische schaltung

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017198661A (ja) * 2016-04-26 2017-11-02 パナソニックIpマネジメント株式会社 気体検出装置及び気体検出方法

Also Published As

Publication number Publication date
WO2020200644A1 (de) 2020-10-08
CN113614548B (zh) 2024-02-20
US12603623B2 (en) 2026-04-14
EP3948306B1 (de) 2025-11-19
TW202037072A (zh) 2020-10-01
EP3948306A1 (de) 2022-02-09
KR20210145745A (ko) 2021-12-02
DE102019108192A1 (de) 2020-10-01
TWI848089B (zh) 2024-07-11
JP7627662B2 (ja) 2025-02-06
JP2022526362A (ja) 2022-05-24
CN113614548A (zh) 2021-11-05
US20250192731A1 (en) 2025-06-12

Similar Documents

Publication Publication Date Title
KR102882669B1 (ko) 소전류 증폭용 증폭 장치
US2329073A (en) Thermionic tube circuit
EP1174720A3 (en) Current sensing circuit
US9531181B2 (en) Current sensing circuit
US20070103174A1 (en) Direct current test apparatus
US10001424B2 (en) Physical quantity detector
CN116569072A (zh) 用于光子计数应用的前端电子电路
CN111064442A (zh) 用于测量宽范围的电流的放大器系统
RU2797496C2 (ru) Усилительное устройство для усиления малых токов
CN105960618B (zh) 用于检测电流的电流探测装置和方法
JP5829745B1 (ja) 放射線測定装置
CN103518140A (zh) 用于测量电荷的系统
US6825717B2 (en) Feedback network and amplifier and/or converter circuit with a feedback network
JPH07501616A (ja) 粒子電流の測定方法および測定回路
JP2010127820A (ja) 直流試験装置及び半導体試験装置
JPWO2020200644A5 (https=)
CN117311441B (zh) 电流镜像电路、方法及装置
JP2007040771A (ja) ノイズ測定用半導体装置
KR101138692B1 (ko) 부하 전류 검출 회로
Herbert A circuit for stabilizing the electron current to the anode of a hot-filament device
US7852141B2 (en) Circuit arrangement for selective generation of an analog current output value or an analog voltage output value
US2739286A (en) Alpha survey meter circuit
CN110389611B (zh) 电流平衡电路
JP4967652B2 (ja) 電流電圧増幅回路および半導体試験装置
JP2022126026A (ja) 電流信号処理装置

Legal Events

Date Code Title Description
PA0105 International application

St.27 status event code: A-0-1-A10-A15-nap-PA0105

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

R17-X000 Change to representative recorded

St.27 status event code: A-3-3-R10-R17-oth-X000

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

D22 Grant of ip right intended

Free format text: ST27 STATUS EVENT CODE: A-1-2-D10-D22-EXM-PE0701 (AS PROVIDED BY THE NATIONAL OFFICE)

PE0701 Decision of registration

St.27 status event code: A-1-2-D10-D22-exm-PE0701

F11 Ip right granted following substantive examination

Free format text: ST27 STATUS EVENT CODE: A-2-4-F10-F11-EXM-PR0701 (AS PROVIDED BY THE NATIONAL OFFICE)

PR0701 Registration of establishment

St.27 status event code: A-2-4-F10-F11-exm-PR0701

PR1002 Payment of registration fee

St.27 status event code: A-2-2-U10-U12-oth-PR1002

Fee payment year number: 1

U12 Designation fee paid

Free format text: ST27 STATUS EVENT CODE: A-2-2-U10-U12-OTH-PR1002 (AS PROVIDED BY THE NATIONAL OFFICE)

Year of fee payment: 1

PG1601 Publication of registration

St.27 status event code: A-4-4-Q10-Q13-nap-PG1601

Q13 Ip right document published

Free format text: ST27 STATUS EVENT CODE: A-4-4-Q10-Q13-NAP-PG1601 (AS PROVIDED BY THE NATIONAL OFFICE)