JP7627662B2 - 小電流を増幅する増幅装置 - Google Patents
小電流を増幅する増幅装置 Download PDFInfo
- Publication number
- JP7627662B2 JP7627662B2 JP2021557746A JP2021557746A JP7627662B2 JP 7627662 B2 JP7627662 B2 JP 7627662B2 JP 2021557746 A JP2021557746 A JP 2021557746A JP 2021557746 A JP2021557746 A JP 2021557746A JP 7627662 B2 JP7627662 B2 JP 7627662B2
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- JP
- Japan
- Prior art keywords
- amplifier
- current
- input
- path
- feedback
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/72—Gated amplifiers, i.e. amplifiers which are rendered operative or inoperative by means of a control signal
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/08—Circuits for altering the measuring range
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
- H03F3/45475—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using IC blocks as the active amplifying circuit
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/0004—Gaseous mixtures, e.g. polluted air
- G01N33/0009—General constructional details of gas analysers, e.g. portable test equipment
- G01N33/0027—General constructional details of gas analysers, e.g. portable test equipment concerning the detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/36—Overload-protection arrangements or circuits for electric measuring instruments
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0046—Arrangements for measuring currents or voltages or for indicating presence or sign thereof characterised by a specific application or detail not covered by any other subgroup of G01R19/00
- G01R19/0061—Measuring currents of particle-beams, currents from electron multipliers, photocurrents, ion currents; Measuring in plasmas
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/261—Amplifier which being suitable for instrumentation applications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/426—Indexing scheme relating to amplifiers the amplifier comprising circuitry for protection against overload
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/444—Diode used as protection means in an amplifier, e.g. as a limiter or as a switch
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/462—Indexing scheme relating to amplifiers the current being sensed
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45138—Two or more differential amplifiers in IC-block form are combined, e.g. measuring amplifiers
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/45—Indexing scheme relating to differential amplifiers
- H03F2203/45518—Indexing scheme relating to differential amplifiers the FBC comprising one or more diodes and being coupled between the LC and the IC
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
- H03F2203/72—Indexing scheme relating to gated amplifiers, i.e. amplifiers which are rendered operative or inoperative by means of a control signal
- H03F2203/7227—Indexing scheme relating to gated amplifiers, i.e. amplifiers which are rendered operative or inoperative by means of a control signal the gated amplifier being switched on or off by a switch in the supply circuit of the amplifier
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Amplifiers (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Combustion & Propulsion (AREA)
- Food Science & Technology (AREA)
- Medicinal Chemistry (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102019108192.0A DE102019108192A1 (de) | 2019-03-29 | 2019-03-29 | Verstärkervorrichtung zur Verstärkung kleiner Ströme |
| DE102019108192.0 | 2019-03-29 | ||
| PCT/EP2020/056031 WO2020200644A1 (de) | 2019-03-29 | 2020-03-06 | Verstärkervorrichtung zur verstärkung kleiner ströme |
Publications (4)
| Publication Number | Publication Date |
|---|---|
| JP2022526362A JP2022526362A (ja) | 2022-05-24 |
| JPWO2020200644A5 JPWO2020200644A5 (https=) | 2022-12-26 |
| JP2022526362A5 JP2022526362A5 (https=) | 2022-12-26 |
| JP7627662B2 true JP7627662B2 (ja) | 2025-02-06 |
Family
ID=69810812
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2021557746A Active JP7627662B2 (ja) | 2019-03-29 | 2020-03-06 | 小電流を増幅する増幅装置 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US12603623B2 (https=) |
| EP (1) | EP3948306B1 (https=) |
| JP (1) | JP7627662B2 (https=) |
| KR (1) | KR102882669B1 (https=) |
| CN (1) | CN113614548B (https=) |
| DE (1) | DE102019108192A1 (https=) |
| TW (1) | TWI848089B (https=) |
| WO (1) | WO2020200644A1 (https=) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FI3719993T3 (fi) * | 2019-04-02 | 2023-03-20 | QuantalRF AG | Radiotaajuustehovahvistinjärjestelmä ja menetelmä sen lähtösignaalin linearisoimiseksi |
| WO2022173862A1 (en) | 2021-02-09 | 2022-08-18 | QuantalRF AG | System and method for adjusting amplifier bias current based on input signal envelope tracking |
| US11973478B2 (en) * | 2021-09-02 | 2024-04-30 | Globalfoundries U.S. Inc. | Single-to-differential converter |
| KR102735229B1 (ko) * | 2022-07-14 | 2024-11-28 | (주)시스코어 | 저잡음 완전 차동 전하 증폭기 |
| US12519456B2 (en) | 2022-08-31 | 2026-01-06 | QuantalRF AG | Integrated coupled resonator filtering |
| KR102888013B1 (ko) * | 2023-12-07 | 2025-11-24 | 주식회사 인스파워 | 광대역 피드-포워드 증폭기 및 이를 제어하는 제어 장치 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2017198661A (ja) | 2016-04-26 | 2017-11-02 | パナソニックIpマネジメント株式会社 | 気体検出装置及び気体検出方法 |
Family Cites Families (34)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2723609A1 (de) | 1977-05-25 | 1978-11-30 | Leybold Heraeus Gmbh & Co Kg | Eingangsschaltung fuer einen messverstaerker |
| US4259643A (en) | 1979-01-25 | 1981-03-31 | National Semiconductor Corporation | Current gain amplifier cell |
| DE3144003C2 (de) | 1981-11-04 | 1984-11-08 | Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V., 3400 Göttingen | Meßanordnung für extrem kleine Ströme |
| JPS63190974A (ja) | 1987-01-29 | 1988-08-08 | Horikawa Jiro | 加硫ゴムパツキン |
| JPH0645909Y2 (ja) * | 1987-05-29 | 1994-11-24 | 株式会社アドバンテスト | Ic試験装置 |
| DE4140112A1 (de) * | 1991-12-05 | 1993-06-09 | Leybold Ag, 6450 Hanau, De | Verfahren und schaltung zur messung von teilchenstroemen |
| JP3181954B2 (ja) * | 1991-10-30 | 2001-07-03 | アジレント・テクノロジー株式会社 | 電流/電圧変換回路およびこの回路を用いた電流/電圧変換方法 |
| US6583421B2 (en) | 2001-10-11 | 2003-06-24 | Diamond Semiconductor Group, Llc | Charge measuring device with wide dynamic range |
| US6897665B2 (en) | 2003-09-06 | 2005-05-24 | Taiwan Semiconductor Manufacturing Co., Ltd | In-situ electron beam induced current detection |
| US7230431B2 (en) * | 2004-01-27 | 2007-06-12 | Aadu Mirme | Integrating electrometer amplifying circuit |
| US20090000236A1 (en) | 2006-01-18 | 2009-01-01 | David Schlumpf | Keeper device for perpendicularly positioning a tie rod relative to a panel form wall |
| DE102007030172A1 (de) * | 2007-06-27 | 2009-01-15 | Forschungszentrum Jülich GmbH | Strommessgerät mit hoher Dynamik und kleiner Zeitkonstante |
| US9086400B2 (en) | 2007-11-29 | 2015-07-21 | Cornell Research Foundation, Inc. | Amplifier and array for measuring small current |
| CN101236404B (zh) * | 2008-02-29 | 2010-06-02 | 钱生宏 | 一种延时切换控制器 |
| CN101556169A (zh) * | 2008-04-07 | 2009-10-14 | 中国科学院空间科学与应用研究中心 | 一种微电流放大器 |
| JP4800371B2 (ja) * | 2008-07-30 | 2011-10-26 | 富士男 小澤 | レンジ切り替え回路 |
| CN102472097B (zh) | 2009-07-09 | 2015-03-04 | 斯克皮尔塔公司 | 用于高度耐磨应用的耐磨附件 |
| US8278909B2 (en) * | 2009-07-16 | 2012-10-02 | Mks Instruments, Inc. | Wide-dynamic range electrometer with a fast response |
| CN102545793A (zh) | 2010-12-17 | 2012-07-04 | 南京航空航天大学 | 一种pA-μA量程的微弱电流放大器 |
| WO2013179058A2 (en) | 2012-06-01 | 2013-12-05 | Smiths Detection-Watford Limited | Capacitive transimpedance amplifier with offset |
| US9274145B2 (en) * | 2012-10-22 | 2016-03-01 | Tektronix, Inc. | Active shunt ammeter apparatus and method |
| KR101582994B1 (ko) * | 2013-11-12 | 2016-01-06 | 가락전자 주식회사 | Dsp 내장형 오디오 증폭기의 출력 제어방법 |
| CN103558445B (zh) * | 2013-11-13 | 2019-05-21 | 福禄克精密测量有限公司 | 电流检测电路以及测量装置 |
| CN103592498B (zh) * | 2013-11-13 | 2019-05-03 | 福禄克精密测量有限公司 | 电流检测电路 |
| CN203708590U (zh) * | 2014-01-26 | 2014-07-09 | 深圳市梓晶微科技有限公司 | 一种具有高功率因数高效率的led线性恒流控制电路 |
| CN203759112U (zh) * | 2014-03-31 | 2014-08-06 | 深圳市嘉力电气技术有限公司 | 一种高频电流检测电路 |
| US9671270B2 (en) | 2015-07-30 | 2017-06-06 | Daniel Measurement And Control, Inc. | Flow meter having electronic mount bracket assembly |
| CN105372525A (zh) * | 2015-11-09 | 2016-03-02 | 上海芯哲微电子科技有限公司 | 运算放大器的测试电路 |
| CN106936423B (zh) * | 2015-12-29 | 2024-10-01 | 柳州桂通科技股份有限公司 | 运算放大器、驱动接口、测控设备、驱动电路和驱动器 |
| CN107171650B (zh) * | 2016-03-08 | 2020-04-17 | 晶豪科技股份有限公司 | 可变增益放大电路 |
| JP6594810B2 (ja) * | 2016-03-23 | 2019-10-23 | ルネサスエレクトロニクス株式会社 | 電流検出回路及びそれを備えたdcdcコンバータ |
| US9806685B1 (en) | 2016-05-13 | 2017-10-31 | Mks Instruments, Inc. | Trans-impedance amplifier with increased dynamic range |
| US10338224B2 (en) * | 2017-03-27 | 2019-07-02 | Analog Devices Global Unlimited Company | High dynamic range analog front-end receiver for long range LIDAR |
| EP4042566A1 (de) * | 2019-10-09 | 2022-08-17 | Gottfried Wilhelm Leibniz Universität Hannover | Elektrische schaltung |
-
2019
- 2019-03-29 DE DE102019108192.0A patent/DE102019108192A1/de active Pending
-
2020
- 2020-03-06 US US17/438,872 patent/US12603623B2/en active Active
- 2020-03-06 WO PCT/EP2020/056031 patent/WO2020200644A1/de not_active Ceased
- 2020-03-06 EP EP20711091.7A patent/EP3948306B1/de active Active
- 2020-03-06 CN CN202080023762.7A patent/CN113614548B/zh active Active
- 2020-03-06 KR KR1020217030597A patent/KR102882669B1/ko active Active
- 2020-03-06 JP JP2021557746A patent/JP7627662B2/ja active Active
- 2020-03-27 TW TW109110634A patent/TWI848089B/zh active
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2017198661A (ja) | 2016-04-26 | 2017-11-02 | パナソニックIpマネジメント株式会社 | 気体検出装置及び気体検出方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2020200644A1 (de) | 2020-10-08 |
| CN113614548B (zh) | 2024-02-20 |
| KR102882669B1 (ko) | 2025-11-07 |
| US12603623B2 (en) | 2026-04-14 |
| EP3948306B1 (de) | 2025-11-19 |
| TW202037072A (zh) | 2020-10-01 |
| EP3948306A1 (de) | 2022-02-09 |
| KR20210145745A (ko) | 2021-12-02 |
| DE102019108192A1 (de) | 2020-10-01 |
| TWI848089B (zh) | 2024-07-11 |
| JP2022526362A (ja) | 2022-05-24 |
| CN113614548A (zh) | 2021-11-05 |
| US20250192731A1 (en) | 2025-06-12 |
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