TWI848089B - 放大小電流的放大器裝置 - Google Patents

放大小電流的放大器裝置 Download PDF

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Publication number
TWI848089B
TWI848089B TW109110634A TW109110634A TWI848089B TW I848089 B TWI848089 B TW I848089B TW 109110634 A TW109110634 A TW 109110634A TW 109110634 A TW109110634 A TW 109110634A TW I848089 B TWI848089 B TW I848089B
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TW
Taiwan
Prior art keywords
amplifier
current
amplifier device
input terminal
feedback
Prior art date
Application number
TW109110634A
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English (en)
Chinese (zh)
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TW202037072A (zh
Inventor
諾博 羅爾夫
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德商英飛康股份有限公司
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Publication of TW202037072A publication Critical patent/TW202037072A/zh
Application granted granted Critical
Publication of TWI848089B publication Critical patent/TWI848089B/zh

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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/72—Gated amplifiers, i.e. amplifiers which are rendered operative or inoperative by means of a control signal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/08—Circuits for altering the measuring range
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • H03F3/45071—Differential amplifiers with semiconductor devices only
    • H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
    • H03F3/45475—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using IC blocks as the active amplifying circuit
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0004—Gaseous mixtures, e.g. polluted air
    • G01N33/0009—General constructional details of gas analysers, e.g. portable test equipment
    • G01N33/0027—General constructional details of gas analysers, e.g. portable test equipment concerning the detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/36—Overload-protection arrangements or circuits for electric measuring instruments
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0046—Arrangements for measuring currents or voltages or for indicating presence or sign thereof characterised by a specific application or detail not covered by any other subgroup of G01R19/00
    • G01R19/0061—Measuring currents of particle-beams, currents from electron multipliers, photocurrents, ion currents; Measuring in plasmas
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2200/00—Indexing scheme relating to amplifiers
    • H03F2200/261—Amplifier which being suitable for instrumentation applications
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2200/00—Indexing scheme relating to amplifiers
    • H03F2200/426—Indexing scheme relating to amplifiers the amplifier comprising circuitry for protection against overload
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2200/00—Indexing scheme relating to amplifiers
    • H03F2200/444—Diode used as protection means in an amplifier, e.g. as a limiter or as a switch
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2200/00—Indexing scheme relating to amplifiers
    • H03F2200/462—Indexing scheme relating to amplifiers the current being sensed
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
    • H03F2203/45—Indexing scheme relating to differential amplifiers
    • H03F2203/45138—Two or more differential amplifiers in IC-block form are combined, e.g. measuring amplifiers
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
    • H03F2203/45—Indexing scheme relating to differential amplifiers
    • H03F2203/45518—Indexing scheme relating to differential amplifiers the FBC comprising one or more diodes and being coupled between the LC and the IC
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
    • H03F2203/72—Indexing scheme relating to gated amplifiers, i.e. amplifiers which are rendered operative or inoperative by means of a control signal
    • H03F2203/7227—Indexing scheme relating to gated amplifiers, i.e. amplifiers which are rendered operative or inoperative by means of a control signal the gated amplifier being switched on or off by a switch in the supply circuit of the amplifier

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Amplifiers (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Combustion & Propulsion (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
TW109110634A 2019-03-29 2020-03-27 放大小電流的放大器裝置 TWI848089B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102019108192.0A DE102019108192A1 (de) 2019-03-29 2019-03-29 Verstärkervorrichtung zur Verstärkung kleiner Ströme
DE102019108192.0 2019-03-29

Publications (2)

Publication Number Publication Date
TW202037072A TW202037072A (zh) 2020-10-01
TWI848089B true TWI848089B (zh) 2024-07-11

Family

ID=69810812

Family Applications (1)

Application Number Title Priority Date Filing Date
TW109110634A TWI848089B (zh) 2019-03-29 2020-03-27 放大小電流的放大器裝置

Country Status (8)

Country Link
US (1) US12603623B2 (https=)
EP (1) EP3948306B1 (https=)
JP (1) JP7627662B2 (https=)
KR (1) KR102882669B1 (https=)
CN (1) CN113614548B (https=)
DE (1) DE102019108192A1 (https=)
TW (1) TWI848089B (https=)
WO (1) WO2020200644A1 (https=)

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FI3719993T3 (fi) * 2019-04-02 2023-03-20 QuantalRF AG Radiotaajuustehovahvistinjärjestelmä ja menetelmä sen lähtösignaalin linearisoimiseksi
WO2022173862A1 (en) 2021-02-09 2022-08-18 QuantalRF AG System and method for adjusting amplifier bias current based on input signal envelope tracking
US11973478B2 (en) * 2021-09-02 2024-04-30 Globalfoundries U.S. Inc. Single-to-differential converter
KR102735229B1 (ko) * 2022-07-14 2024-11-28 (주)시스코어 저잡음 완전 차동 전하 증폭기
US12519456B2 (en) 2022-08-31 2026-01-06 QuantalRF AG Integrated coupled resonator filtering
KR102888013B1 (ko) * 2023-12-07 2025-11-24 주식회사 인스파워 광대역 피드-포워드 증폭기 및 이를 제어하는 제어 장치

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US4510442A (en) * 1981-11-04 1985-04-09 Max-Planck-Gesellschaft Zur Foerderung Der Wissenschaften E.V. Measuring system for exceedingly weak currents
US6583421B2 (en) * 2001-10-11 2003-06-24 Diamond Semiconductor Group, Llc Charge measuring device with wide dynamic range
US6897665B2 (en) * 2003-09-06 2005-05-24 Taiwan Semiconductor Manufacturing Co., Ltd In-situ electron beam induced current detection
CN102545793A (zh) * 2010-12-17 2012-07-04 南京航空航天大学 一种pA-μA量程的微弱电流放大器
US9086400B2 (en) * 2007-11-29 2015-07-21 Cornell Research Foundation, Inc. Amplifier and array for measuring small current
JP2017198661A (ja) * 2016-04-26 2017-11-02 パナソニックＩｐマネジメント株式会社 気体検出装置及び気体検出方法

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CN106936423B (zh) * 2015-12-29 2024-10-01 柳州桂通科技股份有限公司 运算放大器、驱动接口、测控设备、驱动电路和驱动器
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Publication number Priority date Publication date Assignee Title
US4259643A (en) * 1979-01-25 1981-03-31 National Semiconductor Corporation Current gain amplifier cell
US4510442A (en) * 1981-11-04 1985-04-09 Max-Planck-Gesellschaft Zur Foerderung Der Wissenschaften E.V. Measuring system for exceedingly weak currents
US6583421B2 (en) * 2001-10-11 2003-06-24 Diamond Semiconductor Group, Llc Charge measuring device with wide dynamic range
US6897665B2 (en) * 2003-09-06 2005-05-24 Taiwan Semiconductor Manufacturing Co., Ltd In-situ electron beam induced current detection
US9086400B2 (en) * 2007-11-29 2015-07-21 Cornell Research Foundation, Inc. Amplifier and array for measuring small current
CN102545793A (zh) * 2010-12-17 2012-07-04 南京航空航天大学 一种pA-μA量程的微弱电流放大器
JP2017198661A (ja) * 2016-04-26 2017-11-02 パナソニックＩｐマネジメント株式会社 気体検出装置及び気体検出方法

Also Published As

Publication number Publication date
WO2020200644A1 (de) 2020-10-08
CN113614548B (zh) 2024-02-20
KR102882669B1 (ko) 2025-11-07
US12603623B2 (en) 2026-04-14
EP3948306B1 (de) 2025-11-19
TW202037072A (zh) 2020-10-01
EP3948306A1 (de) 2022-02-09
KR20210145745A (ko) 2021-12-02
DE102019108192A1 (de) 2020-10-01
JP7627662B2 (ja) 2025-02-06
JP2022526362A (ja) 2022-05-24
CN113614548A (zh) 2021-11-05
US20250192731A1 (en) 2025-06-12

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