KR102596189B1 - Ct 장치 - Google Patents

Ct 장치 Download PDF

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Publication number
KR102596189B1
KR102596189B1 KR1020210124532A KR20210124532A KR102596189B1 KR 102596189 B1 KR102596189 B1 KR 102596189B1 KR 1020210124532 A KR1020210124532 A KR 1020210124532A KR 20210124532 A KR20210124532 A KR 20210124532A KR 102596189 B1 KR102596189 B1 KR 102596189B1
Authority
KR
South Korea
Prior art keywords
inspected
inspection
dimensional information
perspective image
imaging position
Prior art date
Application number
KR1020210124532A
Other languages
English (en)
Korean (ko)
Other versions
KR20220127726A (ko
Inventor
마사미 조우노
데루오 야마모토
Original Assignee
도시바 아이티 앤 콘트롤 시스템 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 도시바 아이티 앤 콘트롤 시스템 가부시키가이샤 filed Critical 도시바 아이티 앤 콘트롤 시스템 가부시키가이샤
Publication of KR20220127726A publication Critical patent/KR20220127726A/ko
Application granted granted Critical
Publication of KR102596189B1 publication Critical patent/KR102596189B1/ko

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/04—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T11/00—2D [Two Dimensional] image generation
    • G06T11/003—Reconstruction from projections, e.g. tomography
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3307—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts source and detector fixed; object moves

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Engineering & Computer Science (AREA)
  • Radiology & Medical Imaging (AREA)
  • Pulmonology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Electromagnetism (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
KR1020210124532A 2021-03-11 2021-09-17 Ct 장치 KR102596189B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2021039738A JP2022139381A (ja) 2021-03-11 2021-03-11 Ｃｔ装置
JPJP-P-2021-039738 2021-03-11

Publications (2)

Publication Number Publication Date
KR20220127726A KR20220127726A (ko) 2022-09-20
KR102596189B1 true KR102596189B1 (ko) 2023-10-30

Family

ID=83246029

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020210124532A KR102596189B1 (ko) 2021-03-11 2021-09-17 Ct 장치

Country Status (3)

Country Link
JP (1) JP2022139381A (ja)
KR (1) KR102596189B1 (ja)
CN (1) CN115078415A (ja)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101823743B1 (ko) 2014-01-23 2018-01-31 가부시키가이샤 죠부 X선 검사 장치 및 x선 검사 방법
JP2018031759A (ja) * 2016-08-25 2018-03-01 東芝Ｉｔコントロールシステム株式会社 Ｃｔ装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09257434A (ja) * 1996-03-27 1997-10-03 Nok Corp 画像処理装置
JP4715409B2 (ja) 2005-09-15 2011-07-06 株式会社島津製作所 Ｘ線検査装置
JP2009294047A (ja) 2008-06-04 2009-12-17 Shimadzu Corp Ｘ線検査装置
KR20150058672A (ko) * 2013-11-19 2015-05-29 삼성전자주식회사 엑스선 영상 장치 및 그 제어 방법

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101823743B1 (ko) 2014-01-23 2018-01-31 가부시키가이샤 죠부 X선 검사 장치 및 x선 검사 방법
JP2018031759A (ja) * 2016-08-25 2018-03-01 東芝Ｉｔコントロールシステム株式会社 Ｃｔ装置

Also Published As

Publication number Publication date
KR20220127726A (ko) 2022-09-20
CN115078415A (zh) 2022-09-20
JP2022139381A (ja) 2022-09-26

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AMND Amendment
E601 Decision to refuse application
X091 Application refused [patent]
AMND Amendment
X701 Decision to grant (after re-examination)
GRNT Written decision to grant