KR102447294B9 - X선을 이용한 구조물의 결함 검사 시스템 - Google Patents

X선을 이용한 구조물의 결함 검사 시스템

Info

Publication number
KR102447294B9
KR102447294B9 KR1020210111611A KR20210111611A KR102447294B9 KR 102447294 B9 KR102447294 B9 KR 102447294B9 KR 1020210111611 A KR1020210111611 A KR 1020210111611A KR 20210111611 A KR20210111611 A KR 20210111611A KR 102447294 B9 KR102447294 B9 KR 102447294B9
Authority
KR
South Korea
Prior art keywords
ray
inspecting defects
inspecting
defects
Prior art date
Application number
KR1020210111611A
Other languages
English (en)
Other versions
KR102447294B1 (ko
Inventor
나명찬
Original Assignee
주식회사 네프
주식회사 엘시스
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 주식회사 네프, 주식회사 엘시스 filed Critical 주식회사 네프
Priority to KR1020210111611A priority Critical patent/KR102447294B1/ko
Priority to US17/891,127 priority patent/US11585768B1/en
Application granted granted Critical
Publication of KR102447294B1 publication Critical patent/KR102447294B1/ko
Publication of KR102447294B9 publication Critical patent/KR102447294B9/ko
Priority to US18/155,285 priority patent/US11821854B2/en
Priority to US18/513,596 priority patent/US20240102949A1/en

Links

KR1020210111611A 2021-08-24 2021-08-24 X선을 이용한 구조물의 결함 검사 시스템 KR102447294B1 (ko)

Priority Applications (4)

Application Number Priority Date Filing Date Title
KR1020210111611A KR102447294B1 (ko) 2021-08-24 2021-08-24 X선을 이용한 구조물의 결함 검사 시스템
US17/891,127 US11585768B1 (en) 2021-08-24 2022-08-18 System and method for inspecting defects of structure by using x-ray
US18/155,285 US11821854B2 (en) 2021-08-24 2023-01-17 System and method for inspecting defects of structure by using X-ray
US18/513,596 US20240102949A1 (en) 2021-08-24 2023-11-19 System and method for inspecting defects of structure by using x-ray

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020210111611A KR102447294B1 (ko) 2021-08-24 2021-08-24 X선을 이용한 구조물의 결함 검사 시스템

Publications (2)

Publication Number Publication Date
KR102447294B1 KR102447294B1 (ko) 2022-09-26
KR102447294B9 true KR102447294B9 (ko) 2022-12-27

Family

ID=83452648

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020210111611A KR102447294B1 (ko) 2021-08-24 2021-08-24 X선을 이용한 구조물의 결함 검사 시스템

Country Status (1)

Country Link
KR (1) KR102447294B1 (ko)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102556319B1 (ko) * 2022-10-07 2023-07-18 주식회사 엘시스 무인 항공기 기반 비파괴 검사 시스템 및 방법
KR102523331B1 (ko) * 2022-11-30 2023-04-21 (주)메타파스 X-선 이미지의 선명도 확보를 위한 무인 항공기 제어 시스템 및 방법

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4691170B2 (ja) * 2008-03-04 2011-06-01 株式会社ジョブ Ｘ線照射装置
KR20160067688A (ko) 2014-12-04 2016-06-14 대우조선해양 주식회사 풍력 발전기용 블레이드, 그의 제조 방법 및 결함 검사 방법
KR20170104762A (ko) * 2016-03-08 2017-09-18 한국해양과학기술원 드론을 이용한 풍력터빈의 표면 손상 탐지 시스템 및 방법
US20190041856A1 (en) * 2017-11-07 2019-02-07 Intel IP Corporation Methods and apparatus to capture tomograms of structures using unmanned aerial vehicles
KR101958266B1 (ko) * 2018-05-04 2019-03-14 (주)지엠시스텍 가공전선 검사시스템 및 가공전선 검사방법

Also Published As

Publication number Publication date
KR102447294B1 (ko) 2022-09-26

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Legal Events

Date Code Title Description
AMND Amendment
X091 Application refused [patent]
AMND Amendment
X701 Decision to grant (after re-examination)
GRNT Written decision to grant
G170 Re-publication after modification of scope of protection [patent]