KR102399718B9 - X선을 이용한 구조물의 결함 검사 시스템의 x선 출력 제어 방법 - Google Patents

X선을 이용한 구조물의 결함 검사 시스템의 x선 출력 제어 방법

Info

Publication number
KR102399718B9
KR102399718B9 KR1020210111615A KR20210111615A KR102399718B9 KR 102399718 B9 KR102399718 B9 KR 102399718B9 KR 1020210111615 A KR1020210111615 A KR 1020210111615A KR 20210111615 A KR20210111615 A KR 20210111615A KR 102399718 B9 KR102399718 B9 KR 102399718B9
Authority
KR
South Korea
Prior art keywords
ray
controlling output
inspecting defects
inspecting
defects
Prior art date
Application number
KR1020210111615A
Other languages
English (en)
Other versions
KR102399718B1 (ko
Inventor
이우상
Original Assignee
주식회사 네프
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 주식회사 네프 filed Critical 주식회사 네프
Priority to KR1020210111615A priority Critical patent/KR102399718B1/ko
Priority to PCT/KR2021/012040 priority patent/WO2023027227A1/ko
Application granted granted Critical
Publication of KR102399718B1 publication Critical patent/KR102399718B1/ko
Priority to US17/891,127 priority patent/US11585768B1/en
Priority to US18/155,285 priority patent/US11821854B2/en
Publication of KR102399718B9 publication Critical patent/KR102399718B9/ko
Priority to US18/513,596 priority patent/US20240102949A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G01N23/087—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays using polyenergetic X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/55—Depth or shape recovery from multiple images
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/02—Constructional details
    • H05G1/04—Mounting the X-ray tube within a closed housing
    • H05G1/06—X-ray tube and at least part of the power supply apparatus being mounted within the same housing
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • H05G1/30—Controlling
    • H05G1/32—Supply voltage of the X-ray apparatus or tube
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/70—Wind energy
    • Y02E10/72—Wind turbines with rotation axis in wind direction

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
KR1020210111615A 2021-08-24 2021-08-24 X선을 이용한 구조물의 결함 검사 시스템의 x선 출력 제어 방법 KR102399718B1 (ko)

Priority Applications (5)

Application Number Priority Date Filing Date Title
KR1020210111615A KR102399718B1 (ko) 2021-08-24 2021-08-24 X선을 이용한 구조물의 결함 검사 시스템의 x선 출력 제어 방법
PCT/KR2021/012040 WO2023027227A1 (ko) 2021-08-24 2021-09-06 X선을 이용한 구조물의 결함 검사 시스템, 검사 시스템의 x선 출력 제어 방법 및 결함의 깊이를 산출하는 방법
US17/891,127 US11585768B1 (en) 2021-08-24 2022-08-18 System and method for inspecting defects of structure by using x-ray
US18/155,285 US11821854B2 (en) 2021-08-24 2023-01-17 System and method for inspecting defects of structure by using X-ray
US18/513,596 US20240102949A1 (en) 2021-08-24 2023-11-19 System and method for inspecting defects of structure by using x-ray

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020210111615A KR102399718B1 (ko) 2021-08-24 2021-08-24 X선을 이용한 구조물의 결함 검사 시스템의 x선 출력 제어 방법

Publications (2)

Publication Number Publication Date
KR102399718B1 KR102399718B1 (ko) 2022-05-19
KR102399718B9 true KR102399718B9 (ko) 2023-04-12

Family

ID=81801157

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020210111615A KR102399718B1 (ko) 2021-08-24 2021-08-24 X선을 이용한 구조물의 결함 검사 시스템의 x선 출력 제어 방법

Country Status (2)

Country Link
KR (1) KR102399718B1 (ko)
WO (1) WO2023027227A1 (ko)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102640847B1 (ko) * 2021-08-26 2024-02-28 한국항공우주연구원 추락방지 멀티콥터 및 멀티콥터 제어방법
KR102491254B1 (ko) * 2022-09-01 2023-01-27 주식회사 엘시스 피사체 결함 탐지를 위한 x선 촬영 위치 결정 방법
KR102464192B1 (ko) * 2022-09-13 2022-11-10 주식회사 엘시스 피사체의 내재 부재의 결함을 탐지하기 위한 x선 영상을 생성하는 방법
KR102607507B1 (ko) 2022-09-22 2023-11-30 주식회사 케이프로시스템 X선을 이용한 풍력발전 블레이드 파손검사용 드론장치
KR102634313B1 (ko) * 2023-10-04 2024-02-07 주식회사 엘시스 엑스선 발생부와 디텍터 사이의 거리 및 고도 그리고 피사체의 두께에 따른 엑스선 관전압 및 관전류의 자동 제어 방법

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001035687A (ja) * 1999-07-23 2001-02-09 Canon Inc Ｘ線検出装置、ｘ線曝射制御信号発生装置及びｘ線曝射制御信号発生方法
KR20160067688A (ko) 2014-12-04 2016-06-14 대우조선해양 주식회사 풍력 발전기용 블레이드, 그의 제조 방법 및 결함 검사 방법
KR101680602B1 (ko) * 2015-06-03 2016-11-29 한국생산기술연구원 3차원 내부 영상 복원 시스템, 3차원 내부 영상 복원 장치, 3차원 내부 영상 복원 방법 및 기록 매체
US10539708B2 (en) * 2016-02-01 2020-01-21 The University Of North Carolina At Chapel Hill Mobile and free-form x-ray imaging systems and methods
KR20170104762A (ko) * 2016-03-08 2017-09-18 한국해양과학기술원 드론을 이용한 풍력터빈의 표면 손상 탐지 시스템 및 방법
KR101844537B1 (ko) * 2016-10-28 2018-04-02 (주)선재하이테크 전자 집속 개선용 x선관
US20190041856A1 (en) * 2017-11-07 2019-02-07 Intel IP Corporation Methods and apparatus to capture tomograms of structures using unmanned aerial vehicles

Also Published As

Publication number Publication date
KR102399718B1 (ko) 2022-05-19
WO2023027227A1 (ko) 2023-03-02

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