KR102278675B9 - 엑스레이를 이용한 도금두께 측정 장치 - Google Patents

엑스레이를 이용한 도금두께 측정 장치

Info

Publication number
KR102278675B9
KR102278675B9 KR20190023427A KR20190023427A KR102278675B9 KR 102278675 B9 KR102278675 B9 KR 102278675B9 KR 20190023427 A KR20190023427 A KR 20190023427A KR 20190023427 A KR20190023427 A KR 20190023427A KR 102278675 B9 KR102278675 B9 KR 102278675B9
Authority
KR
South Korea
Prior art keywords
plating
ray
measuring thickness
measuring
thickness
Prior art date
Application number
KR20190023427A
Other languages
English (en)
Other versions
KR20190113561A (ko
KR102278675B1 (ko
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of KR20190113561A publication Critical patent/KR20190113561A/ko
Application granted granted Critical
Publication of KR102278675B1 publication Critical patent/KR102278675B1/ko
Publication of KR102278675B9 publication Critical patent/KR102278675B9/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/02—Dosimeters
    • G01T1/023—Scintillation dose-rate meters
KR1020190023427A 2018-03-28 2019-02-27 엑스레이를 이용한 도금두께 측정 장치 KR102278675B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR20180036089 2018-03-28
KR1020180036089 2018-03-28

Publications (3)

Publication Number Publication Date
KR20190113561A KR20190113561A (ko) 2019-10-08
KR102278675B1 KR102278675B1 (ko) 2021-07-16
KR102278675B9 true KR102278675B9 (ko) 2021-09-17

Family

ID=68208520

Family Applications (2)

Application Number Title Priority Date Filing Date
KR1020190023473A KR102170972B1 (ko) 2018-03-28 2019-02-27 엑스레이를 이용한 물질두께 측정 장치
KR1020190023427A KR102278675B1 (ko) 2018-03-28 2019-02-27 엑스레이를 이용한 도금두께 측정 장치

Family Applications Before (1)

Application Number Title Priority Date Filing Date
KR1020190023473A KR102170972B1 (ko) 2018-03-28 2019-02-27 엑스레이를 이용한 물질두께 측정 장치

Country Status (1)

Country Link
KR (2) KR102170972B1 (ko)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102554824B1 (ko) 2023-03-21 2023-07-12 알에프머트리얼즈 주식회사 도금 두께 측정 시스템 및 방법

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002107134A (ja) * 2000-07-27 2002-04-10 Seiko Instruments Inc 蛍光ｘ線膜厚計
TW565604B (en) 2001-04-25 2003-12-11 Toray Industries Pyrromethene metal complex, material of luminescent element using it and luminescent element
WO2007041639A2 (en) * 2005-10-04 2007-04-12 Thermo Niton Analyzers Llc Analysis of elemental composition and thickness in multilayered materials
EP2893331B1 (en) * 2012-09-07 2020-01-15 Carl Zeiss X-Ray Microscopy, Inc. Combined confocal x-ray fluorescence and x-ray computerised tomographic system and method

Also Published As

Publication number Publication date
KR20190113562A (ko) 2019-10-08
KR20190113561A (ko) 2019-10-08
KR102278675B1 (ko) 2021-07-16
KR102170972B1 (ko) 2020-10-28

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Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E902 Notification of reason for refusal
E90F Notification of reason for final refusal
E701 Decision to grant or registration of patent right
GRNT Written decision to grant
G170 Publication of correction