SG10202003858SA - Measuring apparatus - Google Patents

Measuring apparatus

Info

Publication number
SG10202003858SA
SG10202003858SA SG10202003858SA SG10202003858SA SG10202003858SA SG 10202003858S A SG10202003858S A SG 10202003858SA SG 10202003858S A SG10202003858S A SG 10202003858SA SG 10202003858S A SG10202003858S A SG 10202003858SA SG 10202003858S A SG10202003858S A SG 10202003858SA
Authority
SG
Singapore
Prior art keywords
measuring apparatus
measuring
Prior art date
Application number
SG10202003858SA
Inventor
Saito Yoshinobu
Ito Yusaku
Original Assignee
Disco Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Disco Corp filed Critical Disco Corp
Publication of SG10202003858SA publication Critical patent/SG10202003858SA/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/20Investigating strength properties of solid materials by application of mechanical stress by applying steady bending forces
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/02Details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/02Details
    • G01N3/06Special adaptations of indicating or recording means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/02Details
    • G01N3/06Special adaptations of indicating or recording means
    • G01N3/068Special adaptations of indicating or recording means with optical indicating or recording means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/08Investigating strength properties of solid materials by application of mechanical stress by applying steady tensile or compressive forces
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/0001Type of application of the stress
    • G01N2203/0003Steady
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/0014Type of force applied
    • G01N2203/0023Bending
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/0058Kind of property studied
    • G01N2203/006Crack, flaws, fracture or rupture
    • G01N2203/0067Fracture or rupture
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02Details not specific for a particular testing method
    • G01N2203/06Indicating or recording means; Sensing means
    • G01N2203/0641Indicating or recording means; Sensing means using optical, X-ray, ultraviolet, infrared or similar detectors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02Details not specific for a particular testing method
    • G01N2203/06Indicating or recording means; Sensing means
    • G01N2203/0641Indicating or recording means; Sensing means using optical, X-ray, ultraviolet, infrared or similar detectors
    • G01N2203/0647Image analysis
SG10202003858SA 2019-05-21 2020-04-27 Measuring apparatus SG10202003858SA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2019095163A JP7271063B2 (en) 2019-05-21 2019-05-21 measuring device

Publications (1)

Publication Number Publication Date
SG10202003858SA true SG10202003858SA (en) 2020-12-30

Family

ID=73052621

Family Applications (1)

Application Number Title Priority Date Filing Date
SG10202003858SA SG10202003858SA (en) 2019-05-21 2020-04-27 Measuring apparatus

Country Status (7)

Country Link
US (1) US11402310B2 (en)
JP (1) JP7271063B2 (en)
KR (1) KR20200134146A (en)
CN (1) CN111982703A (en)
DE (1) DE102020206345A1 (en)
SG (1) SG10202003858SA (en)
TW (1) TW202044449A (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7390200B2 (en) 2020-01-29 2023-12-01 株式会社ディスコ Chip strength measurement method, testing device, and chip strength calculation method
CN115808356B (en) * 2023-02-09 2023-07-11 荣耀终端有限公司 Chip testing method and chip testing equipment

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09229838A (en) 1996-02-24 1997-09-05 Shin Etsu Handotai Co Ltd Method and instrument for measuring mechanical strength of semiconductor material
JP3373831B2 (en) * 2000-01-19 2003-02-04 岸本産業株式会社 Test specimen elongation measuring method and apparatus
US7426062B2 (en) * 2001-08-21 2008-09-16 Canon Kabushiki Kaisha Signal output apparatus, image forming apparatus and information output apparatus
JP2003130772A (en) 2001-10-19 2003-05-08 Taiheiyo Cement Corp Fracture strength measuring instrument
JP3979337B2 (en) 2003-05-01 2007-09-19 株式会社島津製作所 Bending testing machine
JP4378330B2 (en) * 2005-08-15 2009-12-02 キヤノン株式会社 Sheet information output apparatus, sheet processing apparatus, and image forming apparatus
JP4684958B2 (en) * 2006-06-28 2011-05-18 キヤノン株式会社 Sheet material information detection apparatus and sheet material processing apparatus
JP2008150145A (en) * 2006-12-15 2008-07-03 Canon Inc Sheet material information detecting means and sheet material handling device
JP4895302B2 (en) 2007-07-31 2012-03-14 黒崎播磨株式会社 Elastic modulus measuring method, elastic modulus measuring apparatus, and program
JP2011013061A (en) 2009-07-01 2011-01-20 Shimadzu Corp Apparatus for measuring dimensions of test piece
CN103364262B (en) 2013-07-06 2016-06-01 郑州大学 A kind of polymkeric substance environmental stress cracking experiment combined device
JP2015127653A (en) 2013-12-27 2015-07-09 レーザーテック株式会社 Inspection apparatus and inspection method
CN109100240A (en) 2018-09-27 2018-12-28 贵州大学 A kind of room is built with girder steel flexural strength testing machine

Also Published As

Publication number Publication date
KR20200134146A (en) 2020-12-01
CN111982703A (en) 2020-11-24
US11402310B2 (en) 2022-08-02
TW202044449A (en) 2020-12-01
JP7271063B2 (en) 2023-05-11
US20200371005A1 (en) 2020-11-26
DE102020206345A1 (en) 2020-11-26
JP2020190449A (en) 2020-11-26

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