KR102156451B1 - 콘택트 렌즈 검사 시스템 및 방법 - Google Patents

콘택트 렌즈 검사 시스템 및 방법 Download PDF

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Publication number
KR102156451B1
KR102156451B1 KR1020147034696A KR20147034696A KR102156451B1 KR 102156451 B1 KR102156451 B1 KR 102156451B1 KR 1020147034696 A KR1020147034696 A KR 1020147034696A KR 20147034696 A KR20147034696 A KR 20147034696A KR 102156451 B1 KR102156451 B1 KR 102156451B1
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KR
South Korea
Prior art keywords
cuvette
lens
inspection system
ophthalmic device
device inspection
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English (en)
Korean (ko)
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KR20150013279A (ko
Inventor
스테펜 도날드 뉴만
히로야마 오야마
조하네스 푼트
주에르겐 람프레슈트
Original Assignee
메니콘 싱가포르 피티이. 엘티디.
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0207—Details of measuring devices
    • G01M11/0214—Details of devices holding the object to be tested
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8803—Visual inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G01N2021/9583—Lenses
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03—Cuvette constructions

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  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Eyeglasses (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
KR1020147034696A 2012-05-10 2013-05-10 콘택트 렌즈 검사 시스템 및 방법 Active KR102156451B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
SG201203439-3 2012-05-10
SG2012034393A SG195400A1 (en) 2012-05-10 2012-05-10 Systems and methods for the inspection of contact lenses
PCT/SG2013/000187 WO2013169211A1 (en) 2012-05-10 2013-05-10 Systems and methods for the inspection of contact lenses

Publications (2)

Publication Number Publication Date
KR20150013279A KR20150013279A (ko) 2015-02-04
KR102156451B1 true KR102156451B1 (ko) 2020-09-22

Family

ID=49551074

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020147034696A Active KR102156451B1 (ko) 2012-05-10 2013-05-10 콘택트 렌즈 검사 시스템 및 방법

Country Status (9)

Country Link
US (2) US9797803B2 (enExample)
EP (1) EP2847569B1 (enExample)
JP (1) JP6301910B2 (enExample)
KR (1) KR102156451B1 (enExample)
CN (1) CN104428649B (enExample)
DK (1) DK2847569T3 (enExample)
ES (1) ES2929026T3 (enExample)
SG (1) SG195400A1 (enExample)
WO (1) WO2013169211A1 (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SG195400A1 (en) * 2012-05-10 2013-12-30 Menicon Singapore Pte Ltd Systems and methods for the inspection of contact lenses
JP6654139B2 (ja) * 2013-10-08 2020-02-26 イーメージ ヴィジョン ピーティーイー． エルティーディー．Ｅｍａｇｅ Ｖｉｓｉｏｎ Ｐｔｅ． Ｌｔｄ． 濡れた眼用レンズの検査システムおよび検査方法
CN105572041B (zh) * 2014-10-16 2020-09-08 北京普利生仪器有限公司 光学检测设备、方法及其光学检测装置和反应杯
FR3039660B1 (fr) * 2015-07-30 2017-09-08 Essilor Int Methode de verification d'une caracteristique geometrique et d'une caracteristique optique d'une lentille ophtalmique detouree et dispositif associe
CN105115989B (zh) * 2015-10-09 2018-02-23 爱丁堡（南京）光电设备有限公司 一种隐形眼镜缺陷的自动检测设备及检测方法
US10634618B2 (en) * 2018-01-23 2020-04-28 Hong Kong Applied Science and Technology Research Institute Company Limited Apparatus and a method for inspecting a light transmissible optical component
CN113378665B (zh) * 2019-11-27 2024-11-15 奥特斯科技(重庆)有限公司 处理部件承载件的方法及光学检查设备和计算机可读介质
US12186917B2 (en) * 2020-04-16 2025-01-07 Alcon Inc. Method and apparatus for calibrating ophthalmic lens grippers
KR102860351B1 (ko) * 2020-10-14 2025-09-15 이미지 비전 피티이. 리미티드 콘택트 렌즈 결함 분석 및 추적 시스템
US11861823B2 (en) * 2021-04-27 2024-01-02 Johnson & Johnson Vision Care, Inc. Microfluidic device and method for quantifying contact lens deposition
CN119509389A (zh) * 2023-08-22 2025-02-25 中国航发商用航空发动机有限责任公司 压气机径向间隙测量装置及方法
CN119338797B (zh) * 2024-10-22 2025-09-30 平方和(北京)科技有限公司 一种基于极坐标系下的高精度多光场隐形眼镜边缘瑕疵检测方法及装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060132761A1 (en) * 2004-12-22 2006-06-22 Hall William J Apparatus and method for detecting lens thickness
JP2010185803A (ja) * 2009-02-13 2010-08-26 Hitachi Ltd 波面収差測定方法及びその装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4665624A (en) * 1984-11-20 1987-05-19 Michael Wodis Contact lens analyzing apparatus
AU649291B2 (en) 1990-12-19 1994-05-19 Bodenseewerk Geratetechnik Gmbh Process and apparatus for examining optical components, especially optical components for the eye and device for illuminating clear-transparent test-objects
IL107605A (en) * 1992-12-21 1998-01-04 Johnson & Johnson Vision Prod Lens inspection system
US5995213A (en) * 1995-01-17 1999-11-30 Johnson & Johnson Vision Products, Inc. Lens inspection system
US6765661B2 (en) * 2001-03-09 2004-07-20 Novartis Ag Lens inspection
ES2243129B1 (es) * 2004-04-23 2006-08-16 Universitat Politecnica De Catalunya Perfilometro optico de tecnologia dual (confocal e interferometrica) para la inspeccion y medicion tridimensional de superficies.
FR2878973B1 (fr) * 2004-12-03 2007-04-20 Essilor Int Dispositif de mesure automatique de caracteristiques d'une lentille ophtalmique
US20060176491A1 (en) 2004-12-22 2006-08-10 Hall William J Device and method for non-contact scanning of contact lens mold geometry
JP5122581B2 (ja) * 2006-12-21 2013-01-16 ジョンソン・アンド・ジョンソン・ビジョン・ケア・インコーポレイテッド 干渉法検査用レンズ、ならびに干渉法検査用システムおよび装置
CN102199719A (zh) * 2010-03-24 2011-09-28 Tdk株式会社 稀土磁体用合金和稀土磁体用合金的制造方法
JP2011222966A (ja) 2010-03-24 2011-11-04 Tdk Corp 希土類磁石用合金及び希土類磁石用合金の製造方法
SG195400A1 (en) * 2012-05-10 2013-12-30 Menicon Singapore Pte Ltd Systems and methods for the inspection of contact lenses

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060132761A1 (en) * 2004-12-22 2006-06-22 Hall William J Apparatus and method for detecting lens thickness
JP2010185803A (ja) * 2009-02-13 2010-08-26 Hitachi Ltd 波面収差測定方法及びその装置

Also Published As

Publication number Publication date
SG195400A1 (en) 2013-12-30
US20180045604A1 (en) 2018-02-15
US9797803B2 (en) 2017-10-24
DK2847569T3 (da) 2022-10-24
KR20150013279A (ko) 2015-02-04
ES2929026T3 (es) 2022-11-24
US20150138540A1 (en) 2015-05-21
JP6301910B2 (ja) 2018-03-28
CN104428649B (zh) 2018-09-21
EP2847569B1 (en) 2022-07-20
EP2847569A4 (en) 2016-01-27
US10215662B2 (en) 2019-02-26
WO2013169211A1 (en) 2013-11-14
EP2847569A1 (en) 2015-03-18
JP2015517682A (ja) 2015-06-22
CN104428649A (zh) 2015-03-18

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