ES2929026T3 - Sistemas y métodos para la inspección de lentes de contacto - Google Patents

Sistemas y métodos para la inspección de lentes de contacto Download PDF

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Publication number
ES2929026T3
ES2929026T3 ES13787245T ES13787245T ES2929026T3 ES 2929026 T3 ES2929026 T3 ES 2929026T3 ES 13787245 T ES13787245 T ES 13787245T ES 13787245 T ES13787245 T ES 13787245T ES 2929026 T3 ES2929026 T3 ES 2929026T3
Authority
ES
Spain
Prior art keywords
lens
cuvette
inspection system
ophthalmic device
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
ES13787245T
Other languages
English (en)
Spanish (es)
Inventor
Stephen Donald Newman
Hiroyama Oyama
Johannes Pfund
Juergen Lamprecht
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Menicon Singapore Pte Ltd
Original Assignee
Menicon Singapore Pte Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Menicon Singapore Pte Ltd filed Critical Menicon Singapore Pte Ltd
Application granted granted Critical
Publication of ES2929026T3 publication Critical patent/ES2929026T3/es
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0207Details of measuring devices
    • G01M11/0214Details of devices holding the object to be tested
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8803Visual inspection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958Inspecting transparent materials or objects, e.g. windscreens
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958Inspecting transparent materials or objects, e.g. windscreens
    • G01N2021/9583Lenses
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03Cuvette constructions

Landscapes

  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Eyeglasses (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
ES13787245T 2012-05-10 2013-05-10 Sistemas y métodos para la inspección de lentes de contacto Active ES2929026T3 (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
SG2012034393A SG195400A1 (en) 2012-05-10 2012-05-10 Systems and methods for the inspection of contact lenses
PCT/SG2013/000187 WO2013169211A1 (en) 2012-05-10 2013-05-10 Systems and methods for the inspection of contact lenses

Publications (1)

Publication Number Publication Date
ES2929026T3 true ES2929026T3 (es) 2022-11-24

Family

ID=49551074

Family Applications (1)

Application Number Title Priority Date Filing Date
ES13787245T Active ES2929026T3 (es) 2012-05-10 2013-05-10 Sistemas y métodos para la inspección de lentes de contacto

Country Status (9)

Country Link
US (2) US9797803B2 (enExample)
EP (1) EP2847569B1 (enExample)
JP (1) JP6301910B2 (enExample)
KR (1) KR102156451B1 (enExample)
CN (1) CN104428649B (enExample)
DK (1) DK2847569T3 (enExample)
ES (1) ES2929026T3 (enExample)
SG (1) SG195400A1 (enExample)
WO (1) WO2013169211A1 (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SG195400A1 (en) * 2012-05-10 2013-12-30 Menicon Singapore Pte Ltd Systems and methods for the inspection of contact lenses
JP6654139B2 (ja) * 2013-10-08 2020-02-26 イーメージ ヴィジョン ピーティーイー. エルティーディー.Emage Vision Pte. Ltd. 濡れた眼用レンズの検査システムおよび検査方法
CN105572041B (zh) * 2014-10-16 2020-09-08 北京普利生仪器有限公司 光学检测设备、方法及其光学检测装置和反应杯
FR3039660B1 (fr) * 2015-07-30 2017-09-08 Essilor Int Methode de verification d'une caracteristique geometrique et d'une caracteristique optique d'une lentille ophtalmique detouree et dispositif associe
CN105115989B (zh) * 2015-10-09 2018-02-23 爱丁堡(南京)光电设备有限公司 一种隐形眼镜缺陷的自动检测设备及检测方法
US10634618B2 (en) * 2018-01-23 2020-04-28 Hong Kong Applied Science and Technology Research Institute Company Limited Apparatus and a method for inspecting a light transmissible optical component
CN113378665B (zh) * 2019-11-27 2024-11-15 奥特斯科技(重庆)有限公司 处理部件承载件的方法及光学检查设备和计算机可读介质
US12186917B2 (en) * 2020-04-16 2025-01-07 Alcon Inc. Method and apparatus for calibrating ophthalmic lens grippers
KR102860351B1 (ko) * 2020-10-14 2025-09-15 이미지 비전 피티이. 리미티드 콘택트 렌즈 결함 분석 및 추적 시스템
US11861823B2 (en) * 2021-04-27 2024-01-02 Johnson & Johnson Vision Care, Inc. Microfluidic device and method for quantifying contact lens deposition
CN119509389A (zh) * 2023-08-22 2025-02-25 中国航发商用航空发动机有限责任公司 压气机径向间隙测量装置及方法
CN119338797B (zh) * 2024-10-22 2025-09-30 平方和(北京)科技有限公司 一种基于极坐标系下的高精度多光场隐形眼镜边缘瑕疵检测方法及装置

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4665624A (en) * 1984-11-20 1987-05-19 Michael Wodis Contact lens analyzing apparatus
AU649291B2 (en) 1990-12-19 1994-05-19 Bodenseewerk Geratetechnik Gmbh Process and apparatus for examining optical components, especially optical components for the eye and device for illuminating clear-transparent test-objects
IL107605A (en) * 1992-12-21 1998-01-04 Johnson & Johnson Vision Prod Lens inspection system
US5995213A (en) * 1995-01-17 1999-11-30 Johnson & Johnson Vision Products, Inc. Lens inspection system
US6765661B2 (en) * 2001-03-09 2004-07-20 Novartis Ag Lens inspection
ES2243129B1 (es) * 2004-04-23 2006-08-16 Universitat Politecnica De Catalunya Perfilometro optico de tecnologia dual (confocal e interferometrica) para la inspeccion y medicion tridimensional de superficies.
FR2878973B1 (fr) * 2004-12-03 2007-04-20 Essilor Int Dispositif de mesure automatique de caracteristiques d'une lentille ophtalmique
US7433027B2 (en) * 2004-12-22 2008-10-07 Novartis Ag Apparatus and method for detecting lens thickness
US20060176491A1 (en) 2004-12-22 2006-08-10 Hall William J Device and method for non-contact scanning of contact lens mold geometry
JP5122581B2 (ja) * 2006-12-21 2013-01-16 ジョンソン・アンド・ジョンソン・ビジョン・ケア・インコーポレイテッド 干渉法検査用レンズ、ならびに干渉法検査用システムおよび装置
JP5452032B2 (ja) * 2009-02-13 2014-03-26 株式会社日立製作所 波面収差測定方法及びその装置
CN102199719A (zh) * 2010-03-24 2011-09-28 Tdk株式会社 稀土磁体用合金和稀土磁体用合金的制造方法
JP2011222966A (ja) 2010-03-24 2011-11-04 Tdk Corp 希土類磁石用合金及び希土類磁石用合金の製造方法
SG195400A1 (en) * 2012-05-10 2013-12-30 Menicon Singapore Pte Ltd Systems and methods for the inspection of contact lenses

Also Published As

Publication number Publication date
SG195400A1 (en) 2013-12-30
US20180045604A1 (en) 2018-02-15
US9797803B2 (en) 2017-10-24
DK2847569T3 (da) 2022-10-24
KR20150013279A (ko) 2015-02-04
US20150138540A1 (en) 2015-05-21
JP6301910B2 (ja) 2018-03-28
CN104428649B (zh) 2018-09-21
EP2847569B1 (en) 2022-07-20
EP2847569A4 (en) 2016-01-27
US10215662B2 (en) 2019-02-26
WO2013169211A1 (en) 2013-11-14
EP2847569A1 (en) 2015-03-18
JP2015517682A (ja) 2015-06-22
KR102156451B1 (ko) 2020-09-22
CN104428649A (zh) 2015-03-18

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