KR102105968B1 - 부착물 정량화 장치 및 그것을 사용한 부착물 정량화 방법 - Google Patents

부착물 정량화 장치 및 그것을 사용한 부착물 정량화 방법 Download PDF

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KR102105968B1
KR102105968B1 KR1020167031804A KR20167031804A KR102105968B1 KR 102105968 B1 KR102105968 B1 KR 102105968B1 KR 1020167031804 A KR1020167031804 A KR 1020167031804A KR 20167031804 A KR20167031804 A KR 20167031804A KR 102105968 B1 KR102105968 B1 KR 102105968B1
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water
branch
light
quantifying
unit
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KR1020167031804A
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KR20170031652A (ko
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히로키 가쓰라
가나메 하라다
신이치 구리하라
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쿠리타 고교 가부시키가이샤
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/59Transmissivity

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
KR1020167031804A 2014-07-18 2015-03-09 부착물 정량화 장치 및 그것을 사용한 부착물 정량화 방법 KR102105968B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JPJP-P-2014-147625 2014-07-18
JP2014147625A JP5874785B2 (ja) 2014-07-18 2014-07-18 付着物定量化装置及びそれを用いた付着物定量化方法
PCT/JP2015/056886 WO2016009669A1 (fr) 2014-07-18 2015-03-09 Dispositif de quantification de dépôt et procédé de quantification de dépôt l'utilisant

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KR20170031652A KR20170031652A (ko) 2017-03-21
KR102105968B1 true KR102105968B1 (ko) 2020-04-29

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JP (1) JP5874785B2 (fr)
KR (1) KR102105968B1 (fr)
CN (1) CN106461551A (fr)
WO (1) WO2016009669A1 (fr)

Families Citing this family (1)

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Publication number Priority date Publication date Assignee Title
JP6804403B2 (ja) * 2017-07-14 2020-12-23 三菱電機株式会社 汚れ判断装置およびそれを用いた計測器のメンテナンス装置

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000146833A (ja) 1998-11-13 2000-05-26 Meidensha Corp 連続式有機汚濁モニタにおける検水流路の異常検知方法
JP2001512834A (ja) 1997-08-12 2001-08-28 カリブラント リミテッド 複数検出器を有する検定装置
JP2002116147A (ja) 2000-10-05 2002-04-19 K I Chemical Industry Co Ltd 水系の汚染測定装置とその測定方法
JP2002282866A (ja) 2001-03-29 2002-10-02 Katayama Chem Works Co Ltd 循環式冷却水系の水処理方法および水処理システム
JP2004337789A (ja) 2003-05-19 2004-12-02 Permachem Asia Ltd スライム監視装置及びスライム防除方法
JP2005030766A (ja) 2003-07-07 2005-02-03 Hakuto Co Ltd 付着汚れ測定装置及び付着汚れ測定方法
JP2011059054A (ja) 2009-09-14 2011-03-24 Nippon Denshoku Kogyo Kk 濁度・色度連続計測装置、濁度・色度連続計測装置の自動洗浄システム及び自動洗浄方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0138445Y2 (fr) * 1985-09-27 1989-11-17
JP3422164B2 (ja) 1996-03-01 2003-06-30 栗田工業株式会社 スライム検知装置及びスライム防止装置
JP2000185276A (ja) 1998-10-13 2000-07-04 Katayama Chem Works Co Ltd 水監視用部材およびそれを用いた水監視装置並びに水監視用部材の濾過装置
JP4159407B2 (ja) 2003-05-26 2008-10-01 ソマール株式会社 水系の濁度モニターシステム
KR100949629B1 (ko) * 2007-12-11 2010-03-26 한국수자원공사 자동식 쟈 테스트 장치 및 테스트 방법
US9280726B2 (en) * 2009-12-18 2016-03-08 Fpinnovation On-line macrocontaminant analyser and method
JP5414721B2 (ja) * 2011-03-17 2014-02-12 株式会社東芝 紫外線照射装置の監視制御システム
US20130032545A1 (en) * 2011-08-05 2013-02-07 Freese Robert P Methods for monitoring and modifying a fluid stream using opticoanalytical devices

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001512834A (ja) 1997-08-12 2001-08-28 カリブラント リミテッド 複数検出器を有する検定装置
JP2000146833A (ja) 1998-11-13 2000-05-26 Meidensha Corp 連続式有機汚濁モニタにおける検水流路の異常検知方法
JP2002116147A (ja) 2000-10-05 2002-04-19 K I Chemical Industry Co Ltd 水系の汚染測定装置とその測定方法
JP2002282866A (ja) 2001-03-29 2002-10-02 Katayama Chem Works Co Ltd 循環式冷却水系の水処理方法および水処理システム
JP2004337789A (ja) 2003-05-19 2004-12-02 Permachem Asia Ltd スライム監視装置及びスライム防除方法
JP2005030766A (ja) 2003-07-07 2005-02-03 Hakuto Co Ltd 付着汚れ測定装置及び付着汚れ測定方法
JP2011059054A (ja) 2009-09-14 2011-03-24 Nippon Denshoku Kogyo Kk 濁度・色度連続計測装置、濁度・色度連続計測装置の自動洗浄システム及び自動洗浄方法

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JP5874785B2 (ja) 2016-03-02
JP2016024016A (ja) 2016-02-08
WO2016009669A1 (fr) 2016-01-21
KR20170031652A (ko) 2017-03-21
CN106461551A (zh) 2017-02-22

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