KR102037560B1 - 곡립 외관 측정 장치 - Google Patents

곡립 외관 측정 장치 Download PDF

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Publication number
KR102037560B1
KR102037560B1 KR1020157002039A KR20157002039A KR102037560B1 KR 102037560 B1 KR102037560 B1 KR 102037560B1 KR 1020157002039 A KR1020157002039 A KR 1020157002039A KR 20157002039 A KR20157002039 A KR 20157002039A KR 102037560 B1 KR102037560 B1 KR 102037560B1
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grain
image
grains
images
processing means
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KR20150036203A (ko
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히데아키 마츠시마
히로키 이시즈키
히로아키 다케우치
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가부시끼가이샤 사따께
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/85—Investigating moving fluids or granular solids
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B02—CRUSHING, PULVERISING, OR DISINTEGRATING; PREPARATORY TREATMENT OF GRAIN FOR MILLING
    • B02B—PREPARING GRAIN FOR MILLING; REFINING GRANULAR FRUIT TO COMMERCIAL PRODUCTS BY WORKING THE SURFACE
    • B02B7/00—Auxiliary devices
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T1/00—General purpose image data processing
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T11/00—2D [Two Dimensional] image generation
    • G06T11/60—Editing figures and text; Combining figures or text
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20212—Image combination
    • G06T2207/20221—Image fusion; Image merging
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30128—Food products

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  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Quality & Reliability (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
KR1020157002039A 2012-06-27 2013-05-16 곡립 외관 측정 장치 Active KR102037560B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JPJP-P-2012-143709 2012-06-27
JP2012143709A JP6024949B2 (ja) 2012-06-27 2012-06-27 穀粒外観測定装置
PCT/JP2013/063700 WO2014002636A1 (ja) 2012-06-27 2013-05-16 穀粒外観測定装置

Publications (2)

Publication Number Publication Date
KR20150036203A KR20150036203A (ko) 2015-04-07
KR102037560B1 true KR102037560B1 (ko) 2019-10-28

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KR1020157002039A Active KR102037560B1 (ko) 2012-06-27 2013-05-16 곡립 외관 측정 장치

Country Status (8)

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US (1) US9607368B2 (enExample)
EP (1) EP2869065A4 (enExample)
JP (1) JP6024949B2 (enExample)
KR (1) KR102037560B1 (enExample)
CN (1) CN104428657B (enExample)
IN (1) IN2015KN00059A (enExample)
TW (1) TWI585396B (enExample)
WO (1) WO2014002636A1 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6481263B2 (ja) * 2014-06-05 2019-03-13 株式会社サタケ 粒状物外観品位判別装置における品位判別基準の作成方法
JP6590907B2 (ja) * 2015-02-19 2019-10-16 株式会社ガオチャオエンジニアリング 莢果選別システム、莢果選別装置及び莢果選別方法
WO2017145824A1 (ja) * 2016-02-22 2017-08-31 株式会社サタケ 粒状物外観品位判別装置
CN108593548A (zh) * 2018-03-07 2018-09-28 四川杰莱美科技有限公司 一种考种用标定托盘
CN111435427B (zh) * 2019-01-14 2024-08-13 珠海格力电器股份有限公司 识别大米的方法、装置和烹饪器具
EP4281227A4 (en) * 2021-01-25 2025-03-26 Inspect Technologies Ltd. Automated grains inspection

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003319165A (ja) * 2002-04-24 2003-11-07 Dainippon Printing Co Ltd 画像合成方法およびシステム
JP2004361333A (ja) 2003-06-06 2004-12-24 Yamamoto Co Ltd 粒状被検査物状態判別装置

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4713781A (en) * 1985-09-19 1987-12-15 Deere & Company Grain damage analyzer
JPH10104165A (ja) * 1996-09-27 1998-04-24 Kubota Corp 撮像式の評価装置
US5917927A (en) * 1997-03-21 1999-06-29 Satake Corporation Grain inspection and analysis apparatus and method
JP4345148B2 (ja) * 1999-07-30 2009-10-14 株式会社サタケ 米粒品位判別装置
KR20000077034A (ko) * 1999-04-22 2000-12-26 사따께 사또루 입상물의 품질을 평가하기 위한 장치 및 방법
US7058335B2 (en) * 2002-06-14 2006-06-06 Ricoh Company, Ltd. Process cartridge and image forming apparatus with toner fed cleaning mode
CN100460176C (zh) 2003-09-11 2009-02-11 三泽住宅株式会社 树脂成形品制造装置
JP4159526B2 (ja) * 2004-09-03 2008-10-01 株式会社山本製作所 粒状被検査物の状態判別装置
JP4529700B2 (ja) 2005-01-18 2010-08-25 株式会社サタケ 穀粒品位判別装置
JP4294706B2 (ja) * 2007-06-22 2009-07-15 財団法人日本穀物検定協会 穀類粒の品質評価システム及び品質評価方法
CN101109743B (zh) * 2007-09-10 2011-05-04 肯特大学 基于数字图像处理技术的便携式谷类分析仪
CN101281112A (zh) 2008-04-30 2008-10-08 浙江理工大学 一种对网状粘连稻米的图像式自动分析方法
CN101788497B (zh) * 2009-12-30 2013-05-29 深圳先进技术研究院 一种基于图像识别技术的嵌入式豆类分类系统
JP4716389B1 (ja) 2010-03-31 2011-07-06 株式会社ケット科学研究所 穀粒鑑定具
JP5533245B2 (ja) * 2010-05-19 2014-06-25 株式会社サタケ 穀粒外観品位判別装置における品位別重量比率の算出方法
CN201699810U (zh) * 2010-06-25 2011-01-05 北京东孚久恒仪器技术有限公司 用于颗粒状物料图像采集的扫描仪
TWM416988U (en) * 2011-05-26 2011-12-01 Univ Far East Inspection structure of paddy machine

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003319165A (ja) * 2002-04-24 2003-11-07 Dainippon Printing Co Ltd 画像合成方法およびシステム
JP2004361333A (ja) 2003-06-06 2004-12-24 Yamamoto Co Ltd 粒状被検査物状態判別装置

Also Published As

Publication number Publication date
US20150146938A1 (en) 2015-05-28
IN2015KN00059A (enExample) 2015-07-31
CN104428657A (zh) 2015-03-18
WO2014002636A1 (ja) 2014-01-03
JP2014006215A (ja) 2014-01-16
JP6024949B2 (ja) 2016-11-16
CN104428657B (zh) 2016-11-09
US9607368B2 (en) 2017-03-28
EP2869065A4 (en) 2016-02-17
EP2869065A1 (en) 2015-05-06
KR20150036203A (ko) 2015-04-07
TWI585396B (zh) 2017-06-01
TW201415005A (zh) 2014-04-16

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