KR102002518B1 - Test socket and apparatus for testing FPCB(Flexible Printed Circuit Board) and display panel - Google Patents

Abstract

A technical idea of the present invention is to provide a test socket and a test device capable of stably and reliably testing electronic components, in particular, a circuit pattern of a flexible PCB (FPCB) or a display panel. The test socket has: a rubber connector having a rubber body and conductive lines formed through the rubber body, and disposed on a printed circuit board (PCB) wherein the conductive lines are electrically connected to terminals of the PCB; and an interface disposed on the rubber connector and having terminal pins electrically connected to the conductive lines. The terminal pins are disposed to correspond to the arrangement of terminals of a terminal portion of a FPCB or a display panel to be tested, and are disposed on one side of the interface in a first direction, or disposed on both sides of the center of the interface in the first direction.

Description

Technical Field [0001] The present invention relates to a test socket and an apparatus for testing a FPCB and a display panel,

Technical aspects of the present invention relate to a test apparatus, and more particularly, to a test socket and a test apparatus for testing an FPCB and a display panel.

2. Description of the Related Art [0002] In recent years, electronic components mounted inside have become smaller in accordance with the trend toward miniaturization and miniaturization of semiconductors and digital home appliances. For example, electronic components such as a display panel, a display module, and a camera module mounted on a smart phone or a digital camera have been downsized. Generally, electronic components are subjected to electrical tests for their normal operation and performance after their manufacture. Tests on circuit patterns of electronic parts, for example, a flexible printed circuit board (FPCB) or a display panel connected to a camera, generally use a pogo-pin. With the recent miniaturization of electronic components, testing through pogo-pins is becoming increasingly difficult. Also, the method using the pogo-pin has a problem that the terminals are often defective due to use for a long time and physical force. Further, when using the pogo-pins, only a very limited portion of the contact is made, so that an inspection error due to contact failure may occur.

A technical object of the present invention is to provide a test socket and a test apparatus capable of reliably and reliably testing circuit patterns of electronic components, particularly FPCB or a display panel.

Technical Solution In order to solve the above problems, the technical idea of the present invention is to provide a semiconductor device having a rubber body and conductive lines formed through the rubber body, disposed on a printed circuit board (PCB) A rubber connector electrically connected to the terminals of the PCB; And an interface disposed on the rubber connector and having terminal pins electrically connected to the conductive lines, wherein the terminal pins are disposed on a flexible printed circuit board (FPCB) or an arrangement of terminals of a terminal portion of a display panel And arranged on either side of the interface along a first direction or on both sides in a central portion of the interface along the first direction.

According to another aspect of the present invention, there is provided a semiconductor device comprising a rubber body and conductive lines formed through the rubber body, the conductive lines being electrically connected to terminals of the PCB, Connected rubber connector; And a fixing device for fixing the rubber connector on the PCB and guiding the terminal part of the FPCB or the display panel to be tested to be placed on the rubber connector at the time of testing.

Furthermore, the technical idea of the present invention, in order to solve the above-mentioned problems, is a test socket; A PCB on which the test socket is mounted; And a pushing device for pressing the terminal portion of the FPCB or the display panel to be tested with the test socket, wherein the test socket comprises conductive lines formed through the rubber body, the conductive lines being arranged on the PCB, A rubber connector electrically connected to terminals of the PCB and an interface having terminal pins electrically connected to the conductive lines, the terminal pins being electrically connected to the FPCB or the display panel Wherein the plurality of terminals are arranged corresponding to the arrangement of the terminals of the terminal portion and arranged on one side of the interface along the first direction or on both sides of the central portion of the interface along the first direction do.

The test socket and the test apparatus for FPCB and display panel test according to the technical idea of the present invention are used for testing the electronic parts such as FPCB or terminals of the terminal of the display panel to the terminal pins of the interface or the conductive lines of the rubber connector By directly contacting and testing, we can solve all the problems in the test method using existing pogo-pins. Accordingly, the test socket and the test apparatus according to the technical idea of the present invention can reliably and reliably test the circuit patterns of the electronic parts, particularly the FPCB or the display panel.

1A and 1B are perspective views of a test socket according to an embodiment of the present invention.
Fig. 2 is an exploded perspective view of the test socket of Fig. 1b.
3A and 3B are plan views showing terminal portions of an FPCB or a display panel to be tested.
4A is a perspective view showing in more detail the interface of the test socket of FIG. 1A or 1B, FIG. 4B is an enlarged plan view showing part A of the interface of FIG. 4A, FIGS. 4C and 4D are cross- Sectional view showing a portion cut away.
5A is a plan view showing in greater detail an interface included in a test socket according to an embodiment of the present invention, FIG. 5B is an enlarged plan view showing part B of FIG. 5A, FIG. 5C and FIG. Section of the interface " II-II ".
6A is a plan view showing an interface included in a test socket according to an exemplary embodiment of the present invention in more detail, FIGS. 6B and 6B are enlarged plan views showing a portion C of the interface of FIG. 6A, Section of the interface " III-III ".
FIG. 7A is a perspective view showing an interface included in a test socket according to an exemplary embodiment of the present invention in more detail, and FIG. 7B is a cross-sectional view illustrating the interface IV-IV 'of FIG. 7A.
8 is a perspective view of a test socket according to an embodiment of the present invention.
FIG. 9A is a plan view showing the rubber connector of the test socket of FIGS. 1A, 1B, or 8 in more detail, and FIGS. 9B and 9C are cross-sectional views of the V-V 'portion of the rubber connector of FIG. 9A.
Figs. 10A and 10B are plan views showing the rubber connector of the test socket of Figs. 1A, 1B or 8 in more detail.
11 is an exploded perspective view of a test apparatus according to an embodiment of the present invention.
Figs. 12A and 12B are cross-sectional views showing the section VI-VI 'of the pressing apparatus in the test apparatus of Fig.

Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings. The embodiments of the present invention are described in order to more fully explain the present invention to those skilled in the art, and the following embodiments may be modified into various other forms, It is not limited to the embodiment. Rather, these embodiments are provided so that this disclosure will be more thorough and complete, and will fully convey the concept of the invention to those skilled in the art.

In the following description, when an element is described as being connected to another element, it may be directly connected to another element, but a third element may be interposed therebetween. Similarly, when an element is described as being on top of another element, it may be directly on top of the other element, and a third element may be interposed therebetween. In addition, the structure and size of each constituent element in the drawings are exaggerated for convenience and clarity of description, and a part which is not related to the explanation is omitted. Wherein like reference numerals refer to like elements throughout.

Unless otherwise defined, all terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which the inventive concept belongs, including technical terms and scientific terms. In addition, commonly used, predefined terms are to be interpreted as having a meaning consistent with what they mean in the context of the relevant art, and unless otherwise expressly defined, have an overly formal meaning It will not be interpreted. It is to be understood that the terminology used is for the purpose of describing the present invention only and is not used to limit the scope of the present invention.

FIGS. 1A and 1B are perspective views of a test socket according to one embodiment of the present invention, and FIG. 2 is an exploded perspective view of the test socket of FIG. 1B. 3A and 3B are plan views showing terminal portions of an FPCB or a display panel to be tested.

1A and 2, the test socket 100 of the present embodiment may include a rubber connector 110, an interface 120, and a lower guide block 130.

The rubber connector 110 may include a rubber body (see 110b in FIGS. 9a and 10a) and a plurality of conductive lines (see 110w in FIG. 9a and 110p in FIG. 10a) formed in the rubber body. The rubber connector 110 is disposed on a printed circuit board (PCB) 300 of a test apparatus (see 1000 in FIG. 12), and the conductive lines of the rubber connector 110 are connected to terminals 310, respectively. More specifically, most of the upper surface of the PCB 300 may be covered with a PSR (Photo Solder Resist), except for the connection portion Gp where the terminals 310 are disposed. That is, the PSR on the connection part Gp is removed, and the terminals 310 can be exposed to the outside. The rubber connector 110 may be disposed on the connection Gp and the conductive lines of the rubber connector 110 may be electrically connected to the terminals 310. [ The rubber connector 110 will be described in more detail in the description of Figs. 9A to 10B.

The lower guide block 130 may be disposed on the PCB 300. The lower guide block 130 has a first through hole H1 at the center and a first groove G1 having a predetermined depth around the first through hole H1. The rubber connector 110 may be disposed on the PCB 300 through the first through hole H1 of the lower guide block 130. [ The first through hole H1 can guide the rubber connector 110 to be disposed in the correct position on the PCB 300, for example, in the connection portion Gp where the terminals 310 are disposed. The first groove G1 also provides a space in which the interface 120 can bend when pressure is applied to the rubber connector 110 through the upper interface 120 to provide a buffering action.

According to an embodiment, the lower guide block 130 may be omitted. 2, the connection portion Gp where the terminals 310 of the PCB 300 are disposed is formed larger than the size of the rubber connector 110, and the rubber connector 110 is disposed in the connection portion Gp . However, when the lower guide block 130 is omitted, the connection portion Gp is formed to match the size of the rubber connector 110, and the arrangement of the rubber connector 110 can be guided.

The interface 120 may include a plurality of terminal pins 122 disposed on both sides of the center portion and an outer support portion 124. The interface 120 may be disposed on the rubber connector 110 and the lower guide block 130. The terminal pins 122 of the interface 120 may be electrically connected to the conductive lines of the rubber connector 110 disposed below. The interface 120 may function to reduce the load applied to the rubber connector 110 and to protect the surface of the rubber connector 110 by blocking foreign substances flowing therefrom.

The terminal pins 122 of the interface 120 may be arranged in various structures according to the arrangement of terminals of the terminal portions 2100 and 2100a of the FPCB or the display panel 2000 and 2000a to be tested. For example, the FPCB or the display panel 2000 or 2000a of FIG. 3A or 3B may have terminal portions 2100 and 2100a, and the interface 120 of the test socket 100 of the present embodiment may be connected to the terminal portions 2100 and 2100a. So that the FPCB or the display panel 2000 or 2000a can be tested.

3A, the FPCB or the display panel 2000 to be tested may include a terminal portion 2100, a connection wiring 2200, and a protective film 2300. [ . The terminal portion 2100 may be disposed at one end portion of the FPCB or the display panel 2000. Of course, the position of the terminal portion 2100 is not limited thereto. The terminal portion 2100 may include a plurality of terminals 2120 and a connection portion 2140. The terminals 2120 are exposed from the protective film 2300 and can be connected to the connection wiring 2200 through the connection portion 2140. [ As shown, the width of the connection wiring 2200 in the first direction (x direction) may be smaller than the width of the terminals 2120.

According to the embodiment, a part of the connection wiring 2200 may be exposed from the protective film 2300 to form a part of the terminal portion 2100 together with the connection portion 2140. Further, the protective film 2300 may be disposed on the lower surface of the terminal portion 2100. In other words, the protective film 2300 may be disposed on the upper surface and the lower surface of the connection wiring 2200, and extend from the lower surface to the terminal portion 2100. Accordingly, the terminals 2120 of the terminal portion 2100 can be exposed on the upper surface.

The terminals 2120 may include a first terminal 2120-1 and a second terminal 2120-2. The first terminal 2120-1 may be located farther from the connection wiring 2200 in the second direction (y direction) than the second terminal 2120-2. For example, the end of the first terminal 2120-1 is in the first position y1 in the second direction (y direction), and the end of the second terminal 2120-2 is in the second direction And the first position y1 may be located farther from the position y0 of the end of the protective film 2300 in the second direction y direction than the second position y2 have.

The first terminal 2120-1 and the second terminal 2120-2 may be alternately disposed in the first direction (x direction). The widths of the first terminal 2120-1 and the second terminal 2120-2 in the first direction (x direction) are set such that the first terminal 2120-1 and the second terminal 2120-2 are connected to each other through a connection wiring (X direction) of the connection portion 2140 connected to the first electrode 2200. As a result, the first terminals 2120-1 and the second terminals 2120-2 are formed at different positions in the second direction (y direction) and alternately arranged in the first direction (x direction) The pitch of the terminals 2120 can be minimized while securing the width of the terminals 2120. [

In Fig. 3B, the FPCB or the display panel 2000a may include a terminal portion 2100a, a connection wiring 2200, and a protective film 2300. Fig. The terminal portion 2100a may include a plurality of terminals 2120a and a connection portion 2140a. The terminals 2120a are connected to the connection wiring 2200 through the connection portion 2140a and can be all disposed at the same position in the second direction (y direction). 3B, the width of the connection portion 2140a in the first direction (x direction) is substantially the same as that of the connection wiring 2200, but the width of the connection portion 2140a in the first direction (x direction) . In addition, the width of the connection portion 2140a in the first direction (x direction) may be substantially the same as that of the terminals 2120a.

Up to now, the FPCB or the display panel 2000 or 2000a has been exemplified as the test object of the test socket 100 of the present embodiment, but the test object is not limited thereto. For example, various electronic products employing the arrangement structure of terminals which are the same as or similar to those of FIG. 3A or FIG. 3B can be a test object of the test socket 100 of the present embodiment.

 2, the terminal pins 122 of the interface 120 are disposed on both sides of the center portion, but the structure of the terminal pins is not limited thereto. For example, the terminal pins may have a structure disposed on only one side along one direction. The various structures of the interface are described in more detail in the description of Figures 4A-B.

Referring to FIGS. 1B and 2, the test socket 100a of the present embodiment may be different from the test socket 100 of FIG. 1A in that it further includes an upper guide block 140. FIG. That is, the test socket 100a of the present embodiment may include the rubber connector 110, the interface 120, the lower guide block 130, and the upper guide block 140. [ The rubber connector 110, the interface 120, and the lower guide block 130 are as described in the test socket 100 of FIG. 1A.

The upper guide block 140 may be disposed on the interface 120. The upper guide block 140 has an open area Oa having one side open and the terminal pins 122 of the interface 120 can be exposed through the open area Oa. A groove G may be formed in the periphery of the open area Oa.

The upper guide block 140 may be coupled to and fixed to the PCB 300 via a coupling member 360 such as a screw or bolt with the interface 120 to thereby secure the interface 120. The upper guide block 140 may guide the terminal portions 2100 and 2100a of the FPCB or the display panel when testing a test object, for example, an FPCB or a display panel 2000 or 2000a. Specifically, the terminal portions 2100 and 2100a of the FPCB or the display panels 2000 and 2000a can be guided through the open area Oa and the groove G and can be stably placed in the correct position on the interface 120. [ The terminal portions 2100 and 2100a of the FPCB or the display panel 2000 and 2000a can be inserted into the open side of the open area Oa.

The test sockets 100 and 100a of the present embodiment connect the terminals 2120 and 2120a of the terminal portions 2100 and 2100a of the electronic components to be tested such as the FPCB or the display panel 2000 and 2000a to the terminals By directly contacting and testing the pins 122, it is possible to solve all the problems in the test method using existing pogo-pins. Accordingly, the test socket 100, 100a of this embodiment can reliably and reliably test the circuit patterns of the electronic components, particularly the FPCB or the display panel 2000, 2000a.

4A is a perspective view showing in more detail the interface of the test socket of FIG. 1A or 1B, FIG. 4B is an enlarged plan view showing part A of the interface of FIG. 4A, FIGS. 4C and 4D are cross- Sectional view showing a portion cut away.

4A-4D, the interface 120 may include terminal pins 122, a support 124, and a support film 126. The terminal pins 122 are disposed along the first direction (x direction) on both sides of the second through hole H2 formed elongated in the central portion, and can be electrically and physically separated from each other. The terminal pins 122 may be formed of a conductive material. For example, the terminal pins 122 may be formed of a metal material such as Beryllium-Copper or Stainless Steel (SUS). However, the material of the terminal pins 122 is not limited thereto. On the other hand, plating of nickel, gold, or the like may be performed on the terminal pins 122 to prevent scratches and improve conductivity.

The terminal pins 122 are arranged in the first direction (x direction) on one side and the first terminal pins 122-1 arranged on the other side in the first direction (x direction) around the second through hole H2. And second terminal pins 122-2 disposed along the second terminal pins 122-2. The length of the first terminal pins 122-1 in the second direction (y direction) has a first length Ly1 and the length of the second terminal pins 122-2 in the second direction (y direction) (Ly2). The first length Ly1 may be smaller than the second length Ly2. However, according to the embodiment, the first length Ly1 may be greater than the second length Ly2, and the first length Ly1 and the second length Ly2 may be substantially the same.

As can be seen from FIG. 4B, the first terminal pins 122-1 and the second terminal pins 122-2 may be disposed at positions staggered from each other along the first direction (x direction). The structure of the first terminal pins 122-1 and the second terminal pins 122-2 may correspond to the arrangement structure of the terminals 2120 of the terminal portion 2100 of the FPCB or the display panel 2000 of FIG. have. For example, the first position y1 of the ends of the first terminals 2120-1 in the second direction (y direction) may correspond to the first contact line Y1 of the first terminal pins 122-1 And the second position y2 of the end of the second terminals 2120-2 may correspond to the second contact line Y2 of the second terminal pins 122-2. Here, the first contact line Y1 is defined as an inner line of the contact portion of the first terminal pins 122-1 in the second direction (y direction), and the second contact line Y2 is defined as an inner line of the contact portion of the first terminal pins 122-1 in the second direction y The second terminal pin 122-2 may be defined as the end line of the contact portion of the second terminal pins 122-2. Thus, at the time of testing, the first position y1 of the first terminals 2120-1 is brought to the first contact line Y1 of the first terminal pins 122-1, and the second terminals 2120 -2 can be brought into contact with the second contact lines Y2 of the second terminal pins 122-2 so as to be brought into contact with each other.

)나 꺽쇠 구조(∧)와 같은 형태의 돌출부(P)가 형성되도록 할 수도 있다.On the other hand, in the interface 120 'of FIG. 4D, the terminal pins 122' may have protrusions P at their end portions. The protrusion P of the terminal pin 122 'can make the contact with the terminals 2120 of the terminal portion 2100 of the FPCB or the display panel 2000 more easily and stably. The projecting portion P may be formed by half-etching a part of the portion exposed in the support film 126. However, the shape and the forming method of the protruding portion P are not limited thereto. For example, the shape of the mold that forms the terminal pins 122 'may be altered such that a 90 ° bending structure (not shown) is formed at the end of the terminal pins 122'

) Or a protrusion P of the same shape as the bracket structure ().

The support portions 124 may be disposed at both outer portions of the extending direction of the second through-hole H2. The support portion 124 is formed of the same metal material as the terminal pins 122 and 122 ', but can be electrically separated from the terminal pins 122 and 122'. According to the embodiment, the support portion 124 may have a structure separated from the outer portion along the second through hole H2. The interface 120 may be included in the test socket 100 via the support 124 and mounted on the PCB 300.

The support film 126 may be disposed on the upper and lower surfaces of the terminal pins 122 and 122 'and the support portion 124. The support film 126 is disposed on the lower surface of the upper support film 126u and the terminal pins 122 and 122 'and the support portion 124 disposed on the upper surfaces of the terminal pins 122 and 122' And a lower support film 126d. The support film 126 is used to secure the terminal pins 122 and 122 'so that the terminal pins 122 and 122' can contact the terminals 2120 of the terminal portion 2100 of the FPCB or the display panel 2000 The terminal pins 122 and 122 'can be fixed with a predetermined gap therebetween. In addition, the support film 126 may be disposed adjacent to the second through hole H2 so that a predetermined portion of the terminal pins 122 and 122 'is exposed to the outside. The terminal pins 122 and 122'are electrically connected to the terminals 2120 of the terminal portion 2100 of the upper FPCB or the display panel 2000 and the conductive lines of the lower rubber connector 110 via the exposed portions Can be connected.

The support film 126 may be a high-performance adhesive tape excellent in insulation and heat resistance. However, the material of the support film 126 is not limited thereto. For example, the support film 126 may be formed of an epoxy resin. In the test socket 100 of the present embodiment, the interface 120 has a structure in which the support film 126 is adhered to both the terminal pins 122 and 122 'and the support portion 124, The structure is not limited thereto. For example, the support film 126 may be adhered only to either the top surface or the bottom surface of the terminal pins 122, 122 'and the support portion 124. In addition, the shape of the support film 126 is not limited to the shape shown in Fig. 4A. For example, the support film 126 may have various shapes within the range of performing the function of fixing the terminal pins 122 and 122 '.

5A is a plan view showing in greater detail an interface included in a test socket according to an embodiment of the present invention, FIG. 5B is an enlarged plan view showing part B of FIG. 5A, FIG. 5C and FIG. Section of the interface " II-II ". The contents already described in the description of Figs. 4A to 4D will be briefly described or omitted.

5A to 5D, in the interface 120a of this embodiment, the terminal pins 122a are arranged on one side along the first direction (x direction) without a through hole in the center portion, (120). Here, one side may mean the relative position of the exposed portion of the terminal pins 122a with respect to the portion covered by the support film 126a.

More specifically, the interface 120a includes terminal pins 122a, a support portion 124a, and a support film 126a, and the terminal pins 122a are connected to one side in the form of a comb in a first direction As shown in FIG. In addition, as shown in FIG. 5A, the terminal pins 122a may have the same length in the second direction (y direction). The structure of the interface 120a may correspond to the arrangement structure of the terminals 2120a of the terminal portion 2100a of the FPCB or the display panel 2000a of FIG. 3b. For example, the position of the end of the terminals 2120a in the second direction (y direction) may correspond to the contact line Y of the terminal pins 122a. Here, the contact line Y may be defined as an inner line of the contact portion of the terminal pins 122a in the second direction (y direction). Therefore, at the time of testing, the positions of the ends of the terminals 2120a can be arranged so as to be in contact with the contact lines Y of the terminal pins 122a to make contact with each other.

Meanwhile, in the interface 120a 'of FIG. 5D, the terminal pins 122a' may have protrusions P at their end portions. The protrusion P of the terminal pin 122a 'can make contact with the terminals 2120a of the terminal portion 2100a of the FPCB or the display panel 2000a more easily and stably. The structure and the forming method of the protrusion P are the same as those described in the description of FIG. 4D.

The support film 126a may be disposed on the top and bottom surfaces of the terminal pins 122a and 122a 'and the support portion 124a. For example, the support film 126a is formed on the lower surfaces of the upper support film 126ua, the terminal pins 122a, 122a 'and the support portion 124a, which are disposed on the upper surfaces of the terminal pins 122a, 122a' And a lower support film 126da disposed therein. The support film 126 may be disposed on one side so that the contact portions of the terminal pins 122a and 122a 'are exposed to the outside. The terminal pins 122a and 122a 'are electrically connected to the conductive lines of the upper FPCB or the terminal 2100a of the terminal portion 2100a of the display panel 2000a and the conductive lines of the lower rubber connector 110 through the exposed contact portion .

In addition, the contents of the interface 120a are as described in the description of FIGS. 4A to 4D.

6A is a plan view showing an interface included in a test socket according to an exemplary embodiment of the present invention in more detail, FIGS. 6B and 6B are enlarged plan views showing a portion C of the interface of FIG. 6A, Section of the interface " III-III ". The contents already described in the description of Figs. 4A to 5D will be briefly described or omitted.

6A to 6D, the interface 120b of the present embodiment may differ from the structure of the interface 120a of FIG. 5A in that the terminal pins 122b are not the same length.

More specifically, the interface 120b may be disposed along the first direction (x direction) to one side in the form of a comb, similar to the interface 120a of FIG. 5A. However, unlike the terminal pins 122a of the interface 120a of FIG. 5a, the terminal pins 122b of the interface 120b are connected to the first terminal pins 122b with a first length L1 in the second direction (y direction) And second terminal pins 122b-2 having a first length L2 and a second length L2. The first length L1 and the second length L2 may be defined as a length exposed from the support film 126b in a second direction (y direction), and the first length L1 may be defined as a second length L2, .

The structure of the first terminal pins 122b-1 and the second terminal pins 122b-2 may correspond to the arrangement structure of the terminals 2120 of the terminal portion 2100 of the FPCB or the display panel 2000 of FIG. have. For example, the first position y1 of the ends of the first terminals 2120-1 in the second direction (y direction) may correspond to the first contact line Y1 of the first terminal pins 122b-1 And the second position y2 of the ends of the second terminals 2120-2 may correspond to the second contact line Y2 of the second terminal pins 122b-2. Here, the first contact line Y1 is defined as the inner line of the contact portion of the first terminal pins 122b-1 in the second direction (y direction), and the second contact line Y2 is defined as the inner line of the contact portion of the first terminal pins 122b- Direction of the second terminal pins 122b-2. Thus, at the time of testing, the first position y1 of the first terminals 2120-1 is brought to the first contact line Y1 of the first terminal pins 122b-1, and the second terminals 2120 -2 can be brought into contact with the second contact lines Y2 of the second terminal pins 122b-2 so as to be brought into contact with each other.

4A, the terminals 2120 of the terminal portion 2100 are extended from the protective film 2300 in the second direction (y direction) by a relatively long length And the structure of the terminal pins 122b of the present embodiment may be suitable for a structure in which the terminals 2120 of the terminal portion 2100 extend relatively short in the second direction (y direction) from the protective film 2300 have.

In the interface 120b 'of FIG. 6C, the terminal pins 122b' may be formed so that the width of the contact portion in the first direction (x direction) is wider than the width of the other portion. In other words, when the terminal pins 122b 'are divided into the extended portion and the contact portion, the width of the contact portion in the first direction (x direction) may be larger than the extended portion. By forming the terminal pins 122b 'in such a structure, the pitch of the terminal pins 122b' can be minimized while securing the width of the contact portion.

In the interface 120b "of Figure 6d, the terminal pins 122b" may have protrusions P1 and P2 at their end portions. The protrusions P1 and P2 of the terminal pins 122b "can make the contact with the terminals 2120 of the terminal portion 2100 of the FPCB or the display panel 2000 more easily and stably. A first protrusion P1 may be formed on the first terminal pins 122b "-1 and a second protrusion P2 may be formed on the second terminal pins 122b" -2. The structure and formation method are the same as those described in the description of FIG. 4D.

In addition, the content of the interface 120b is as described in the description of FIGS. 4A to 5D.

FIG. 7A is a perspective view showing an interface included in a test socket according to an exemplary embodiment of the present invention in more detail, and FIG. 7B is a cross-sectional view illustrating the interface IV-IV 'of FIG. 7A.

7A and 7B, the interface 120c may include terminal pins 122c, and a flexible substrate 128. [ The terminal pins 122c may be disposed along the first direction (x direction) on both sides of the elongated second through hole H2 '. The terminal pins 122c may include upper terminal pins 122uc disposed on the upper surface of the flexible substrate 128 and lower terminal pins 122dc disposed on the lower surface of the flexible substrate 128. [ The terminal pins 122c are arranged in pairs on the upper and lower surfaces of the flexible substrate 128 and the pair of two terminal pins 122c are connected to the via contacts 125 formed in the flexible substrate 128. [ As shown in FIG. According to the embodiment, the second through hole H2 'may be omitted.

On the other hand, similarly to the interface 120 of FIG. 4B, the terminal pins 122c disposed on both sides of the second through-hole H2 'may be disposed at positions offset from each other along the first direction (x direction) . The structure of the terminal pins 122c may correspond to the arrangement structure of the terminals 2120 of the terminal portion 2100 of the FPCB or the display panel 2000 of Fig. The arrangement structure of the terminal pins 122c of this embodiment is the same as the arrangement structure of the terminal pins 122 of Figs. 4A to 4D.

The flexible substrate 128 can be formed of a flexible insulating material that can be flexed and bent freely. For example, the flexible substrate 128 may be formed of an insulating plastic such as polyimide (PI), poly-ester (PET), glass epoxy (GE), or the like. Since the flexible substrate 128 is formed of a flexible material, even if a bending stress or the like is applied during the test, breakage can be minimized. The flexible substrate 128 may have a single layer structure formed of one layer, but may have a multi-layer structure in which a plurality of layers are stacked. The flexible substrate 128 can be used to fabricate FPCB, and the FPCB can be a single side FPCB, a double side FPCB, a multi-layer FPCB or the like as a general PCB.

A plurality of via contacts 125 passing through the flexible substrate 128 may be formed in the flexible substrate 128. The via contacts 125 may be formed of a highly electrically conductive metal material such as copper (Cu), aluminum (Al), nickel (Ni), Ni / Cu, The via contacts 125 can electrically couple two terminal pins 122c that are paired on the upper surface and the lower surface of the flexible substrate 128, as described above. Although the via contacts 125 are disposed in the outer portion in FIG. 7B, the arrangement positions of the via contacts 125 are not limited thereto.

In the test socket 100 of the present embodiment, the flexible substrate 128 of the interface 120c may be formed in a cross-sectional, double-sided, or multi-layer structure. However, in the test socket 100 of the present embodiment, the flexible board 128 of the interface 120c mainly functions to support and connect the upper terminal pins 122uc and the lower terminal pins 122dc, A separate circuit pattern may not be formed on the upper and lower surfaces of the flexible substrate 128 except for the terminal pins 122c and the via contacts 125. [ However, according to the embodiment, a circuit pattern may be formed on the upper surface and the lower surface of the flexible substrate 128.

8 is a perspective view of a test socket according to an embodiment of the present invention. The contents already described in the description of FIGS. 1A to 3B will be briefly described or omitted.

8, the test socket 100b of this embodiment may be different from the test socket 100, 100a of FIG. 1A or 1B in that it does not include an interface. More specifically, the test socket 100b of the present embodiment may include a rubber connector 110, and a lower guide block 130. The rubber connector 110 is as described in the description of Figs. 1A to 3B.

The lower guide block 130 may be disposed on the PCB 300. The lower guide block 130 has a first through hole H1 at the center and a first groove G1 'opened to one side with a predetermined depth around the first through hole H1. The rubber connector 110 is disposed on the connection portion Gp of the PCB 300 through the first through hole H1 and the conductive lines of the rubber connector 110 are electrically connected to the terminals 310 of the PCB 300 . The lower guide block 130 may serve as a fixing device for fixing the rubber connector 110 on the PCB 300. According to the embodiment, a separate fixing device (not shown) for fixing the rubber connector 110 on the PCB 300 may be installed in the lower guide block 130.

The first through hole H1 of the lower guide block 130 can guide the rubber connector 110 to be placed in the correct position on the PCB 300, e.g., in the connection Gp in which the terminals 310 are disposed . The first groove G1 'guides the terminal portions 2100 and 2100a of the FPCB or the display panels 2000 and 2000a so that the terminal portions 2100 and 2100a can be stably positioned at the predetermined position on the rubber connector 110 have. The terminal portions 2100 and 2100a of the FPCB or the display panel 2000 and 2000a can be inserted into the open side of the first groove G1 '.

According to an embodiment, the lower guide block 130 may be omitted. When the lower guide block 130 is omitted, the connection portion Gp is formed to match the size of the rubber connector 110, so that the arrangement of the rubber connector 110 can be guided. A separate fixing device (not shown) for fixing the rubber connector 110 on the PCB 300 may be installed on the PCB 300 when the lower guide block 130 is omitted.

The test socket 100b of the present embodiment directly contacts the terminals of the terminal portions 2100 and 2100 of the electronic components to be tested such as the FPCB or the display panel 2000 and 2000a to the conductive lines of the rubber connector 110, Thus, it is possible to solve all the problems in the test method using the conventional pogo-pin. Accordingly, the test socket 100b of this embodiment can reliably and reliably test the circuit patterns of the electronic components, particularly the FPCB or the display panel 2000, 2000a.

FIG. 9A is a plan view showing the rubber connector of the test socket of FIGS. 1A, 1B, or 8 in more detail, and FIGS. 9B and 9C are cross-sectional views of the V-V 'portion of the rubber connector of FIG. 9A. 1A, 1B, or 8 will be described together.

9A to 9C, the rubber connectors 110 and 110 'may include the rubber body 110b and the conductive lines 110w and 110w'. The rubber body 110b may be formed of, for example, silicon. However, the material of the rubber body 110b is not limited to silicon. The conductive lines 110w and 110w 'may be metal wires formed in the rubber body 110b. The metal wires can be closely arranged while penetrating the rubber body 110b with a very narrow gap, for example, an interval of 0.1 mm or less.

When the rubber connectors 110 and 110 'are used in the test socket 100 and 100a shown in FIG. 1A or 1B, the rubber connectors 110 and 110' are disposed at the upper portion through the conductive lines 110w and 110w ' The terminal pins 122 of the interface 120 may be electrically connected to the terminals 310 of the PCB 300 disposed below. In addition, when the rubber connectors 110 and 110 'are used in the test socket 100b of FIG. 8, the rubber connectors 110 and 110' are connected to the FPCB or FPCB disposed above the conductive lines 110w and 110w ' The terminals 2120 and 2120a of the terminal portions 2100 and 2100a of the display panels 2000 and 2000a and the terminals 310 of the PCB 300 disposed below can be electrically connected.

Since the conductive lines 110w and 110w 'are separately arranged in the rubber connectors 110 and 110', the rubber connectors 110 and 110 'are in contact with the upper portions of the conductive lines 110w and 110w' The terminals may be electrically connected to the terminals contacting the lower portions of the corresponding conductive lines 110w and 110w ', and may be electrically isolated from the other terminals.

As shown in FIG. 9B, the conductive lines 110w may be inclined at an angle? With respect to the upper surface of the rubber body 110b. In addition, as shown in FIG. 9C, the conductive lines 110w 'may be arranged vertically on the upper surface of the rubber body 110b. In the case of the obliquely arranged conductive lines 110w, the stress against the vertical pressure is strong, and the life and stability of the rubber connector 110 can be improved. In addition, the manufacturing method can be made to have a very narrow gap as compared with the vertical structure. On the other hand, the tilt angle of the conductive lines 110w can be appropriately adjusted according to the pressure applied to the rubber connector 110. [ On the other hand, in the case of vertically arranged conductive lines 110w ', there is an advantage that it is easy to confirm the connection relation between the terminals of the electronic parts arranged at the upper part and the lower part.

Figs. 10A and 10B are plan views showing the rubber connector of the test socket of Figs. 1A, 1B or 8 in more detail. The contents already described in the description of Figs. 9A to 9C will be briefly described or omitted. 1A, 1B, or 8 will be described together.

Referring to FIGS. 10A and 10B, the rubber connectors 110a and 110a 'may have a different structure from the rubber connectors 110 and 110' of FIG. 9A. That is, in the test socket 100, 100a, 100b of the present embodiment, the rubber connectors 110a, 110a 'are formed as conductive lines 110p, 100p' in the rubber body 110b by a metal powder, Nickel powder.

When the rubber connectors 110a and 110a 'are used in the test socket 100 or 100a of Figure 1a or 1b, the conductive lines 110p and 100p' are connected to the terminal pins 122 of the interface 120 and the PCB 300 may be formed at positions corresponding to positions of the terminals 310. That is, the terminal pins 122 of the interface 120 and the terminals 310 of the lower PCB 300 may be connected to each other through the conductive lines 110p and 100p 'formed of metal powder. When the rubber connectors 110a and 110a 'are used in the test socket 100b of FIG. 8, the rubber connectors 110a and 110a' are connected to the upper portions of the rubber connectors 110a and 110a 'through the conductive lines 110p and 100p' The terminals 2120 and 2120a of the terminal portions 2100 and 2100a of the FPCB or the display panel 2000 and 2000a and the terminals 310 of the PCB 300 disposed below can be electrically connected.

In the rubber connector 110a of FIG. 10A, the conductive lines 110p may be disposed along the first direction (x direction) with a predetermined spacing at the central portion, similar to the interface 120 of FIG. 4A. In addition, the conductive lines 110p disposed on both sides may be disposed at positions offset from each other along the first direction (x direction). The arrangement of the conductive lines 110p may correspond to the arrangement structure of the terminals 2120 of the terminal portion 2100 of the FPCB or the display panel 2000 of Fig. The arrangement structure of the conductive lines 110p is as described for the arrangement structure of the terminal pins 122 in Figs. 4A to 4D.

10A is similar to the rubber connector 110a of FIG. 10A, but in that the metal powder forming the conductive lines 110p 'is formed only at the contact portion, the rubber connector 110a' (110a). Accordingly, the first contact line Y1 is defined as the upper end line of one of the conductive lines 110p 'in the second direction (y direction), and the second contact line Y2 is defined as the upper end line of the one conductive line 110p' May be defined as the upper end line of the other conductive lines 110p.

Although not shown, corresponding to the arrangement structure of the terminals 2120a of the terminal portion 2100a of the FPCB or the display panel 2000a of Fig. 3b, the conductive lines of the rubber connector are connected to the terminal pins 122a ). ≪ / RTI > That is, the conductive lines of the rubber connector may be formed of a metal powder disposed along the first direction (x direction) on only one side.

FIG. 11 is an exploded perspective view of a test apparatus according to an embodiment of the present invention, and FIGS. 12A and 12B are cross-sectional views showing a section VI-VI 'of the pressing apparatus in the test apparatus of FIG.

11 to 12B, the test apparatus 1000 of the present embodiment may include a test socket 100, a PCB 300, and pushers 400 and 400a. The test socket 100 may be the test socket 100 of FIG. 1A. However, the test socket 100a of FIG. 1B or the test socket 100b of FIG. 8 may be employed in the test apparatus 1000 of the present embodiment.

The test socket 100 may be mounted on the PCB 300. The PCB 300 may be a test PCB for testing an electronic product, such as an FPCB or a display panel 2000, 2000a, or the like. The test socket 100 may be mounted on the PCB 300 and fixed through a coupling member (see 360 in FIG. 2) such as a screw or a bolt.

The pushing devices 400 and 400a push the terminal portions 2100 and 2100a of the FPCB or the display panels 2000 and 2000a to the interfaces 120 and 120a to 120c or the rubber connectors 110 and 110a, The contact can be surely performed. The pushers 400 and 400a may be disposed on the test socket 100 or the PCB 300 through a connection portion or may be mounted on another support device not shown in the test socket 100 and the PCB 300 And can press the terminal portions 2100 and 2100a of the FPCB or the display panels 2000 and 2000a at the time of testing.

11 illustrates a structure in which the pressing devices 400 and 400a are disposed at the upper portion of the test socket 100 and the PCB 300 and the pressing device 400 is pressed downward. However, the present invention is not limited thereto, and it may have a structure in which the pushing devices 400 and 400a are disposed at the lower portion and the pushing device 400 is pressed upward by being disposed on the test socket 100 and the PCB 300. [

12A, the pressing device 400 may include a main body 410, a pressing portion 420, and an elastic connecting portion 430. As shown in FIG. The pressing device 400 includes the elastic connecting portion 430 so that the pressing portion 420 can be pressed with elasticity when pressing the terminal portions 2100 and 2100a of the FPCB or the display panels 2000 and 2000a. Thus, damage to the terminal portions 2100 and 2100a of the FPCB or the display panels 2000 and 2000a, the interfaces 120 and 120a to 120c, or the rubber connectors 110 and 110a can be minimized. The elastic connection portion 430 may be, for example, a spring. However, the type of the elastic connection portion 430 is not limited thereto. For example, the elastic connecting portion 430 may be formed of an elastic material.

12B, the pressing device 400a may include a main body 410 and a pressing part 420a, and the pressing part 420a itself may be formed of an elastic material. Accordingly, the pressing device 400a can press the terminal portions 2100 and 2100a of the FPCB or the display panels 2000 and 2000a with elasticity through the elastic pressing portion 420a.

The test apparatus 1000 of the present embodiment can be tested by using the test sockets 100, 100a and 100b and pushers 400 and 400a of FIG. 1A, 1B, or 8 mounted on the PCB 300 By testing the target electronic product, that is, the FPCB or the display panel 2000, 2000a, the test object can be reliably and reliably tested.

While the present invention has been described with reference to exemplary embodiments thereof, it will be understood by those of ordinary skill in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention as defined by the appended claims. will be. Accordingly, the true scope of the present invention should be determined by the technical idea of the appended claims.

The present invention relates to a test socket and a method of testing the test socket using the test socket. The present invention relates to a flexible printed circuit board, and more particularly, to a flexible printed circuit board having a flexible printed circuit board and a printed circuit board. : Test equipment

Claims (15)

delete A rubber body, and conductive lines formed through the rubber body, the conductive lines being disposed on a printed circuit board (PCB), the conductive lines being electrically connected to terminals of the PCB by a rubber connector ); And
And an interface disposed on the rubber connector and having terminal pins electrically connected to the conductive lines,
Wherein the terminal pins are arranged corresponding to the arrangement of terminals of a terminal portion of a flexible printed circuit board (FPCB) or a display panel to be tested, and are disposed on one side of the interface along a first direction, Are disposed on both sides in a central portion,
The terminals of the terminal portion are all disposed at the same position in a second direction perpendicular to the first direction along the first direction or alternately at the first position and the second position in the second direction, Respectively,
Wherein the terminal pins are disposed on one side of the interface along the first direction and have all the same length in the second direction corresponding to the arrangement of the terminals of the terminal portion or alternately have the same length in the second direction, And wherein the test socket has a different length in the second direction. 3. The method of claim 2,
The terminal pins alternate along the first direction and have different lengths in the second direction,
Wherein an end portion of the terminal pins which is in contact with the terminals of the terminal portion is wider in the first direction than a fixed portion of the terminal pins fixed by the support film. A rubber body, and conductive lines formed through the rubber body, the conductive lines being disposed on a printed circuit board (PCB), the conductive lines being electrically connected to terminals of the PCB by a rubber connector ); And
And an interface disposed on the rubber connector and having terminal pins electrically connected to the conductive lines,
Wherein the terminal pins are arranged corresponding to the arrangement of terminals of a terminal portion of a flexible printed circuit board (FPCB) or a display panel to be tested, and are disposed on one side of the interface along a first direction, Are disposed on both sides in a central portion,
The terminals of the terminal portion are arranged at the first position and the second position in the second direction perpendicular to the first direction alternately along the first direction,
Wherein the terminal pins are disposed on both sides of the central portion of the interface along the first direction and the first terminal pins disposed on either one of the terminal pins are disposed at a position corresponding to the first position in the second direction And the second terminal pins disposed on the other side are disposed at positions corresponding to the second position in the second direction,
Wherein the first terminal pins and the second terminal pins are staggered along the first direction in correspondence with positions of the terminals of the terminal portion in the first direction. 5. The method according to any one of claims 2 to 4,
Wherein the terminal pins have a shape in which an end portion that contacts the terminals of the terminal portion protrudes. Item 2 or 4 As a result,
The interface may include a first structure including a main body having the terminal pins and an outer support portion and a support film for fixing the terminal pins,
A flexible substrate including a plurality of via contacts and a plurality of terminal pins disposed on the upper and lower surfaces of the flexible substrate, wherein the two terminal pins of the upper surface and the lower surface are connected to each other via a via contact Of the test socket. The method according to claim 2 or 4,
And a guide block disposed on the interface and guiding the terminal portion to be positioned on the interface at the time of testing. The method according to claim 2 or 4,
Wherein the terminals of the terminal portion are pressed and contacted to the terminal pins through a pressing device having a spring or an elastic material. delete The method according to claim 2 or 4,
Each of the conductive lines is formed of a metal wire,
Wherein the metal wire is vertically or inclined on the upper surface of the rubber body. The method according to claim 2 or 4,
Each of the conductive lines is formed of a metal powder,
Wherein the metal powder is disposed at a position corresponding to the terminals of the terminal portion. delete Test socket;
A PCB on which the test socket is mounted; And
And a pressing device for pressing the terminal portion of the FPCB or the display panel to be tested with the test socket,
The test socket comprises:
A rubber connector having a rubber body and conductive lines formed through the rubber body and electrically connected to the terminals of the PCB, the conductive lines being disposed on the PCB, the conductive connector being disposed on the rubber connector, And an interface having terminal pins electrically connected to the terminal,
The terminal pins are arranged corresponding to the arrangement of the terminals of the terminal portion of the FPCB or the display panel to be tested and are arranged on one side of the interface along the first direction or on the central portion of the interface along the first direction Respectively,
The terminals of the terminal portion are arranged at the first position and the second position in the second direction perpendicular to the first direction alternately along the first direction,
Wherein the terminal pins are disposed on both sides of the central portion of the interface along the first direction and the first terminal pins disposed on either one of the terminal pins are disposed at a position corresponding to the first position in the second direction And the second terminal pins disposed on the other side are disposed at positions corresponding to the second position in the second direction,
Wherein the first terminal pins and the second terminal pins are staggered along the first direction in correspondence with positions of the terminals of the terminal portion in the first direction. 14. The method of claim 13,
Wherein the pressing device comprises a main body and a pressing portion disposed on the bottom surface of the main body. 15. The method of claim 14,
Wherein the pushing portion is formed of an elastic material, or the pushing portion is connected to the body through a spring.

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