KR101997903B1 - Aligner and Handler for testing electronic parts - Google Patents

Abstract

The present invention relates to an aligner for testing an electronic component device, which can simultaneously perform alignments in X- and Y-axial directions while a carrier is positioned on a test space by performing an operation through one driving source when the carrier arranged with an electronic component device is aligned on the test space to test the electronic component device and a handler having the same.

Description

Technical Field [0001] The present invention relates to an aligner and a handler having the same,

The present invention relates to an aligner for testing an electronic component and a handler having the same, and more particularly, to an aligner for testing an electronic component by aligning a carrier on which an electronic component is arranged on a test space And aligning the X-axis direction and the Y-axis direction while simultaneously positioning the carrier on the test space by performing an operation through the driving source of the aligner and the handler having the aligner.

The manufactured electronic component devices are tested for the presence or absence of defects, and a handler is used as a device for supporting testing according to various conditions such as electrical or physical characteristics of electronic component devices.

Generally, a carrier having an array of electronic component elements is placed on a test space, and a test process is performed. When the alignment of the test object with respect to the test object is not properly performed, Or an error occurs in the judgment result, an aligner is provided for the position alignment with respect to the test object.

Since alignment devices for each direction are provided for aligning positions with respect to the test object in each of the X-axis direction and the Y-axis direction on the test space, the apparatus becomes complicated and thus a considerable cost There is a problem.

Furthermore, in the case of an in-line process method in which a test is performed while horizontally moving a carrier arrayed with electronic component elements, alignment of the test object with respect to the test object may be easy, but a sufficient space for installing the test device as a whole is required.

Patent Publication No. 10-2008-0033783

SUMMARY OF THE INVENTION The present invention has been made in order to solve the problems of the prior art as described above, and it is an object of the present invention to provide a method and apparatus for aligning a test object in X- and Y- Devices have to be provided so that the test apparatus becomes complicated thereby solving the problem of a considerable expense to construct a test apparatus.

Furthermore, in the case of an in-line process method in which a test is performed while horizontally moving a carrier arrayed with electronic component elements, alignment of the test object with respect to the test object may be straightforward, but sufficient space is required to install the test device as a whole. I would like to suggest ways to do this.

According to an aspect of the present invention, there is provided an aligner for testing an electronic component according to the present invention, the aligner advances to a test space into which a carrier in which an electronic component is arranged is inserted, A grip unit for aligning the carrier with respect to the X-axis direction on the test space; The other end of the grip unit is rotated inwardly in the test space as the grip unit is advanced with the rotation axis thereof being in close contact with the side surface in the Y axis direction of the carrier, A clamp unit for aligning the carrier with respect to the Y-axis direction; And a guide unit for guiding the grip unit moved by the moving unit and supporting the rotating clamp unit in accordance with the movement of the grip unit, And the carrier can be aligned and positioned at the same time with respect to the X-axis and Y-axis directions on the test space according to the movement of the grip unit through the moving unit.

Preferably, the clamp unit includes: a rotation pin connected to the guide unit and rotatable while supporting the clamp unit; An alignment clamp which is brought into close contact with the Y-axis direction side surface of the carrier to align the carrier with respect to the Y-axis direction on the test space; And a centering block which is connected to the rotation pin at one end and is provided with the alignment clamp at the other end and at least part of which is in contact with the grip unit and rotates in the test space with the rotation pin as the forward movement of the grip unit, .

More preferably, the clamp unit has one side fixed to the guide unit and the other side connected to the centering block, extending due to the rotation of the centering block as the grip unit advances, And returning the centering block to the home position by rotating the centering block with a restoring force.

Here, the centering block may be curved or bent from one end toward the other end.

The grip unit may further include a grip block that advances or retracts onto the test space by the moving unit and is brought into close contact with the X axis side surface of the carrier to align the carrier with respect to the X axis direction on the test space; A cam mounting block protruding from a longitudinal end of the grip block toward an outer surface of the centering block; And a guide which is installed in the cam mounting block so as to be in contact with the outer surface of the centering block and moves forward while pushing the side surface of the centering block in accordance with advancement of the gripping block to rotate the other end of the centering block toward the inside of the test space And may further include a cam.

Preferably, the grip block may be formed with a carrier seating part for seating the side surface in the X-axis direction of the carrier and aligning the carrier with respect to the X-axis direction on the test space.

The guide unit may further include a guide plate provided with the moving means and provided with at least one guide rail for supporting and guiding the grip block moved by the moving means, And a rail guide block for engaging with the guide rail and guiding the movement of the grip block along the guide rail.

Preferably, the aligner according to the present invention may be provided with a pair of carrier grip devices opposed to each other on the test space.

Here, each of the carrier grip devices may be provided with a pair of clamp units corresponding to both longitudinal ends of the grip unit.

Or each of the carrier gripping devices may be provided so that the clamping unit is provided at one end of the grip unit in the longitudinal direction thereof so that the clamping units of the pair of carrier gripping devices are staggered and symmetrical have.

Further, the present invention provides a handler having an aligner for testing electronic components.

Preferably, the apparatus further comprises a carrier transporting means for moving the carrier on which the electronic component device is arranged onto the test space, wherein the carrier drawn on the test space by the carrier transporting means is moved along the X- Axis direction and the Y-axis direction.

According to the present invention, when a carrier on which an electronic component is arranged is arranged on a test space for testing an electronic component, an operation is performed through one drive source to move the carrier in the X- And alignment in the Y-axis direction can be performed simultaneously.

Particularly, in the case of the handler equipped with the aligner according to the present invention, the space occupied by the device for testing can be drastically reduced by carrying the test process by lifting and lowering the carrier on which the electronic component device is arranged to the test space, It is possible to solve the problem of the pinching phenomenon occurring at the time of alignment.

1 shows an embodiment of a carrier grip unit of an aligner for testing electronic component according to the present invention,
FIG. 2A is an exploded perspective view of the carrier grip unit with respect to the direction of A in FIG. 1,
FIG. 2B is an exploded perspective view of the carrier grip unit with respect to the direction B in FIG. 1,
Figure 3 shows an embodiment of an aligner for electronic component testing according to the present invention,
FIGS. 4A and 4B show operation diagrams for the embodiment of FIG. 3,
5 shows another embodiment of an aligner for electronic component testing according to the present invention,
6 shows an embodiment of a handler equipped with an aligner for testing electronic component according to the present invention.

BRIEF DESCRIPTION OF THE DRAWINGS The above and other objects, features and advantages of the present invention will become more apparent from the following detailed description of the present invention when taken in conjunction with the accompanying drawings.

First, the terminology used in the present application is used only to describe a specific embodiment, and is not intended to limit the present invention, and the singular expressions may include plural expressions unless the context clearly indicates otherwise. Also, in this application, the terms "comprise", "having", and the like are intended to specify that there are stated features, integers, steps, operations, elements, parts or combinations thereof, But do not preclude the presence or addition of features, numbers, steps, operations, components, parts, or combinations thereof.

In the following description of the present invention, a detailed description of known functions and configurations incorporated herein will be omitted when it may make the subject matter of the present invention rather unclear.

The present invention relates to a test apparatus for aligning a carrier on which an electronic component device is arranged for testing of an electronic component device by aligning the carrier on the test space by performing an operation through one drive source, And alignment in the Y-axis direction, and a handler equipped with the aligner.

Here, the electronic component means a variety of electronic component devices such as a camera module, a sensor, a lens, a memory semiconductor device, a non-memory semiconductor device, an LED device, a solar device, etc. The aligner and handler according to the present invention include , General configurations for testing the electronic component may be provided as necessary.

First, an aligner for testing an electronic component according to the present invention will be described with reference to embodiments.

1 shows an embodiment of a carrier grip unit of an aligner for testing electronic component according to the present invention.

The carrier grip device 100 constituting the aligner according to the present invention may roughly include a guide unit 110, a grip unit 120, and clamp units 130a and 130b.

The grip unit 120 moves forward or backward on the test space into which the carrier having the electronic component elements arranged therein is brought in and is brought into close contact with the side surface of the carrier in the X- Align the carriers.

The clamp units 130a and 130b are provided so that at least a part of the clamp units 130a and 130b are in contact with the longitudinal ends of the grip unit 120. The clamp units 130a and 130b rotate inwardly And is brought into close contact with the Y-axis direction side surface to align the carrier with respect to the Y-axis direction on the test space.

One of the main features of the present invention is to simultaneously perform alignment in the X-axis direction and the Y-axis direction while positioning the carrier on the test space. Referring to the enlarged portion of the clamp unit 130a in relation thereto, the grip unit 120 The guide cam 124a of the grip unit 120 moves forward as the grip unit 120 advances to the test space in a state where the guide cam 124a of the grip unit 120a is in contact with the outer surface of the clamp unit 130a The outer surface of the clamp unit 130a is pushed, thereby rotating the clamp unit 130a. As the clamp unit 130a is rotated, the alignment clamp 135a of the clamp unit 130a is brought into close contact with the Y-axis direction side surface of the carrier to align the carrier with respect to the Y-axis direction on the test space.

The guide unit 110 is provided with a moving means for moving the grip unit 120 forward or backward on a test space for testing an electronic component element and guides the grip unit 120 moved by the moving means, And supports the rotating clamp units 130a and 130b as the unit 120 moves.

As described above, in the present invention, the grip unit 120 is closely contacted with the X-axis direction side surface of the carrier through one moving means, while aligning the carrier with respect to the X-axis direction on the test space. The units 130a and 130b may be rotated and brought into close contact with the Y-axis direction side surface of the carrier to align the carriers with respect to the Y-axis direction on the test space so that the carriers can be aligned with respect to the X- do.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, the present invention will be described in detail with reference to the accompanying drawings.

FIG. 2A is an exploded perspective view of the carrier grip unit viewed from the direction of A in FIG. 1, and FIG. 2B is an exploded perspective view of the carrier grip unit seen from the direction of B in FIG.

The guide unit 110 includes a guide plate 111. The guide unit 111 includes a grip unit 120 and a clamp unit 130 which are positioned below the grip unit 120 and the clamp units 130a and 130b, 130a, and 130b and support each operation.

In the guide plate 111, a moving means mounting portion 112 is formed at a rear portion, and a moving means is provided to the moving means mounting portion 112. In the above-described embodiment, the cylinder 115 capable of reciprocating movement is used to move the grip unit 120 forward and backward by the moving means. In addition to this, as an example, there is a variety of grip units 120 that can move forward and backward Moving means can optionally be applied as needed.

The moving means mounting portion 112 may be formed to have a constant height so that the grip unit 120 can be smoothly moved forward and backward by the reciprocating motion cylinder 115. The moving means mounting portion 112 is provided with a reciprocating cylinder And the cylinder rod 116 of the reciprocating cylinder 115 is coupled to the cylinder rod connecting groove 122 formed behind the grip block 121 of the grip unit 120. [

The guide plate 111 is provided with guide rails 113a and 113b for supporting and guiding the grip unit 120 moved by the reciprocating cylinder 115. Preferably, The guide rails 113a and 113b may be provided on both sides of the reciprocating cylinder 115 so as to stably support the movement of the grip unit 120. [ Of course, the number and positions of the guide rails 113a and 113b can be appropriately changed.

Clamp unit mounting portions 114a and 114b are formed at both ends of the guide plate 111 in the longitudinal direction so as to correspond to the length of the grip unit 120 to support a free operation while supporting the clamp units 130a and 130b .

Next, referring to the grip unit 120, the grip block 121 is brought into close contact with the side surface of the carrier in the X-axis direction during forward movement while being advanced or retracted into the test space by the reciprocating cylinder 115, Align the carrier with respect to the carrier.

The lower surface of the grip block 121 is engaged with the guide rails 113a and 113b provided on the guide plate 111 so that the forward and backward movements of the grip block 121 by the reciprocating motion cylinder 115 can be smoothly performed, Rail guide blocks 123a and 123b for guiding the movement while supporting the grip block 121 along the rails 113a and 113b may be provided. At this time, the rail guide blocks 123a and 123b can be changed or modified according to the shape, number, and position of the guide rails 113a and 113b.

Preferably, the front surface of the grip block 121 has a length sufficient to accommodate the length of the carrier in the X-axis direction and is formed in a shape corresponding to the X-axis direction of the carrier, The side surface of the carrier in the X-axis direction is entirely adhered to the front surface so that the carrier can be more easily and accurately aligned with respect to the X-axis direction on the test space. At this time, a carrier seating portion 126 is formed on the front surface of the grip block 121 so that the position of the carrier can be stably maintained while aligning the X-axis direction of the carrier, so that the side surface of the carrier in the X- 126, respectively.

The grip unit 120 also includes cam mounting blocks 124a and 124b and guide cams 125a and 125b that extend from the longitudinal ends of the grip block 121 to the clamp unit 130a And guide cams 125a and 125b are installed on the cam mounting blocks 124a and 124b so as to contact the outer surfaces of the clamp units 130a and 130b.

The guide cams 125a and 125b are provided to be in contact with the centering guides 134a and 134b formed in the centering blocks 133a and 133b of the clamp units 130a and 130b, The cams 125a and 125b are moved forward and a force pushing the centering guides 134a and 134b of the centering blocks 133a and 133b is transmitted so that the centering blocks 133a and 133b rotate the rotation pins 132a and 132b, To the inside of the test space. The guide cams 125a and 125b may be formed of bearings or the like so that the force of the guide cams 125a and 125b pushing the centering guides 134a and 134b may be smoothly transmitted while minimizing the frictional force, 125a, 125b, and the centering guides 134a, 134b are engaged with each other.

The clamp units 130a and 130b interlock with the grip unit 120. The clamp units 130a and 130b include centering blocks 133a and 133b having one end as a rotation axis and the other end rotating inside the test space, The centering blocks 133a and 133b are formed with centering guides 134a and 134b which are in contact with the guide cams 125a and 125b of the grip block 121. The centering blocks 133a and 133b guide the guide cams 125a and 125b, A force for pushing the centering guides 134a and 134b is transmitted, thereby the centering blocks 133a and 133b rotate.

To this end, the rotation pins 132a and 132b are coupled to one end of the centering blocks 133a and 133b, and the rotation pins 132a and 132b are connected to the clamp unit mounting portions 114a and 114b of the guide plate 111, (130a, 130b). When the alignment clamps 135a and 135b are mounted on the other ends of the centering blocks 133a and 133b and the other ends of the centering blocks 133a and 133b are rotated to the inside of the test space, the alignment clamps 135a and 135b are aligned with the Y- Direction to align the carrier with respect to the Y-axis direction on the test space. Although the alignment clamps 135a and 135b are shown in the form of a cylindrical bearing, the alignment clamps 135a and 135b are not limited to this, and a groove corresponding to the thickness of the carrier may be formed on the side surface of the alignment clamp. The alignment clamp can be altered or modified in various configurations or configurations that can minimize stresses associated with the alignment.

Here, the centering blocks 133a and 133b may be formed in a shape bent from one end toward the other end or curved from one end to the other end as shown in the embodiment, so that the centering blocks 133a and 133b The alignment clamps 135a and 135b can be brought into close contact with the side surface of the carrier in the Y-axis direction even when rotated at an angle. The shape of the centering blocks 133a and 133b can be appropriately modified as required.

Further, the clamp units 130a and 130b may include elastic members 136a and 136b. One of the elastic members 136a and 136b is elastically fixed to the clamp unit mounting portions 114a and 114b of the guide unit plate 111, Pins 131a and 131b, and the other end thereof is connected to the centering blocks 133a and 133b.

With such a configuration, the centering guides 134a and 134b are pushed by the movement of the guide cams 125a and 125b as the grip block 121 advances, and the elastic members 136a and 136b are rotated as the centering blocks 133a and 133b rotate, When the force of pushing the centering guides 134a and 134b is removed by the movement of the guide cams 125a and 125b due to the backward movement of the grip block 121, The centering blocks 133a and 133b are returned to their original positions by rotating the centering blocks 133a and 133b with a restoring force according to the energy.

Hereinafter, the aligner constituted by the carrier grip device according to the present invention will be described with reference to the embodiments.

Fig. 3 shows an embodiment of an aligner for testing electronic component according to the present invention.

The aligner for testing an electronic component according to the present invention comprises a pair of carrier grip devices 200 and 300 facing each other on a test space, and each of the carrier grip devices 200 and 300 The clamp units 230a, 230b, 330a, and 330b are installed in pairs corresponding to both ends of the grip units 220 and 230 in the longitudinal direction.

Depending on the situation, one side of the test space may be provided with a support structure for maintaining only the position of the carrier, and one side of the carrier grip device may be provided with a carrier grip device to position and position the carrier on the test space In order to achieve more effective alignment, it is preferable that a pair of carrier gripping devices 200 and 300 are installed facing each other on a test space as shown in FIG. 3, and a pair of carrier gripping devices 200 The carrier grip devices 200 and 300 may be operated simultaneously and simultaneously to align the carrier 10 accurately in a short period of time. It is preferable to operate.

In order to further reduce the space occupied by the test apparatus, the carrier in which the electronic component elements are arranged may be moved horizontally to enter the test space. However, as shown in FIG. 3, It can be lifted up from the lower part and introduced into the test space.

When the carrier 10 is pulled into the test space, the carrier grip devices 200 and 300, which are provided on both sides of the test space in correspondence with each other, are held in the test space while being held in the X- and Y- The operation of this operation will be described with reference to the operation diagrams shown in FIGS. 4A and 4B.

When the carrier 10 is pulled onto the test space, the carrier gripping devices 200 and 300 are operated as shown in FIG. 4A. The carrier gripping devices 200 and 300 are operated by the reciprocating cylinders 215 and 315 provided on the guide units 210 and 310 The clamp units 230a, 230b, 330a, and 330b, which are provided in pairs in the carrier grip devices 200 and 300 in accordance with the advancing operation of the grip units 220 and 320 while the grip units 220 and 320 advance to the test space, Is rotated inward of the test space.

The lateral direction of the carrier 10 on which the electronic component elements are arranged is seated on the carrier seating portions 226 and 326 of the grip units 220 and 320 while the carrier 10 is gripped by the grip units 220 and 320. [ Is aligned with the X-axis of the test space.

The clamp units 230a, 230b, 330a, and 330b rotate inward in the test space as the grip units 220 and 320 are advanced while aligning the carrier 10 in the X-axis direction, and the alignment clamps 235a , 235b, 335a, and 335b are brought into close contact with the Y-axis direction side surface of the carrier 10 to align the carrier 10 with respect to the Y-axis direction on the test space.

4B, the upper surface of the carrier 10 is aligned with the lower surface with respect to the X-axis of the test space by the grip units 220 and 320, and the operation of the grip units 220 and 320 The clamps 230a, 230b, 330a, and 330b interlocked with each other are aligned on both sides of the carrier 10 with respect to the Y axis of the test space, so that the carrier 10 can be accurately aligned on four sides in a short period of time .

5 shows another embodiment of an aligner for testing electronic component according to the present invention.

In the embodiment of FIG. 5, the carrier gripping devices 400 and 500 according to the present invention are configured as a pair facing each other on a test space, wherein each of the carrier gripping devices 400 and 500 has a grip The clamp units 430 and 530 of the pair of carrier grip devices 400 and 500 are provided on one side of the test space in the longitudinal direction of the units 420 and 520, Staggered and symmetrical to each other.

5, when the carrier 10 is pulled into the test space, the carrier gripping devices 400 and 500 mutually operate, and the reciprocating cylinders 415 and 515 provided on the guide units 410 and 510, The clamp units 430 and 530 provided in the carrier gripping devices 400 and 500 are moved inwardly in the test space by the advancing operation of the grip units 420 and 520 while the grip units 420 and 520 are advanced to the test space, .

The sides of the carrier 10 in which the electronic component elements are arranged are mounted on the carrier seating portions of the grip units 420 and 520 so that the carrier 10 is held by the grip units 420 and 520 in X The clamping units 430 and 530 are rotated to the inside of the test space while the alignment clamps 435 and 535 are brought into close contact with the Y-axis direction side surface of the carrier 10, Thereby aligning the carrier 10.

With the above operation, the upper surface of the carrier 10 is aligned with the lower surface of the carrier 10 with respect to the X axis of the test space by the grip units 420 and 520, and one clamp unit 430 The left side of the carrier 10 is aligned and the right side of the carrier 10 is aligned with respect to the Y axis of the test space by the other clamp unit 530, Lt; / RTI >

Furthermore, by mounting an aligner for testing an electronic component according to the present invention on a handler, space for constructing a test apparatus can be drastically reduced, and at the same time, accurate alignment of a test object can be achieved. Fig. 2 shows an embodiment of a handler equipped with an aligner for electronic component testing.

The present invention can be applied to testing various electronic component devices such as a camera module, a sensor, a lens, a memory semiconductor device, a non-memory semiconductor device, an LED device, and a photovoltaic device. The configuration for the test of the electronic component device itself is omitted in FIG. 6, and only the configuration in which the aligner according to the present invention is mounted on the handler is shown in a simplified manner in order to easily explain the present invention.

6, the aligner 610 according to the present invention is mounted on the handler 600 according to the present invention. The aligner 610 is provided with carrier grip devices 610a and 610b on the test space And a plurality of aligners may be sequentially mounted as needed.

The space between the pair of carrier gripping devices 610a and 610b constituting the aligner 610 is provided with carrier transporting means for moving the carrier in which the electronic component devices are arranged at the lower portion thereof to the test space, When the carrier is lifted and lowered onto the test space by the carrier transporting means, the aligner 610 composed of the pair of carrier gripping devices 610a and 610b operates to align the carrier on the test space.

Here, a plurality of carriers may be sequentially stacked on the lower portion of the test space, and the carrier transporting means may move the carrier up and down on the test space in order from the upper layer.

In the handler having the aligner according to the present invention, the space occupied by the device for testing can be drastically reduced by carrying the test process by lifting and lowering the carrier in which the electronic component device is arranged to the test space, It is possible to solve the problem of the pinching phenomenon occurring at the time of alignment.

The foregoing description is merely illustrative of the technical idea of the present invention, and various changes and modifications may be made by those skilled in the art without departing from the essential characteristics of the present invention. Therefore, the embodiments of the present invention are not intended to limit the scope of the present invention but to limit the scope of the present invention. The scope of protection of the present invention should be construed according to the following claims, and all technical ideas within the scope of equivalents thereof should be construed as being included in the scope of the present invention.

10: carrier,
100, 200, 300, 610a, 610b: carrier grip device,
110, 210, 310, 410, 510: guide unit,
111: guide plate,
112: moving means mounting portion,
113a, 113b: guide rails,
114a and 114b: a clamp unit mounting portion,
115, 215, 315, 415, 515: reciprocating cylinder,
116: cylinder rod,
120, 220, 320, 420, 520: grip unit,
121: grip block,
122: cylinder rod connecting groove,
123a, 123b: rail guide block,
124a, 124b: cam mounting block,
125a, 125b: guide cam,
126, 226, 326: a carrier seating portion,
130a, 130b, 230a, 230b, 330a, 330b, 430, 530: clamp unit,
131a and 131b: elastic fixing pins,
132a, 132b: rotation pin,
133a, 133b: centering block,
134a, 134b: a centering guide,
135a, 135b, 235a, 235b, 335a, 335b, 435, 535: alignment clamp,
136a, 136b: elastic body,
600: Handler,
610: Earliner.

Claims (12)

A grip unit that advances onto a test space into which a carrier having an array of electronic components arranged therein is brought into intimate contact with a side surface of the carrier in the X axis direction to align the carrier with respect to the X axis direction on the test space; At least a part of which is in contact with the longitudinal end of the grip unit and is rotated by the rotation shaft to advance inside the test space as the grip unit advances and is brought into close contact with the side surface in the Y axis direction of the carrier, A clamp unit for aligning the carrier with respect to the axial direction; And a guide unit for guiding the grip unit to be moved by the moving unit and supporting the rotating clamp unit in accordance with the movement of the grip unit, The carrier is aligned and positioned with respect to the X-axis and Y-axis directions on the test space according to the movement of the grip unit through the moving unit,
The clamp unit includes: a rotation pin connected to the guide unit and rotatable while supporting the clamp unit; An alignment clamp which is brought into close contact with the Y-axis direction side surface of the carrier to align the carrier with respect to the Y-axis direction on the test space; And a centering block having the rotation pin connected at one end and the alignment clamp at the other end and at least a portion of the centering block being in contact with the grip unit to rotate inside the test space about the rotation pin as the grip unit advances and,
The grip unit includes a grip block for advancing or retracting onto the test space by the moving unit and closely contacting the X-axis direction side surface of the carrier to align the carrier with respect to the X-axis direction on the test space; A cam mounting block protruding from a longitudinal end of the grip block toward an outer surface of the centering block; And a guide cam which is installed on the cam mounting block so as to be in contact with the outer surface of the centering block and moves forward while pushing the side surface of the centering block in accordance with advancement of the grip block to rotate the other end of the centering block toward the inside of the test space. / RTI >
Wherein the guide unit comprises a guide plate provided with the moving means and provided with at least one guide rail for supporting and guiding the grip block moved by the moving means,
Wherein the grip unit further comprises a rail guide block mounted on the grip block and engaged with the guide rail to guide movement of the grip block along the guide rail.
Aligner for testing electronic components. delete The method according to claim 1,
Wherein the clamp unit is extended by a rotation of the centering block in accordance with advancement of the grip unit and one side is fixed to the guide unit and the other side is connected to the centering block, Further comprising an elastic body for rotating the block and returning the block to the original position. The method according to claim 1,
Wherein the centering block is formed in a curved or bent shape from the one end toward the other end. delete The method according to claim 1,
Wherein the grip block is formed with a carrier receiving portion for receiving a side surface of the carrier in the X-axis direction and aligning the carrier with respect to the X-axis direction on the test space. delete The method according to claim 1,
And the carrier gripping devices are provided in a pair in opposition to each other on the test space. 9. The method of claim 8,
Each said carrier gripping device comprising:
And the clamp unit is provided in a pair corresponding to both longitudinal ends of the grip unit. 9. The method of claim 8,
Each said carrier gripping device comprising:
Wherein the clamp unit is provided so as to correspond to one longitudinal end of the grip unit and the clamp units of the pair of carrier grip apparatuses are staggered and symmetrically arranged on the test space. Liner. A handler characterized by comprising an aligner for testing an electronic component element according to claim 1. 12. The method of claim 11,
Further comprising a carrier transporting means for lifting the carrier on which the electronic component element is arranged onto the test space,
Wherein the aligner is arranged in alignment with the X-axis and Y-axis directions on the test space at the same time as the carrier drawn on the test space by the carrier transferring means.

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