KR101890639B1 - Test System for Memory Card - Google Patents

Abstract

A memory card test system is disclosed. A memory card test system according to an embodiment of the present invention includes a memory card moving unit that supports a memory card and moves the memory card to a test working position where the memory card is tested; And a docking unit for testing a memory card, wherein the memory card moving unit is dockable at a test work position and the test operation is performed on the memory card when the memory card moving unit is docked.

Description

[0001] The present invention relates to a test system for a memory card,

The present invention relates to a memory card test system, and more particularly, to a memory card test system that provides the same environment as a real computer situation for a memory card test, and can automate a memory card test to increase the efficiency of a memory card test ≪ / RTI >

The structure of a computer is broadly classified into five types: an input device, an arithmetic device, a control device, a storage device, and an output device, and the storage device can be divided into a main storage device and an auxiliary storage device.

A semiconductor memory device is generally used as a storage medium of a main memory device, and a semiconductor memory device includes a ROM (Read Only Memory) and a RAM (Random Access Memory).

A ROM (Read Only Memory) is a read-only memory device of a computer, which is also referred to as a non-volatile memory because information is not lost when the power is turned off.

Random access memory (RAM), on the other hand, is a storage device that can read and store other information, and is also referred to as volatile memory because the recorded information is lost when the power is turned off . Therefore, RAM is used for temporary storage of computer main storage, application loading, and temporary storage of data.

Generally, a memory used as a main memory device in a computer includes a plurality of semiconductor chips. A semiconductor chip card including a plurality of semiconductor chips is referred to as a RAM module or a memory module, and plays a very important role in components constituting the computer.

The memory module can be divided into a single in-line memory module (SIMM), a dual in-line memory module (DIMM), and a Rambus in-line memory module (RIMM).

A single in-line memory module (SIMM) is an abbreviation for a single-line memory module. A memory is mounted on a single substrate. A memory is arranged on one end of the substrate, Module.

 Dual in-line memory modules (DIMMs) are short for "two-way memory modules." It comes from the fact that the terminals are on both sides of the board. In a single in-line memory module (SIMM) While dual inline memory modules (DIMMs) have different signal lines installed on both sides.

A Rambus inline memory module (RIMM) is a memory module that uses Rambus directly on a board.

Such various types of memory modules can be defined as a memory card, and hereinafter, the memory module will be referred to as a memory card.

Since the memory card is an important part of the operation of the computer, the performance of the memory card is inspected after the manufacture of the memory card.

The DC test is performed by connecting a DC power supply to the measured terminal and applying a specified voltage or current to measure the voltage or current flowing through the terminal. Is measured by a DC measuring device to check the DC characteristics of the memory card. The DC test is used to check the input current of the memory card, the power supply current, the output voltage, and the short circuit of the internal wiring can do. The AC test measures the timing of the memory card. By applying a pulse signal to the input terminal of the memory, the characteristics of the operation can be checked by measuring the delay time to the input / output terminal, the start time and the end time of the output signal have.

On the other hand, there is a main board as a hardware constituting the inside of the computer.

A main board is a physical hardware that stores basic circuits and components in a computer and is called a mother board or a main board and includes a central processing unit (CPU), a microprocessor, a memory card, A BIOS, an expansion slot, a connection circuit, and the like. The main board sets the execution environment of the computer, maintains the information, and plays a role in the stable operation of the computer.

However, the DC test or the AC test independently checks the state of the memory card irrespective of the main board of the computer in which the memory card is actually mounted. Therefore, even if the memory card is determined to be normal after the DC test or AC test, it may happen that the memory card is not actually operated after being mounted on the main board of the computer or mounted on another apparatus.

Therefore, memory card manufacturers apply a process to test all tested memory cards again to see whether they are working properly in real computer situations. This is called memory card mounting test.

Most of these memory card mounting tests are performed manually. That is, an operator places a separate main board in a workbench or a chamber, mounts a memory card in a slot mounted on the main board, and then applies power to the main board to check the characteristics of the memory in a real computer situation.

Particularly, since the process of moving from the place where the main board is stored before the memory card mounting test process to the memory card mounting test place where the memory card mounting test is performed is manually performed, the inspection time of the memory card mounting test is prolonged, The efficiency of the memory card mounting test is deteriorated.

Korean Patent Laid-Open Patent No. 10-2011-0008905 (Micro-contact Solution, Inc.), September 20, 2011

SUMMARY OF THE INVENTION Accordingly, it is an object of the present invention to provide a memory card test system capable of increasing the efficiency of a memory card test by automating a manual memory card test by providing an environment identical to an actual computer situation for a memory card test will be.

According to an aspect of the invention, there is provided a memory card moving unit for supporting a memory card, the memory card moving unit being provided for moving the memory card to a test working position where the memory card is tested; And a docking unit for testing the memory card, wherein the memory card moving unit is dockable at the test working position and the test operation is performed on the memory card when the memory card moving unit is docked A memory card test system can be provided.

The memory card moving unit includes: a moving unit body; And a test board provided on the moving unit body to allow the test work to proceed in a state where a plurality of memory cards are coupled.

The test board includes: a substrate main body on which wiring patterns are formed; A memory card test slot electrically connected to the wiring pattern, the memory card test slot being provided on one side of the board body and mounting the memory card; And a test module provided on the other surface of the substrate body and electrically connected to the wiring pattern.

Wherein the moving unit body comprises: an interposing board connecting the test board and the moving unit body; A power port provided on the interposer board and supplying power to the test board through the interposer board; And an input / output port provided on the interposer board for inputting data to the test board through the interposer board and outputting data from the test board through the interposer board.

Wherein the docking unit for testing the memory card comprises: a docking unit body in which a docking space in which the memory card moving unit is docked is formed; And a plurality of docking unit side drive rollers provided in the docking unit main body, for driving the memory card moving unit to / from the memory card moving unit.

The memory card testing docking unit may further include a docking unit supporting plate for supporting the docking unit body from below.

The memory card testing docking unit may further include an individual temperature adjusting unit for adjusting the temperature of the docking space.

And a memory card test station having a plurality of docking unit support shelves for forming the test work locations and individually supporting a plurality of the memory card test docking units.

Wherein the memory card test station includes a moving unit stocker for transferring the memory card moving unit to the memory card testing docking unit at a predetermined position or for taking out the memory card moving unit that has been tested in the memory card testing docking unit .

Wherein the moving unit stocker comprises: a stocker body movably provided at the test work position; And a memory card transferring unit for transferring the memory card moving unit to the memory card testing docking unit or the memory card moving docking unit for testing the memory card, And a stocker shelf for taking out the unit.

The stocker shelf includes: a base plate; A rotating plate rotatably coupled to the base plate; A plurality of moving unit stocker-side drive rollers provided on the rotating plate, for driving the memory card moving unit for moving in and out of the memory card moving unit; And an immovable unit anti-rotation jam module provided on the rotating plate for preventing rotation of the memory card moving unit.

A receiving tray on which the memory card to be loaded is loaded; And a delivery tray for taking out the tested memory card from the memory card moving unit and loading it.

Wherein the output tray comprises: a normal memory card output tray on which a normally operating memory card of the tested memory card is loaded; And an abnormal memory card output tray on which the malfunctioning memory card is loaded among the memory cards that have been tested.

And a memory card transfer unit for transferring the memory card loaded on the receiving tray to the memory card moving unit or transferring the memory card mounted on the memory card moving unit to the output tray.

Wherein the memory card transfer unit comprises: a first pick and place unit for taking out the memory card loaded on the receiving tray and mounting the memory card on the memory card moving unit; And a second pick and place unit for taking out the memory card mounted on the memory card moving unit and loading the memory card on the output tray.

The first pick-and-place unit may include a first memory card identification module for recognizing an identification code provided on the memory card, and the second pick-and-place unit may include a second memory card identification module for recognizing an identification code And a memory card identification module.

A receiving tray station provided adjacent to the memory card transmitting unit and having a plurality of the receiving trays stacked thereon; And an output tray station provided adjacent to the memory card transfer unit and loaded with a plurality of the output trays.

And a tray stocker for taking out the receiving tray from the receiving tray station and transferring the receiving tray to the memory card transfer unit or receiving the output tray from the memory card transfer unit and loading the same on the output tray station.

The delivery unit may include a receiving tray cover provided on the receiving tray to prevent impurities from entering the receiving tray, and a receiving tray cover opening part separating the receiving tray to open the receiving tray. And an output tray cover engaging portion for engaging the output tray with the output tray cover provided on the output tray to prevent the entry of impurities into the output tray.

According to the present invention, it is possible to automate the movement and mounting of a memory card for a memory card test by manually providing an environment identical to a real computer situation for testing a memory card, It is possible to provide a memory card test system capable of increasing the efficiency of the memory card test while reducing the size of the memory card.

1 is a top view of a memory card test system in accordance with an embodiment of the present invention.
2 is a perspective view of one side of the memory card moving unit of Fig.
3 is a perspective view of the other side of the memory card moving unit of Fig.
4 is a cross-sectional view of one side of the memory card moving unit of Fig.
Fig. 5 is a plan view of the memory card moving unit of Fig. 2;
6 is a perspective view of the docking unit for testing the memory card of Fig.
7 is a sectional top view of the docking unit for testing the memory card of Fig. 6;
Fig. 8 is a cross-sectional view of one side of the state in which the memory card moving unit and the memory card testing docking unit in Fig. 6 are docked.
Figure 9 is a partial enlarged view of the memory card station of Figure 1;
10 is a partial enlarged view of the tray common stocker of FIG.

In order to fully understand the present invention, operational advantages of the present invention, and objects achieved by the practice of the present invention, reference should be made to the accompanying drawings and the accompanying drawings which illustrate preferred embodiments of the present invention.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings. Like reference symbols in the drawings denote like elements. In the following description, well-known functions or constructions are not described in order to avoid unnecessary obscuration of the present invention.

In general, a memory used as a main memory device in a computer includes a plurality of semiconductor chips, a semiconductor chip card including a plurality of semiconductor chips is referred to as a RAM module or a memory module, and a memory module includes a single in-line memory module (SIMM, A single in-line memory module, a dual in-line memory module (DIMM), and a Rambus in-line memory module (RIMM). Hereinafter, the memory module will be referred to as a memory card without any distinction.

Hereinafter, the memory card mounting test will be referred to as a memory card test.

1 is an explanatory view of a memory card test system according to an embodiment of the present invention.

1, the memory card test system 1000 includes a memory card moving unit 1100, a memory card test docking unit 1200, a memory card test station 1300, a receiving tray (not shown) 1400 includes a delivery tray 1500, a memory card transfer unit 1600, a loading station 1700, a delivery station 1800, and a tray common stocker 1900.

1, the memory card test system 1000 includes a roller conveyor or conveyor belt or the like between the goods receipt station 1700 and the transfer unit 1600 or between the transfer unit 1600 and the goods dispatch station 1800 . Thus, it is possible to deliver the receiving tray 1400 from the receiving station 1700 to the conveying unit 1600 with a roller conveyor or a conveyor belt or the like from the conveying unit 1600 to the receiving station 1800 as a roller conveyor or conveyor belt, The tray 1500 can be delivered.

FIG. 2 is a perspective view of one side of the memory card moving unit of FIG. 1, FIG. 3 is a perspective view of the other side of the memory card moving unit of FIG. 2, Of the memory card moving unit of Fig.

The memory card moving unit 1100 supports the memory card 1 and includes a moving unit body 1110 and a test board 1120 as shown in these drawings.

The test board 1120 is provided on the moving unit main body 1110 and enables the test operation to proceed in a state where a plurality of memory cards 1 are coupled. Although the test board 1120 according to the present embodiment is configured such that two test boards 1120 are symmetrically arranged on the moving unit body 1110, the scope of the present invention is not limited thereto, 1120 may be provided.

The test board 1120 includes a substrate main body 1121 on which a wiring pattern (not shown) is formed, a memory card test slot 1122, and a test module 1123.

The memory card test slot 1122 is electrically connected to a wiring pattern (not shown) formed on the board main body 1121 and is provided on one side of the board main body 1121 and the memory card 1 is mounted. A plurality of memory card test slots 1122 may be provided on one surface of the substrate main body 1121, and the memory card test slots 1122 may be expanded according to a user's request. Therefore, it is possible to simultaneously test a plurality of memory cards 1, increase the efficiency of testing of the memory card 1, and reduce the test process time of the memory card 1.

The test module 1123 is provided on the other side opposite to the side where the memory card test slot 1122 of the board main body 1121 on which the wiring pattern (not shown) is formed, (Not shown) and forms the same environment as the main board actually mounted on the computer, so that the test reliability of the memory card 1 is enhanced. The test module 1123 may include a central processing unit (CPU), a microprocessor, a coprocessor, and a connection circuit.

The moving unit main body 1110 includes an interposer board 1111, a power port 1112, and an input / output port 1113.

The interposer board 1111 connects the test board 1120 and the moving unit body 1110 and the power port 1112 is provided on the interposer board 1111 and is connected to the interposer board 1111 by the test board 1120. [ The input / output port 1113 is provided on the interposer board 1111 and inputs data to the test board 1120 through the interposer board 1111 and outputs data from the test board 1120 to the interposer board 1120. [ 1111).

As described above, the memory card moving unit 1100 includes a moving unit body 1110 and a test board 1120. The memory card moving unit 1100 forms the same environment as an actual computer and is utilized for a memory card test, And the number of memory cards 1 mounted can be expanded according to the user's convenience, thereby improving the efficiency of the test.

The memory card moving unit 1100 is provided to move the memory card 1 to the test work position P1 where the memory card 1 is to be tested. Accordingly, the memory card test system 1000 according to the present invention can save manpower and time required for the test, thereby enhancing the efficiency of the test, which will be described later in detail.

Figure 6 is a perspective view of a docking unit for testing a memory card of Figure 1, Figure 7 is a cross-sectional top view of a docking unit for testing a memory card of Figure 6, Figure 8 is a cross- Sectional view of the docking unit in a state where the docking unit is docked.

The docking unit 1200 for testing the memory card is provided such that the memory card moving unit 1100 can be docked to the test working position P1 and the memory card moving unit 1100 is provided, The test operation for the memory card 1 is carried out.

6, the memory card testing docking unit 1200 includes a docking unit main body 1210, a docking unit side driving roller 1220, a docking unit supporting plate 1230, (Not shown).

A docking space P2 is formed in the docking unit main body 1210 and a docking space P2 is a space in which the memory card moving unit 1100 is docked. Since the docking space P2 is formed inside the docking unit main body 1210, the size of the docking unit 1200 for testing the memory card can be reduced and space utilization can be improved.

The docking unit-side drive roller 1220 is provided in the docking unit main body 1210 and drives the memory card moving unit 1100 to move the memory card moving unit 1100 in and out.

That is, the docking unit-side drive roller 1220 can automatically drive the memory card moving unit 1100. Therefore, the labor required for moving the memory card 1 for testing the memory card 1 can be reduced, and the total time required for testing the memory card 1 can be shortened, thereby increasing the efficiency of the memory card 1 test .

Since the docking unit supporting plate 1230 supports the docking unit body 1210 from the lower side, the stability of the memory card testing docking unit 1200 is improved and the reliability of the test of the memory card 1 is improved.

The individual temperature regulating unit 1240 can regulate the temperature of the docking space P2 and performs an extreme test to test the performance of the memory card 1 at a high temperature and a low temperature through the temperature control of the docking space P2 can do. That is, since a separate process for the extreme test is not required, the test efficiency of the memory card 1 is increased and the reliability of the memory card 1 tested in the memory card test system 1000 according to the present invention is increased.

Figure 9 is a partial enlarged view of the memory card station of Figure 1;

1 and 9, the memory card test station 1300 includes a plurality of docking units 1200 for forming a test work position P1 and supporting a plurality of memory card test docking units 1200 individually, And has a supporting shelf 1310, and includes a moving unit stocker 1320.

Since the memory card test station 1300 includes a plurality of docking unit supporting shelves 1310, it is possible to test a plurality of memory cards 1 at the same time, thereby enhancing the efficiency of the test.

9, the moving unit stocker 1320 includes a stocker body 1321 movably provided in the test work position P1, a stocker rack 1322, and a memory card moving unit 1100 to the memory card test docking unit 1200 at the predetermined position or the memory card moving unit 1100 that has been tested in the memory card test docking unit 1200 is taken out.

That is, the moving unit stocker 1320 automatically transfers the memory card moving unit 1100 to the memory card testing docking unit 1200 or the memory card moving unit 1100 in the memory card testing docking unit 1200 The moving time and necessary manpower of the memory card moving unit 1100 can be reduced, and the efficiency of the memory card 1 test is enhanced.

The stocker shelf 1322 is coupled to the stocker body 1321 so as to be movable up and down so as to transfer the memory card moving unit 1100 to the memory card testing docking unit 1200, A memory card moving unit 1200 which has been tested in the use docking unit 1200 is taken out and includes a base plate 1322a, a rotation plate 1322b rotatably coupled on the base plate 1322a, A unit stocker side drive roller 1322c, and a moving unit rotation prevention jam module 1322d.

The plurality of moving unit stocker-side drive rollers 1322c are provided on the rotating plate 1322b and drive the memory card moving unit 1100 for the entry and exit of the memory card moving unit 1100. [

In other words, the plurality of moving unit stocker-side drive rollers 1322c automatically drive the memory card moving unit 1100, and as described above, it is possible to reduce the moving time and necessary manpower of the memory card moving unit 1100 Memory Card (1) Increase the efficiency of testing.

The moving unit rotation preventing jamming module 1322d is provided on the rotating plate 1322b to prevent the rotation of the memory card moving unit 1100 and improve the stability when the memory card moving unit 1100 is moved.

The receiving tray 1400 is loaded with a memory card 1 to be loaded for testing, and can load a plurality of memory cards 1 at the same time.

The stocking tray 1500 stores the memory card 1 loaded with the tested memory card 1 from the memory card moving unit 1100 and stores it in a normal state in which the normally functioning memory card 1 of the tested memory card 1 is loaded A memory card output tray 1510 and an abnormal memory card output tray 1520 on which an abnormally operating memory card among the tested memory cards 1 is loaded.

The memory card 1 thus tested is automatically distinguished from the normally operating memory card 1 and the malfunctioning memory card 1 and is loaded into the normal memory card output tray 1510 and the abnormal memory card output tray 1520, Which will be described later in detail.

1, the memory card transfer unit 1600 transfers the memory card 1 loaded on the receiving tray 1400 to the memory card moving unit 1100 or the memory card moving unit 1100 The first pick and place unit 1610, the second pick and place unit 1620, and the pick-up tray 1620. The pick-and- A cover opening portion 1630, and an output tray cover engaging portion 1640.

The first pick and place unit 1610 takes out the memory card 1 loaded on the receiving tray 1400 and mounts the same on the memory card moving unit 1100, And a first memory card identification module 1611 for recognizing the first memory card.

The second pick and place section 1620 takes out the memory card 1 mounted on the memory card moving unit 1100 and loads it on the output tray 1500 and inserts the identification code provided on the memory card 1 And a second memory card identification module 1621 for recognizing the second memory card.

1, the first pick-and-place unit 1610 removes the memory card 1 loaded on the receiving tray 1400 and mounts it on the memory card moving unit 1100, and the second pick- The unit 1620 removes the memory card 1 mounted on the memory card moving unit 1100 and loads it on the output tray 1500 so that a known one may be used. do.

As described above, the first memory card identification module 1611 and the second memory card identification module 1621 recognize the identification code provided on the memory card 1, and recognize the information of the recognized memory card 1 The memory card moving unit 1100 or the memory card testing docking unit 1200 so as to automatically classify the memory card 1, which will be described later in detail.

On the other hand, the identification code provided on the memory card 1 may be provided as a barcode, but the scope of the present invention is not limited thereto, and the identification code may be provided with an identification code other than the barcode, if necessary.

The receiving tray cover opening portion 1630 separates the receiving tray tray 1400a and the receiving tray 1400 provided on the receiving tray 1400 to prevent impurities from entering the receiving tray 1400, The tray 1400 is opened.

The output tray cover engaging portion 1640 engages the outlet tray cover 1500a provided on the output tray 1500 to prevent the entry of impurities into the output tray 1500. [

The receiving tray station 1700 is provided adjacent to the memory card transmitting unit 1600 to load a plurality of receiving trays 1400.

The output tray station 1800 is provided adjacent to the memory card transfer unit 1600 to load a plurality of output trays 1500.

10 is a partial enlarged view of the tray common stocker of FIG.

1 and 10, the common stocker 1900 receives the goods receipt tray 1400, takes it out of the tray station 1700 and transfers it to the memory card transfer unit 1600 or transfers it to the memory card transfer unit 1600 And may include a common stocker body 1910, a common stocker rotation section 1920, and a common stocker tray shelf 1930. The common stocker tray 1920 may include a common stocker tray 1920,

The common stocker rotation section 1920 is connected to the common stocker body 1910 and is rotatably provided and includes a first rotation module 1921, a second rotation module 1922, and a rotation module axis 1923 .

The first rotation module 1921 and the second rotation module 1922 are connected to each other via a rotation module shaft 1923, and are provided so as to overlap each other, thereby improving space efficiency.

The operation of the memory card test system 1000 having such a configuration will now be described.

As shown in Fig. 1, the memory card test system 1000 of the present embodiment is loaded with a memory card 1 to be placed in a stock tray 1400 for testing. The receiving tray 1400 loaded with the memory card 1 is loaded on the receiving tray station 1700. [

The tray common stocker 1900 wears the receiving tray 1400 and takes it out of the tray station 1700 and transfers it to the memory card transmitting unit 1600.

The memory card transfer unit 1600 transfers the memory card 1 loaded on the receiving tray 1400 to the memory card moving unit 1100.

The process of transferring the memory card 1 from the memory card transfer unit 1600 to the memory card moving unit 1100 from the tray 1400 will be described in detail as follows.

The receiving tray cover opening portion 1630 separates the receiving tray 1400a from the receiving tray 1400 and opens the receiving tray 1400. [ The first pick and place section 1610 takes out the memory card 1 from the open receiving tray 1400 and the first memory card identifying module 1611 recognizes the identification code of the memory card 1. [ The first pick-and-place unit 1610 mounts the memory card 1 whose identification code is recognized in the memory card moving unit 1100.

That is, the memory card transfer unit 1600 automatically transfers the memory card 1 from the tray 1400 to the memory card moving unit 1100 to reduce the time and manpower required for the memory card test, thereby improving the efficiency of the memory card test Increase.

On the other hand, the moving unit stocker 1320 transfers the memory card moving unit 1100 to the memory card testing docking unit 1200 at a predetermined position. The moving unit stocker-side driving roller 1322c drives the memory card moving unit 1100 to transfer it to the docking unit 1200 for testing the memory card.

The memory card moving unit 1100 is docked with the docking unit 1200 for testing the memory card in the docking space P2 and the docking unit 1200 for testing the memory card moves to the memory card 1100 when the memory card moving unit 1100 is docked 1).

At this time, the individual temperature regulator 1240 may control the temperature of the docking space P2 to perform an extreme test of high temperature or low temperature for the memory card 1. [

And the memory card test station 1300 has a plurality of docking unit support shelves for individually supporting the docking unit 1200 for testing the memory card so that the plurality of memory card test docking units 1200 can simultaneously access the memory card 1) The test work can be carried out.

A plurality of docking unit side driving rollers 1220 drives a memory card moving unit 1100 and a moving unit storeer 1320 drives a memory card moving unit 1100 that has been tested in the memory card testing docking unit 1200 Out.

The memory card transfer unit 1600 transfers the memory card 1 mounted on the memory card moving unit 1100 to the output tray 1500.

The process of transferring the memory card 1 mounted on the memory card moving unit 1100 to the output tray 1500 will be described in detail as follows.

The second pick and place unit 1620 takes out the memory card 1 from the memory card moving unit 1100 and the second memory card identifying module 1621 recognizes the identification code of the memory card 1. [ The second pick-and-place unit 1620 loads the memory card 1 whose identification code is recognized in the output tray 1500. [

At this time, the second pick and place section 1620 loads the normally operating memory card 1 of the tested memory card 1 into the normal memory card output tray 1510, The abnormally operating memory card 1 is loaded in the abnormal memory card output tray 1520.

The output tray cover engaging portion 1640 engages the output tray cover 1500a and the output tray 1500. [

The output tray 1500 is loaded on the output tray station 1800 where the tray common stocker 1900 separately loads the normal memory card output tray 1510 and the abnormal memory card output tray 1520.

As described above, according to the present invention, since the tested memory card 1 is automatically distinguished as a normal memory card and an abnormal memory card and loaded into the normal memory card output tray 1510 and the abnormal memory card output tray 1520, Increase the efficiency of the test process by shortening time and reducing manpower.

It will be apparent to those skilled in the art that various modifications and variations can be made in the present invention without departing from the spirit or scope of the invention. It is therefore intended that such modifications or alterations be within the scope of the claims appended hereto.

1000: memory card test system 1100: memory card moving unit
1110: Moving unit body 1120: Test board
1200: memory card test docking unit 1210: docking unit body
1220: Driving roller on the docking unit side 1230: Docking unit supporting plate
1240: Individual temperature control unit 1300: Memory card test station
1310: Shelf for supporting the docking unit 1320: Moving unit stocker
1400: Receipt tray 1500: Out tray
1600: memory card transfer unit 1610: first pick and place unit
1620: 2nd pick and place unit 1630: Wear tray cover opening
1640: output tray cover engaging portion 1700: receiving station
1800: Outgoing station 1900: Tray common stocker

Claims (19)

A memory card moving unit for supporting the memory card and moving the memory card to a test working position where the memory card is tested; And
And a docking unit for testing a memory card, the docking unit being capable of docking the memory card moving unit in the test work position and performing a test operation on the memory card when the memory card moving unit is docked,
Wherein the memory card testing docking unit comprises:
A docking unit body in which a docking space in which the memory card moving unit is docked is formed; And
And a plurality of docking unit side drive rollers provided in the docking unit main body for driving the memory card moving unit for moving in and out of the memory card moving unit. The method according to claim 1,
The memory card moving unit includes:
A moving unit body; And
And a test board provided on the moving unit main body and allowing the test operation to proceed in a state where a plurality of memory cards are coupled. 3. The method of claim 2,
The test board includes:
A substrate main body on which wiring patterns are formed;
A memory card test slot electrically connected to the wiring pattern, the memory card test slot being provided on one side of the board body and mounting the memory card; And
And a test module provided on the other surface of the substrate body and electrically connected to the wiring pattern. 3. The method of claim 2,
In the moving unit body,
An interposer board connecting the test board and the moving unit body;
A power port provided on the interposer board and supplying power to the test board through the interposer board; And
And an input / output port provided on the interposer board for inputting data to the test board through the interposer board and outputting data from the test board through the interposer board. delete The method according to claim 1,
Wherein the memory card testing docking unit comprises:
And a docking unit supporting plate for supporting the docking unit main body from below. The method according to claim 1,
Wherein the memory card testing docking unit comprises:
Further comprising an individual temperature regulator for regulating the temperature of the docking space. The method according to claim 1,
Further comprising a memory card test station having a plurality of docking unit support shelves for forming the test work locations and individually supporting a plurality of the memory card test docking units. 9. The method of claim 8,
The memory card test station includes:
Further comprising a moving unit stocker for transferring the memory card moving unit to the memory card testing docking unit at a predetermined position or for taking out the memory card moving unit that has been tested in the memory card testing docking unit Memory card test system. 10. The method of claim 9,
The moving unit stocker
A stocker body movably provided at the test work position; And
Wherein the memory card moving unit is coupled to the stocker body so as to move up / down, and the memory card moving unit is transferred to the memory card testing docking unit or the memory card moving unit And a stocker shelf for taking out the memory card. 11. The method of claim 10,
The stocker lathe includes:
A base plate;
A rotating plate rotatably coupled to the base plate;
A plurality of moving unit stocker-side drive rollers provided on the rotating plate, for driving the memory card moving unit for moving in and out of the memory card moving unit; And
And a moving unit anti-rotation jamming module provided on the rotating plate for preventing rotation of the memory card moving unit. The method according to claim 1,
A receiving tray on which the memory card to be loaded is loaded; And
Further comprising: an output tray for taking out the tested memory card from the memory card moving unit and loading it. 13. The method of claim 12,
The stock tray includes:
A normal memory card output tray on which a normally operating memory card among the memory cards tested is loaded; And
And an abnormality memory card output tray to which an abnormal operation memory card is loaded, among the memory cards whose test has been completed. 13. The method of claim 12,
Further comprising a memory card transfer unit for transferring the memory card loaded on the receiving tray to the memory card moving unit or for transferring the memory card mounted on the memory card moving unit to the output tray Memory card test system. 15. The method of claim 14,
Wherein the memory card transfer unit comprises:
A first pick and place unit for taking out the memory card loaded on the receiving tray and mounting the same on the memory card moving unit; And
And a second pick and place unit for taking out the memory card mounted on the memory card moving unit and loading the memory card on the output tray. 16. The method of claim 15,
The first pick-and-
And a first memory card identification module for recognizing an identification code provided on the memory card,
The second pick-and-
And a second memory card identification module for recognizing an identification code provided on the memory card. 15. The method of claim 14,
A receiving tray station provided adjacent to the memory card transmitting unit and having a plurality of the receiving trays stacked thereon; And
Further comprising an outlet tray station adjacent to the memory card transfer unit and loaded with a plurality of the output trays. 18. The method of claim 17,
Further comprising a tray stocker for taking the stock tray from the stock tray station and transferring the same to the memory card transfer unit or receiving the stock tray from the memory card transfer unit and loading the same on the stock tray station Memory card test system. 15. The method of claim 14,
Wherein the memory card transfer unit comprises:
A receiving tray cover opening provided on the receiving tray for separating the receiving tray from the receiving tray tray to prevent impurities from entering the receiving tray; And
And an output tray cover engaging portion for engaging the output tray with an output tray cover provided on the output tray to prevent impurities from entering the output tray.

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