KR101892945B1 - Memory Card Testing Kit And Memory Card Testing Apparatus Having The Same, And Test System for Memory Card Having The Same - Google Patents

Abstract

A memory card test kit, a memory card test device including the same, and a memory card test system to which the memory card test device is applied are disclosed. The memory card test kit according to an embodiment of the present invention performs a test operation on a memory card in a memory card test tray when the memory card test tray supporting the memory card is docked and includes: a kit body in which the memory card test tray is docked in one side; a docking slot part formed on a wall surface of one side of the kit body and docked with the memory card test tray; and a power supply unit provided in the kit body and supplying power for the test operation to the memory card test tray when the memory card test tray is docked in the docking slot unit. Accordingly, the present invention can stably, quickly and automatically perform the test operation on the memory card.

Description

TECHNICAL FIELD [0001] The present invention relates to a memory card test kit, a memory card test apparatus having the memory card test kit, and a memory card test system to which the memory card test apparatus is applied }

The present invention relates to a memory card test kit, a memory card test apparatus having the memory card test kit, and a memory card test system to which the memory card test apparatus is applied. More particularly, A memory card test kit including the memory card test kit and the memory card test apparatus including the same, which can contribute to productivity improvement by enabling automatic construction of a test operation of the memory card, Card test system.

The structure of a computer is broadly classified into five types: an input device, an arithmetic device, a control device, a storage device, and an output device, and the storage device can be divided into a main storage device and an auxiliary storage device.

A semiconductor memory device is generally used as a storage medium of a main memory device, and a semiconductor memory device includes a ROM (Read Only Memory) and a RAM (Random Access Memory).

A ROM (Read Only Memory) is a read-only memory device of a computer, which is also referred to as a non-volatile memory because information is not lost when the power is turned off.

Random access memory (RAM), on the other hand, is a storage device that can read and store other information, and is also referred to as volatile memory because the recorded information is lost when the power is turned off . Therefore, RAM is used for temporary storage of computer main storage, application loading, and temporary storage of data.

Generally, a memory used as a main memory device in a computer includes a plurality of semiconductor chips. A semiconductor chip card including a plurality of semiconductor chips is referred to as a RAM module or a memory module, and plays a very important role in components constituting the computer.

The memory module can be divided into a single in-line memory module (SIMM), a dual in-line memory module (DIMM), and a Rambus in-line memory module (RIMM).

A single in-line memory module (SIMM) is an abbreviation for a single-line memory module. A memory is mounted on a single substrate. A memory is arranged on one end of the substrate, Module.

 Dual in-line memory modules (DIMMs) are short for "two-way memory modules." It comes from the fact that the terminals are on both sides of the board. In a single in-line memory module (SIMM) While dual inline memory modules (DIMMs) have different signal lines installed on both sides.

A Rambus inline memory module (RIMM) is a memory module that uses Rambus directly on a board.

Such various types of memory modules can be defined as a memory card, and hereinafter, the memory module will be referred to as a memory card.

Since the memory card is an important part of the operation of the computer, the performance of the memory card is inspected after the manufacture of the memory card.

The DC test is performed by connecting a DC power supply to the measured terminal and applying a specified voltage or current to measure the voltage or current flowing through the terminal. Is measured by a DC measuring device to check the DC characteristics of the memory card. The DC test is used to check the input current of the memory card, the power supply current, the output voltage, and the short circuit of the internal wiring can do. The AC test measures the timing of the memory card. By applying a pulse signal to the input terminal of the memory, the characteristics of the operation can be checked by measuring the delay time to the input / output terminal, the start time and the end time of the output signal have.

On the other hand, there is a main board as a hardware constituting the inside of the computer.

A main board is a physical hardware that stores basic circuits and components in a computer and is called a mother board or a main board and includes a central processing unit (CPU), a microprocessor, a memory card, A BIOS, an expansion slot, a connection circuit, and the like. The main board sets the execution environment of the computer, maintains the information, and plays a role in the stable operation of the computer.

However, the DC test or the AC test independently checks the state of the memory card irrespective of the main board of the computer in which the memory card is actually mounted. Therefore, even if the memory card is determined to be normal after the DC test or AC test, it may happen that the memory card is not actually operated after being mounted on the main board of the computer or mounted on another apparatus.

Therefore, memory card manufacturers apply a process to test all tested memory cards again to see whether they are working properly in real computer situations. This is called memory card mounting test.

As described above, for the memory card mounting test, development of a device that stably supports the memory card during the process of transferring the memory card for the memory card mounting test or performing the memory card mounting test operation by providing the same environment as the actual computer situation .

However, until now, almost all semiconductor companies have been testing the memory card manually, so that the efficiency of the mounting test on the memory card may be lowered and the productivity may be reduced. It is necessary.

Korean Patent Laid-Open Patent No. 10-2011-0008905 (Micro-contact Solution, Inc.), September 20, 2011

SUMMARY OF THE INVENTION Accordingly, it is an object of the present invention to provide a memory card test system capable of automatically and stably performing a test operation on a memory card and automating construction of a test operation of the memory card, A kit and a memory card test apparatus having the same, and a memory card test system to which the memory card test apparatus is applied.

According to an aspect of the present invention, there is provided a method for testing a memory card test tray in a memory card test tray when the memory card test tray supporting the memory card is docked, A kit body docked at one side; A docking slot formed on one side wall of the kit body and docked with the memory card test tray; And a power supply unit provided in the kit body and supplying power for a test operation to the memory card test tray when the memory card test tray is docked in the docking slot unit. A kit may be provided.

A guide wall connected to the kit body along a direction in which the memory card test tray is docked; And a plurality of tray supports for supporting the memory card test tray at opposite sides of the guide wall with the memory card test tray interposed therebetween.

And a plurality of cooling fans provided on the guide wall for cooling the heat generated during the test operation of the memory card.

A temperature sensing unit connected to the kit body and sensing a temperature of the memory card test tray during a test operation of the memory card; And a controller which is provided in the kit body and controls the operation of the cooling fan based on the sensed value of the temperature sensing unit.

A plurality of guide pins inserted in guide pin grooves of the memory card test tray and guiding the correct position of the memory card test tray when the memory card test tray is docked in the docking slot portion; .

And a motorized tray locking unit provided on the kit body for locking the memory card test tray in a motorized manner so that the memory card test tray docked in the docking slot unit is not arbitrarily detached.

The electric tray locking portion includes: an electric actuator; A locking member selectively locked to a locking portion of the memory card test tray; And a motion transmitting portion for moving or rotating the locking member based on the power of the electric actuator.

According to another aspect of the present invention, there is provided a memory card test tray comprising: a tray main body; and a test board provided on the tray main body for supporting the memory card and allowing a test operation to proceed in a state where a plurality of the memory cards are coupled to each other; And a memory card test kit disposed to enable the memory card test tray to be docked and to conduct a test operation on the memory card in the memory card test tray when the memory card test tray is docked Wherein the memory card test kit comprises: a kit body in which the memory card test tray is docked at one side; A docking slot formed on one side wall of the kit body and docked with the memory card test tray; And a power supply unit provided in the kit body and supplying power for a test operation to the memory card test tray when the memory card test tray is docked in the docking slot unit. May be provided.

Wherein the memory card test kit comprises: a guide wall connected to the kit body along a direction in which the memory card test tray is docked; And a plurality of tray supports for supporting the memory card test tray at opposite sides of the guide wall with the memory card test tray interposed therebetween.

Wherein the memory card test kit includes: a plurality of cooling fans provided on the guide wall for cooling heat generated during a test operation of the memory card; A temperature sensing unit connected to the kit body and sensing a temperature of the memory card test tray during a test operation of the memory card; And a controller which is provided in the kit body and controls the operation of the cooling fan based on the sensed value of the temperature sensing unit.

Wherein the memory card test kit is provided in the kit body and inserted into a guide pin groove of the memory card test tray when the memory card test tray is docked in the docking slot portion, And a plurality of guide pins for guiding the guide pins.

And a motorized tray locking unit provided on the kit body for locking the memory card test tray in a motorized manner so that the memory card test tray docked in the docking slot unit is not arbitrarily detached.

The electric tray locking portion includes: an electric actuator; A locking member selectively locked to a locking portion of the memory card test tray; And a motion transmitting portion for moving or rotating the locking member based on the power of the electric actuator.

The tray main body includes: an interposer board connecting the test board and the tray main body; A power port provided on the interposer board and supplying power to the test board through the interposer board; And an input / output port provided on the interposer board for inputting data to the test board through the interposer board and outputting data from the test board through the interposer board.

The test board includes: a substrate main body on which wiring patterns are formed; A memory card test slot electrically connected to the wiring pattern, the memory card test slot being disposed on one side of the substrate body and mounting the memory card; And a test module disposed on the other surface of the substrate body and electrically connected to the wiring pattern.

According to another aspect of the present invention there is provided a memory card test system comprising a memory card test tray for supporting a memory card and a memory card test tray for performing a test operation on the memory card in the memory card test tray when the memory card test tray is docked A memory card test apparatus having a memory card test kit; A memory card test station for forming a test work location where the memory card is tested and individually supporting a plurality of the memory card test kits; A receiving tray on which the memory card to be loaded is loaded; And an output tray for taking out the tested memory card from the memory card test tray, wherein the output tray is loaded.

The memory card test station further includes a tray stocker for transferring the memory card test tray to the memory card test kit at a predetermined position or for taking out the memory card test tray that has been tested in the memory card test kit .

Wherein the tray stocker comprises: a stocker body movably provided at the test work position; And a memory card test tray, which is coupled to the stocker body so as to be movable up / down, for transferring the memory card test tray to the memory card test kit or the memory card test tray, And may include a stocker shelf to be taken out.

And a memory card transfer unit for transferring the memory card loaded on the receiving tray to the memory card test tray or transferring the memory card mounted on the memory card test tray to the output tray.

Wherein the memory card transfer unit comprises: a first pick and place unit for taking out the memory card loaded on the receiving tray and mounting the memory card on the memory card test tray; And a second pick and place unit for taking out the memory card mounted on the memory card test tray and loading the memory card on the output tray.

A receiving tray station provided adjacent to the memory card transmitting unit and having a plurality of the receiving trays stacked thereon; And an output tray station provided adjacent to the memory card transfer unit and loaded with a plurality of the output trays.

And a tray stocker for taking out the receiving tray from the receiving tray station and transferring the receiving tray to the memory card transfer unit or receiving the output tray from the memory card transfer unit and loading the same on the output tray station.

Wherein the output tray comprises: a normal memory card output tray on which a normally operating memory card of the tested memory card is loaded; And an abnormal memory card output tray on which the malfunctioning memory card is loaded among the memory cards that have been tested.

According to the present invention, a test operation for a memory card can be performed automatically in a stable and quick manner. Further, automation of a test operation of a memory card can be constructed, thereby contributing to productivity improvement.

1 is a plan view of a memory card test kit according to an embodiment of the present invention.
2 is a perspective view of FIG.
3 is a perspective view of a memory card test apparatus according to an embodiment of the present invention in which a memory card test tray is docked in a memory card test kit.
Fig. 4 is a plan view of Fig. 3. Fig.
5 is a side view of Fig.
FIGS. 6 to 9 are operation diagrams of a memory card test apparatus showing a step of docking a memory card test tray to a memory card test kit.
10 is a schematic plan structural view of a memory card test system according to an embodiment of the present invention.
11 is an enlarged view of the main part of the memory card test system shown in Fig.
12 is a diagram showing a request structure of a memory card test station.

In order to fully understand the present invention, operational advantages of the present invention, and objects achieved by the practice of the present invention, reference should be made to the accompanying drawings and the accompanying drawings which illustrate preferred embodiments of the present invention.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings. Like reference symbols in the drawings denote like elements.

Prior to describing the drawings, in general, a memory used as a main memory device in a computer includes a plurality of semiconductor chips, a semiconductor chip card including a plurality of semiconductor chips is referred to as a RAM module or a memory module, The memory module can be divided into a single in-line memory module (SIMM), a dual in-line memory module (DIMM), and a Rambus in-line memory module (RIMM). Hereinafter, the memory module will be referred to as a memory card without any distinction. Hereinafter, the memory card mounting test will be referred to as a memory card test and a test operation.

FIG. 1 is a plan view of a memory card test kit according to an embodiment of the present invention, FIG. 2 is a perspective view of FIG. 1, and FIG. 3 is a side view of a memory card test kit in which a memory card test tray is docked. FIG. 5 is a side view of FIG. 3, and FIGS. 6 to 9 illustrate a process of docking a memory card test tray to a memory card test kit. FIG. 10 is a schematic plan structural view of a memory card test system according to an embodiment of the present invention, and Fig. 11 is a schematic plan structural view of a memory card test system shown in Fig. 10, And FIG. 12 is a diagram showing a request structure of a memory card test station.

1 is a block diagram illustrating a memory card according to a first embodiment of the present invention; FIG. 2 is a block diagram illustrating a memory card according to an embodiment of the present invention; It is.

In order to implement such an operation, the memory card test kit 1200 having the structure shown in FIGS. 1 and 2 can be applied. The scope of the present invention includes a memory card test kit 1200 having the structure as shown in FIGS. 1 and 2, a memory card test tray 1100 as shown in FIGS. 3 to 5, A memory card test apparatus 1000 provided in a docked state, and a memory card test system 10 in the form of FIG. 10 including such a memory card test apparatus.

Hereinafter, for convenience of explanation, the memory card test tray 1100 docked in the memory card test kit 1200 will be described first, as shown in FIG. 3 to FIG.

The memory card test tray 1100 includes a tray main body 1110 and a test unit 1110 for supporting the memory card 1 so as to perform a test operation in a state where a plurality of memory cards 1 are coupled to each other, Board 1120 as shown in FIG.

In this embodiment, two test boards 1120 are provided symmetrically on the tray main body 1110, but the scope of rights of the present invention is not limited to these. That is, a plurality of test boards 1120 may be provided as needed.

The tray body 1110 includes an interposer board 1111, a power port 1112, and an input / output port 1113, as schematically shown in Figs.

The interposer board 1111 connects the test board 1120 to the tray main body 1110 and the power port 1112 is provided on the interposer board 1111 to connect the interposer board 1111 with the test board 1120 The input / output port 1113 is provided on the interposer board 1111 and inputs data to the test board 1120 through the interposer board 1111 and outputs the data from the test board 1120 to the interposer board 1111 And outputs the data.

The test board 1120 includes a substrate main body 1121 having a wiring pattern formed thereon, a memory card test slot 1122, and a test module (not shown).

The substrate main body 1121 supports a plurality of memory card test slots 1122. The memory card test slot 1122 is electrically connected to a wiring pattern formed on the board main body 1121 and disposed on one side of the board main body 1121 to form a place where the memory card 1 is mounted. The plurality of memory card test slots 1122 may be arranged on one surface of the substrate main body 1121, and may be extended according to the demand of the user. When a plurality of memory card test slots 1122 are formed on one surface of the substrate main body 1121 as in the present embodiment, a plurality of memory cards 1 can be tested at the same time, the efficiency of testing of the memory card 1 can be enhanced, The test process time of the memory card 1 can be reduced.

Although not shown, the test module is electrically connected to the wiring pattern formed on the substrate main body 1121, which is disposed on the other surface opposite to the surface on which the memory card test slot 1122 of the substrate main body 1121 on which the wiring pattern is formed, It forms the same environment as the main board actually mounted on the computer, thereby enhancing the test reliability of the memory card 1. [ Such a test module may include a central processing unit (CPU), a microprocessor, a coprocessor, and a connection circuit.

As described above, the memory card test tray 1100 applied to the present embodiment includes the tray main body 1110 and the test board 1120. Since the memory card test tray 1100 is used for the memory card test by forming the same environment as the actual computer, . ≪ / RTI > In addition, the number of the memory cards 1 can be expanded according to the convenience of the user, thereby preventing blurring in the progress of the test work, thereby enhancing the efficiency and stability of the test.

3 to 9, the memory card test apparatus 1000 according to the present embodiment includes a memory card test tray 1100 and a memory card test tray 1100 so that the memory card test tray 1100 and the memory card test tray 1100 can be docked And includes a memory card test kit 1200 that allows the memory card test tray 1100 to carry out a test operation on the memory card 1 when the memory card test tray 1100 is docked.

The memory card test kit 1200 includes a kit body 1210, a docking slot 1220 to which the memory card test tray 1100 is docked, a memory card test tray 1100, And a power supply unit 1230.

1 and 2 in which the memory card test tray 1100 is not docked, if the memory card test tray 1100 is docked in the memory card test kit 1200 as shown in FIGS. 3 to 5, The power supply necessary for the test is automatically supplied to the memory card test tray 1100 and the test operation for the memory card 1 is automatically performed on the memory card test tray 1100 through this operation, The efficiency can be significantly improved.

Particularly, when the memory card testing apparatus 1000 according to the present embodiment is used in conjunction with the system shown in Fig. 10, there is an advantage that the productivity can be remarkably improved.

First, the kit body 1210 forms a place where the memory card test tray 1100 is docked from one side.

The memory card test kit 1200 takes a state in which most of the space is open. Therefore, it is possible to reduce the material cost of manufacturing the memory card test kit 1200, and further, there is an advantage that the handling becomes light. A large number of circuits can be mounted in the kit body 1210.

The docking slot portion 1220 is formed on one side wall of the kit body 1210 and forms a place where the memory card test tray 1100 is docked. At this time, the memory card test kit 1200 is provided with a plurality of guide pins 1671 so that the memory card test tray 1100 is properly docked in the docking slot 1220.

A plurality of guide pins 1671 are provided in the kit body 1210 and are inserted into the guide pin groove 1130 of the memory card test tray 1100 when the memory card test tray 1100 is docked in the docking slot portion 1220 And serves to guide the correct position of the memory card test tray 1100.

Meanwhile, when the memory card test tray 1100 is docked to the docking slot 1220, the memory card test tray 1100 in the docking slot 1220 should not be arbitrarily separated. In fact, if the memory card test tray 1100 is arbitrarily disconnected during the test, the memory card 1 may be damaged. In order to prevent such a phenomenon, a motorized tray locking portion 1280 is provided in the memory card test kit 1200 so that the memory card test tray 1100 is not arbitrarily separated from the docking slot portion 1220.

6 to 9, the motorized tray locking portion 1280 is provided on the kit body 1210 so that the memory card test tray 1100 docked in the docking slot portion 1220 is not arbitrarily separated And serves to lock the memory card test tray 1100 in a motorized manner.

The motorized tray locking portion 1280 includes an electric actuator 1281, a locking member 1282 that is selectively locked to the locking portion 1130 of the memory card test tray 1100, And a motion transmission portion 1283 for advancing or rotating the locking member 1282.

8, when the memory card test tray 1100 approaches the memory card test kit 1200 and the guide pin 1271 is coupled to the guide pin groove 1140 as shown in FIG. 6, the electric actuator 1281, The power transmission portion 1283 is rotated to lock the locking member 1282 to the locking portion 1130 of the memory card test tray 1100 after the power transmission portion 1283 is advanced. In this state, the memory card test tray 1100 can not be separated arbitrarily, and a stable test operation can be performed.

The power supply unit 1230 is provided in the kit body 1210 and automatically supplies power for the test operation to the memory card test tray 1100 when the memory card test tray 1100 is docked in the docking slot unit 1220 It serves as a supplier. As a result, when the memory card test tray 1100 is docked in the memory card test kit 1200 as shown in FIGS. 3 to 5, the power supply unit 1230 of the memory card test kit 1200 supplies power necessary for the test to the memory card The test operation for the memory card 1 is automatically performed on the memory card test tray 1100 through the automatic operation of the test tray 1100 so that the previous test efficiency can be significantly improved will be.

The memory card test kit 1200 according to an embodiment of the present invention includes a guide wall 1240 and a plurality of tray supports 1215. [

The guide wall 1240 is a structure that is connected to the kit body 1210 along the direction in which the memory card test tray 1100 is docked and supports a plurality of cooling fans 1251.

The plurality of tray supports 1215 serve to support the memory card test tray 1100 on the opposite side of the guide wall 1240 with the memory card test tray 1100 therebetween. The kit body 1210 is provided with a setting pin 1211 and a setting hole 1212 through which the memory card test kit 1200 can be set in place in the system.

The memory card test kit 1200 according to an exemplary embodiment of the present invention includes a cooling fan 1251 and a temperature sensing unit 1252 as means for preventing heat generation that may occur during a test operation on the memory card 1, And a controller 1260 for controlling them.

The cooling fan 1251 is provided in the guide wall 1240 and serves to cool the heat generated during the test operation of the memory card 1. [ Since a plurality of memory cards 1 are applied, and both of them are tested simultaneously, the cooling fan 1251 can also be applied to a plurality of memory cards 1 in correspondence to all of them.

The temperature sensing unit 1252 is connected to the kit body 1210 and senses the temperature of the memory card 1 test tray 1100 during a test operation of the memory card 1. In this embodiment, the temperature sensing part 1252 is of a bar type and is arranged long along the direction in which the memory card test tray 1100 is docked from both sides of the guide wall 1240. Of course, it is also possible to consider applying several temperature sensors in addition to these structures, all of which are within the scope of the present invention.

The controller 1260 is provided in the kit body 1210 and controls the operation of the cooling fan 1251 based on the sensed value of the temperature sensing unit 1252. That is, when the sensed value of the temperature sensing unit 1252 is higher than a preset reference value, the controller 1260 determines that the memory card 1 is in the overheated state and the controller 1260 turns on the operation of the cooling fan 1251, It is possible to prevent damage.

Meanwhile, the memory card test apparatus 1000 as described above may be used as a single apparatus or may be applied to the memory card test system 10 as shown in FIG.

Hereinafter, a description will be given of how the memory card testing apparatus 1000 according to the present embodiment is applied to the memory card testing system 10 of FIG. However, the memory card test apparatus 1000 according to the present embodiment may not be applied to the memory card test system 10 in Fig.

10 to 12, the memory card test system 10 according to the present embodiment includes a memory card test tray 1000 having a memory card test tray 1100 and a memory card test kit 1200 A memory card test station 1300, a goods receipt tray 1400, a goods receipt tray 1500, a memory card transfer unit 1600, a goods receipt station 1700, a goods dispatch station 1800, And a tray common stocker 1900.

The memory card test system 1000 according to the present embodiment may further include a roller conveyor or a conveyor belt or the like between the loading station 1700 and the transfer unit 1600 or between the transfer unit 1600 and the output station 1800 have. In this case, it is possible to transfer the receiving tray 1400 from the receiving station 1700 to the conveying unit 1600 with a roller conveyor or a conveyor belt or the like from the conveying unit 1600 to the delivering station 1800, As shown in FIG.

The memory card test station 1300 forms a test work position P1. The memory card test station 1300 includes a kit supporting shelf 1310 in which a plurality of memory card test kits 1200 are individually supported and a tray stocker 1320. Since a plurality of kit supporting shelves 1310 are provided in the memory card test station 1300, the plurality of memory cards 1 can be tested at the same time, and the efficiency of the test can be enhanced.

The tray stocker 1320 includes a stocker body 1321 movably provided in the test work position P1 and a memory card test tray 1321 coupled to the stocker body 1321 so as to be movable up / 1110 to the memory card test kit 1120 or to take out the tested memory card test tray 1110 from the memory card test kit 1120. [

The tray stocker 1320 automatically transfers the memory card test tray 1100 to the memory card test kit 1200 or takes out the memory card test tray 1100 from the memory card test kit 1200, The movement time and necessary manpower of the tray 1100 can be reduced, thereby enhancing the efficiency of the memory card 1 test.

The receiving tray 1400 is loaded with a memory card 1 to be loaded for testing and allows a plurality of memory cards 1 to be loaded at the same time.

The output tray 1500 is loaded with the tested memory card 1 taken out of the memory card test tray 1100 and is loaded into a normal memory 1500 in which the normally functioning memory card 1 of the tested memory card 1 is loaded Card dispensing tray 1510 and an abnormal memory card output tray 1520 on which an abnormally operating memory card among the tested memory cards 1 is loaded.

The memory card 1 thus tested is automatically distinguished from the normally operating memory card 1 and the malfunctioning memory card 1 and is loaded into the normal memory card output tray 1510 and the abnormal memory card output tray 1520, Which will be described later in detail.

The memory card transfer unit 1600 transfers the memory card 1 loaded on the receiving tray 1400 to the memory card test tray 1100 or the memory card 1 mounted on the memory card test tray 1100 To the delivering tray 1500 and is provided with a first pick and place portion 1610, a second pick and place portion 1620, a receiving tray cover opening portion 1630, And a tray cover engaging portion 1640.

The first pick and place unit 1610 takes out the memory card 1 loaded on the receiving tray 1400 and mounts it on the memory card test tray 1100 and displays the identification code And a first memory card identification module 1611 for recognizing the first memory card.

The second pick and place section 1620 takes out the memory card 1 mounted on the memory card test tray 1100 and loads it on the output tray 1500 and inserts the identification code provided on the memory card 1 And a second memory card identification module 1621 for recognizing the second memory card.

10, the first pick-and-place unit 1610 takes out the memory card 1 loaded on the receiving tray 1400 and mounts it on the memory card test tray 1100, while the second pick- The unit 1620 removes the memory card 1 mounted on the memory card test tray 1100 and stacks it on the output tray 1500 so that a known one may be used. do.

As described above, the first memory card identification module 1611 and the second memory card identification module 1621 recognize the identification code provided on the memory card 1, and recognize the information of the recognized memory card 1 The memory card test tray 1100 or the memory card test kit 1200 so as to automatically classify the memory card 1, which will be described later in detail.

On the other hand, the identification code provided on the memory card 1 may be provided as a barcode, but the scope of the present invention is not limited thereto, and the identification code may be provided with an identification code other than the barcode, if necessary.

The receiving tray cover opening portion 1630 separates the receiving tray tray 1400a and the receiving tray 1400 provided on the receiving tray 1400 to prevent impurities from entering the receiving tray 1400, The tray 1400 is opened.

The output tray cover engaging portion 1640 engages the outlet tray cover 1500a provided on the output tray 1500 to prevent the entry of impurities into the output tray 1500. [

The receiving tray station 1700 is provided adjacent to the memory card transmitting unit 1600 to load a plurality of receiving trays 1400. And the output tray station 1800 is provided adjacent to the memory card transfer unit 1600 to load a plurality of output trays 1500.

11, the common stocker 1900 wears the receiving tray 1400, takes it out of the tray station 1700 and transfers it to the memory card transfer unit 1600 or transfers it from the memory card transfer unit 1600 to the output tray 1500 And may include a common stocker main body 1910, a common stocker rotation section 1920, and a common stocker tray shelf 1930. The common stocker tray 1920 may be a single stocker,

The common stocker rotation section 1920 is connected to the common stocker body 1910 and is rotatably provided and includes a first rotation module 1921, a second rotation module 1922, and a rotation module axis 1923 . The first rotation module 1921 and the second rotation module 1922 are connected to each other via a rotation module shaft 1923, and are provided so as to overlap each other, thereby improving space efficiency.

Hereinafter, the operation of the memory card test system 10 will be briefly described.

In the receiving tray 1400, a memory card 1 to be loaded for testing is loaded. The receiving tray 1400 loaded with the memory card 1 is loaded on the receiving tray station 1700. [

The tray common stocker 1900 wears the receiving tray 1400, takes it out of the tray station 1700, and transfers it to the memory card transmitting unit 1600. The memory card transfer unit 1600 transfers the memory card 1 loaded on the receiving tray 1400 to the memory card test tray 1100. [

The process of transferring the memory card 1 from the memory card transfer unit 1600 to the memory card test tray 1100 from the tray 1400 will be described in detail as follows.

The receiving tray cover opening portion 1630 separates the receiving tray 1400a from the receiving tray 1400 and opens the receiving tray 1400. [ The first pick and place section 1610 takes out the memory card 1 from the open receiving tray 1400 and the first memory card identifying module 1611 recognizes the identification code of the memory card 1. [ The first pick and place unit 1610 mounts the memory card 1 whose identification code is recognized in the memory card test tray 1100. That is, the memory card transfer unit 1600 automatically transfers the memory card 1 from the tray 1400 to the memory card test tray 1100 to reduce the time and manpower required for the memory card test, Increase.

On the other hand, the tray stocker 1320 transfers the memory card test tray 1100 to the memory card test kit 1200 at a predetermined position. When the tray stocker 1320 transfers the memory card test tray 1100 to the test kit 1200, the memory card test tray 1100 is docked to the memory card test kit 1200 through the process of FIGS. do.

7, when the memory card test tray 1100 approaches the memory card test kit 1200 and the guide pin 1271 is coupled to the guide pin groove 1140, the electric actuator 1281 The power transmitting portion 1283 is advanced and then the power transmitting portion 1283 is rotated as shown in FIG. 9 so that the locking member 1282 is locked to the locking portion 1130 of the memory card test tray 1100. In this state, the memory card test tray 1100 can not be separated arbitrarily, and a stable test operation can be performed.

When the docking is completed, power is supplied from the memory card test kit 1200 to the memory card test tray 1100, and a test operation for the memory card 1 is performed on the memory card test tray 1100 based on the power It proceeds automatically.

When the temperature detected by the temperature sensing unit 1252 is higher than a predetermined reference value during the test operation for the memory card 1, the controller 1260 determines that the memory card 1 is in an overheated state, and turns on the operation of the cooling fan 1251. [ It is possible to prevent the memory card 1 being tested from being damaged.

On the other hand, when the test operation is completed, the memory card test tray 1100 having been tested in the memory card test kit 1200 is taken out. The memory card transfer unit 1600 transfers the memory card 1 mounted on the memory card test tray 1100 to the output tray 1500. [

The process of transferring the memory card 1 mounted on the memory card test tray 1100 to the output tray 1500 will be described in detail as follows.

The second pick and place section 1620 takes out the memory card 1 from the memory card test tray 1100 and the second memory card identification module 1621 recognizes the identification code of the memory card 1. [ The second pick-and-place unit 1620 loads the memory card 1 whose identification code is recognized in the output tray 1500. [ At this time, the second pick and place section 1620 loads the normally operating memory card 1 of the tested memory card 1 into the normal memory card output tray 1510, The abnormally operating memory card 1 is loaded in the abnormal memory card output tray 1520.

The output tray cover engaging portion 1640 engages the output tray cover 1500a and the output tray 1500. [ The output tray 1500 is loaded on the output tray station 1800 where the tray common stocker 1900 separately loads the normal memory card output tray 1510 and the abnormal memory card output tray 1520.

As described above, according to the present invention, the tested memory card 1 is automatically distinguished as a normal memory card and an abnormal memory card, and loaded into the normal memory card output tray 1510 and the abnormal memory card output tray 1520, respectively, Time can be shortened and manpower can be reduced to increase the efficiency of the test process.

Particularly, according to the present embodiment, the testing operation for the memory card 1 can be performed stably and quickly, and furthermore, the test operation of the memory card 1 can be automated, thereby contributing to the improvement of productivity .

It will be apparent to those skilled in the art that various modifications and variations can be made in the present invention without departing from the spirit or scope of the invention. It is therefore intended that such modifications or alterations be within the scope of the claims appended hereto.

1000: Memory card test device 1100: Memory card test tray
1110: Moving unit body 1120: Test board
1130: locking portion 1140: guide pin groove
1200: Memory card test kit 1210: Kit body
1215: tray support part 1220: docking slot part
1230: Power supply unit 1240: Guide wall
1251: cooling fan 1252: temperature sensing unit
1260: Controller 1271: Guide pin
1280: electric tray locking part 1281: electric actuator
1282: locking member 1283:

Claims (23)

A memory card test tray for supporting a memory card is docked, and a test operation for the memory card is performed in the memory card test tray,
A kit body in which the memory card test tray is docked at one side;
A docking slot formed on one side wall of the kit body and docked with the memory card test tray;
A power supply unit provided in the kit body and supplying power for a test operation to the memory card test tray when the memory card test tray is docked in the docking slot unit; And
And a motorized tray locking unit provided on the kit body for electrically locking the memory card test tray so that the memory card test tray docked in the docking slot unit is not arbitrarily separated. . The method according to claim 1,
A guide wall connected to the kit body along a direction in which the memory card test tray is docked; And
Further comprising: a plurality of tray supports for supporting the memory card test tray across the memory card test tray and opposite the guide wall. 3. The method of claim 2,
Further comprising a plurality of cooling fans provided on the guide wall for cooling the heat generated during a test operation of the memory card. The method of claim 3,
A temperature sensing unit connected to the kit body and sensing a temperature of the memory card test tray during a test operation of the memory card; And
Further comprising a controller provided in the kit body for controlling the operation of the cooling fan based on the sensed value of the temperature sensing unit. The method according to claim 1,
A plurality of guide pins inserted in guide pin grooves of the memory card test tray and guiding the correct position of the memory card test tray when the memory card test tray is docked in the docking slot portion; And a memory card for storing the test data. delete The method according to claim 1,
The motorized tray locking portion includes:
Electric actuators;
A locking member selectively locked to a locking portion of the memory card test tray; And
And a motion transmitting portion for moving or rotating the locking member based on the power of the electric actuator. A memory card test tray having a tray main body and a test board for supporting the memory card, the test board being provided on the tray main body and allowing the test operation to proceed in a state where a plurality of the memory cards are coupled; And
Wherein the memory card test tray is disposed to be dockable and a test for the memory card is performed in the memory card test tray when the memory card test tray is docked, ,
The memory card test kit includes:
A kit body in which the memory card test tray is docked at one side;
A docking slot formed on one side wall of the kit body and docked with the memory card test tray;
A power supply unit provided in the kit body and supplying power for a test operation to the memory card test tray when the memory card test tray is docked in the docking slot unit; And
And a motorized tray locking unit provided on the kit body for electrically locking the memory card test tray so that the memory card test tray docked in the docking slot unit is not arbitrarily separated. 9. The method of claim 8,
The memory card test kit includes:
A guide wall connected to the kit body along a direction in which the memory card test tray is docked; And
Further comprising a plurality of tray supports for supporting the memory card test tray at opposite sides of the guide wall with the memory card test tray interposed therebetween. 10. The method of claim 9,
The memory card test kit includes:
A plurality of cooling fans provided on the guide wall for cooling the heat generated during a test operation of the memory card;
A temperature sensing unit connected to the kit body and sensing a temperature of the memory card test tray during a test operation of the memory card; And
Further comprising a controller provided in the kit body for controlling the operation of the cooling fan based on the sensed value of the temperature sensing unit. 9. The method of claim 8,
The memory card test kit includes:
A plurality of guide pins inserted in guide pin grooves of the memory card test tray and guiding the correct position of the memory card test tray when the memory card test tray is docked in the docking slot portion; And the memory card is connected to the memory card. delete 9. The method of claim 8,
The motorized tray locking portion includes:
Electric actuators;
A locking member selectively locked to a locking portion of the memory card test tray; And
And a motion transmitting unit for moving or rotating the locking member based on the power of the electric actuator. 9. The method of claim 8,
The tray main body includes:
An interposer board connecting the test board and the tray main body;
A power port provided on the interposer board and supplying power to the test board through the interposer board; And
And an input / output port provided on the interposer board for inputting data to the test board through the interposer board and outputting data from the test board through the interposer board. 9. The method of claim 8,
The test board includes:
A substrate main body on which wiring patterns are formed;
A memory card test slot electrically connected to the wiring pattern, the memory card test slot being disposed on one side of the substrate body and mounting the memory card; And
And a test module disposed on the other surface of the substrate body and electrically connected to the wiring pattern. A memory card test tray for supporting a memory card and a memory card test kit for causing a test operation on the memory card to proceed from the memory card test tray when the memory card test tray is docked, Card test equipment;
A memory card test station for forming a test work location where the memory card is tested and individually supporting a plurality of the memory card test kits;
A receiving tray on which the memory card to be loaded is loaded; And
And a delivery tray for taking out the tested memory card from the memory card test tray,
The memory card test kit of the memory card test apparatus comprises:
A kit body in which the memory card test tray is docked at one side;
A docking slot formed on one side wall of the kit body and docked with the memory card test tray;
A power supply unit provided in the kit body and supplying power for a test operation to the memory card test tray when the memory card test tray is docked in the docking slot unit; And
And a motorized tray locking unit provided on the kit body for electrically locking the memory card test tray so that the memory card test tray docked in the docking slot unit is not arbitrarily separated. 17. The method of claim 16,
The memory card test station includes:
Further comprising a tray stocker for transferring the memory card test tray to the memory card test kit at a predetermined position or for taking out the memory card test tray that has been tested in the memory card test kit system. 18. The method of claim 17,
The tray stocker includes:
A stocker body movably provided at the test work position; And
The memory card test tray is transferred to the memory card test kit or the memory card test tray which has been tested in the memory card test kit is taken out The memory card test system comprising: 17. The method of claim 16,
Further comprising a memory card transfer unit for transferring the memory card loaded on the input tray to the memory card test tray or for transferring the memory card mounted on the memory card test tray to the output tray Memory card test system. 20. The method of claim 19,
Wherein the memory card transfer unit comprises:
A first pick and place unit for taking out the memory card loaded on the receiving tray and mounting the memory card on the memory card test tray; And
And a second pick and place unit for taking out the memory card mounted on the memory card test tray and loading the memory card onto the output tray. 20. The method of claim 19,
A receiving tray station provided adjacent to the memory card transmitting unit and having a plurality of the receiving trays stacked thereon; And
Further comprising an outlet tray station adjacent to the memory card transfer unit and loaded with a plurality of the output trays. 22. The method of claim 21,
Further comprising a tray stocker for taking the stock tray from the stock tray station and transferring the same to the memory card transfer unit or receiving the stock tray from the memory card transfer unit and loading the same on the stock tray station Memory card test system. 17. The method of claim 16,
The stock tray includes:
A normal memory card output tray on which a normally operating memory card among the memory cards tested is loaded; And
And an abnormality memory card output tray to which an abnormal operation memory card is loaded, among the memory cards whose test has been completed.

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