KR101774074B1 - 웨브 제조 공정에서의 응용-특정된 반복 결함 검출 시스템 - Google Patents

웨브 제조 공정에서의 응용-특정된 반복 결함 검출 시스템 Download PDF

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KR101774074B1
KR101774074B1 KR1020127026343A KR20127026343A KR101774074B1 KR 101774074 B1 KR101774074 B1 KR 101774074B1 KR 1020127026343 A KR1020127026343 A KR 1020127026343A KR 20127026343 A KR20127026343 A KR 20127026343A KR 101774074 B1 KR101774074 B1 KR 101774074B1
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KR20130006466A (ko
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스티븐 피 플로에더
제임스 에이 마스터만
스티븐 알 드레거
칼 제이 스켑스
스티븐 알 웨거맨
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쓰리엠 이노베이티브 프로퍼티즈 컴파니
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • DTEXTILES; PAPER
    • D06TREATMENT OF TEXTILES OR THE LIKE; LAUNDERING; FLEXIBLE MATERIALS NOT OTHERWISE PROVIDED FOR
    • D06HMARKING, INSPECTING, SEAMING OR SEVERING TEXTILE MATERIALS
    • D06H3/00Inspecting textile materials
    • D06H3/08Inspecting textile materials by photo-electric or television means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/8922Periodic flaws
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G01N2021/8917Paper, also ondulated
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G01N2021/8918Metal
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G01N21/8915Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined non-woven textile material

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  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Materials Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Treatment Of Fiber Materials (AREA)
  • Image Processing (AREA)
KR1020127026343A 2010-03-10 2011-03-04 웨브 제조 공정에서의 응용-특정된 반복 결함 검출 시스템 Expired - Fee Related KR101774074B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US31259810P 2010-03-10 2010-03-10
US61/312,598 2010-03-10
PCT/US2011/027104 WO2011112427A1 (en) 2010-03-10 2011-03-04 Application-specific repeat defect detection in web manufacturing processes

Publications (2)

Publication Number Publication Date
KR20130006466A KR20130006466A (ko) 2013-01-16
KR101774074B1 true KR101774074B1 (ko) 2017-09-01

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KR1020127026343A Expired - Fee Related KR101774074B1 (ko) 2010-03-10 2011-03-04 웨브 제조 공정에서의 응용-특정된 반복 결함 검출 시스템

Country Status (8)

Country Link
US (1) US8935104B2 (enExample)
EP (1) EP2545360B1 (enExample)
JP (2) JP2013522595A (enExample)
KR (1) KR101774074B1 (enExample)
CN (1) CN102792154B (enExample)
SG (1) SG183894A1 (enExample)
TW (1) TWI506271B (enExample)
WO (1) WO2011112427A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102232196B1 (ko) * 2020-10-22 2021-03-26 주식회사 아이파미코리아 마스크 필터의 이물질 검사장치

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CN114813741B (zh) * 2021-01-29 2025-03-11 宝山钢铁股份有限公司 一种管棒材缺陷在线标识装置及方法
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EP2545360B1 (en) 2020-02-12
JP2015227888A (ja) 2015-12-17
CN102792154A (zh) 2012-11-21
JP5965038B2 (ja) 2016-08-03
EP2545360A1 (en) 2013-01-16
JP2013522595A (ja) 2013-06-13
TWI506271B (zh) 2015-11-01
WO2011112427A1 (en) 2011-09-15
CN102792154B (zh) 2015-09-23
KR20130006466A (ko) 2013-01-16
TW201137343A (en) 2011-11-01
SG183894A1 (en) 2012-10-30
US20110224918A1 (en) 2011-09-15
US8935104B2 (en) 2015-01-13

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