KR101749671B1 - 역-도통 전력 반도체 디바이스 - Google Patents
역-도통 전력 반도체 디바이스 Download PDFInfo
- Publication number
- KR101749671B1 KR101749671B1 KR1020137007778A KR20137007778A KR101749671B1 KR 101749671 B1 KR101749671 B1 KR 101749671B1 KR 1020137007778 A KR1020137007778 A KR 1020137007778A KR 20137007778 A KR20137007778 A KR 20137007778A KR 101749671 B1 KR101749671 B1 KR 101749671B1
- Authority
- KR
- South Korea
- Prior art keywords
- layer
- cells
- igct
- anode
- cathode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
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Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D18/00—Thyristors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D18/00—Thyristors
- H10D18/80—Bidirectional devices, e.g. triacs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D18/00—Thyristors
- H10D18/221—Thyristors having amplifying gate structures, e.g. cascade configurations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D18/00—Thyristors
- H10D18/60—Gate-turn-off devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/101—Integrated devices comprising main components and built-in components, e.g. IGBT having built-in freewheel diode
- H10D84/131—Thyristors having built-in components
- H10D84/135—Thyristors having built-in components the built-in components being diodes
- H10D84/136—Thyristors having built-in components the built-in components being diodes in anti-parallel configurations, e.g. reverse current thyristor [RCT]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/124—Shapes, relative sizes or dispositions of the regions of semiconductor bodies or of junctions between the regions
- H10D62/126—Top-view geometrical layouts of the regions or the junctions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/13—Semiconductor regions connected to electrodes carrying current to be rectified, amplified or switched, e.g. source or drain regions
- H10D62/141—Anode or cathode regions of thyristors; Collector or emitter regions of gated bipolar-mode devices, e.g. of IGBTs
- H10D62/142—Anode regions of thyristors or collector regions of gated bipolar-mode devices
Landscapes
- Thyristors (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Electrodes Of Semiconductors (AREA)
- Junction Field-Effect Transistors (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP10181546.2 | 2010-09-29 | ||
| EP10181546 | 2010-09-29 | ||
| PCT/EP2011/066979 WO2012041958A2 (en) | 2010-09-29 | 2011-09-29 | Reverse-conducting power semiconductor device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20130100144A KR20130100144A (ko) | 2013-09-09 |
| KR101749671B1 true KR101749671B1 (ko) | 2017-06-21 |
Family
ID=43743553
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020137007778A Active KR101749671B1 (ko) | 2010-09-29 | 2011-09-29 | 역-도통 전력 반도체 디바이스 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US8847277B2 (enExample) |
| EP (1) | EP2622639B1 (enExample) |
| JP (1) | JP5972881B2 (enExample) |
| KR (1) | KR101749671B1 (enExample) |
| CN (1) | CN103119715B (enExample) |
| WO (1) | WO2012041958A2 (enExample) |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2015078657A1 (en) * | 2013-11-29 | 2015-06-04 | Abb Technology Ag | Reverse-conducting power semiconductor device |
| EP2930753A1 (en) | 2014-04-09 | 2015-10-14 | ABB Technology AG | Turn-off power semiconductor device |
| EP3130004B1 (en) * | 2014-04-10 | 2019-05-08 | ABB Schweiz AG | Turn-off power semiconductor device and method for manufacturing the same |
| EP2960941B1 (en) | 2014-06-26 | 2017-01-04 | ABB Schweiz AG | Reverse-conducting power semiconductor device |
| JP6602380B2 (ja) * | 2014-12-17 | 2019-11-06 | アーベーベー・シュバイツ・アーゲー | 双方向パワー半導体デバイス |
| CN104637997A (zh) * | 2015-01-28 | 2015-05-20 | 电子科技大学 | 一种双模逆导门极换流晶闸管及其制备方法 |
| EP3073530B1 (en) * | 2015-03-23 | 2017-05-03 | ABB Schweiz AG | Reverse conducting power semiconductor device |
| CN105590959B (zh) * | 2015-12-17 | 2018-05-29 | 清华大学 | 具有双p基区门阴极结构的门极换流晶闸管及其制备方法 |
| CN115039233A (zh) | 2020-02-03 | 2022-09-09 | 日立能源瑞士股份公司 | 反向导通功率半导体器件及其制造方法 |
| US12342559B2 (en) | 2020-03-31 | 2025-06-24 | Hitachi Energy Ltd | Turn-off power semiconductor device with gate runners |
| WO2021197774A1 (en) | 2020-03-31 | 2021-10-07 | Abb Power Grids Switzerland Ag | Power semiconductor device comprising a thyristor and a bipolar junction transistor |
| DE212021000403U1 (de) | 2020-08-31 | 2023-02-24 | Hitachi Energy Switzerland Ag | Elektronische Vorrichtung, Gehäuse und Halbleiterchip dafür |
| EP4053915B1 (en) * | 2021-03-02 | 2024-06-19 | Hitachi Energy Ltd | Gate-commuted thyristor cell with a base region having a varying thickness |
| WO2023099298A1 (en) | 2021-12-03 | 2023-06-08 | Hitachi Energy Switzerland Ag | Semiconductor device and method for operating a semiconductor device |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20040164316A1 (en) | 2003-02-25 | 2004-08-26 | Mitsubishi Denki Kabushiki Kaisha | Pressure contact type semiconductor device having dummy segment |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5342234B2 (enExample) | 1973-02-12 | 1978-11-09 | ||
| CH668505A5 (de) | 1985-03-20 | 1988-12-30 | Bbc Brown Boveri & Cie | Halbleiterbauelement. |
| DE4403429C2 (de) | 1994-02-04 | 1997-09-18 | Asea Brown Boveri | Abschaltbares Halbleiterbauelement |
| US5594261A (en) * | 1994-04-05 | 1997-01-14 | Harris Corporation | Device for isolating parallel sub-elements with reverse conducting diode regions |
| JP3571353B2 (ja) * | 1998-09-10 | 2004-09-29 | 三菱電機株式会社 | 半導体装置 |
| US20040142573A1 (en) * | 2003-01-16 | 2004-07-22 | Jun Osanai | Method for manufacturing MOSFET semiconductor device |
| US7489490B2 (en) * | 2006-06-07 | 2009-02-10 | International Rectifier Corporation | Current limiting MOSFET structure for solid state relays |
-
2011
- 2011-09-29 CN CN201180047291.4A patent/CN103119715B/zh active Active
- 2011-09-29 EP EP11763673.8A patent/EP2622639B1/en active Active
- 2011-09-29 JP JP2013530733A patent/JP5972881B2/ja active Active
- 2011-09-29 KR KR1020137007778A patent/KR101749671B1/ko active Active
- 2011-09-29 WO PCT/EP2011/066979 patent/WO2012041958A2/en not_active Ceased
-
2013
- 2013-03-28 US US13/852,366 patent/US8847277B2/en active Active
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20040164316A1 (en) | 2003-02-25 | 2004-08-26 | Mitsubishi Denki Kabushiki Kaisha | Pressure contact type semiconductor device having dummy segment |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2013543260A (ja) | 2013-11-28 |
| JP5972881B2 (ja) | 2016-08-17 |
| US20130207157A1 (en) | 2013-08-15 |
| WO2012041958A3 (en) | 2012-08-02 |
| US8847277B2 (en) | 2014-09-30 |
| EP2622639B1 (en) | 2015-01-21 |
| CN103119715B (zh) | 2016-08-03 |
| WO2012041958A2 (en) | 2012-04-05 |
| KR20130100144A (ko) | 2013-09-09 |
| EP2622639A2 (en) | 2013-08-07 |
| CN103119715A (zh) | 2013-05-22 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0105 | International application |
Patent event date: 20130327 Patent event code: PA01051R01D Comment text: International Patent Application |
|
| PG1501 | Laying open of application | ||
| PA0201 | Request for examination |
Patent event code: PA02012R01D Patent event date: 20160929 Comment text: Request for Examination of Application |
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| PA0302 | Request for accelerated examination |
Patent event date: 20160929 Patent event code: PA03022R01D Comment text: Request for Accelerated Examination |
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| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 20161213 Patent event code: PE09021S01D |
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| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
Patent event code: PE07011S01D Comment text: Decision to Grant Registration Patent event date: 20170426 |
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| PR0701 | Registration of establishment |
Comment text: Registration of Establishment Patent event date: 20170615 Patent event code: PR07011E01D |
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| PR1002 | Payment of registration fee |
Payment date: 20170616 End annual number: 3 Start annual number: 1 |
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